JPS61119673A - Continuous type apparatus for producing thin metallic film - Google Patents

Continuous type apparatus for producing thin metallic film

Info

Publication number
JPS61119673A
JPS61119673A JP24146784A JP24146784A JPS61119673A JP S61119673 A JPS61119673 A JP S61119673A JP 24146784 A JP24146784 A JP 24146784A JP 24146784 A JP24146784 A JP 24146784A JP S61119673 A JPS61119673 A JP S61119673A
Authority
JP
Japan
Prior art keywords
substrate
chamber
thin film
chambers
sputtering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24146784A
Other languages
Japanese (ja)
Inventor
Kazuki Kamata
和樹 鎌田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP24146784A priority Critical patent/JPS61119673A/en
Publication of JPS61119673A publication Critical patent/JPS61119673A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/562Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To permit the easy regulation of the pressure difference between respective vacuum chambers and to prevent the drop of the metal deposited by evaporation on the surface of a substrate to earth potential by providing partition plates each provided with a thin film of a flexible high-polymer material between the plural adjacent vacuum chambers of a device which sputters a thin metallic film on the surface of the long-sized flexible substrate. CONSTITUTION:The long-sized flexible substrate 2 is passed through a chamber II, a chamber III and a chamber IV from a chamber I and is subjected to a sputtering treatment on both surfaces in the stage of producing a long-sized magnetic recording medium such as magnetic tape. More specifically, glow discharge is generated between the targets 7, 7' in the chambers II, III and the inside walls of the vacuum chambers II, III so that the metals of the targets 7, 7' are stuck by sputtering on both surfaces of the substrate 1. A flat plate 20 consisting of the high-polymer material is attached to each substrate passage port 10 of the partition plates 9-9'' between the respective chambers and a thin flexible film 19 consisting of a 'Teflon(R)' film, etc., is attached thereto. The leakage of the inert gas between the respective chamber is prevented. The metal deposited on the substrate 2 is insulated from the plates 9 by the films 19. The drop of said metal to the earth potential by the contact and the consequent failure of the vapor deposition are thus prevented.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は長尺の可撓性基板上にスパッタリング法により
て連続的に金属ち膜を形成する連続式金属薄膜製造装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a continuous metal thin film manufacturing apparatus for continuously forming a metal thin film on a long flexible substrate by sputtering.

(従来技術とその問題点) 近年、磁気テープ、磁気ディスクなどの磁気記録媒体の
普及と共にその製造装置の研究開発が盛んに行なわれる
よ5になりた。
(Prior Art and its Problems) In recent years, with the spread of magnetic recording media such as magnetic tapes and magnetic disks, research and development of manufacturing equipment for the same has become active.

この種の製造装置は長尺の可撓性基板に金属薄膜 膜を連も、に形成した後に用途に合りた形状に加工する
ものである。
This type of manufacturing equipment forms a series of thin metal films on a long flexible substrate and then processes the film into a shape suitable for the intended use.

従来、金属薄膜の形成方法としては塗布法、メ、キ法、
スバ、タリング法、イオンブレーティング法、蒸着法等
が知られている。
Conventionally, methods for forming metal thin films include coating methods, metallizing methods,
Methods such as sludge, talling, ion blating, and vapor deposition are known.

本発明はこれらの金属薄膜の形成方法の5ち、スパッタ
リング法を用いてする連続式金属薄膜製造装置に関する
もの・で、第5図に従来のこの種の装置の一例を略図に
して示した。
The present invention relates to a continuous metal thin film manufacturing apparatus using sputtering, which is one of the methods for forming metal thin films, and FIG. 5 schematically shows an example of a conventional apparatus of this type.

第5図において、1は真空槽であり、開閉可変パルプ1
4を介して真空ポンプ11によって10−7に分けられ
ている。
In FIG. 5, 1 is a vacuum chamber, and the opening/closing variable pulp 1
4 and is divided into 10-7 by a vacuum pump 11.

