JPS61108249A - Test system for time division exchange system - Google Patents

Test system for time division exchange system

Info

Publication number
JPS61108249A
JPS61108249A JP22896284A JP22896284A JPS61108249A JP S61108249 A JPS61108249 A JP S61108249A JP 22896284 A JP22896284 A JP 22896284A JP 22896284 A JP22896284 A JP 22896284A JP S61108249 A JPS61108249 A JP S61108249A
Authority
JP
Japan
Prior art keywords
time division
test
line
time
communication line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22896284A
Other languages
Japanese (ja)
Other versions
JPH0548652B2 (en
Inventor
Minoru Abe
稔 安部
Naohisa Oota
直久 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Original Assignee
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Oki Electric Industry Co Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP22896284A priority Critical patent/JPS61108249A/en
Publication of JPS61108249A publication Critical patent/JPS61108249A/en
Publication of JPH0548652B2 publication Critical patent/JPH0548652B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
    • H04M3/244—Arrangements for supervision, monitoring or testing with provision for checking the normal operation for multiplex systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To attain a simultaneous test from plural time division line concentrators and to reduce remarkably the line test time by reflecting a communication line to be tested in a time division exchange, transmitting a test signal on a time slot corresponding to the said communication line from the time division concentrators to the said communication line to be tested and comparing the said test signal with the signal received reflectedly. CONSTITUTION:In testing a communication line ln connecting an LUn of a line circuit LU and an ELUn of a time division exchange EX, a test line circuit TLU is inserted to the ELUn of the time division change EX, an operation display section CNS applies the LU number, the LUn and the communication line command, then a test signal is transmitted from a test signal line TBD to the ELUn of the time division exchange EX on the time slot corresponding to the LUn, is reflected at the ELUn and the test signal is received by a test circuit TST on the time slot corresponding to the LUn of a forward spuer highway FSH of the time division line concentrator LC.

Description

【発明の詳細な説明】 （技術分野） 本発明は時分割交換システムにおける試験方式％式％ 従来、第１図のように構成される時分割交換システムに
おいて、時分割多重伝送路を介して時分割集線装置と時
分割交換機を接続する通信回線を試験する場合、中央制
御装置より時分割交換機と時分割多重伝送路と制御回線
を介して、時分割集線装置に対して試験通信回線の折返
し指示を行い、中□央制御装置より時分割交換機を介し
て試験通信回線に対して試験データを送出し、時分割多
重伝送路と通信回線を介して時分割集線装置内で折返よ
れたデータを中央制御装置で照合する方式をとっている
。Detailed Description of the Invention (Technical Field) The present invention relates to a test method in a time division switching system. Conventionally, in a time division switching system configured as shown in FIG. When testing a communication line connecting a division concentrator and a time-division switch, the central control unit instructs the time-division concentrator to turn back the test communication line via the time division switch, time division multiplex transmission line, and control line. The test data is sent from the central controller to the test communication line via the time division switch, and the data returned within the time division concentrator is sent to the central control unit via the time division multiplex transmission line and the communication line. A method is used in which verification is performed using a control device.

以−ヒ述べた従来方式では、時分割交換機を介して、中
央制御装置より複数の時分割集線装置との通信回線の接
続試験を順次行うため多くの試験１１！１間を必要とし
、また回線試験時に必ず時分割交換システムが介在する
必要があるため、時分割交換機高の保守者の負担が増加
する欠点があった。The conventional method described below requires a large number of tests (11!1) to sequentially test the connection of communication lines from a central controller to multiple time-division concentrators via a time-division switch, and Since the time-sharing switching system always needs to be involved during testing, there is a drawback that the burden on the maintenance personnel of the time-sharing switching system increases.

（発明の目的） 本発明はこれらの問題点を解決し、中央制御装置の介在
なしに複数の時分割交換機２１から同時に時分割集線装
置と時分割交換機を接続する複数の通信回線の試験を可
能として回線試験時間の短縮を図るとともに、時分割交
換局の保守者の負担軽減を図ることを目的とする。(Object of the Invention) The present invention solves these problems and makes it possible to simultaneously test multiple communication lines connecting time division concentrators and time division exchanges from a plurality of time division exchanges 21 without the intervention of a central control device. The purpose is to shorten line testing time and reduce the burden on maintenance staff at time-sharing exchanges.

