JPS6114737A - Lead warpage detector - Google Patents

Lead warpage detector

Info

Publication number
JPS6114737A
JPS6114737A JP13429784A JP13429784A JPS6114737A JP S6114737 A JPS6114737 A JP S6114737A JP 13429784 A JP13429784 A JP 13429784A JP 13429784 A JP13429784 A JP 13429784A JP S6114737 A JPS6114737 A JP S6114737A
Authority
JP
Japan
Prior art keywords
fiber
lead
array
good
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13429784A
Other languages
Japanese (ja)
Inventor
Hideyuki Tsujimura
秀之 辻村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP13429784A priority Critical patent/JPS6114737A/en
Publication of JPS6114737A publication Critical patent/JPS6114737A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

PURPOSE:To eliminate the conventional physical adjustment by obtaining the position of a fiber for a good lead by a calibration before detecting, and setting the judging range for the position by a program. CONSTITUTION:When an IC1 moves under an optical fiber array 3 and a photoreceptor 5 receives a light from the end of a lead, an output varies. A control circuit 6 has a function of counting the variation in the outputs of the respective fibers of the array 3, and when the lead of the IC1 passaes under the array 3, the reflected light from the end of the lead passes the interior of the fiber in the array 3, and the count of the fiber increases by ''1''. When the ICs of the prescribed number are moved in this manner, the number of the passed leads can be known for the position of the fiber. The distribution of the counted result for the position of the fiber is obtained to provide the position of the fiber for the maximum value. Then, the circuit 6 sets the good judgement range in both directions for the position of the fiber obtained from a calibration to judge whether it is good or not by moving the IC in this state.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は集積回路(以下ICと略す)の外観検査に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to visual inspection of integrated circuits (hereinafter abbreviated as IC).

〔従来技術〕[Prior art]

ICをプリント基板の穴の中に自動実装する場合に、第
3図に示すようにICIのり一ド】aが横方向に曲って
いたり、第4図のようにリード1aが幅方向に曲ってい
ると、リードがプリント基板の穴の中に入らず実装上不
具合が生ずることになる。
When automatically mounting an IC into a hole in a printed circuit board, the ICI glue lead 1a may be bent in the horizontal direction as shown in Figure 3, or the lead 1a may be bent in the width direction as shown in Figure 4. Otherwise, the leads will not fit into the holes in the printed circuit board, resulting in mounting problems.

そこでリード曲りの検査が必要となる。Therefore, it is necessary to inspect the lead bends.

従来は、第5図に示すようにリード1aの先端部分に隣
接させて、ある幅をもったファイバ2を配置し、IC1
がファイバ2の下方を移動する時にリードの先端の反射
をそのファイバが受ければ良と判定し、受けなければ不
良と判定していた。第5図において、リードla、は良
、リードla、とla。
Conventionally, as shown in FIG. 5, a fiber 2 with a certain width is placed adjacent to the tip of the lead 1a, and
If the fiber receives the reflection from the tip of the lead as it moves below the fiber 2, it is determined to be good, and if it does not, it is determined to be defective. In FIG. 5, lead la is good, lead la is good, and lead la is good.

は不良となる。becomes defective.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

この場合、曲り角に対する規格の変更に対しては専用の
ファイバを製作する必要があり、又ファイバの幅の精度
も問題であった。
In this case, it is necessary to manufacture a dedicated fiber in response to changes in the standard for bending angles, and the accuracy of the fiber width is also a problem.

又ζ第5図のファイバ2の位置の設定は、IC1の良品
リードla、の先端位置がファイバ2の中心位置に配置
する。ところが、ICの移動条件等により良品リード1
a1の位置が相対的に左右にシフトする事がある。その
場合に、その度ファイバ2の位置を再調整する必要があ
り、又その調整も大変であった。
Furthermore, the position of the fiber 2 in FIG. However, due to IC movement conditions, etc., good product lead 1
The position of a1 may be relatively shifted to the left or right. In that case, it was necessary to readjust the position of the fiber 2 each time, and the adjustment was also difficult.