第1室では巻出しロール3に巻かれた長尺の可撓性基板
2(以後基板2と呼ぶ)はガイドロール4に導びかれて
l−■真空室の仕切板9に設けられた通過口10から送
り出される。更に第■、m室のスパッタリング室とll
−l1l、1it−PI真空室の仕切板9’、  9’
に設置された通過口10′・ 10’を経て、第■室に
入り、ガイドロール4′に導びかれて巻取りロール5に
巻き取られる。
In the first chamber, a long flexible substrate 2 (hereinafter referred to as substrate 2) wound around an unwinding roll 3 is guided by a guide roll 4 and passed through a partition plate 9 of the l-■ vacuum chamber. It is sent out from the mouth 10. Furthermore, the sputtering chamber of the second chamber, the m chamber, and the ll
-l1l, 1it-PI vacuum chamber partition plates 9', 9'
The material enters the chamber (1) through passage ports 10' and 10' installed in the 4th section, is guided by a guide roll 4', and is wound up on a winding roll 5.

第ff、  [[[室のスパッタリング室には該基板2
をはさんで電極6,6′と、該基板2表面に形成され△ る金属WI膜と同種材料のターゲット7.7’が設けら
れている。
ff, the sputtering chamber of the [[[ chamber has the substrate 2
Electrodes 6, 6' and a target 7, 7' made of the same material as the metal WI film formed on the surface of the substrate 2 are provided on both sides.

第5図には両面に単層の金属薄膜を形成する装置を示し
たが、両面又は片面に二層又はそれ以上を形成する場合
には真空室1〜II/の数を増す必要がある。
Although FIG. 5 shows an apparatus for forming a single layer metal thin film on both sides, in the case of forming two or more layers on both sides or one side, it is necessary to increase the number of vacuum chambers 1 to II/.

第5図の装置を動作させるには、真空槽l内を開閉可変
バルブ14を介して真空ポンプIIKよりて10Tor
r以下に排気し、第1I、  111室の真空室に圧力
調整用可変バルブ1.5.15’を介して不活性ガス(
アルゴンガスなと)ボンベ12.12’より不活性ガス
を注入し、真空槽1内の圧力を5×10〜2X10  
Torr程度に維持する。この場合、真空室ポンプ(油
拡散ポンプなど)の臨界背圧に応じて、開閉可変パルプ
14の開度が調整される。
In order to operate the apparatus shown in FIG.
evacuated to below r, and inert gas (
Inject inert gas (such as argon gas) from cylinder 12.
Maintain at around Torr. In this case, the opening degree of the variable opening/closing pulp 14 is adjusted depending on the critical back pressure of a vacuum chamber pump (such as an oil diffusion pump).

基板2は前記搬送機構によって一定速度で移動とによっ
てターゲット7.7′と真空[1との間でグルー放電を
起こさせると、ターゲット7.7′の魔 電子が基板20表面に付着することによって、金属薄膜
の形成が行なわれる。金属薄膜が形成された基板2は前
記搬送機構によって巻取りロール5に巻き取られる。
When the substrate 2 is moved at a constant speed by the transport mechanism and a glue discharge is caused between the target 7.7' and the vacuum [1, the magic electrons of the target 7.7' adhere to the surface of the substrate 20. , a metal thin film is formed. The substrate 2 on which the metal thin film is formed is wound onto a winding roll 5 by the transport mechanism.

周知のようにスパッタリング法による薄膜の形成はスパ
ッタリング中の雰囲気に大きく影響される。即ち、真空
槽内へ導入される不活性ガスの圧力によって薄膜の形成
状態が異なり、一般に不活性ガスの圧力が高い程、薄膜
に亀裂、歪み、しわを生ずるl傾向がある7またターグ
ツl−7,7’へる。
As is well known, the formation of thin films by sputtering is greatly influenced by the atmosphere during sputtering. That is, the state of thin film formation varies depending on the pressure of the inert gas introduced into the vacuum chamber, and generally speaking, the higher the pressure of the inert gas, the more likely it is that the thin film will develop cracks, distortions, and wrinkles. 7, 7'.

さて、上述した理由から連続してスパッタリングを行な
う場合には、1〜■の各真空室は互に異なったガス圧力
で作業を行なうことが多い。
For the reasons mentioned above, when sputtering is performed continuously, the vacuum chambers 1 to 2 are often operated at different gas pressures.

このような場合、従来のこの種の装置では、第5図の圧
力調整用可変バルブ15.15’を調整することによっ
て不活性ガスポンベ12.12’から不活性ガスの適量
を注入して、第■、III室の圧力を設定する方法がと
られている。
In such a case, in a conventional device of this type, an appropriate amount of inert gas is injected from the inert gas pump 12.12' by adjusting the pressure adjustment variable valve 15.15' shown in FIG. (2) A method is used to set the pressure in chamber III.

