JPH07270332A - Inspection device for memory medium - Google Patents

Inspection device for memory medium

Info

Publication number
JPH07270332A
JPH07270332A JP25207693A JP25207693A JPH07270332A JP H07270332 A JPH07270332 A JP H07270332A JP 25207693 A JP25207693 A JP 25207693A JP 25207693 A JP25207693 A JP 25207693A JP H07270332 A JPH07270332 A JP H07270332A
Authority
JP
Japan
Prior art keywords
polarizer
light
storage medium
photodetector
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25207693A
Other languages
Japanese (ja)
Inventor
Koichi Kajiyama
康一 梶山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ADOMON SCI KK
NIPPON FERROFLUIDICS KK
Original Assignee
ADOMON SCI KK
NIPPON FERROFLUIDICS KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ADOMON SCI KK, NIPPON FERROFLUIDICS KK filed Critical ADOMON SCI KK
Priority to JP25207693A priority Critical patent/JPH07270332A/en
Publication of JPH07270332A publication Critical patent/JPH07270332A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Abstract

PURPOSE:To detect a defect having an optical anisotropy in an optical disk. CONSTITUTION:A first polarizer 2 and a second polarizer 4 are disposed between a light source 1 and a photodetector 5 so that vibration directions of polarized lights thereof are perpendicular to each other. An optical disk 3 is disposed between both of the polarizers 2, 4. When the optical disk 3 does not have a defect of an optical anisotropy, the light does not reach the photodetector 5. When it has a defect, birefringence occurs in the position so that the vibration directions are varied, then a part of the light can reach the photodetector 5.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明はコンパクトディスク
(CD)やレーザディスク(LD)に代表される光ディ
スク等の記憶媒体の検査装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for a storage medium such as an optical disc represented by a compact disc (CD) or a laser disc (LD).

【0002】[0002]

【従来の技術】従来、コンパクトディスクやレーザディ
スクに代表される光ディスクは、プラスチックを成型す
ることにより製造されていた。この場合に、その製造過
程で光ディスクに光学的異方性を有する欠陥が発生する
ことがあったが、製造されたディスク等の記憶媒体の検
査は専ら物理的形状に関するものが主であり、材質の光
学的異方性を有する欠陥の検査には及んでいないのが実
情であった。すなわち光ディスクに光学的異方性を有す
る欠陥が生じている場合、その欠陥部分は欠陥のない部
分に比べて光学的性質が異なるのみで、他の物理的特性
は全く同じであることから、従来の物理的特性について
の検査のみでは、光学的異方性を有する欠陥の検出は困
難であったのである。
2. Description of the Related Art Conventionally, optical discs represented by compact discs and laser discs have been manufactured by molding plastic. In this case, a defect having optical anisotropy may occur in the optical disc in the manufacturing process, but the inspection of the manufactured storage medium such as the disc is mainly related to the physical shape, and The fact is that it has not reached the inspection of defects having optical anisotropy. That is, when a defect having optical anisotropy is generated on the optical disc, the defective portion is different from the non-defect portion only in the optical property and the other physical properties are exactly the same. It was difficult to detect a defect having optical anisotropy only by inspecting the physical characteristics of the.

【0003】[0003]

【発明が解決しようとする課題】そのためこの発明の目
的は、光ディスク等の記憶媒体における光学的異方性を
有する欠陥を検出することが可能な検査装置を提供する
ことにある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an inspection apparatus capable of detecting a defect having optical anisotropy in a storage medium such as an optical disk.

【0004】[0004]

【課題を解決するための手段】そこでこの発明の記憶媒
体の検査装置は、光源1と光検知器5との間に第1偏光
子2と第2偏光子4とが配置され、上記第1偏光子2と
上記第2偏光子4との間に検査対象物たる記憶媒体3を
配置すると共に、上記第1偏光子2と上記第2偏光子4
とは、その偏光の振動方向が交差するように配置して成
り、上記光源1からの光が、上記第1偏光子2を介して
直線偏光に変換され、上記直線偏光が上記記憶媒体3と
上記第2偏光子4とを順に通過した後、上記光検知器5
に入射する構造を有することを特徴としている。
Therefore, in the inspection apparatus for a storage medium according to the present invention, the first polarizer 2 and the second polarizer 4 are arranged between the light source 1 and the photodetector 5, and the first polarizer is provided. A storage medium 3, which is an inspection object, is arranged between the polarizer 2 and the second polarizer 4, and the first polarizer 2 and the second polarizer 4 are arranged.
Is arranged such that the vibration directions of the polarized light intersect, the light from the light source 1 is converted into linearly polarized light via the first polarizer 2, and the linearly polarized light is stored in the storage medium 3 and After sequentially passing through the second polarizer 4, the photodetector 5
It is characterized in that it has a structure for incident on.

【0005】[0005]

【作用】上記の結果、光ディスク等の記憶媒体3上の光
学的異方性を有する欠陥部分を通過した直線偏光は、欠
陥のない場合とは異なる偏光を向けることによりなる。
そしてこの結果、欠陥の有無により、第2偏光子4の通
過光が変化し、これが光検知器5における光の強さの差
異となって現れる。
As a result of the above, the linearly polarized light that has passed through the defective portion having optical anisotropy on the storage medium 3 such as an optical disk is directed to the polarized light different from that when there is no defect.
As a result, the light passing through the second polarizer 4 changes depending on the presence / absence of a defect, which appears as a difference in light intensity in the photodetector 5.

