JPS61108954A - Probe for measuring coat film - Google Patents

Probe for measuring coat film

Info

Publication number
JPS61108954A
JPS61108954A JP22982284A JP22982284A JPS61108954A JP S61108954 A JPS61108954 A JP S61108954A JP 22982284 A JP22982284 A JP 22982284A JP 22982284 A JP22982284 A JP 22982284A JP S61108954 A JPS61108954 A JP S61108954A
Authority
JP
Japan
Prior art keywords
electrode
coat film
measured
coating film
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22982284A
Other languages
Japanese (ja)
Other versions
JPH0432982B2 (en
Inventor
Kunio Deguchi
出口 邦雄
Kiyoshi Fukui
清 福井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP22982284A priority Critical patent/JPS61108954A/en
Publication of JPS61108954A publication Critical patent/JPS61108954A/en
Publication of JPH0432982B2 publication Critical patent/JPH0432982B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20Investigating the presence of flaws
    • G01N27/205Investigating the presence of flaws in insulating materials

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PURPOSE:To detect and evaluate the deterioration of a coat film precisely and simply by forming a sponge-like electrode arranged on a surface opposed to the coat film so as to be a projected surface, and a vessel for storing conductive gell impregnated in the electrode. CONSTITUTION:When a coat film measuring probe is abutted upon a surface to be measured on the coat film 2, the probe is contacted with the surface to be measured from its center part without fail because the sponge-like electrode 11 on the leading end part of the probe body 8 is formed like a projected surface, and even if an air bubble is generated between the coat film 2 and the electrode 11, the air bubble is pushed out to the external periphery. Thereby, the electrode 11 is completely and tightly adhered to the surface to be measured of the coat film 2 and fixed by magnetic adsorbing force between a magnet 15 and a ground metal 1. The conductive gel 3 is impregnated into the electrode 11 and adhered to the whole surface to be measured. The change of pressure in the gel tank which may be generated when the electrode 11 is pressed or pealed against/from the surface to be measured is buffered by the expansion/contraction of bellows 9. Since the probe body 8 is fixed by the magnet 15 at the time of measurement, the probe body 8 can be fixed on any position and the impedance of the coat film can be measured simply and precisely.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は塗膜測定ブO−ブに係り、特に金属表面に防錆
や美観仕上げ等の目的で塗付された塗装膜の劣化を電気
化学的に検出し評価するに好適な塗膜測定プローブに関
する。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a coating film measurement probe, and in particular, electrochemical measurement of the deterioration of coating films applied to metal surfaces for purposes such as rust prevention and aesthetic finishing. The present invention relates to a coating film measurement probe suitable for quantitative detection and evaluation.

〔発明の技術的背景〕[Technical background of the invention]

一般に、金属表面の塗膜劣化の検出や評価を行なう場合
、第5図の概念図に示す如き構成を用いた電気化学的評
価方式が実施されている。同図に示す如く、評価に当っ
ては素地金属1上に塗装した評価すべき塗装膜2の上に
導電性ゲル3を介してA1箔等の測定用電極4を接触さ
せる。次に、素地金属1と測定用電極4間に電流計5を
介して電流電源6を用いて交流電圧を印加する。このと
きに印加された電圧を素地金属1と測定用電極4の間に
接続された電圧計7により読取る。
Generally, when detecting and evaluating the deterioration of a coating on a metal surface, an electrochemical evaluation method using a configuration as shown in the conceptual diagram of FIG. 5 is implemented. As shown in the figure, in the evaluation, a measuring electrode 4 such as A1 foil is brought into contact with a coating film 2 to be evaluated coated on a base metal 1 via a conductive gel 3. Next, an alternating voltage is applied between the base metal 1 and the measurement electrode 4 using a current power source 6 via an ammeter 5. The voltage applied at this time is read by a voltmeter 7 connected between the base metal 1 and the measuring electrode 4.

