JPS6083943U - Optical disk birefringence inspection device - Google Patents
Optical disk birefringence inspection deviceInfo
- Publication number
- JPS6083943U JPS6083943U JP17642183U JP17642183U JPS6083943U JP S6083943 U JPS6083943 U JP S6083943U JP 17642183 U JP17642183 U JP 17642183U JP 17642183 U JP17642183 U JP 17642183U JP S6083943 U JPS6083943 U JP S6083943U
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical disk
- inspection device
- analyzer
- disk
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Optical Recording Or Reproduction (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来例の光学系を示す図、第２図は本考案の一
実施例を示す概略図、第３図は上記実施例によつが得ら
れるレターデーションと判別値にとの関係を示す線図で
ある。
３・・・・・・ディスク、６・・・・・・レーザ、７，
８・・・・・・λ／４板、９・・・・・・透明ガラス、
１０・・・・・・偏光ビームスプリッタ、１１，１２．
１３・・・・・・ホトダイオード。Fig. 1 is a diagram showing a conventional optical system, Fig. 2 is a schematic diagram showing an embodiment of the present invention, and Fig. 3 is a diagram showing the relationship between the retardation obtained in the above embodiment and the discriminant value. FIG. 3...disc, 6...laser, 7,
8...λ/4 plate, 9...Transparent glass,
10...Polarizing beam splitter, 11, 12.
13...Photodiode.
Claims (1)
直線偏光に直し、検光子で一方向の偏光成分のみを検出
することによってディスクの複屈折を検査する装置にお
いて、上記検光子に入射する光を手前で分岐して該分岐
光の光強度を検出し検光子で検出された光強度を上記分
岐光の強度で除し、この除した値でディスクの良否を判
定することを特徴とした光ディスクの複屈折検査装置。In an apparatus that inspects the birefringence of a disk by making circularly polarized light incident on the disk, converting the light that has passed through the disk into linearly polarized light, and detecting only the polarized light component in one direction with an analyzer, the light incident on the analyzer is An optical disc characterized in that the optical disc is branched in front, the optical intensity of the branched light is detected, the optical intensity detected by an analyzer is divided by the intensity of the branched light, and the quality of the disc is determined based on this divided value. Birefringence testing device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17642183U JPS6083943U (en) | 1983-11-15 | 1983-11-15 | Optical disk birefringence inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17642183U JPS6083943U (en) | 1983-11-15 | 1983-11-15 | Optical disk birefringence inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6083943U true JPS6083943U (en) | 1985-06-10 |
Family
ID=30383568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17642183U Pending JPS6083943U (en) | 1983-11-15 | 1983-11-15 | Optical disk birefringence inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6083943U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63103926A (en) * | 1986-10-21 | 1988-05-09 | Nakamichi Corp | Double reflection measuring instrument |
| JPS63103927A (en) * | 1986-10-21 | 1988-05-09 | Nakamichi Corp | Mueller matrix measuring instrument |
| JP2017181608A (en) * | 2016-03-28 | 2017-10-05 | オリンパス株式会社 | Lamellar bone microscope |
-
1983
- 1983-11-15 JP JP17642183U patent/JPS6083943U/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63103926A (en) * | 1986-10-21 | 1988-05-09 | Nakamichi Corp | Double reflection measuring instrument |
| JPS63103927A (en) * | 1986-10-21 | 1988-05-09 | Nakamichi Corp | Mueller matrix measuring instrument |
| JP2017181608A (en) * | 2016-03-28 | 2017-10-05 | オリンパス株式会社 | Lamellar bone microscope |
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