JPH06102218A - Measuring method for deterioration of coating film - Google Patents

Measuring method for deterioration of coating film

Info

Publication number
JPH06102218A
JPH06102218A JP25092892A JP25092892A JPH06102218A JP H06102218 A JPH06102218 A JP H06102218A JP 25092892 A JP25092892 A JP 25092892A JP 25092892 A JP25092892 A JP 25092892A JP H06102218 A JPH06102218 A JP H06102218A
Authority
JP
Japan
Prior art keywords
coating film
impedance
gel
probe
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25092892A
Other languages
Japanese (ja)
Inventor
Takemi Mori
武美 毛利
Takeshi Kondo
武 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP25092892A priority Critical patent/JPH06102218A/en
Publication of JPH06102218A publication Critical patent/JPH06102218A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a method for measuring the deterioration of a coating film whereby the impedance is measured in a short time even when a plurality of points are to be measured. CONSTITUTION:An electrode and a member for impregnation of gel are accommodated in a case 12, thereby to form an impedance measuring probe 11. A gel penetration probe 20 is provided by accommodating a gel impregnation member within a case 12(a). Gel penetration probes 20 are nearly concurrently set at a plurality of measuring points to allow a conductive gel to penetrate therethrough. Thereafter, the gel penetration probe 20-a is exchanged with the impedance measuring probe 11 to measure the impedance of the measuring point. Then, the gel penetration probe 20-b is exchanged with the impedance measuring probe 11 thereby to measure the impedance of the measuring point. In this manner, by sequentially exchanging the gel penetration probe 20 with the impedance measuring probe 11, the impedance of the respective measuring points is sequentially measured.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、素地金属の表面に塗布
された塗膜の劣化を電気化学的に検出する塗膜劣化測定
方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a coating film deterioration measuring method for electrochemically detecting deterioration of a coating film applied to the surface of a base metal.

【0002】[0002]

【従来の技術】塗膜劣化測定方法には、その塗膜のイン
ピーダンスを測定し、その測定されたインピーダンスか
ら前記塗膜の劣化度合いを診断する方法がある。以下、
この種の塗膜劣化測定方法の概略について説明する。
2. Description of the Related Art As a coating film deterioration measuring method, there is a method of measuring the impedance of the coating film and diagnosing the degree of deterioration of the coating film from the measured impedance. Less than,
An outline of this type of coating film deterioration measuring method will be described.

【0003】まず、塗膜のインピーダンスの測定は、図
7に示すような方法で行う。即ち、導電性ゲルが含浸さ
れたゲル含浸用部材1の下面を塗膜Aに密着させ、ゲル
含浸用部材1の上面を、アルミ箔等からなる電極2に密
着させる。そして、交流電源3により、塗膜Aが塗布さ
れた素地金属Bと電極2との間に交流電圧を印加して、
このときの電流値および電圧値を夫々電流計4および電
圧計5から読取り、これら両測定値から塗膜Aのインピ
ーダンスを求める。
First, the impedance of the coating film is measured by the method shown in FIG. That is, the lower surface of the gel impregnating member 1 impregnated with the conductive gel is brought into close contact with the coating film A, and the upper surface of the gel impregnating member 1 is brought into close contact with the electrode 2 made of aluminum foil or the like. Then, the AC power supply 3 applies an AC voltage between the base metal B coated with the coating film A and the electrode 2,
The current value and the voltage value at this time are read from the ammeter 4 and the voltmeter 5, respectively, and the impedance of the coating film A is determined from these measured values.

【0004】塗装直後の正常な状態では、塗膜Aの電気
抵抗は非常に大きく10(Ω/cm)あるいは、それ
以上の値を有し、塗膜Aの電気的等価回路は、図8に示
すように、抵抗Rfと容量Cfとの並列回路で表され
る。ところが、塗膜Aは、劣化すると、このような単純
な等価回路から複数の時定数を持つ複雑なインピーダン
スを示すようになるので、この性質を利用することによ
り、塗膜Aの劣化度合いを診断することができる。
In a normal state immediately after coating, the electric resistance of the coating film A is very large and has a value of 10 8 (Ω / cm) or more. The electrical equivalent circuit of the coating film A is as shown in FIG. As shown in, it is represented by a parallel circuit of a resistor Rf and a capacitor Cf. However, when the coating film A deteriorates, such a simple equivalent circuit exhibits a complicated impedance having a plurality of time constants. Therefore, by utilizing this property, the degree of deterioration of the coating film A can be diagnosed. can do.

【0005】以下、塗膜Aのインピーダンスから、その
劣化度合いを診断する二つの方法について説明する。ま
ず、第1は、図9に示すように、塗膜Aのインピーダン
スZの絶対値を、交流電源3の周波数f(対数)に対し
てプロットすることにより、いわゆるボード線図を作成
する方法である。同図において、aは、塗膜Aが正常な
場合の曲線、bは、塗膜Aが劣化した場合の曲線であ
り、両曲線a,bを比較すると、周波数の低い側におい
て、インピーダンスZの違いが顕著である。従って、こ
のことから、塗膜Aの劣化度合いを診断することができ
る(尚、図9から明らかなように、インピーダンスZの
絶対値のみから塗膜Aの劣化を検出する場合には、周波
数fの低い側で測定する方が有効である)。
Two methods for diagnosing the degree of deterioration of the coating film A will be described below. First, as shown in FIG. 9, the first is to create a so-called Bode diagram by plotting the absolute value of the impedance Z of the coating film A against the frequency f (logarithm) of the AC power supply 3. is there. In the figure, a is a curve when the coating film A is normal, and b is a curve when the coating film A is deteriorated. Comparing the curves a and b, the impedance Z of the low frequency side is The difference is remarkable. Therefore, from this fact, the degree of deterioration of the coating film A can be diagnosed (as is clear from FIG. 9, when the deterioration of the coating film A is detected only from the absolute value of the impedance Z, the frequency f It is more effective to measure on the lower side of.