本発明の目的は、検査する前にキャリブレーションによ
って良品リード1a□に対するファイバ位置を求め、そ
の位置に対して判定範囲をプログラムで設定することに
より従来の物理的調整をなくす装置を提供することにあ
る。
An object of the present invention is to provide an apparatus that eliminates the conventional physical adjustment by determining the fiber position with respect to the non-defective lead 1a□ by calibration before inspection and setting a determination range for that position by a program. be.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は第1図に示すように投光部と受光部が一体とな
った光ファイバをN本(但しNは整数)一直線に並べた
構造の光ファイバアレー3,3・・・を集積回路(以下
ICという)1のり一ド1aの横方向に対して直角方向
に配置するとともにリード1aの先端部分に隣接して配
設し、前記光ファイバアレー3の投光側に発光素子4を
、受光側に各ファイバに対応した受光素子5をそれぞれ
設置し、さらに各ファイバを通過したリードの数を言1
数し、各ファイバの位置と計数結果より分布を求め、そ
の最大値に対応したファイバ位置を求め、上記求めたフ
ァイバ位置に対し、両方向に判定範囲を定めることによ
り集積回路のリード曲りの検査を行う制御回路6を備え
たものである。
As shown in FIG. 1, the present invention is an integrated circuit using an optical fiber array 3, 3, etc., which has a structure in which N optical fibers (N is an integer) in which a light emitting part and a light receiving part are integrated are arranged in a straight line. (hereinafter referred to as IC) 1 is arranged in a direction perpendicular to the lateral direction of the lead 1a and adjacent to the tip of the lead 1a, and a light emitting element 4 is provided on the light emitting side of the optical fiber array 3. A light receiving element 5 corresponding to each fiber is installed on the light receiving side, and the number of leads passing through each fiber is 1.
The method calculates the position of each fiber and its distribution from the counting results, determines the fiber position corresponding to the maximum value, and determines the determination range in both directions for the fiber position determined above to inspect lead bending of integrated circuits. It is equipped with a control circuit 6 that performs the following operations.

〔作用〕[Effect]

本発明は光ファイバアレーによるリード数の計数結果と
各ファイバの位置データに基づいて制御回路でリードの
分布を求め、その最大値に対応したファイバ位置を求め
、求めたファイバ位置に対し両方向に判定範囲を定める
ことによりICのリード曲りの検査を行う。
The present invention uses a control circuit to determine the lead distribution based on the result of counting the number of leads in an optical fiber array and the position data of each fiber, determines the fiber position corresponding to the maximum value, and makes judgments in both directions for the determined fiber position. Inspect IC lead bending by determining the range.

〔実施例〕〔Example〕

以下に、本発明の一実施例を図により説明する。 An embodiment of the present invention will be described below with reference to the drawings.

第2図に示すように、光ファイバJ、、J2の一端をそ
れぞれ発光素子4aと受光素子5aとに接続し、光ファ
イバJ、、J2の他端(投光部と受光部)をKのように
一体化した光ファイバをN本(但しNは整数)一直線に
並べた構造の光ファイバアレー3をICIのリード1a
の横方向に対して直角方向に配置するとともにリードの
先端部分に隣接して配置する。
As shown in FIG. 2, one end of the optical fibers J, J2 is connected to the light emitting element 4a and the light receiving element 5a, respectively, and the other end (light emitting part and light receiving part) of the optical fiber J, J2 is connected to the light emitting element 4a and the light receiving element 5a, respectively. ICI's lead 1a is an optical fiber array 3 having a structure in which N optical fibers (N is an integer) are arranged in a straight line.
The lead is disposed perpendicular to the lateral direction of the lead and adjacent to the tip of the lead.

さらに、各ファイバを通過したリードの数を計数し、各
ファイバの値と計数結果の分布を求め、その最大値に対
応したファイバの位置を求め、求めたファイバ位置に対
し、両方向に判定範囲を定めることによりICのリード
曲りの検査を行う制御回路6に前記受光素子5を接続す
る。
Furthermore, the number of leads passing through each fiber is counted, the value of each fiber and the distribution of the counting results are determined, the position of the fiber corresponding to the maximum value is determined, and the judgment range is determined in both directions for the determined fiber position. The light-receiving element 5 is connected to a control circuit 6 that inspects the lead bending of the IC.

次に装置の動作を説明する。Next, the operation of the device will be explained.

動作はICの移動状態をチェックする為のキャリブレー
ション動作とキャリブレーション結果を利用して検査を
行うテスト動作に分かれる。
The operation is divided into a calibration operation for checking the movement state of the IC and a test operation for performing an inspection using the calibration result.

まず、キャリブレーション動作について説明する。First, the calibration operation will be explained.

第1図のように光ファイバアレー3,3をリード先端部
分に隣接して配置する。発光素子4より光をファイバを
通じてリード先端部に入射する。
As shown in FIG. 1, optical fiber arrays 3, 3 are arranged adjacent to the lead tip portions. Light from the light emitting element 4 is incident on the lead tip through the fiber.

もし、光ファイバアレー3,3の下にリードの先端がな
い時は受光側に光が入らないため、受光素子5の出力は
変化しないが、もし光ファイバアレー3の下をICが移
動し、リード先端よりの光を受光素子5が受けると、出
力が変化する。制御回路6には光ファイバアレー3の各
ファイバの出力の変化を計数する機能があり、光ファイ
バアレー3の下をICのリードが通過すると、リード先
端部よりの反射光が光ファイバアレー3内のあるファイ
バ内を通過し、そのファイバに対する計数を1増加する
If there are no lead tips under the optical fiber arrays 3, 3, no light will enter the light receiving side, so the output of the light receiving element 5 will not change, but if the IC moves under the optical fiber array 3, When the light receiving element 5 receives light from the tip of the lead, the output changes. The control circuit 6 has a function of counting the changes in the output of each fiber of the optical fiber array 3, and when the IC lead passes under the optical fiber array 3, the reflected light from the lead tip is reflected inside the optical fiber array 3. passes through a certain fiber and increases the count for that fiber by 1.