一般に、塗装膜2は塗装置後の正常な状態では電気抵抗
が非常に大きく、108Ω−artあるいはそれ以上の
直流抵抗を有する。塗装WA2の電気的等価回路は、塗
装膜2が正常な場合には、第6図の等価回路図に示すよ
うな抵抗Rfと容量Ofとの並列回路で表わされる。こ
れに対して、塗装膜2が劣化してくると、この抵抗Rf
が減少してくるとともに、第6図に示されるような単純
な等価回路から複数の時定数を持つような複雑なインピ
ーダンスを示すようになってくる。しかしながら、劣化
の初期段階では、抵抗Rfと容量Cfとの並列回路とし
て扱うことが可能である。
Generally, the coating film 2 has a very high electrical resistance in a normal state after coating, and has a DC resistance of 10 8 Ω-art or more. When the coating film 2 is normal, the electrical equivalent circuit of the coating WA2 is represented by a parallel circuit of a resistance Rf and a capacitance Of as shown in the equivalent circuit diagram of FIG. On the other hand, when the coating film 2 deteriorates, this resistance Rf
As the impedance decreases, the impedance changes from a simple equivalent circuit as shown in FIG. 6 to a complex impedance having multiple time constants. However, at the initial stage of deterioration, it is possible to treat it as a parallel circuit of a resistor Rf and a capacitor Cf.

塗装膜2のインピーダンスZ(jω)は、第5図の構成
を通じて測定される電圧、電流に基いて、(1)式から
求めることができる。
The impedance Z (jω) of the coating film 2 can be determined from equation (1) based on the voltage and current measured through the configuration shown in FIG.

Z(jω)−e(jω)/i (jω)・・・(1)た
だし、ωは角周波数、e(jω)は電圧、i(jω)は
電流である。また、もう一つの劣化の指標であるtan
δは(2)式から求めることができる。
Z(jω)−e(jω)/i (jω) (1) where ω is the angular frequency, e(jω) is the voltage, and i(jω) is the current. In addition, another indicator of deterioration, tan
δ can be determined from equation (2).

tan6−I2ml/1Zel     −(2)ここ
で、Zmはインピーダンスの虚数部、Zeはインピーダ
ンスの実数部である。ちなみに、実数部とはインピーダ
ンスが純抵抗で得られるときの位相成分である。塗装膜
が劣化してくると、第6図の抵抗Rfが減少し、同じ交
流電圧e(jω)を印加した場合にはi’(jω)が増
加し、インピーダンスZ(jω)が減少する。同様にし
て、抵抗Rfが減少してくると、17elが減少しta
nδが増加する。このようにして塗装膜2のインピーダ
ンスあるいはtanδを測定することで、塗装膜の劣化
を検出することができる。
tan6-I2ml/1Zel-(2) where Zm is the imaginary part of impedance, and Ze is the real part of impedance. Incidentally, the real part is the phase component when impedance is obtained by pure resistance. As the coating film deteriorates, the resistance Rf in FIG. 6 decreases, and when the same AC voltage e(jω) is applied, i'(jω) increases and the impedance Z(jω) decreases. Similarly, as resistance Rf decreases, 17el decreases and ta
nδ increases. By measuring the impedance or tan δ of the paint film 2 in this manner, deterioration of the paint film can be detected.

塗装膜2の劣化前後のインピーダンスの変化を第7図な
らびに第8図の特性図に示す。ちなみに、第7図はイン
ピーダンスの絶対値を周波数(対数)に対してプロット
したものであり、一般にボード線図と言われている。劣
化していない塗装膜のインピーダンス曲線aに対して塗
装膜が劣化してくるとインピーダンスは曲線すのように
周波数の低い側での減少が顕著となる。したがって、イ
ンピーダンスの絶対値のみから劣化を検出する場合には
、周波数の低い方で測定する方が有効である。
Changes in impedance before and after the paint film 2 deteriorates are shown in the characteristic diagrams of FIGS. 7 and 8. Incidentally, FIG. 7 is a plot of the absolute value of impedance versus frequency (logarithm), and is generally referred to as a Bode diagram. Compared to the impedance curve a of an undegraded paint film, as the paint film deteriorates, the impedance decreases markedly on the lower frequency side as shown in the curve. Therefore, when detecting deterioration only from the absolute value of impedance, it is more effective to measure at a lower frequency.