【0006】第2は、図10に示すように、塗膜Aのイ
ンピーダンスの実部と虚部とを複素平面上に表すことに
より、いわゆるナイキスト線図を作成する方法である。
同図において、cは、塗膜Aが正常な場合の軌跡、d
は、塗膜Aが劣化した場合の軌跡であり、軌跡dは、軌
跡cより半径が小さく、しかも、若干変形するようにな
る。従って、このことから、塗膜Aの劣化の程度を推定
することができる。
The second is a method for creating a so-called Nyquist diagram by expressing the real part and the imaginary part of the impedance of the coating film A on a complex plane as shown in FIG.
In the figure, c is a locus when the coating film A is normal, d
Is a locus when the coating film A is deteriorated, and the locus d has a smaller radius than the locus c and is slightly deformed. Therefore, the degree of deterioration of the coating film A can be estimated from this.

【0007】ところで、以上のような測定方法におい
て、精度の良い測定を行うためには、ゲル含浸用部材を
塗膜に密着させて、塗膜の被測定部位に導電性ゲルを浸
透させる必要がある。しかしながら、塗膜に凹凸等があ
る場合には、ゲル含浸用部材を塗膜に密着させることが
困難であり、そこで、特願平1−105839号公報に
おいて、次のようなものが提案されている。
In the above measuring method, in order to perform accurate measurement, it is necessary to bring the gel impregnating member into close contact with the coating film and allow the conductive gel to permeate the measurement site of the coating film. is there. However, when the coating film has irregularities, it is difficult to bring the gel impregnating member into close contact with the coating film, and therefore, the following is proposed in Japanese Patent Application No. 1-105839. There is.

【0008】即ち、図11において、ケース6の内面に
は、錫箔からなる電極7が貼付され、電極7には、接続
端子8が接続されている。また、ケース6内には、導電
性ゲルが含浸されたスポンジ状のゲル含浸用部材9が収
容されており、測定時には、磁石10により、ケース6
を素地金属に固定する。この場合、塗膜に凹凸等があっ
ても、ゲル含浸用部材9の凸面部9aがその凹凸を吸収
して塗膜に密着するので、塗膜に導電性ゲルを浸透させ
ることができる。
That is, in FIG. 11, an electrode 7 made of tin foil is attached to the inner surface of the case 6, and a connection terminal 8 is connected to the electrode 7. In addition, a sponge-like gel impregnating member 9 impregnated with a conductive gel is accommodated in the case 6, and a magnet 10 is used to hold the case 6 during measurement.
Is fixed to the base metal. In this case, even if the coating film has irregularities, the convex surface portion 9a of the gel impregnating member 9 absorbs the irregularities and adheres to the coating film, so that the conductive gel can penetrate into the coating film.

【0009】[0009]

【発明が解決しようとする課題】ところで、図12は、
塗膜に導電性ゲルが浸透していく様子を示したものであ
り、図11に示す装置を用いた実験結果である。この場
合、横軸は、ゲル含浸用部材9を塗膜に密着させておく
時間(放置時間)を示し、縦軸は周波数0.1Hzにお
ける塗膜のインピーダンスZ(対数)を示す。同図にて
明らかなように、曲線がフラットになってインピーダン
スが安定するまで、即ち、塗膜に装置をセットしてから
導電性ゲルが浸透するまでに、装置を1時間以上放置し
ておく必要がある。
By the way, FIG.
It shows how the conductive gel permeates the coating film, and is the result of an experiment using the apparatus shown in FIG. 11. In this case, the horizontal axis represents the time (standing time) during which the gel impregnating member 9 is kept in close contact with the coating film, and the vertical axis represents the coating film impedance Z (logarithm) at a frequency of 0.1 Hz. As is clear from the figure, the device is left for one hour or more until the curve becomes flat and the impedance becomes stable, that is, until the conductive gel permeates after setting the device on the coating film. There is a need.

【0010】このため、塗膜の複数箇所においてインピ
ーダンスを測定する場合には、その測定の毎に、装置を
塗膜にセットして1時間以上放置しておかなくてはなら
ず、測定に長時間要してしまう。しかも、導電性ゲルの
塗膜への浸透度合いは、周囲の気温・湿度等に依存する
ため、測定が長時間に及んでしまうと、気温・湿度等が
経時変化して測定条件にばらつきが生じ、測定精度が低
下してしまう。
For this reason, when measuring the impedance at a plurality of points on the coating film, it is necessary to set the device on the coating film and leave it for one hour or more each time the measurement is performed. It takes time. Moreover, the degree of permeation of the conductive gel into the coating film depends on the surrounding temperature and humidity, so if the measurement takes a long time, the temperature and humidity will change over time and the measurement conditions will vary. , The measurement accuracy will decrease.

【0011】本発明は、上記事情に鑑みてなされたもの
であり、その目的は、塗膜の被測定部位が複数ある場合
でも、比較的短時間のうちに測定を行うことができる塗
膜劣化測定方法を提供するにある。
The present invention has been made in view of the above circumstances, and an object thereof is deterioration of a coating film which can be measured in a relatively short time even when there are a plurality of measured portions of the coating film. To provide a measuring method.

【0012】[0012]

【課題を解決するための手段】請求項1記載の発明は、
導電性ゲルが含浸されたゲル含浸用部材の一端面を塗膜
に密着させ、前記ゲル含浸用部材の他端面を電極に密着
させ、前記塗膜が塗布された素地金属と前記電極との間
に交流電圧を印加することにより前記塗膜のインピーダ
ンスを測定し、そのインピーダンスから前記塗膜の劣化
度合いを診断する塗膜劣化測定方法において、前記電極
および前記ゲル含浸用部材をケース内に収容してなるイ
ンピーダンス測定用プローブと、前記ゲル含浸用部材を
ケース内に収容してなる複数のゲル浸透用プローブとを
用い、前記塗膜における複数の被測定部位夫々に、前記
ゲル浸透用プローブをセットして前記導電性ゲルを浸透
させ、この後、前記ゲル浸透用プローブを前記インピー
ダンス測定用プローブと順次交換して、各被測定部位の
インピーダンスを順次測定するようにしたところに特徴
を有する。
The invention according to claim 1 is
Between the one end surface of the gel impregnated member impregnated with the conductive gel is adhered to the coating film, the other end surface of the gel impregnated member is adhered to the electrode, and between the base metal coated with the coating film and the electrode. By measuring the impedance of the coating film by applying an AC voltage to the, coating film deterioration measuring method for diagnosing the degree of deterioration of the coating film from the impedance, the electrode and the gel impregnating member is housed in a case. An impedance measurement probe and a plurality of gel permeation probes having the gel impregnating member housed in a case are used, and the gel permeation probe is set at each of a plurality of measurement sites in the coating film. Then, the conductive gel is permeated, and then the gel permeation probe is sequentially replaced with the impedance measurement probe, and the impedance of each measured site is changed. Characterized in was such that the next measurement.

