JPS611159U - 赤外線輻射式ガス分析計 - Google Patents

赤外線輻射式ガス分析計

Info

Publication number
JPS611159U
JPS611159U JP1984085696U JP8569684U JPS611159U JP S611159 U JPS611159 U JP S611159U JP 1984085696 U JP1984085696 U JP 1984085696U JP 8569684 U JP8569684 U JP 8569684U JP S611159 U JPS611159 U JP S611159U
Authority
JP
Japan
Prior art keywords
infrared radiation
gas analyzer
radiation gas
heater
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1984085696U
Other languages
English (en)
Inventor
公夫 宮武
司 佐竹
Original Assignee
株式会社 堀場製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社 堀場製作所 filed Critical 株式会社 堀場製作所
Priority to JP1984085696U priority Critical patent/JPS611159U/ja
Priority to US06/740,055 priority patent/US4667105A/en
Publication of JPS611159U publication Critical patent/JPS611159U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0332—Cuvette constructions with temperature control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第１図Ａ， Ｂは本考案に係る赤外線輻射式ガス分析計
の一例を示すもので、Ａは側面図、Ｂは断面正面図、第
２図は従来例を示す構成図である。 １０・・・・・・サンプルセル、１６，１７・・・・・
・自己温度制御式ヒータ。

Claims (1)

    【実用新案登録請求の範囲】
  1. − サンプルセル内のサンプルガスをヒータにより加熱
    し、そのとき発生する赤外線の輻射量に基づいてサンプ
    ルガス中の測定対象成分の濃度を測定する赤外線輻射式
    ガス分析計において、前記ヒータとして自己温度市ｉ御
    式ヒータを用いたことを特徴とする赤外線輻射式ガス分
    析計。
JP1984085696U 1984-06-09 1984-06-09 赤外線輻射式ガス分析計 Pending JPS611159U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1984085696U JPS611159U (ja) 1984-06-09 1984-06-09 赤外線輻射式ガス分析計
US06/740,055 US4667105A (en) 1984-06-09 1985-05-30 Infrared radiation gas analyzer with PTC resistance heater

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1984085696U JPS611159U (ja) 1984-06-09 1984-06-09 赤外線輻射式ガス分析計

Publications (1)

Publication Number Publication Date
JPS611159U true JPS611159U (ja) 1986-01-07

Family

ID=13865988

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1984085696U Pending JPS611159U (ja) 1984-06-09 1984-06-09 赤外線輻射式ガス分析計

Country Status (2)

Country Link
US (1) US4667105A (ja)
JP (1) JPS611159U (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4772790A (en) * 1986-10-14 1988-09-20 Teledyne Industries, Inc. Non-dispersive optical gas analyzer
JPH0619327B2 (ja) * 1988-03-10 1994-03-16 三洋電機株式会社 赤外線ガス濃度計
JP2719593B2 (ja) * 1988-05-06 1998-02-25 チノン株式会社 光電スイッチ
US5594249A (en) * 1995-06-16 1997-01-14 Whirlpool Corporation Subambient temperature controlled cell for infrared spectroscopic analysis and a method for the detection of paraffinic hydrocarbons
JPH102858A (ja) * 1996-06-14 1998-01-06 Nippon Soken Inc 吸着種検出装置及び固体物評価システム
CN100392375C (zh) * 2003-02-18 2008-06-04 张荣华 可置于紫外-可见谱仪中的有窗口的高压反应器
US7664607B2 (en) 2005-10-04 2010-02-16 Teledyne Technologies Incorporated Pre-calibrated gas sensor
CN102507522B (zh) * 2011-11-07 2014-01-29 上海智城分析仪器制造有限公司 一种氧自由基吸收能力测定分析仪中数据采集方法及加热系统
CN103630516B (zh) * 2012-08-24 2016-01-13 北京瑞利分析仪器有限公司 用于原子荧光低温点火原子化器的加热装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3749879A (en) * 1971-12-27 1973-07-31 Texas Instruments Inc Apparatus for providing controlled temperature ambient
US4499378A (en) * 1982-03-09 1985-02-12 Horiba, Ltd. Infrared radiation gas analyzer
US4570046A (en) * 1983-09-09 1986-02-11 Gte Products Corporation Method of processing PTC heater
US4518944A (en) * 1983-10-18 1985-05-21 Trw Inc. Temperature stabilizer

Also Published As

Publication number Publication date
US4667105A (en) 1987-05-19

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