このとき問題を生ずるのが第5図の通過口10゜IQ’
、10″に°ある。これら通過口の正面回を第3図に示
したが、これらの通過口はその開口面積を小さくするほ
ど、各真空室l〜■の圧力調整は容易になる。しかし、
この開口を小さくすることには限界がある。
In this case, the problem arises at the passage port 10°IQ' in Figure 5.
, 10''. The front view of these passage ports is shown in Figure 3, and the smaller the opening area of these passage ports, the easier it will be to adjust the pressure in each of the vacuum chambers 1 to 2. However, ,
There is a limit to how small this opening can be made.

これら通過口のガス流入のコンダクタンスを小さくする
ために第4図に示すような通過口を設ける例がある。第
4図の通過口は第3図の通過口に基板20幅よりも広い
口をもつ角型配管17を用意してこれをL形アングル1
6によ、−C仕切板9等に取付けたものである。第4図
の通過口は第3図の通過口よりもコンダクタンスを小さ
くできるがこれでもなお充分な圧力差を画室間に確保す
ることは困難である。
In order to reduce the conductance of gas inflow through these passage ports, there is an example in which passage ports as shown in FIG. 4 are provided. For the passage port in FIG. 4, prepare a rectangular pipe 17 with an opening wider than the width of the board 20 at the passage port in FIG.
6, it is attached to the -C partition plate 9, etc. Although the passage port shown in FIG. 4 can have a smaller conductance than the passage port shown in FIG. 3, it is still difficult to ensure a sufficient pressure difference between the compartments.

第4図の通過口の角型配管17を長くすればガス流入の
コンダクタンスは小さくなる。しか、し、装置の大型化
、基板2の角型配管17の内侵への接触等の不具合を−
伴うのでこの実H施も困難である。
If the rectangular pipe 17 at the passage port shown in FIG. 4 is lengthened, the conductance of gas inflow will be reduced. However, problems such as an increase in the size of the device and contact with the rectangular piping 17 of the board 2 can be avoided.
Therefore, this implementation is also difficult.

角型配管17を長くすると、スパッタリングで形成され
、かつ現在スパッタリング中である金属薄膜の付着した
基板2が、通常導体(ステンレス等)で構成される通過
口10等の内周に接触して金属薄膜の電位がアース電位
に落ちる可能性がある。
When the rectangular pipe 17 is lengthened, the substrate 2 to which the metal thin film is attached, which has been formed by sputtering and is currently being sputtered, comes into contact with the inner periphery of the passage port 10, etc., which is usually made of a conductor (stainless steel, etc.), and the metal thin film is attached. The potential of the thin film may drop to ground potential.

スパッタリング中に基板2に付着した金F4薄膜の電位
がアース電位に落ちると、基板2に電子の衝突する割合
が大きくなり、基板2の温度上昇が発生する。
When the potential of the gold F4 thin film adhered to the substrate 2 during sputtering drops to the ground potential, the proportion of electrons colliding with the substrate 2 increases, causing a rise in the temperature of the substrate 2.

その結果、金属薄膜の付着した基板2が燃焼したり、金
属薄膜に亀裂、歪み、しわが入ったりする原因となる。
As a result, the substrate 2 to which the metal thin film is attached may burn, or the metal thin film may be cracked, distorted, or wrinkled.

     (発明a>P]*す)本願の発明は隣接する
真空室の圧力差の調整が容易である連続式金属薄膜製造
装置の提供及び/又はスパッタリング中に可撓性基板に
付着した金属薄膜の電位がアース電位に落ちるのを防止
できる連続式金属薄膜製造装置の提供を目的とする。
(Invention a>P] *) The invention of the present application provides a continuous metal thin film manufacturing apparatus that allows easy adjustment of the pressure difference between adjacent vacuum chambers, and/or provides a continuous metal thin film manufacturing apparatus that can easily adjust the pressure difference between adjacent vacuum chambers, and/or The purpose of the present invention is to provide a continuous metal thin film manufacturing apparatus that can prevent the potential from dropping to ground potential.

