JPS61107166U - - Google Patents
Info
- Publication number
- JPS61107166U JPS61107166U JP19315284U JP19315284U JPS61107166U JP S61107166 U JPS61107166 U JP S61107166U JP 19315284 U JP19315284 U JP 19315284U JP 19315284 U JP19315284 U JP 19315284U JP S61107166 U JPS61107166 U JP S61107166U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- outer contact
- held
- tip
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第1図はこの考案による導電接触ピンの一実施
例にかかる縦断面図、第2図はこの導電接触ピン
の出力端子部への接触状態を示した要部縦断面図
である。
図中、1は導電接触ピン、2は保持スリーブ、
3は外側コンタクト、4は頭部、6は凹部、7は
スプリング、9,13は電気絶縁性カラー、10
は内側コンタクト、11は導電性中継ロツド、1
2は導電性スプリングである。
FIG. 1 is a longitudinal cross-sectional view of one embodiment of a conductive contact pin according to this invention, and FIG. 2 is a longitudinal cross-sectional view of a main part showing the state of contact of this conductive contact pin with an output terminal portion. In the figure, 1 is a conductive contact pin, 2 is a holding sleeve,
3 is an outer contact, 4 is a head, 6 is a recess, 7 is a spring, 9 and 13 are electrically insulating collars, 10
is an inner contact, 11 is a conductive relay rod, 1
2 is a conductive spring.
Claims (1)
摺動自在に挿通保持されかつ先端が被測定端子部
に対して面接触し得るように形成された円筒状の
外側コンタクトと、該外側コンタクトと上記保持
スリーブとの間に介装され該外側コンタクトをそ
の先端方向に付勢する第1のスプリング手段と、
電気絶縁性のカラーを介して上記外側コンタクト
内に出没自在に保持されかつ先端が上記被測定端
子部に対して接触し得るように形成された内側コ
ンタクトと、該内側コンタクトを上記外側コンタ
クトの先端から突出するように付勢保持する第2
のスプリング手段とを備えてなることを特徴とす
る同軸形導電接触ピン。 a cylindrical holding sleeve; a cylindrical outer contact that is slidably inserted and held within the holding sleeve and whose tip is formed so that it can make surface contact with the terminal to be measured; the outer contact and the above-mentioned a first spring means interposed between the retaining sleeve and biasing the outer contact toward its distal end;
an inner contact that is held retractably in the outer contact via an electrically insulating collar and is formed such that its tip can come into contact with the terminal to be measured; and the inner contact is connected to the tip of the outer contact. the second biased and held so as to protrude from the
A coaxial conductive contact pin comprising: a spring means;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984193152U JPH0346462Y2 (en) | 1984-12-20 | 1984-12-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984193152U JPH0346462Y2 (en) | 1984-12-20 | 1984-12-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61107166U true JPS61107166U (en) | 1986-07-07 |
JPH0346462Y2 JPH0346462Y2 (en) | 1991-10-01 |
Family
ID=30750571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984193152U Expired JPH0346462Y2 (en) | 1984-12-20 | 1984-12-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0346462Y2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
JP2007309798A (en) * | 2006-05-18 | 2007-11-29 | Espec Corp | Current/voltage probe |
JP2008191080A (en) * | 2007-02-07 | 2008-08-21 | Hioki Ee Corp | Contact probe |
JP2008191081A (en) * | 2007-02-07 | 2008-08-21 | Hioki Ee Corp | Contact probe |
WO2016072193A1 (en) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | Probe |
JP2017037064A (en) * | 2015-08-14 | 2017-02-16 | 致茂電子股▲分▼有限公司Chroma Ate Inc. | probe |
JP2019032267A (en) * | 2017-08-09 | 2019-02-28 | ヒロセ電機株式会社 | Coaxial probe |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4870154U (en) * | 1971-12-07 | 1973-09-04 |
-
1984
- 1984-12-20 JP JP1984193152U patent/JPH0346462Y2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4870154U (en) * | 1971-12-07 | 1973-09-04 |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
JP2007309798A (en) * | 2006-05-18 | 2007-11-29 | Espec Corp | Current/voltage probe |
JP2008191080A (en) * | 2007-02-07 | 2008-08-21 | Hioki Ee Corp | Contact probe |
JP2008191081A (en) * | 2007-02-07 | 2008-08-21 | Hioki Ee Corp | Contact probe |
WO2016072193A1 (en) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | Probe |
KR20170061156A (en) * | 2014-11-07 | 2017-06-02 | 가부시키가이샤 무라타 세이사쿠쇼 | Probe |
JPWO2016072193A1 (en) * | 2014-11-07 | 2017-07-20 | 株式会社村田製作所 | probe |
CN107148575A (en) * | 2014-11-07 | 2017-09-08 | 株式会社村田制作所 | Probe |
US10197598B2 (en) | 2014-11-07 | 2019-02-05 | Murata Manufacturing Co., Ltd. | Probe |
CN107148575B (en) * | 2014-11-07 | 2021-03-12 | 株式会社村田制作所 | Probe needle |
JP2017037064A (en) * | 2015-08-14 | 2017-02-16 | 致茂電子股▲分▼有限公司Chroma Ate Inc. | probe |
JP2019032267A (en) * | 2017-08-09 | 2019-02-28 | ヒロセ電機株式会社 | Coaxial probe |
Also Published As
Publication number | Publication date |
---|---|
JPH0346462Y2 (en) | 1991-10-01 |
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