一方、第8図はインピーダンスを実数部と虚数部とで表
示したもので、一般にはナイキスト線図と言われる形に
複素表示したものである。塗装WA2が劣化してくると
インピーダンス軌跡dは正常な場合(曲線C)と比べて
半円が小さくなるとともに円が変形してくる。この形か
ら塗装膜の劣化の程度を推定することができる。
On the other hand, FIG. 8 shows the impedance as a real part and an imaginary part, which is generally expressed as a complex diagram in a form called a Nyquist diagram. As the coating WA2 deteriorates, the semicircle of the impedance locus d becomes smaller and the circle becomes deformed compared to the normal case (curve C). The degree of deterioration of the paint film can be estimated from this shape.

〔背景技術の問題点〕[Problems with background technology]

上述した如く、第5図の概念図に示す如き構成を通じて
、塗装膜2のインピーダンスを測定した結果から塗装置
12の劣化を検出することができる。
As described above, deterioration of the coating station 12 can be detected from the results of measuring the impedance of the coating film 2 through the configuration shown in the conceptual diagram of FIG.

ところが、このような方式において正確な測定を行なう
ためには、アルミニウム箔等の測定用電極4を塗装膜2
に密着させる必要がある。このため、従来から導電性ゲ
ル3を被測定面に塗布して、測定誤差を少なくするべく
対策が考えられてきた。
However, in order to perform accurate measurements using this method, it is necessary to place the measurement electrode 4, such as aluminum foil, on the coating film 2.
It is necessary to keep it in close contact with the For this reason, conventional measures have been taken to reduce measurement errors by applying conductive gel 3 to the surface to be measured.

しかしながら、塗装膜2上の被測定面が天井面や凹面部
分に対応するような場合には、第9図(a)、(b)に
示すように、導電性ゲル3内に気泡Mを生じやすく、生
じた気aMの除去も極めて困難であるというような状況
になりやすい。この場合、塗装膜2上の被測定面全面に
導電性ゲル3が介在していない状態となり、測定用電極
4と塗装膜2の間の測定面積が一定とならない。このた
めに、インピーダンスの測定結果に誤差を生じ、塗装膜
2の本来のインピーダンスが測定できなくなり、塗装膜
2の劣化を正確に検出することが不可能となる。
However, when the surface to be measured on the coating film 2 corresponds to a ceiling surface or a concave surface, bubbles M are generated in the conductive gel 3, as shown in FIGS. 9(a) and 9(b). This tends to lead to a situation where it is extremely difficult to remove the generated Qi aM. In this case, the conductive gel 3 is not present on the entire surface of the coating film 2 to be measured, and the measurement area between the measurement electrode 4 and the coating film 2 is not constant. This causes an error in the impedance measurement result, making it impossible to measure the original impedance of the paint film 2, and making it impossible to accurately detect the deterioration of the paint film 2.

〔発明の目的〕[Purpose of the invention]

従って、本発明の目的は、上記従来技術の問題点を解消
し、金属構造体表面に塗布された塗装膜の劣化を正確か
つ簡便に検出、評価することを可能とした塗膜測定プロ
ーブを提供するにある。
Therefore, an object of the present invention is to provide a coating film measurement probe that solves the problems of the prior art described above and makes it possible to accurately and easily detect and evaluate the deterioration of a coating film applied to the surface of a metal structure. There is something to do.

〔発明の概要〕[Summary of the invention]

上記目的を達成するために、本発明は塗膜に対向する面
に凸面状に配されるスポンジ状電極と、スポンジ状電極
に含浸すべき導電性ゲルを収容する容器とを備えた塗膜
測定プローブを提供するものである。
In order to achieve the above object, the present invention provides a coating film measurement method comprising a sponge-like electrode disposed in a convex manner on a surface facing the coating film, and a container containing a conductive gel to be impregnated into the sponge-like electrode. It provides a probe.