この目的を達成するための本発明の要旨は、時分割交換
機と、時分割交換機より制御される時分割集線装置と、
時分割多重伝送路を介して時分割交換機と時分割集線装
置とを接続する複数の通信回線とを有する時分割交換シ
ステムにおいて、試験をすべき通信回線を時分割交換機
内で折返し、時分割集線装置から前記試験なすべき通信
回線に対し当該通信回線に対応するタイムスロット１−
に試験信号を送信し、該試験信号と折返し受信された信
号とを比較することにより−ｆ＋信回線を試験する時分
割交換システム試験方式にある。The gist of the present invention for achieving this purpose is to provide a time division switch, a time division concentrator controlled by the time division switch,
In a time division switching system having a plurality of communication lines that connect a time division exchange and a time division concentrator via time division multiplex transmission lines, the communication line to be tested is looped back within the time division exchange, and the time division concentrator is From the device to the communication line to be tested, the time slot 1- corresponding to the communication line is
This is a time-division switching system test method in which a -f+ signal line is tested by transmitting a test signal to and comparing the test signal with a signal received in return.

以下、本発明な一実施例に基づき図面を参照して詳細に
説明する。Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

（発明の構成及び作用） 第２図及び第３図は本発明の一実施例のブロック図であ
る。第２図は時分割集線装置と時分割交換機を接続する
通信回線を試験するためのブロック図で、時分割集線装
置ＬＣは、時分割多重伝送路■曽と接続するためのライ
ン回路ＬＵｏ〜ｎ、　ＬＵで受信した信号をフォワード
スーパーハイウェイ　ＦＳＨＩＩＩ上の定められた時間
位ｉｉ’ｉ（以下タイムスロットと呼ぶ）に多重化する
多重化回路ＭＰＸ　、　ＦＳＨＷ−１−、のタイムスロ
ット１−の信１′Ｊとバックワードスーパーハイウェイ
　ｌｌ５ＩＩＷのタイムスロット上の信号の交換を行う
時分割スイッチＳＷ、　ＢＳＨＷ−Ｈの信号をタイムス
ロットに対応したライン回路ＬＵへ分配するための分配
回路ｒ］ＭＰＸ、試験回路ＴＳＴ　、及びＴＳＴに対し
て試験指示を行なうとともにＴＳＴからの試験結果を表
示する操作表示部ＣＮＳから構成されている。また時分
割交換機ＥＸは、時分割多重伝送路間と接続するための
ライン回路ＥＬＵｏ、ｎ、　ＥＬＵのタイムスロット１
−の信号の相互交換を行なう通話路装置ＴＳＷ、及びＴ
ＳＷの制御を行なう制御装置ＣＴＬから構成されている
。(Structure and operation of the invention) FIGS. 2 and 3 are block diagrams of an embodiment of the invention. Figure 2 is a block diagram for testing the communication line connecting the time division concentrator and the time division switch. , the signal 1 of the time slot 1- of the multiplexing circuit MPX, FSHW-1-, which multiplexes the signal received by the LU at a predetermined time position ii'i (hereinafter referred to as a time slot) on the forward superhighway FSHIII. Time division switch SW for exchanging signals on the time slots of 'J and Backward Super Highway ll5IIW, distribution circuit r for distributing the BSHW-H signal to the line circuit LU corresponding to the time slot] MPX, test circuit It consists of a TST and an operation display section CNS that issues test instructions to the TST and displays test results from the TST. In addition, the time division exchange EX has line circuits ELUo and ELUn for connecting between time division multiplex transmission lines, and time slot 1 of ELU.
- a communication path device TSW for mutually exchanging signals;
It is composed of a control device CTL that controls the SW.

第３図は第２図の試験回線に対応するライン回路Ｅ１．
１１部に挿入する試験用ライン回路ＴＬＵの構成例で、
時分割多重伝送路間からの信号を受信する受信回路ＲＶ
と時分割多重伝送路間へ信号を送出する送信回路口Ｖで
構成される。FIG. 3 shows line circuit E1.corresponding to the test line in FIG.
This is an example of the configuration of the test line circuit TLU inserted in section 11.
Receiving circuit RV that receives signals from between time division multiplex transmission lines
and a transmitting circuit port V for sending signals between the time division multiplex transmission lines.