【0013】請求項2記載の発明は、導電性ゲルが含浸
されたゲル含浸用部材の一端面を塗膜に密着させ、前記
ゲル含浸用部材の他端面を電極に密着させ、前記塗膜が
塗布された素地金属と前記電極との間に交流電圧を印加
することにより前記塗膜のインピーダンスを測定し、そ
のインピーダンスから前記塗膜の劣化度合いを診断する
塗膜劣化測定方法において、前記電極が着脱可能なケー
ス内に前記ゲル浸透用プローブを収容してなる複数の兼
用プローブを用い、前記塗膜における複数の被測定部位
夫々に、前記電極が装着されていない状態の前記兼用プ
ローブをセットして導電性ゲルを浸透させ、この後、こ
れら各兼用プローブに前記電極を順次装着して、各被測
定部位のインピーダンスを順次測定するようにしたとこ
ろに特徴を有する。
According to a second aspect of the invention, the conductive gel is impregnated.
One end surface of the gel impregnated member adhered to the coating film,
The other end surface of the gel impregnating member is adhered to the electrode, and the coating film is
AC voltage is applied between the applied base metal and the electrode
The impedance of the coating film is measured by
The degree of deterioration of the coating film is diagnosed from the impedance of
In the coating film deterioration measurement method, the electrode can be attached and detached.
A plurality of chambers containing the gel permeation probe inside
Multiple measuring points on the coating film using a probe for
Each of the dual-purpose plugs without the electrodes attached
Set the lobe to penetrate the conductive gel, then
Attach these electrodes to each dual-purpose probe in sequence and
The impedance of a fixed part is measured sequentially.
It has special characteristics.

【0014】また、請求項2記載の発明の場合、筒体と
該筒体の上面開口に着脱可能に嵌合される蓋とからケー
スを構成すると共に、前記蓋の下面に電極を取着するこ
とにより、前記電極を前記ケースに対して着脱可能にし
ても良い(請求項3記載の発明)。
According to the second aspect of the present invention, the case is composed of the cylindrical body and the lid removably fitted in the upper opening of the cylindrical body, and the electrode is attached to the lower surface of the lid. Therefore, the electrode may be detachable from the case (the invention according to claim 3).

【0015】[0015]

【作用】請求項1記載の発明においては、まず、複数の
被測定部位夫々に、ゲル浸透用プローブをセットして導
電性ゲルを浸透させ、この後、ゲル浸透用プローブを順
次インピーダンス測定用プローブと交換することによ
り、各被測定部位のインピーダンスを順次測定する。従
って、インピーダンスを測定する毎に装置を被測定部位
にセットして所定時間放置していた従来に比べ、装置の
放置時間を短縮することができ、その結果、短時間のう
ちに測定を行うことができる。
According to the first aspect of the present invention, first, a gel permeation probe is set in each of a plurality of measurement sites to permeate the conductive gel, and then the gel permeation probes are sequentially placed in the impedance measurement probe. By exchanging with, the impedance of each measurement site is sequentially measured. Therefore, each time the impedance is measured, the device is set at the site to be measured and left for a predetermined time, so that the device can be left for a shorter time, and as a result, the measurement can be performed in a short time. You can

【0016】請求項2記載の発明においては、まず、複
数の被測定部位夫々に、電極が装着されていない状態の
兼用プローブをセットして導電性ゲルを浸透させ、この
後、各兼用プローブに電極を順次装着して、各被測定部
位のインピーダンスを順次測定する。従って、従来に比
べ、装置の放置時間を短縮することができ、その結果、
短時間のうちに測定を行うことができる。しかも、兼用
プローブのケースは塗膜に固定されたままであるから、
導電性ゲルが浸透される部位とインピーダンスが測定さ
れる部位との間に、位置ずれが生じる可能性がなく、確
実に被測定部位のインピーダンスを測定することができ
る。
According to the second aspect of the present invention, first, the combined probe with no electrodes attached is set in each of the plurality of sites to be measured to permeate the conductive gel, and then the combined probe is used. The electrodes are sequentially attached, and the impedance of each measurement site is sequentially measured. Therefore, it is possible to shorten the leaving time of the device as compared with the conventional one, and as a result,
The measurement can be performed in a short time. Moreover, since the case of the dual-purpose probe remains fixed to the coating film,
There is no possibility of misalignment between the site where the conductive gel penetrates and the site where the impedance is measured, and the impedance of the site to be measured can be reliably measured.

【0017】また、請求項3記載の発明においては、筒
体と、該筒体の上面開口に着脱可能に嵌合される蓋とか
らケースを構成すると共に、前記蓋の下面に電極を取着
したので、比較的簡単な構成で、電極をケースに対して
着脱可能にし得る。
Further, in the invention according to claim 3, a case is composed of a cylindrical body and a lid removably fitted in an upper opening of the cylindrical body, and an electrode is attached to a lower surface of the lid. Therefore, the electrode can be attached to and detached from the case with a relatively simple structure.