〔発明の実施例〕[Embodiments of the invention]

以下、図面を参照しながら本発明の実施例を説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例に係る塗膜、測定プローブの
概略構成図で、同図(a)は断面図、同図(b)は底面
図をそれぞれ示すものである。一方、第2図は第1図に
示した塗膜測定プローブを使用して塗装膜の凹面状部分
の塗膜インピーダンスを測定している状態を示した説明
図である。
FIG. 1 is a schematic diagram of a coating film and a measurement probe according to an embodiment of the present invention, with FIG. 1(a) showing a sectional view and FIG. 1(b) showing a bottom view. On the other hand, FIG. 2 is an explanatory diagram showing a state in which the coating film impedance of a concave portion of the coating film is measured using the coating film measurement probe shown in FIG. 1.

さて、第1図に示す如く、プローブ本体8の内部にはベ
ロー9を取り付けた多孔板10が配されており、先端に
は外面(被測定面側)を凸面状にしたスポンジ状電極1
1が取り付けられている。
Now, as shown in FIG. 1, a perforated plate 10 to which a bellows 9 is attached is disposed inside the probe body 8, and a sponge-like electrode 1 whose outer surface (measured surface side) is convex is disposed at the tip.
1 is attached.

更に、プローブ本体8のへロー9の上部には空気抜き孔
12が配され、側面には導電性ゲル3を注入するための
ゲル注入口13が設けられている。
Furthermore, an air vent hole 12 is provided above the hollow 9 of the probe body 8, and a gel injection port 13 for injecting the conductive gel 3 is provided on the side surface.

導電性ゲル3は注入口13よりスポンジ状電極11と多
孔板10およびベロー9から成るゲル槽内に注入される
。導電性ゲル3にはリード線として被覆銅I!14が接
続されている。ちなみに、導電性ゲル3としては3%食
塩水に3%の増粘剤(カルボキシルメチルセルローズ 等が使用可能である。なお、プローブ本体8の下端には
塗膜インピーダンスの測定時にプローブ本体8を塗装膜
に固定するための磁石15が取り付けられている。
The conductive gel 3 is injected into a gel bath consisting of a sponge-like electrode 11, a porous plate 10, and a bellows 9 through an injection port 13. The conductive gel 3 is coated with copper I! as a lead wire. 14 are connected. By the way, as the conductive gel 3, 3% saline solution and 3% thickener (carboxyl methyl cellulose, etc.) can be used.The lower end of the probe body 8 can be coated with the probe body 8 when measuring the coating film impedance. A magnet 15 is attached for fixing to the membrane.

かかる構成において、次にその作用を第2図の説明図に
従って説明する。第1図に示すように構成された塗膜測
定プローブを塗装膜2上の被測定面に当てると、プロー
ブ本体8の先端部のスポンジ状電極11は凸面状となっ
ているために被測定  ′面側に必ず中央部より接触し
て行き、塗装膜2のスポンジ状電極11との間に気泡が
発生しても、これは外周に押し出されていく。このため
、気泡を生じることなく、最終的にスポンジ状電極11
は塗装膜2の被測定面に全面密着して、磁石15と素地
金属1の間の磁気的な吸着力により固定される。導電性
ゲル3はスポンジ状電極11に浸み込んでおり、被測定
塗膜面全面に付着する。また、スポンジ状電極11を被
測定面に押しつけたりはがしたりする時に生じるゲル槽
内の圧力の変化は、ベロー9の伸縮により緩衝される。
The operation of this configuration will now be explained with reference to the explanatory diagram of FIG. 2. When the coating film measurement probe configured as shown in FIG. The surface side is always contacted from the center, and even if air bubbles are generated between the coating film 2 and the sponge-like electrode 11, they are pushed out to the outer periphery. Therefore, the sponge-like electrode 11 is finally
is in close contact with the entire surface of the coating film 2 to be measured, and is fixed by the magnetic attraction force between the magnet 15 and the base metal 1. The conductive gel 3 has soaked into the sponge-like electrode 11 and adheres to the entire surface of the coating film to be measured. Furthermore, changes in the pressure within the gel bath that occur when the sponge electrode 11 is pressed against or peeled off from the surface to be measured are buffered by the expansion and contraction of the bellows 9.