第２図において、ライン回路ＬＵのＬＵｎと時分割交換
ａＥｘのＥＬＵｎを接続する通信回線Ｏｎを試験する場
合は、時分割交換機ＥＸのＥＬＵｎの個所に第３図に示
す試験用ライン回路ＴＬＵを挿入し、試験回路ＴＳＴに
対して操作表示部ＣＮＳよりＬ１１番号ｌ１Ｉｎと通信
回線試験指示を行なうと、試験回路ＴＳＴは試験指示信
号線Ｔ！ＥＴＩ上の試験指示値％３−によりバックワー
ドスーパーハイウェイＢＳＨＷ１〕のＬｌ！ｎに対応す
るタイムスロット上の時分割スイッチ聞からの送信信号
を抑えて、試験信号線ＴＢＤよりＬＵｎに対応するタイ
ムスロット上に時分割交換機ＥＸのＥＬＵｎに対して試
験信号を送出する。試験回路ＴＳＴからのＥＬＵｎに対
する信号は、ＤＭＰＸ　−Ｌｌｌｎ　−ＨＷ　−ＥＬＵ
ｎｃ７）経路テＥＬＵｎに到達する。ＥＬＵｎには第３
図に示す試験用ライン回路ＴＬＵが挿入されていて、受
信回路ＲＶで受信した試験回路ＴＳＴからの試験信号を
加工せずに送信回路ｎｖで時分割多重伝送路ＨＷ　ｌに
送出する。In Figure 2, when testing the communication line On that connects LUn of the line circuit LU and ELUn of the time division exchange aEx, insert the test line circuit TLU shown in Figure 3 at the location of ELUn of the time division exchange EX. Then, when the test circuit TST is instructed to test the communication line using the L11 number l1In from the operation display unit CNS, the test circuit TST transmits the test instruction signal line T! Ll of Backward Super Highway BSHW1] due to test indication value %3- on ETI! The transmission signal from the time division switch on the time slot corresponding to n is suppressed, and a test signal is sent from the test signal line TBD to ELUn of the time division exchange EX on the time slot corresponding to LUn. The signal for ELUn from the test circuit TST is DMPX -Llln -HW -ELU
nc7) Route ELUn is reached. ELUn has a third
A test line circuit TLU shown in the figure is inserted, and the test signal from the test circuit TST received by the receiver circuit RV is sent to the time division multiplex transmission line HWl by the transmitter circuit nv without being processed.

以上のようにしてＥＬＵｎで折返された試験回路ＴＳＴ
からの試験信号は、第２図のＥｌ、ｌＩｎ　−ＩＩＷ　
−（ｉｎ−ＬＵｎ　−ＭＰＸ経由で時分割集線装置　Ｌ
ＣのフォワードスーパーハイウェイＦＳ１１−の１．ｆ
ｉｎに対応するタイムスロット上で試験回路ＴＳＴが受
信する。試験回路ＴＳＴは受信信号と送信試験信号との
照合を行ない、操作表示部ＣＮＳに対して照合結果を表
示し、試験者はこの表示結果により時分割集線装置ＬＣ
と時分割交換機ＥＸ間の通信回線が正常に接続されてい
るか否かを判断出来る。Test circuit TST folded back at ELUn as described above
The test signal from El, lIn -IIW in FIG.
-(in-LUn - Time division concentrator L via MPX
C's Forward Super Highway FS11-1. f
The test circuit TST receives on the time slot corresponding to in. The test circuit TST compares the received signal and the transmitted test signal, and displays the result of the comparison on the operation display unit CNS.
It can be determined whether the communication line between the time division exchanger EX and the time division exchange EX is properly connected.

（発明の効果） 以上説明したように、本発明は中央制御装置の介在なし
に、時分割集線装置と時分割交換機とを接続する回線試
験を時分割集線装置マ行なうことが出来るので、複数の
時分割集線装置からの同時試験が可能となり回線試験時
間を大幅に短縮出来るとともに、時分割交換機側の保守
者の負荷低減を図れる効果がある。(Effects of the Invention) As explained above, the present invention can perform a line test for connecting a time division concentrator and a time division switch without the intervention of a central control device. Simultaneous testing from the time-division concentrator becomes possible, which greatly reduces line test time, and has the effect of reducing the burden on maintenance personnel on the time-division exchange side.

また、本発明は伝送路を介して接続される装置間の試験
を経済的に実現出来るため、各種システムに応用出来る
等の効果がある。Furthermore, since the present invention can economically perform tests between devices connected via a transmission path, it has the advantage of being applicable to various systems.

