JPS6098060U - probe - Google Patents

probe

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Publication number
JPS6098060U
JPS6098060U JP18992783U JP18992783U JPS6098060U JP S6098060 U JPS6098060 U JP S6098060U JP 18992783 U JP18992783 U JP 18992783U JP 18992783 U JP18992783 U JP 18992783U JP S6098060 U JPS6098060 U JP S6098060U
Authority
JP
Japan
Prior art keywords
probe
tested
inspects
flaw detector
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18992783U
Other languages
Japanese (ja)
Inventor
遠藤　哲男
宏 松山
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP18992783U priority Critical patent/JPS6098060U/en
Publication of JPS6098060U publication Critical patent/JPS6098060U/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の一実施例の断面図、第２図はこの考
案の実施例を説明する図、第３図はこの考案の他の実施
例を説明する図である。 図においては１は超音波探傷子、２は磁気探傷子、６は
被検材、４はハウジングである。FIG. 1 is a sectional view of one embodiment of this invention, FIG. 2 is a diagram illustrating an embodiment of this invention, and FIG. 3 is a diagram illustrating another embodiment of this invention. In the figure, 1 is an ultrasonic flaw detector, 2 is a magnetic flaw detector, 6 is a test material, and 4 is a housing.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検材の欠陥検査を行う探触子において、被検材の内部
検査を行う超音波探傷子と、被検材の表面及び表面近傍
の検査を行う磁気探傷とを一つのハウジング内に収納し
て一体化しであることを特徴とする探触子。In a probe that inspects defects in a material to be tested, an ultrasonic flaw detector that inspects the inside of the material to be tested and a magnetic flaw detector that inspects the surface and vicinity of the surface of the material to be tested are housed in one housing. A probe characterized in that it is integrated with both.
JP18992783U 1983-12-09 1983-12-09 probe Pending JPS6098060U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18992783U JPS6098060U (en) 1983-12-09 1983-12-09 probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18992783U JPS6098060U (en) 1983-12-09 1983-12-09 probe

Publications (1)

Publication Number Publication Date
JPS6098060U true JPS6098060U (en) 1985-07-04

Family

ID=30409364

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18992783U Pending JPS6098060U (en) 1983-12-09 1983-12-09 probe

Country Status (1)

Country Link
JP (1) JPS6098060U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008151588A (en) * 2006-12-15 2008-07-03 Idemitsu Eng Co Ltd Flaw evaluation method of two-layered bellows and eddy current flaw detector used therein

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008151588A (en) * 2006-12-15 2008-07-03 Idemitsu Eng Co Ltd Flaw evaluation method of two-layered bellows and eddy current flaw detector used therein

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