【0018】[0018]

【実施例】以下、本発明の第1実施例につき図1ないし
図3を参照して説明する。まず、図2を参照して、イン
ピーダンス測定用プローブ11について説明する。即
ち、ケース12内の天井面には、錫箔からなる電極13
が貼付されており、この電極13は、ケース12の上面
に設けられた接続端子14に接続されている。また、ケ
ース12内には、スポンジ状のゲル含浸用部材15が収
容されている。ゲル含浸用部材15には、導電性ゲルが
含浸されており、ケース12を塗膜Aに押付けると(図
1参照)、ゲル含浸用部材15の凸面部16が塗膜Aの
凹凸を吸収するように変形して、塗膜Aに密着する。さ
らに、ケース12の外周面には、めねじ部17が設けら
れており、めねじ部17には、磁石18を有するガイド
リング19が螺合されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention will be described below with reference to FIGS. First, the impedance measurement probe 11 will be described with reference to FIG. That is, the electrode 13 made of tin foil is provided on the ceiling surface of the case 12.
Is attached, and the electrode 13 is connected to the connection terminal 14 provided on the upper surface of the case 12. A sponge-like gel impregnating member 15 is housed in the case 12. The gel impregnating member 15 is impregnated with a conductive gel, and when the case 12 is pressed against the coating film A (see FIG. 1), the convex portion 16 of the gel impregnating member 15 absorbs the irregularities of the coating film A. It deforms so that it adheres to the coating film A. Further, a female thread portion 17 is provided on the outer peripheral surface of the case 12, and a guide ring 19 having a magnet 18 is screwed into the female thread portion 17.

【0019】次に、図3を参照して、ゲル浸透用プロー
ブ20について説明する。即ち、ゲル浸透用プローブ2
0は、インピーダンス測定用プローブ11から、電極1
3,接続端子14を除去したものであり、ケース12
(a)内に、導電性ゲルが含浸されたゲル含浸用部材1
5(a)を収容し、ケース12(a)のめねじ部17
(a)に、磁石18(a)を有するガイドリング19
(a)を螺合した構成になっている。
Next, the gel permeation probe 20 will be described with reference to FIG. That is, the gel permeation probe 2
0 indicates the electrode 1 from the impedance measurement probe 11.
3, the connection terminal 14 is removed, the case 12
Gel impregnation member 1 in which conductive gel is impregnated in (a)
5 (a) is accommodated, and the female thread portion 17 of the case 12 (a) is accommodated.
A guide ring 19 having a magnet 18 (a) in (a)
(A) is screwed together.

【0020】一方、図1において、インピーダンス測定
手段21は、交流電源21aと、電流計21bと、電圧
計21cとから構成されるものであり、交流電源21a
により、素地金属Bと電極13との間に交流電圧を印加
して、このときの電流値および電圧値を夫々電流計21
bおよび電圧計21cから読取り、これら両測定値から
塗膜Aのインピーダンスを求める。
On the other hand, in FIG. 1, the impedance measuring means 21 comprises an AC power supply 21a, an ammeter 21b and a voltmeter 21c.
By applying an AC voltage between the base metal B and the electrode 13, the current value and the voltage value at this time are respectively measured by the ammeter 21.
b and the voltmeter 21c are read, and the impedance of the coating film A is determined from these measured values.

【0021】次に、インピーダンス測定用プローブ11
およびゲル浸透用プローブ20を用いて、塗膜Aのイン
ピーダンスを測定する方法について説明する。まず、図
1に示すように、塗膜Aにおける複数の被測定部位夫々
に、ゲル浸透用プローブ20を、磁石18(a)により
略同時に固定して、ゲル含浸用部材15(a)の凸面部
16(a)を塗膜Aに密着させる。そして、そのまま所
定時間放置して導電性ゲルを塗膜Aに浸透させ、塗膜A
から磁石18(a)を取外すことにより、例えば、ゲル
浸透用プローブ20−aを取外す。次に、この被測定部
位にインピーダンス測定用プローブ11を、磁石18に
より固定して、ゲル浸透用プローブ20−aをインピー
ダンス測定用プローブ11と交換する。この後、交流電
源21aにより、素地金属Bと電極13との間に交流電
圧を印加して、該被測定部位のインピーダンスを測定す
る。
Next, the impedance measuring probe 11
A method for measuring the impedance of the coating film A using the gel permeation probe 20 will be described. First, as shown in FIG. 1, a gel permeation probe 20 is fixed to each of a plurality of measurement sites in the coating film A by a magnet 18 (a) at substantially the same time, and the convex surface of the gel impregnating member 15 (a) is fixed. The portion 16 (a) is brought into close contact with the coating film A. Then, it is left as it is for a predetermined time to allow the conductive gel to penetrate into the coating film A,
By removing the magnet 18 (a) from, for example, the gel permeation probe 20-a is removed. Next, the impedance measuring probe 11 is fixed to the measurement site by the magnet 18, and the gel permeation probe 20-a is replaced with the impedance measuring probe 11. After that, an AC voltage is applied between the base metal B and the electrode 13 by the AC power supply 21a to measure the impedance of the measurement site.

【0022】次に、例えば、ゲル浸透用プローブ20−
bを、インピーダンス測定用プローブ11と交換して、
該被測定部位のインピーダンスを測定し、この後、ゲル
浸透用プローブ20−cをインピーダンス測定用プロー
ブ11と交換して該被測定部位のインピーダンスを測定
するといった具合に、ゲル浸透用プローブ20をインピ
ーダンス測定用プローブ11と順次交換して、各被測定
部位のインピーダンスを順次測定する。そして、測定さ
れたインピーダンスに基づき、ボード線図(図9参
照),ナイキスト線図(図10参照)を作成する等し
て、塗膜Aの劣化を診断する。
Next, for example, the gel permeation probe 20-
Replace b with the impedance measuring probe 11,
The impedance of the gel permeation probe 20 is measured by measuring the impedance of the measurement site, then replacing the gel permeation probe 20-c with the impedance measurement probe 11, and measuring the impedance of the measurement site. The measurement probe 11 is sequentially replaced, and the impedance of each measurement site is sequentially measured. Then, based on the measured impedance, a Bode diagram (see FIG. 9) and a Nyquist diagram (see FIG. 10) are created to diagnose the deterioration of the coating film A.