【図面の簡単な説明】[Brief explanation of drawings]

第１図は時分割交換システムの構成例、第２図は本発明
による時分割集線装置と時分割交換機を接続する通信回
線を試験するためのブロック図、及び第３図は第２図の
試験回線に対応するＥＬＵ部に挿入する本発明による試
験用ライン回路の構成例である。 ＬＣ−ｍ−時分割集線装置、 ＭＰＸ−ｍ−多重化回路、Ｓ−一一一時分割スイッチ。 ＦＳＩＩＷ　−一一フオワートスーパーハイウェイ、Ｂ
ＳＩＩＷ−ｍ−パツクワードスーパーハイウェイ、ＤＭ
ＰＸ−ｍ−分配回路、 ＬＵｏ−ｎ　　−−−ライン回路ｏ−ｎ、ＴＳ↑−ｍ−
試験回路、ＣＮＳ　−ｍ−操作表示部、ＴＢローーー　
試験信号線、 ＴＳＴＴ−ｍ−試験指示信号線、 見０〜交ｎ−−−通信回線◎−ｎ、 ）ＩＷ−ｍ一時分割多重伝送路、 ＥＸ　−一　時分割交換機、ＣＴＬ−ｍ−制御回路、Ｅ
ＬＵｏ−ｎ−−ライン回路ｏ−ｙ＋、ＴＳ％ｌｌ−ｍ−
時分割通話路装置、 ＴＬＵ　−ｍ−試験用ライン回路、 ＲＶ−ｍ−受信回路、　　　ＤＶ−ｍ＝送信回路。FIG. 1 is a configuration example of a time-division switching system, FIG. 2 is a block diagram for testing a communication line connecting a time-division concentrator and a time-division exchange according to the present invention, and FIG. 3 is a test of FIG. 2. It is a configuration example of a test line circuit according to the present invention inserted into an ELU unit corresponding to a line. LC-m-time division concentrator, MPX-m-multiplex circuit, S-11 temporary division switch. FSIIW - 11th FWART Super Highway, B
SIIW-m-Packward Super Highway, DM
PX-m-distribution circuit, LUon--line circuit on, TS↑-m-
Test circuit, CNS-m-operation display, TB low-
Test signal line, TSTT-m-test instruction signal line, 0~crossn---communication line◎-n, )IW-m temporary division multiplex transmission line, EX-temporary time division exchange, CTL-m-control circuit , E
LUon-n--line circuit o-y+, TS%ll-m-
Time-division channel equipment, TLU-m-test line circuit, RV-m-receiver circuit, DV-m=transmit circuit.

Claims (1)

【特許請求の範囲】[Claims] 時分割交換機と、時分割交換機より制御される時分割集
線装置と、時分割多重伝送路を介して時分割交換機と時
分割集線装置を接続する複数の通信回線とを有する時分
割交換システムにおいて、試験をすべき通信回線を時分
割交換機内で折返し、時分割集線装置から前記試験をす
べき通信回線に対し当該通信回線に対応するタイムスロ
ット上に試験信号を送信し、該試験信号と折返し受信さ
れた信号とを比較することにより通信回線を試験するこ
とを特徴とする時分割交換システム試験方式。In a time division switching system having a time division switch, a time division concentrator controlled by the time division switch, and a plurality of communication lines connecting the time division switch and the time division concentrator via time division multiplex transmission lines, The communication line to be tested is looped back within the time-division exchange, a test signal is transmitted from the time-division concentrator to the communication line to be tested on the time slot corresponding to the communication line, and the test signal and loopback are received. A time division switching system testing method characterized by testing communication lines by comparing the received signals with the received signals.
JP22896284A 1984-11-01 1984-11-01 Test system for time division exchange system Granted JPS61108249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22896284A JPS61108249A (en) 1984-11-01 1984-11-01 Test system for time division exchange system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22896284A JPS61108249A (en) 1984-11-01 1984-11-01 Test system for time division exchange system

Publications (2)

Publication Number Publication Date
JPS61108249A true JPS61108249A (en) 1986-05-26
JPH0548652B2 JPH0548652B2 (en) 1993-07-22

Family

ID=16884589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22896284A Granted JPS61108249A (en) 1984-11-01 1984-11-01 Test system for time division exchange system

Country Status (1)

Country Link
JP (1) JPS61108249A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56125149A (en) * 1980-03-07 1981-10-01 Oki Electric Ind Co Ltd Test system for network

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56125149A (en) * 1980-03-07 1981-10-01 Oki Electric Ind Co Ltd Test system for network

Also Published As

Publication number Publication date
JPH0548652B2 (en) 1993-07-22

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