(発明の構成) 本発明は、用途によって、幾多の室に分けられた真空槽
内に、長尺の可撓性基板の搬送機構を設置、該長尺の可
撓性基板面上に金属薄膜を形成するためのスバ、タリン
グ機構を設けた連続式スパッタリング装置において、該
真空槽内の隣接する室の仕切板に設けられた、前記長尺
の可撓性基板が通過する通過口の内周を可撓性高分子材
薄膜で覆うことによって前記目的を達成したものである
(Structure of the Invention) The present invention provides a mechanism for transporting a long flexible substrate in a vacuum chamber divided into a number of chambers depending on the application, and a metal thin film is placed on the surface of the long flexible substrate. In a continuous sputtering apparatus equipped with a sputtering mechanism for forming a sputtering mechanism, the inner periphery of a passage hole through which the long flexible substrate passes, which is provided in a partition plate of an adjacent chamber in the vacuum chamber. The above object was achieved by covering the material with a thin film of flexible polymer material.

(実施例) ブ1 以下本発明を実施例により、図に基いて説明す△ る。(Example) Bu1 The present invention will be explained below using examples and drawings. Ru.

第1図は本発明の実施例であって、真空槽1内に会会今
会令基板2の搬送機構を設つ5漕板2に金属薄膜を形成
するスバ、タリング機構を設けるととIは第5図と同様
であり、動作も同様である。
FIG. 1 shows an embodiment of the present invention, in which a five-row plate 2 is provided with a conveyance mechanism for a meeting order board 2 in a vacuum chamber 1, and a taring mechanism for forming a metal thin film is provided. is the same as in FIG. 5, and the operation is also the same.

第1図においては第5図と同じ機能のものKは第5図と
同−符I号を付している。
In FIG. 1, parts K having the same functions as those in FIG. 5 are given the same reference numerals I as in FIG.

仕切板9. 9’、  9’に設けられた基板20通過
口18.18’、18’の詳細を第2図に示した。通過
口18.18’、113’の通過口には可撓性高分子材
薄膜19(例えばテフロン製フィルム)を高分子材平板
20(例えばテフロン板)に余裕を大きくとって巻きつ
け、L聾アメングル21とネジによって仕切板9. 9
’、  9’に取り付けたものである。
Partition plate 9. Details of the substrate 20 passage ports 18, 18', 18' provided in the substrates 9', 9' are shown in FIG. A flexible polymeric thin film 19 (for example, a Teflon film) is wrapped around a polymeric flat plate 20 (for example, a Teflon plate) with a large margin around the passage ports 18, 18' and 113'. Partition plate 9 with amenguru 21 and screws. 9
', 9'.

基板2は上下に設置された可撓性高分子材薄膜19の間
を通過するためスパッタリング中の基板2に付着した金
属薄膜は仕切板9等から確実に絶縁される。
Since the substrate 2 passes between flexible polymer thin films 19 placed above and below, the metal thin film attached to the substrate 2 during sputtering is reliably insulated from the partition plate 9 and the like.

高分子材平板20は可撓性高分子材薄膜19の欠!;/
を防ぎ、もし欠落した場合でも、基板2に付着した金属
薄膜の電位がアース電位に落ちるの   ゛を防ぐ作用
をする。
The polymer material flat plate 20 lacks the flexible polymer material thin film 19! ;/
It also prevents the potential of the metal thin film attached to the substrate 2 from dropping to the ground potential even if it is missing.

可撓性高分子材薄[19が第1図の通過口18゜18’
、18’を覆うことによって、真空槽1内にて隣接する
各真空室1〜■において互いの不活性ガスの交流を防ぎ
、大きな圧力差までそれらの圧力を調整することが可能
である。各真空室[−Wの圧力調整のため、全真空室I
〜■に開閉可変パルプ14を介して真空ポンプ11を設
置している。
A thin flexible polymer material [19 is the passage port 18°18' in Fig. 1]
, 18', it is possible to prevent mutual exchange of inert gas in the adjacent vacuum chambers 1 to 1 in the vacuum chamber 1, and to adjust the pressures thereof to a large pressure difference. To adjust the pressure of each vacuum chamber [-W, all vacuum chambers I
A vacuum pump 11 is installed at ~■ via a variable opening/closing pulp 14.

第6図は10  Torr台に排気された隣接する真空
室I〜■において一つの真空室(例えば■)に不活性ガ
ス(ここではアルゴンガス)を注入したとき、その隣室
(例えばりの圧力がどうなるかを測定した実験データで
ある。
Figure 6 shows that when an inert gas (here, argon gas) is injected into one vacuum chamber (for example, ■) in the adjacent vacuum chambers I to ■, which are evacuated to a level of 10 Torr, the pressure in the adjacent chamber (for example, This is experimental data that measured what would happen.