測定時のプローブ本体8の固定は磁石15により行なう
ので、斜面、垂直面、天井面のいずれでも確実に固定す
ることができ、簡単でかつ確実な塗装膜インピーダンス
の測定が可能となる。
Since the probe body 8 is fixed by the magnet 15 during measurement, it can be securely fixed on any slope, vertical surface, or ceiling surface, making it possible to easily and reliably measure the coating film impedance.

さて、本実施例の塗膜測定プローブを使用してエポキシ
系厚膜塗料の塗装膜インピーダンスを測定した結果を下
の表1に示す。表1からも明らかな如く、測定結果はア
ルミ箔電極を使用した場合とほぼ一致しており、本実施
例の塗膜測定ブOーブは塗膜インピーダンス測定に当っ
て有効に作用する。
Now, the results of measuring the paint film impedance of the epoxy thick film paint using the paint film measurement probe of this example are shown in Table 1 below. As is clear from Table 1, the measurement results are almost the same as those obtained when aluminum foil electrodes are used, and the coating film measuring probe of this example works effectively in measuring coating film impedance.

表1.エポキシ系厚膜塗料の塗膜 なお、上記実施例では、スポンジ状電IN+11の形状
が円形の場合を例示したが、第3図(a)。
Table 1. Coating film of epoxy thick film paint In the above embodiment, the shape of the sponge-like electric wire IN+11 was circular, but as shown in FIG. 3(a).

(b)の説明図に示すように正方形または長方形の電極
形状とすることにより、円形電極では電極表面が全面密
着しないような曲面の場合等に、塗装膜インピーダンス
の測定が可能となる。
By making the electrode shape square or rectangular as shown in the explanatory diagram (b), it becomes possible to measure the impedance of the coating film, for example, in the case of a curved surface where the entire surface of the electrode would not be in close contact with a circular electrode.

また、スポンジ状電極11の材質は、ポリウレタン製ス
ポンジを使用してもゴム製スポンジを使用してもよく、
いずれでも塗装膜2に十分に密酋し、効果的なインピー
ダンス測定を可能とする。
Further, the material of the sponge-like electrode 11 may be a polyurethane sponge or a rubber sponge.
In either case, it adheres sufficiently to the coating film 2 and enables effective impedance measurement.