【0023】上記第1実施例によれば次の効果を奏す
る。即ち、複数の被測定部位夫々に、ゲル浸透用プロー
ブ20をセットして導電性ゲルを浸透させ、この後、ゲ
ル浸透用プローブ20をインピーダンス測定用プローブ
11と順次交換して、各被測定部位のインピーダンスを
順次測定するようにしたので、インピーダンスを測定す
る毎にケースを塗膜にセットして所定時間放置していた
従来に比べ、放置時間を短縮することができる。その結
果、比較的短時間のうちに測定を行うことができ、ひい
ては、測定を略一定の気温,湿度等の測定条件下で行う
ことができるので、測定精度が向上する。
According to the first embodiment described above, the following effects can be obtained. That is, the gel permeation probe 20 is set to each of the plurality of measurement sites to permeate the conductive gel, and then the gel permeation probe 20 is sequentially exchanged with the impedance measurement probe 11, and each measurement site is measured. Since the impedance is measured sequentially, the time for leaving can be shortened as compared with the conventional method in which the case is set on the coating film and left for a predetermined time each time the impedance is measured. As a result, the measurement can be performed in a relatively short time, and the measurement can be performed under a substantially constant measurement condition such as temperature and humidity, so that the measurement accuracy is improved.

【0024】ところで、従来において、放置時間を短縮
して測定を短時間で済ますには、図11に示す装置を複
数用意して、複数の被測定部位夫々に、その装置をセッ
トすることが考えられる。しかしながら、図11に示す
装置は、インピーダンス測定機能(電極7等)を有して
いるため、比較的高価であり、複数用意すると、費用が
かさむという事情があった。この点、上記第1実施例に
おいては、複数用意したゲル浸透用プローブ20は、電
極13を具備しておらず、ケース12(a)内にゲル含
浸用部材15(a)を収容しただけの簡単な構成である
から、比較的安価であり、複数用意しても費用がかさま
ない。
By the way, conventionally, in order to shorten the standing time and shorten the measurement, it is considered to prepare a plurality of devices shown in FIG. 11 and set the devices to each of a plurality of measured parts. To be However, since the device shown in FIG. 11 has an impedance measuring function (electrode 7 etc.), it is relatively expensive, and the cost is high if a plurality of devices are prepared. In this respect, in the above-described first embodiment, the prepared gel permeation probe 20 does not include the electrode 13, and only the gel impregnating member 15 (a) is housed in the case 12 (a). Since it has a simple structure, it is relatively inexpensive, and the cost is not expensive even if multiple units are prepared.

【0025】尚、上記第1実施例においては、ゲル浸透
用プローブ20をインピーダンス測定用プローブ11と
交換するにあたって、塗膜Aからゲル浸透用プローブ2
0をガイドリング19(a)ごと取外したが、次のよう
にしても良い。即ち、ゲル浸透用プローブ20のケース
12(a)をガイドリング19(a)から螺脱すること
により、塗膜Aからケース12(a)だけを取外す。そ
して、インピーダンス測定用プローブ11のケース12
からガイドリング19を螺脱して、塗膜Aに固定されて
いるガイドリング19(a)に、そのケース12を螺着
する。
In the first embodiment, when the gel permeation probe 20 is replaced with the impedance measurement probe 11, the gel permeation probe 2 starts from the coating film A.
Although 0 was removed together with the guide ring 19 (a), it may be carried out as follows. That is, only the case 12 (a) is removed from the coating film A by screwing off the case 12 (a) of the gel permeation probe 20 from the guide ring 19 (a). Then, the case 12 of the impedance measuring probe 11
The guide ring 19 is unscrewed from, and the case 12 is screwed to the guide ring 19 (a) fixed to the coating film A.

【0026】このようにして、ゲル浸透用プローブ20
をインピーダンス測定用プローブ11と交換した場合に
は、導電性ゲルが浸透される部位とインピーダンスが測
定される部位との間に、位置ずれが生じる可能性がな
く、確実に被測定部位のインピーダンスを測定すること
ができる。
In this way, the gel permeation probe 20 is used.
When the probe is replaced with the impedance measuring probe 11, there is no possibility of positional displacement between the site where the conductive gel is permeated and the site where the impedance is measured, and the impedance of the site to be measured is reliably measured. Can be measured.

【0027】次に、本発明の第2実施例について図4な
いし図6を参照して説明する。まず、図5を参照して、
兼用プローブ22について説明する。即ち、ケース23
は、筒体24と、筒体24の上面開口に嵌合される蓋2
5とから構成されている。この場合、筒体24には凹部
26が形成され、蓋25には凸部27が形成されてお
り、筒体24の上面開口に蓋25を押込むと、凹部26
に凸部27が嵌合され、蓋25が筒体24に装着され
る。そして、蓋25を引上げると、凸部27が凹部26
から外れて、蓋25が筒体24から除去される。また、
ケース23内には、凸面部28を有するスポンジ状のゲ
ル含浸用部材29が収容され、ゲル含浸用部材29に
は、導電性ゲルが含浸されており、ケース23の下端面
には、磁石30が埋設されている。
Next, a second embodiment of the present invention will be described with reference to FIGS. First, referring to FIG.
The dual-purpose probe 22 will be described. That is, the case 23
Is a tubular body 24 and a lid 2 fitted in an upper opening of the tubular body 24.
It is composed of 5 and. In this case, a concave portion 26 is formed in the cylindrical body 24, and a convex portion 27 is formed in the lid 25. When the lid 25 is pushed into the upper surface opening of the cylindrical body 24, the concave portion 26 is formed.
The convex portion 27 is fitted to, and the lid 25 is attached to the cylindrical body 24. Then, when the lid 25 is pulled up, the convex portion 27 becomes the concave portion 26.
And the lid 25 is removed from the tubular body 24. Also,
A sponge-like gel impregnating member 29 having a convex portion 28 is accommodated in the case 23, the gel impregnating member 29 is impregnated with a conductive gel, and a magnet 30 is provided on the lower end surface of the case 23. Is buried.

