JPS6110164Y2 - - Google Patents
Info
- Publication number
- JPS6110164Y2 JPS6110164Y2 JP1977020414U JP2041477U JPS6110164Y2 JP S6110164 Y2 JPS6110164 Y2 JP S6110164Y2 JP 1977020414 U JP1977020414 U JP 1977020414U JP 2041477 U JP2041477 U JP 2041477U JP S6110164 Y2 JPS6110164 Y2 JP S6110164Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- light spot
- optical system
- surface accuracy
- test object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1977020414U JPS6110164Y2 (enrdf_load_stackoverflow) | 1977-02-22 | 1977-02-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1977020414U JPS6110164Y2 (enrdf_load_stackoverflow) | 1977-02-22 | 1977-02-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS53115050U JPS53115050U (enrdf_load_stackoverflow) | 1978-09-13 |
JPS6110164Y2 true JPS6110164Y2 (enrdf_load_stackoverflow) | 1986-04-02 |
Family
ID=28851347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1977020414U Expired JPS6110164Y2 (enrdf_load_stackoverflow) | 1977-02-22 | 1977-02-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6110164Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5319412B2 (enrdf_load_stackoverflow) * | 1973-07-31 | 1978-06-21 |
-
1977
- 1977-02-22 JP JP1977020414U patent/JPS6110164Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS53115050U (enrdf_load_stackoverflow) | 1978-09-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109099859B (zh) | 大口径光学元件表面缺陷三维形貌测量装置和方法 | |
CN109975820A (zh) | 基于Linnik型干涉显微镜的同步偏振相移检焦系统 | |
US5493398A (en) | Device for observing test-piece surfaces by the speckle-shearing-method for the measurement of deformations | |
CN104515469A (zh) | 用于检查微观样本的光显微镜和显微镜学方法 | |
US9239237B2 (en) | Optical alignment apparatus and methodology for a video based metrology tool | |
JP3206984B2 (ja) | レンズ総合検査機 | |
JP2002071513A (ja) | 液浸系顕微鏡対物レンズ用干渉計および液浸系顕微鏡対物レンズの評価方法 | |
JPH0324432A (ja) | 光学系、特に眼鏡用レンズの位相検出検査用光学装置 | |
US5467192A (en) | Improvements in or relating to surface curvature measurement | |
JPH02161332A (ja) | 曲率半径測定装置及び方法 | |
CN102175150B (zh) | 具有对点、测试双探测器的红外干涉检测装置 | |
AU663922B2 (en) | Improvements in or relating to surface curvature measurement | |
JP3388285B2 (ja) | 検査装置 | |
JPS6110164Y2 (enrdf_load_stackoverflow) | ||
JP2010019798A (ja) | 表面検査方法および表面検査装置 | |
JPS60209106A (ja) | 平面度検査装置 | |
JP3637165B2 (ja) | 表面測定装置 | |
JP5325481B2 (ja) | 光学素子の測定方法及び光学素子の製造方法 | |
Lopez-Ramirez et al. | New simple geometrical test for aspheric lenses and mirrors | |
JPH05340869A (ja) | 薄膜測定器 | |
JPH01143906A (ja) | 不透明体表裏面の平行度測定装置 | |
JPS6242327Y2 (enrdf_load_stackoverflow) | ||
JPH02242103A (ja) | 多種の用途に独立かつ選択的に操作可能な光学的検査装置 | |
US2684011A (en) | Method and apparatus for measuring angles between reflecting surfaces | |
JPS6029057B2 (ja) | 三面合せ鏡式反射器の反射検査装置 |