この様にしである数のICを移動させると、各ファイバ
位置に対し、通過したリードの本数を知ることができる
。このファイバ位置に対する計数結果の分布を求め、そ
の最大値に対するファイバ位置を求める。これがキャリ
ブレーション動作である。
When a certain number of ICs are moved in this way, the number of leads that have passed can be determined for each fiber position. The distribution of the counting results for this fiber position is determined, and the fiber position for the maximum value is determined. This is a calibration operation.

次に制御回路6ではキャリブレーション動作より求めた
ファイバ位置に対し、両方向に良品判定範囲を設け、こ
の状態でICを移動させて良否判定を行う。これがテス
ト動作である。
Next, the control circuit 6 sets a non-defective judgment range in both directions with respect to the fiber position determined by the calibration operation, and in this state, moves the IC to perform a pass/fail judgment. This is a test operation.

〔発明の効果〕〔Effect of the invention〕

本発明は以上説明したように、キャリブレーション動作
でリード中心位置に対する良否判定範囲を適当に選ぶこ
とにより、従来のように規格を満足するファイバを幾種
類も製作する必要がなく、良品リード位置が移動状態に
より相対的にシフトした時でもキャリブレーション動作
により、良品リード位置を求めることにより従来のよう
にファイバ位置を再調整する必要もなくなる。したがっ
て、本発明のリード曲り検査装置を使用することにより
物理的な変更及び複雑な調整が不要となる利点がある。
As explained above, the present invention appropriately selects the pass/fail judgment range with respect to the lead center position in the calibration operation, thereby eliminating the need to manufacture many types of fibers that meet the standards as in the past, and ensuring the position of the good lead. Even when there is a relative shift due to the movement state, the calibration operation determines the good lead position, eliminating the need to readjust the fiber position as in the conventional case. Therefore, by using the lead bending inspection device of the present invention, there is an advantage that physical changes and complicated adjustments are not required.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す構成図、第2図は本発
明で使用する光ファイバの構造図、第3図、第4図はI
Cのリード曲りを示す図、第5図は従来装置の構成図で
ある。 1・・・IC(集積回路)、1a・・・リード、3・・
・光ファイバ、4・・・発光素子、5・・・受光素子、
6・・・制御同第り図 第2図
Fig. 1 is a block diagram showing an embodiment of the present invention, Fig. 2 is a structural diagram of an optical fiber used in the present invention, and Figs. 3 and 4 are I
FIG. 5, which shows lead bending at C, is a configuration diagram of a conventional device. 1...IC (integrated circuit), 1a...lead, 3...
・Optical fiber, 4... Light emitting element, 5... Light receiving element,
6...Control diagram Figure 2

Claims (1)

【特許請求の範囲】[Claims] (1)投光部と受光部とが一体となつた光ファイバをN
本(但しNは整数)一直線に並べた構造の光ファイバア
レーを集積回路のリードの横方向に対して直角方向に配
置するとともにリードの先端部分に隣接して配設し、前
記光ファイバアレーの投光側に発光素子を、受光側に各
ファイバに対応した受光素子をそれぞれ設置し、さらに
各ファイバを通過したリードの数を計数し、各ファイバ
の位置と計数結果より分布を求め、その最大値に対応し
たファイバ位置を求め、上記求めたファイバ位置に対し
、両方向に判定範囲を定めることにより集積回路のリー
ド曲りの検査を行う制御回路を備えたことを特徴とする
リード曲り検出装置。
(1) N
An optical fiber array (N is an integer) arranged in a straight line is arranged perpendicularly to the lateral direction of the leads of the integrated circuit and adjacent to the tip of the leads. Install a light emitting element on the light emitting side and a light receiving element corresponding to each fiber on the light receiving side, count the number of leads that have passed through each fiber, calculate the distribution from the position of each fiber and the counting results, and calculate the maximum A lead bend detection device comprising: a control circuit for inspecting lead bends of an integrated circuit by determining a fiber position corresponding to the value and determining a determination range in both directions for the determined fiber position.
JP13429784A 1984-06-29 1984-06-29 Lead warpage detector Pending JPS6114737A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13429784A JPS6114737A (en) 1984-06-29 1984-06-29 Lead warpage detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13429784A JPS6114737A (en) 1984-06-29 1984-06-29 Lead warpage detector

Publications (1)

Publication Number Publication Date
JPS6114737A true JPS6114737A (en) 1986-01-22

Family

ID=15124986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13429784A Pending JPS6114737A (en) 1984-06-29 1984-06-29 Lead warpage detector

Country Status (1)

Country Link
JP (1) JPS6114737A (en)

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