【0028】また、図6において、蓋25(a)は、上
記蓋25と同一のものであり、筒体24の凹部26に嵌
合される凸部27(a)を有しており、筒体24に対し
て着脱可能にされている。そして、蓋25(a)の下面
には、錫箔からなる電極31が貼付され、電極31に
は、接続端子32が接続されており、その電極31は、
ケース23に対して着脱可能にされている。
Further, in FIG. 6, the lid 25 (a) is the same as the lid 25 and has a convex portion 27 (a) to be fitted into the concave portion 26 of the cylindrical body 24. It is detachable from the body 24. Then, an electrode 31 made of tin foil is attached to the lower surface of the lid 25 (a), and a connection terminal 32 is connected to the electrode 31, and the electrode 31 is
It is attachable to and detachable from the case 23.

【0029】次に、蓋25(a)および複数の兼用プロ
ーブ22を用いて、塗膜Aのインピーダンスを測定する
方法について説明する。まず、図4に示すように、塗膜
Aにおける複数の被測定部位夫々に、兼用プローブ22
を、磁石30によって略同時に固定して、ゲル含浸用部
材29の凸面部28を塗膜Aに密着させる。そして、そ
のまま所定時間放置して導電性ゲルを塗膜Aに浸透さ
せ、次に、例えば、兼用プローブ22−aから蓋25を
取外し、兼用プローブ22−aの筒体24に、蓋25
(a)を装着して電極31を装着する。この後、インピ
ーダンス測定手段21の交流電源21aにより、素地金
属Bと電極31との間に交流電圧を印加して、塗膜Aの
インピーダンスを求める。
Next, a method of measuring the impedance of the coating film A using the lid 25 (a) and the plurality of dual-purpose probes 22 will be described. First, as shown in FIG. 4, the dual-purpose probe 22 is attached to each of the plurality of measurement sites on the coating film A.
Are fixed at approximately the same time by a magnet 30, and the convex surface portion 28 of the gel impregnating member 29 is brought into close contact with the coating film A. Then, it is left as it is for a predetermined time to allow the conductive gel to penetrate into the coating film A, then, for example, the lid 25 is removed from the dual-purpose probe 22-a, and the lid 25 is attached to the cylindrical body 24 of the dual-purpose probe 22-a.
The electrode 31 is mounted by mounting (a). After that, an AC voltage is applied between the base metal B and the electrode 31 by the AC power supply 21a of the impedance measuring means 21 to obtain the impedance of the coating film A.

【0030】次に、例えば、兼用プローブ22−bの蓋
25を蓋25(a)と交換して、該被測定部位のインピ
ーダンスを測定し、この後、兼用プローブ22−cの蓋
25を蓋25(a)と交換して、該被測定部位のインピ
ーダンスを測定するといった具合に、各兼用プローブ2
2に蓋25(a)を順次装着して、各被測定部位のイン
ピーダンスを順次測定する。
Next, for example, the lid 25 of the dual-purpose probe 22-b is replaced with the lid 25 (a) to measure the impedance of the measurement site, and then the lid 25 of the dual-purpose probe 22-c is closed. 25 (a) and measure the impedance of the site to be measured.
The lid 25 (a) is sequentially attached to the device 2, and the impedance of each measurement site is sequentially measured.

【0031】上記第2実施例によれば、複数の被測定部
位夫々に、兼用プローブ22をセットして導電性ゲルを
浸透させ、この後、兼用プローブ22に蓋25(a)を
順次装着して、各被測定部位のインピーダンスを順次測
定するようにしたので、第1実施例と同様、従来に比
べ、兼用プローブ22の放置時間を短縮することがで
き、その結果、測定時間の短縮、測定精度の向上を図り
得る。しかも、兼用プローブ22のケース24は塗膜A
に固定されたままであるから、導電性ゲルが浸透される
部位とインピーダンスが測定される部位との間に、位置
ずれが生じる可能性がなく、確実に被測定部位のインピ
ーダンスを測定することができる。
According to the second embodiment described above, the combined probe 22 is set in each of the plurality of measurement sites to allow the conductive gel to permeate, and then the combined probe 22 is sequentially fitted with the lid 25 (a). As described above, the impedance of each measurement site is sequentially measured. Therefore, as in the first embodiment, the combined probe 22 can be left for a shorter period of time than in the conventional case. As a result, the measurement time can be shortened and measured. The accuracy can be improved. Moreover, the case 24 of the dual-purpose probe 22 has the coating film A.
Since it remains fixed at the position, there is no possibility of misalignment between the site where the conductive gel is permeated and the site where the impedance is measured, and the impedance of the site to be measured can be reliably measured. .

【0032】さらに、ケース23を、筒体24と筒体2
4に着脱可能に嵌合される蓋25(a)とから構成し、
蓋25(a)の下面に電極31を取着したので、比較的
簡単な構成によって、電極31をケース23に対して着
脱可能にすることができる。また、この場合、複数用意
する必要のある兼用プローブ22は、ケース23内にゲ
ル含浸用部材29を収容しただけの簡単な構成であるか
ら、比較的安価であり、複数用意しても費用がかさまな
い。
Further, the case 23 is provided with a cylindrical body 24 and a cylindrical body 2.
4 and a lid 25 (a) that is detachably fitted to
Since the electrode 31 is attached to the lower surface of the lid 25 (a), the electrode 31 can be attached to and detached from the case 23 with a relatively simple structure. Further, in this case, since the dual-purpose probe 22 that needs to be prepared in a plurality has a simple structure in which the gel-impregnating member 29 is housed in the case 23, it is relatively inexpensive, and it is expensive to prepare a plurality. It won't catch over.

【0033】尚、上記第1および第2実施例において
は、インピーダンス測定用プローブ11および蓋25
(a)を夫々1個用いるようにしたが、例えば、測定者
が3名の場合には、インピーダンス測定用プローブ11
および蓋25(a)も夫々3個用いるといった具合に、
測定者の数に応じて、インピーダンス測定用プローブ1
1および蓋25(a)の個数を調整すれば、さらに効果
的に、測定時間を短縮することができる。
In the first and second embodiments, the impedance measuring probe 11 and the lid 25 are used.
Although one is used for each of (a), for example, when there are three persons, the impedance measurement probe 11 is used.
And three lids 25 (a) are used,
Impedance measurement probe 1 according to the number of measurers
By adjusting the number of 1 and the number of lids 25 (a), the measurement time can be shortened more effectively.