第4図(a)、(b)はそれぞれ本発明の他の実施例及
びその他の実施例に係る塗膜測定プローブの断面図を示
すものである。同図(a)はスポンジ状電極11を被測
定面に密着させる時に生じる導電性ゲル槽内の圧力変化
を、多孔板10の上部に取りつけた薄ゴム膜16の伸縮
により緩衝させる構成を例示するものである。一方、同
図(b)は導電性ゲル槽内の圧力変化を極低圧スプリン
グ17をとりつけたダンパー18で緩衝さける構成を例
示したものである。
FIGS. 4(a) and 4(b) show cross-sectional views of coating film measuring probes according to other embodiments and other embodiments of the present invention, respectively. Figure (a) exemplifies a configuration in which the pressure change in the conductive gel bath that occurs when the sponge-like electrode 11 is brought into close contact with the surface to be measured is buffered by the expansion and contraction of the thin rubber membrane 16 attached to the upper part of the porous plate 10. It is something. On the other hand, FIG. 2B shows an example of a configuration in which pressure changes in the conductive gel tank are buffered by a damper 18 equipped with an extremely low pressure spring 17.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、本発明によれば、塗装膜インピーダ
ンスの測定に当って、被測定塗膜面が斜面、垂直面、天
井面であっても、また凹状面や凸状面であっても、さら
に1[性ゲルを塗布した時に気泡を生じ易いような箇所
であっても、測定面内の気泡の発生を防止でき、塗膜劣
化を検出するためのインピーダンスの測定を正確に実施
することを可能とした塗膜測定プローブを得ることがで
きるものである。
As described above, according to the present invention, when measuring the paint film impedance, it is possible to measure the paint film impedance regardless of whether the paint film surface to be measured is a slope, a vertical surface, a ceiling surface, or a concave or convex surface. In addition, 1. It is possible to prevent the generation of air bubbles within the measurement surface even in areas where air bubbles are likely to occur when applying the adhesive gel, and to accurately measure impedance for detecting paint film deterioration. This makes it possible to obtain a coating film measurement probe that enables the following.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)、(b)は本発明の一実施例に係る塗膜測
定ブ0−プの断面図および底面図、第2図は第1図に示
した塗膜測定プローブを用いて塗装膜劣化を電気化学的
に評価する状態を示す説明図、 第3図(a)、(b)は電極の形状の他の例を示す説明
図、 第4図(a>、(b)はそれぞれ本発明の他の実施例お
よびその他の実施例を示す説明図、第5図は塗装膜劣化
を電気化学的に評価1゛る周知の方式を示す概念図、 第6図は塗装膜の電気的な等価回路図、第7図は塗装膜
の劣化によるインピーダンスの周波数依存性の変化を示
す特性図、 第8図は第7図を複素平面上で表わした特性図、第9図
(a)、(b)はA1箔電極を用いた場合の問題点を示
す説明図である。 1・・・素地金属、2・・・塗装膜、3・・・導電性ゲ
ル、8・・・プローブ本体、9・・・べ0−110・・
・多孔板、11・・・スポンジ状電極、14・・・リー
ド線、15・・・磁石。 出願人代理人  猪  股    清 第1図 (α) Cb) 人り 第3図 (0L) (b) 第4図 (α) (b) 亮5図 第6図 f f 兜了図 大叡沙
FIGS. 1(a) and (b) are a cross-sectional view and a bottom view of a coating film measurement probe according to an embodiment of the present invention, and FIG. An explanatory diagram showing a state in which paint film deterioration is electrochemically evaluated. Figures 3 (a) and (b) are explanatory diagrams showing other examples of electrode shapes. Figures 4 (a> and (b) are FIG. 5 is a conceptual diagram showing a well-known method for electrochemically evaluating paint film deterioration, and FIG. 6 is an explanatory diagram showing another embodiment of the present invention and another example. Figure 7 is a characteristic diagram showing changes in frequency dependence of impedance due to deterioration of the paint film, Figure 8 is a characteristic diagram representing Figure 7 on a complex plane, Figure 9 (a) , (b) is an explanatory diagram showing problems when using A1 foil electrodes. 1... Base metal, 2... Paint film, 3... Conductive gel, 8... Probe body , 9...be0-110...
- Porous plate, 11... sponge-like electrode, 14... lead wire, 15... magnet. Applicant's agent Kiyoshi Inomata Figure 1 (α) Cb) Figure 3 (0L) (b) Figure 4 (α) (b) Figure 5 Figure 6 f

Claims (1)

【特許請求の範囲】 1、塗膜に対向する面に凸面状に配されるスポンジ状電
極と、スポンジ状電極に含浸すべき導電性ゲルを収容す
る容器とを備えたことを特徴とする塗膜測定プローブ。 2、スポンジ状電極の周辺に磁石を配したことを特徴と
する特許請求の範囲第1項に記載の塗膜測定プローブ。 3、容器が導電性ゲルの圧力を吸収するように構成され
ることを特徴とする特許請求の範囲第1項に記載の塗膜
測定プローブ。 4、容器がベロー状に構成されることを特徴とする特許
請求の範囲第3項に記載の塗膜測定プローブ。
[Claims] 1. A coating comprising a sponge-like electrode disposed in a convex manner on a surface facing the coating film, and a container containing a conductive gel to be impregnated into the sponge-like electrode. Membrane measurement probe. 2. The coating film measuring probe according to claim 1, characterized in that a magnet is arranged around the sponge-like electrode. 3. The coating film measurement probe according to claim 1, wherein the container is configured to absorb the pressure of the conductive gel. 4. The coating film measuring probe according to claim 3, wherein the container has a bellows shape.
JP22982284A 1984-10-31 1984-10-31 Probe for measuring coat film Granted JPS61108954A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22982284A JPS61108954A (en) 1984-10-31 1984-10-31 Probe for measuring coat film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22982284A JPS61108954A (en) 1984-10-31 1984-10-31 Probe for measuring coat film