この結果より隣接する真空室に1桁違いの圧力差を設け
ることが容易に可能なことがわかる。
This result shows that it is possible to easily provide a pressure difference of one order of magnitude between adjacent vacuum chambers.

(発明の縛効果) 本願の発明は上記の通りであって、スパッタリングによ
る連続式金属薄膜製造装置において隣接する真空室の圧
力差を調整することが容易にできる利点及び/又は可撓
性基板に形成された金属薄膜の電位をアースに落ちるの
を防ぐことができる利点がある。
(Binding effect of the invention) The invention of the present application is as described above, and has the advantage that the pressure difference between adjacent vacuum chambers can be easily adjusted in a continuous metal thin film manufacturing apparatus by sputtering, and/or There is an advantage that the potential of the formed metal thin film can be prevented from dropping to earth.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の連続式金属薄膜製造装置の実施例の略
図である。 第5図は従来の装置の概略図である。 第6図は第1図において隣接する真空室の一方から不活
性ガスを注入した場合の他方のガス圧力を示した図であ
る。 1・・・真空槽、   2・・・長尺の可撓性基板。 6.6′・・・電極、7.7’・・・ターゲット。 8・・・絶縁物、  11・・・真空ポンプ。 12.12・・・不活性ガスボンベ。 13・・・直流、又は交流電源、 19・・・可撓性高
分子材薄膜。 20・・・高分子材平板、t、n、m、v・・・真空室
FIG. 1 is a schematic diagram of an embodiment of the continuous metal thin film manufacturing apparatus of the present invention. FIG. 5 is a schematic diagram of a conventional device. FIG. 6 is a diagram showing the gas pressure of the other vacuum chamber when inert gas is injected from one of the adjacent vacuum chambers in FIG. 1... Vacuum chamber, 2... Long flexible substrate. 6.6'...electrode, 7.7'...target. 8...Insulator, 11...Vacuum pump. 12.12...Inert gas cylinder. 13...DC or AC power supply, 19...Flexible polymer material thin film. 20... Polymer material flat plate, t, n, m, v... Vacuum chamber.

Claims (1)

【特許請求の範囲】[Claims] (1)複数の室に分けられた真空槽内に、長尺の可撓性
基板の搬送機構を設け、かつ該長尺の可撓性基板面上に
金属薄膜を形成するためのスパッタリング機構を設けた
連続式スパッタリング装置において、該真空槽内の隣接
する室の仕切板に設けられた、前記長尺の可撓性基板が
通過する通過口の内周を可撓性高分子材薄膜で覆ったこ
とを特徴とする連続式金属薄膜製造装置。
(1) A transport mechanism for a long flexible substrate is provided in a vacuum chamber divided into a plurality of chambers, and a sputtering mechanism for forming a metal thin film on the surface of the long flexible substrate is provided. In the provided continuous sputtering apparatus, the inner periphery of a passage hole through which the elongated flexible substrate passes, which is provided in a partition plate of an adjacent chamber in the vacuum chamber, is covered with a flexible polymer thin film. Continuous metal thin film manufacturing equipment characterized by:
JP24146784A 1984-11-15 1984-11-15 Continuous type apparatus for producing thin metallic film Pending JPS61119673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24146784A JPS61119673A (en) 1984-11-15 1984-11-15 Continuous type apparatus for producing thin metallic film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24146784A JPS61119673A (en) 1984-11-15 1984-11-15 Continuous type apparatus for producing thin metallic film

Publications (1)

Publication Number Publication Date
JPS61119673A true JPS61119673A (en) 1986-06-06

Family

ID=17074744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24146784A Pending JPS61119673A (en) 1984-11-15 1984-11-15 Continuous type apparatus for producing thin metallic film

Country Status (1)

Country Link
JP (1) JPS61119673A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63282269A (en) * 1987-04-27 1988-11-18 アメリカン テレフォン アンド テレグラフ カムパニー Method for depositing metal coating on body
EP0909834A2 (en) * 1997-09-11 1999-04-21 Leybold Systems GmbH Foil transporting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63282269A (en) * 1987-04-27 1988-11-18 アメリカン テレフォン アンド テレグラフ カムパニー Method for depositing metal coating on body
EP0909834A2 (en) * 1997-09-11 1999-04-21 Leybold Systems GmbH Foil transporting device
EP0909834A3 (en) * 1997-09-11 1999-05-19 Leybold Systems GmbH Foil transporting device

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