【0034】また、上記両実施例においては、インピー
ダンス測定手段21を、交流電源21a,電流計21
b,電圧計21cとから構成したが、例えば、アンプ,
CPU,メモリ,FDD,ディスプレイ等を備えたパー
ソナルコンピュータから構成し、前記FDDに書き込ま
れたプログラムにより、自動的に塗膜Aの劣化度合いを
測定できるようにしても良い。
In both of the above embodiments, the impedance measuring means 21 is composed of an AC power source 21a and an ammeter 21.
b, and a voltmeter 21c.
The personal computer may be provided with a CPU, a memory, an FDD, a display, etc., and the degree of deterioration of the coating film A may be automatically measured by a program written in the FDD.

【0035】[0035]

【発明の効果】以上の説明から明らかなように、本発明
の塗膜劣化測定方法によれば、以下に述べる優れた効果
を奏する。
As is apparent from the above description, the coating film deterioration measuring method of the present invention has the following excellent effects.

【0036】請求項1記載の発明によれば、インピーダ
ンス測定用プローブと複数のゲル浸透用プローブとを用
い、塗膜における複数の被測定部位夫々に、前記ゲル浸
透用プローブをセットして導電性ゲルを浸透させ、この
後、前記ゲル浸透用プローブを前記インピーダンス測定
用プローブと順次交換して、各被測定部位のインピーダ
ンスを順次測定するようにしたので、比較的短時間のう
ちに測定を行うことができて、その測定精度も向上す
る。
According to the first aspect of the present invention, an impedance measuring probe and a plurality of gel permeation probes are used, and the gel permeation probe is set at each of a plurality of measurement sites in the coating film to make the electroconductive film conductive. The gel is permeated, and thereafter, the gel permeation probe is sequentially replaced with the impedance measurement probe, and the impedance of each measurement site is sequentially measured. Therefore, the measurement is performed within a relatively short time. It is possible to improve the measurement accuracy.

【0037】請求項2記載の発明によれば、塗膜におけ
る複数の被測定部位夫々に、電極が装着されていない状
態の兼用プローブをセットして導電性ゲルを浸透させ、
この後、各兼用プローブに電極を順次装着して、各被測
定部位のインピーダンスを順次測定するようにしたの
で、比較的短時間のうちに測定を行うことができて、そ
の測定精度も向上し、しかも、導電性ゲルが浸透される
部位とインピーダンスが測定される部位との間に、位置
ずれが生じることなく、確実に被測定部位のインピーダ
ンスを測定し得る。
According to the second aspect of the present invention, a dual-purpose probe in a state where no electrode is attached is set in each of the plurality of measurement sites in the coating film to allow the conductive gel to penetrate,
After that, the electrodes were sequentially attached to each dual-purpose probe and the impedance of each measurement site was sequentially measured, so that the measurement can be performed in a relatively short time and the measurement accuracy is improved. Moreover, the impedance of the site to be measured can be reliably measured without causing a positional deviation between the site where the conductive gel penetrates and the site where the impedance is measured.

【0038】請求項3記載の発明によれば、ケースを、
筒体と該筒体の上面開口に着脱可能に嵌合される蓋とか
ら構成し、この蓋の下面に電極を取着したので、比較的
簡単な構成で、電極をケースに対して着脱可能にし得
る。
According to the invention of claim 3, the case is
It consists of a cylinder and a lid that is detachably fitted to the upper opening of the cylinder, and the electrode is attached to the lower surface of this lid, so the electrode can be attached to and detached from the case with a relatively simple structure. You can

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例を示す概略図FIG. 1 is a schematic diagram showing a first embodiment of the present invention.

【図2】インピーダンス測定用プローブを示す縦断面図FIG. 2 is a vertical cross-sectional view showing an impedance measuring probe.

【図3】ゲル浸透用プローブを示す図2相当図FIG. 3 is a view corresponding to FIG. 2 showing a gel permeation probe.

【図4】本発明の第2実施例を示す図1相当図FIG. 4 is a view corresponding to FIG. 1 showing a second embodiment of the present invention.

【図5】兼用プローブを示す図2相当図FIG. 5 is a view corresponding to FIG. 2 showing a dual-purpose probe.

【図6】兼用プローブに電極を装着した状態を示す図2
相当図
FIG. 6 is a view showing a state in which electrodes are attached to the dual-purpose probe.
Corresponding figure

【図7】塗膜のインピーダンス測定構成を原理的に示す
概略図
FIG. 7 is a schematic diagram showing in principle the impedance measurement configuration of a coating film.

【図8】塗膜の電気的等価回路図FIG. 8 is an electrical equivalent circuit diagram of the coating film.

【図9】ボード線図[Figure 9] Bode diagram

【図10】ナイキスト線図Fig. 10 Nyquist diagram

【図11】特願平1−105839号公報の装置を示す
図2相当図
FIG. 11 is a view corresponding to FIG. 2 showing the device of Japanese Patent Application No. 1-105839.

【図12】塗膜のインピーダンスと放置時間との関係を
示す特性図
FIG. 12 is a characteristic diagram showing the relationship between the impedance of the coating film and the standing time.