Publications (2)

Publication Number Publication Date
JPS61108954A true JPS61108954A (en) 1986-05-27
JPH0432982B2 JPH0432982B2 (en) 1992-06-01

Family

ID=16898209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22982284A Granted JPS61108954A (en) 1984-10-31 1984-10-31 Probe for measuring coat film

Country Status (1)

Country Link
JP (1) JPS61108954A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61265559A (en) * 1985-05-14 1986-11-25 シエル・インタ−ナシヨナル・リサ−チ・マ−トスハツペイ・ベ−・ヴエ− Cell for test
JPS62130348A (en) * 1985-09-24 1987-06-12 コ−ルブランド リミテツド Corrosion detector
JPH02157642A (en) * 1988-12-12 1990-06-18 Hideaki Takahashi Gel electrode for electrochemical measurement for evaluating deterioration degree of metallic material
JPH04190149A (en) * 1990-04-09 1992-07-08 Toshiba Corp Apparatus for diagnosing deterioration of film
JPH04218756A (en) * 1991-03-29 1992-08-10 Toshiba Corp Method for diagnosing deterioration of film
JP2007225508A (en) * 2006-02-24 2007-09-06 Dainippon Toryo Co Ltd Measuring cell of under-film metal corrosion diagnosis device
EP2068139A1 (en) 2007-12-06 2009-06-10 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Electrochemical cell for EIS
JP2009204593A (en) * 2008-02-29 2009-09-10 Ihi Corp Probe for electrochemical measurement in electrolyte, electrochemical measuring device, and electrochemical measuring method using it
JP2013238583A (en) * 2012-04-19 2013-11-28 Kansai Paint Co Ltd Electrochemical measurement probe and corrosion evaluation method
JP2017032514A (en) * 2015-08-05 2017-02-09 太平洋セメント株式会社 Corrosion sensor and corrosion detection method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013145136A (en) * 2012-01-13 2013-07-25 Panasonic Corp Fatigue testing method and fatigue testing device of test piece

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61265559A (en) * 1985-05-14 1986-11-25 シエル・インタ−ナシヨナル・リサ−チ・マ−トスハツペイ・ベ−・ヴエ− Cell for test
JPS62130348A (en) * 1985-09-24 1987-06-12 コ−ルブランド リミテツド Corrosion detector
JPH02157642A (en) * 1988-12-12 1990-06-18 Hideaki Takahashi Gel electrode for electrochemical measurement for evaluating deterioration degree of metallic material
JPH04190149A (en) * 1990-04-09 1992-07-08 Toshiba Corp Apparatus for diagnosing deterioration of film
JPH04218756A (en) * 1991-03-29 1992-08-10 Toshiba Corp Method for diagnosing deterioration of film
JP2007225508A (en) * 2006-02-24 2007-09-06 Dainippon Toryo Co Ltd Measuring cell of under-film metal corrosion diagnosis device
EP2068139A1 (en) 2007-12-06 2009-06-10 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Electrochemical cell for EIS
JP2009204593A (en) * 2008-02-29 2009-09-10 Ihi Corp Probe for electrochemical measurement in electrolyte, electrochemical measuring device, and electrochemical measuring method using it
JP2013238583A (en) * 2012-04-19 2013-11-28 Kansai Paint Co Ltd Electrochemical measurement probe and corrosion evaluation method
JP2017032514A (en) * 2015-08-05 2017-02-09 太平洋セメント株式会社 Corrosion sensor and corrosion detection method

Also Published As

Publication number Publication date
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