【符号の説明】[Explanation of symbols]

Aは塗膜,Bは素地金属、11はインピーダンス測定用
プローブ、12,12(a)はケース、13は電極、1
5,15(a)はゲル含浸用部材、20はゲル浸透用プ
ローブ、22は兼用プローブ、23はケース、24は筒
体、25,25(a)は蓋、29はゲル含浸用部材、3
1は電極を示す。
A is a coating film, B is a base metal, 11 is an impedance measuring probe, 12, 12 (a) is a case, 13 is an electrode, 1
5, 15 (a) is a gel impregnating member, 20 is a gel permeation probe, 22 is a dual-purpose probe, 23 is a case, 24 is a cylinder, 25, 25 (a) is a lid, 29 is a gel impregnating member, 3
Reference numeral 1 represents an electrode.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 導電性ゲルが含浸されたゲル含浸用部材
の一端面を塗膜に密着させ、前記ゲル含浸用部材の他端
面を電極に密着させ、前記塗膜が塗布された素地金属と
前記電極との間に交流電圧を印加することにより前記塗
膜のインピーダンスを測定し、そのインピーダンスから
前記塗膜の劣化度合いを診断する塗膜劣化測定方法にお
いて、 前記電極および前記ゲル含浸用部材をケース内に収容し
てなるインピーダンス測定用プローブと、前記ゲル含浸
用部材をケース内に収容してなる複数のゲル浸透用プロ
ーブとを用い、 前記塗膜における複数の被測定部位夫々に、前記ゲル浸
透用プローブをセットして前記導電性ゲルを浸透させ、
この後、前記ゲル浸透用プローブを前記インピーダンス
測定用プローブと順次交換して、各被測定部位のインピ
ーダンスを順次測定するようにしたことを特徴とする塗
膜劣化測定方法。
1. A base metal coated with the coating film, wherein one end surface of a gel impregnating member impregnated with a conductive gel is adhered to a coating film and the other end surface of the gel impregnating member is adhered to an electrode. The impedance of the coating film is measured by applying an AC voltage between the electrode and the coating film deterioration measuring method for diagnosing the degree of deterioration of the coating film from the impedance, wherein the electrode and the member for gel impregnation are used. An impedance measurement probe housed in a case and a plurality of gel permeation probes housed in the case for the gel impregnating member are used, and each of the plurality of measured sites in the coating film contains the gel. Set a probe for permeation to permeate the conductive gel,
After that, the gel permeation probe is sequentially replaced with the impedance measurement probe, and the impedance of each measurement site is sequentially measured.
【請求項2】 導電性ゲルが含浸されたゲル含浸用部材
の一端面を塗膜に密着させ、前記ゲル含浸用部材の他端
面を電極に密着させ、前記塗膜が塗布された素地金属と
前記電極との間に交流電圧を印加することにより前記塗
膜のインピーダンスを測定し、そのインピーダンスから
前記塗膜の劣化度合いを診断する塗膜劣化測定方法にお
いて、 前記電極が着脱可能なケース内に前記ゲル浸透用プロー
ブを収容してなる複数の兼用プローブを用い、 前記塗膜における複数の被測定部位夫々に、前記電極が
装着されていない状態の前記兼用プローブをセットして
導電性ゲルを浸透させ、この後、これら各兼用プローブ
に前記電極を順次装着して、各被測定部位のインピーダ
ンスを順次測定するようにしたことを特徴とする塗膜劣
化測定方法。
2. A base metal coated with the coating film, wherein one end surface of a gel impregnating member impregnated with a conductive gel is brought into close contact with a coating film, and the other end surface of the gel impregnating member is brought into close contact with an electrode. The impedance of the coating film is measured by applying an alternating voltage between the electrodes, and in the coating film deterioration measuring method for diagnosing the degree of deterioration of the coating film from the impedance, the electrode is placed in a detachable case. Using a plurality of dual-purpose probes accommodating the gel permeation probe, a plurality of measurement sites in the coating film, permeate the conductive gel by setting the dual-purpose probe in a state in which the electrode is not attached Then, after that, the electrodes are sequentially attached to each of the dual-purpose probes, and the impedance of each measurement site is sequentially measured.
【請求項3】 筒体と該筒体の上面開口に着脱可能に嵌
合される蓋とからケースを構成すると共に、前記蓋の下
面に電極を取着することにより、前記電極を前記ケース
に対して着脱可能にしたことを特徴とする請求項2記載
の塗膜劣化測定方法。
3. A case is composed of a cylindrical body and a lid detachably fitted to an opening of an upper surface of the cylindrical body, and an electrode is attached to a lower surface of the lid so that the electrode is attached to the case. The coating film deterioration measuring method according to claim 2, wherein the method is detachable.
JP25092892A 1992-09-21 1992-09-21 Measuring method for deterioration of coating film Pending JPH06102218A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25092892A JPH06102218A (en) 1992-09-21 1992-09-21 Measuring method for deterioration of coating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25092892A JPH06102218A (en) 1992-09-21 1992-09-21 Measuring method for deterioration of coating film

Publications (1)

Publication Number Publication Date
JPH06102218A true JPH06102218A (en) 1994-04-15

Family

ID=17215109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25092892A Pending JPH06102218A (en) 1992-09-21 1992-09-21 Measuring method for deterioration of coating film

Country Status (1)

Country Link
JP (1) JPH06102218A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011105980A (en) * 2009-11-16 2011-06-02 Hitachi-Ge Nuclear Energy Ltd Electrolytic etching method and device for surface of structure in nuclear reactor
CN104897745A (en) * 2015-04-29 2015-09-09 中国船舶重工集团公司第七二五研究所 Nondestructive test method for monitoring coating cathode peeling test
JP2016050915A (en) * 2014-09-02 2016-04-11 国立大学法人広島大学 Corrosion resistance evaluation method and corrosion resistance evaluation device for pre-painted metal material
JP2016050916A (en) * 2014-09-02 2016-04-11 マツダ株式会社 Corrosion resistance evaluation method and corrosion resistance evaluation device for pre-painted metal material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011105980A (en) * 2009-11-16 2011-06-02 Hitachi-Ge Nuclear Energy Ltd Electrolytic etching method and device for surface of structure in nuclear reactor
JP2016050915A (en) * 2014-09-02 2016-04-11 国立大学法人広島大学 Corrosion resistance evaluation method and corrosion resistance evaluation device for pre-painted metal material
JP2016050916A (en) * 2014-09-02 2016-04-11 マツダ株式会社 Corrosion resistance evaluation method and corrosion resistance evaluation device for pre-painted metal material
CN104897745A (en) * 2015-04-29 2015-09-09 中国船舶重工集团公司第七二五研究所 Nondestructive test method for monitoring coating cathode peeling test

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