【0006】[0006]

【実施例】次にこの発明の記憶媒体の検査装置の具体的
な実施例について、図面を参照しつつ詳細に説明する。
図1はこの発明の記憶媒体の検査装置の一実施例の構成
を示す斜視図、図2は上記実施例の断面図、図3は記憶
媒体に光学的異方性を有する欠陥がない場合の模式図、
図4は光学的異方性を有する欠陥がある場合のこの実施
例による作用を示した模式図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Specific embodiments of the storage medium inspection apparatus of the present invention will be described in detail with reference to the drawings.
FIG. 1 is a perspective view showing the structure of an embodiment of the storage medium inspection apparatus of the present invention, FIG. 2 is a sectional view of the above embodiment, and FIG. 3 is a case where the storage medium has no defects having optical anisotropy. Pattern diagram,
FIG. 4 is a schematic diagram showing the operation of this embodiment when there is a defect having optical anisotropy.

【0007】図1、図2において、記憶媒体の検査装置
の構成として、光源1と光検知器5との間に第1偏光子
2と第2偏光子4とが配置され、さらに第1偏光子2と
第2偏光子4との間に検査対象物としての記憶媒体、例
えば光ディスク3が配置される。ここにおいて光源1
は、電球や蛍光灯、レーザ光などが用いられるが、自然
光であってもよい。また第1偏光子2及び第2偏光子4
には、自然光等を直線偏光に変換する偏光プリズムやポ
ーラロイド等が用いられる。また光検知器5には、光の
強さを電気信号の強さに変換するフォトダイオードやC
CD等が用いられる。そして第1偏光子2と第2偏光子
4は、その偏光の振動方向が互いに直角になるように配
置される。
In FIGS. 1 and 2, as a structure of a storage medium inspection apparatus, a first polarizer 2 and a second polarizer 4 are arranged between a light source 1 and a photodetector 5, and a first polarized light is further provided. A storage medium as an inspection target, for example, an optical disk 3 is arranged between the child 2 and the second polarizer 4. Where light source 1
For example, a light bulb, a fluorescent lamp, or a laser beam is used, but it may be natural light. In addition, the first polarizer 2 and the second polarizer 4
For this, a polarizing prism or a polaroid that converts natural light or the like into linearly polarized light is used. The photodetector 5 includes a photodiode or C for converting the intensity of light into the intensity of an electric signal.
A CD or the like is used. Then, the first polarizer 2 and the second polarizer 4 are arranged such that the vibration directions of the polarized light are at right angles to each other.

【0008】次に図3、図4に基づき上記実施例におけ
る作用について説明する。まず上記構造において、光源
1からの光7は、第1偏光子2を透過することにより直
線偏光され、第1偏光子2の透過光8として光ディスク
3を透過し、光ディスク3の透過光9が第2偏光子4を
透過した後、透過光10として光検知器5に入射するよ
うになっている。
Next, the operation of the above embodiment will be described with reference to FIGS. First, in the above structure, the light 7 from the light source 1 is linearly polarized by passing through the first polarizer 2, passes through the optical disc 3 as the transmitted light 8 of the first polarizer 2, and the transmitted light 9 of the optical disc 3 becomes After passing through the second polarizer 4, the light is incident on the photodetector 5 as transmitted light 10.

【0009】この際、光ディスク3に光学的異方性を有
する欠陥部分6がなければ、図3において直線偏光であ
る透過光8は、光ディスク3を透過しても変化すること
はなく、そのまま光ディスク3の透過光9となるため、
この透過光9は第1偏光子2の透過光8と同じ直線偏光
のままである。したがって光ディスク3からの透過光9
は、第1偏光子2の偏光の振動方向と90°異なる振動
方向を有する第2偏光子4に遮られ、第2偏光子4から
の透過光10はほとんど生じず、このため光検知器5で
検知される光の強さは零又は非常に弱いものとなる。
At this time, if the optical disk 3 does not have the defect portion 6 having optical anisotropy, the transmitted light 8 which is linearly polarized light in FIG. Since it becomes the transmitted light 9 of 3,
This transmitted light 9 remains the same linearly polarized light as the transmitted light 8 of the first polarizer 2. Therefore, the transmitted light 9 from the optical disk 3
Is blocked by the second polarizer 4 having a vibration direction different from the polarization direction of the first polarizer 2 by 90 °, and almost no transmitted light 10 from the second polarizer 4 is generated. Therefore, the photodetector 5 The intensity of light detected at is zero or very weak.

【0010】これに対して光ディスク3に光学的異方性
を有する欠陥部分6があれば、図4において図3と同様
に直線偏光である第1偏光子2からの透過光8が光ディ
スク3の光学的異方性を有する欠陥部分6を透過する
際、光学的異方性を有する物質のもつ複屈折の特性等に
より、第1偏光子2からの透過光8と振動方向が異なる
直線偏光に変換されて光ディスク3からの透過光9とな
る。したがってこの透過光9の少なくとも一部は第2偏
光子4を通過して透過光10として光検知器5に入射す
る。したがって欠陥部分6のない場合に比べて、検知検
知器5で検知される光の強さが強くなり、これにより光
学的異方性を有する欠陥部分6の検出が可能となる。
On the other hand, if the optical disk 3 has a defective portion 6 having optical anisotropy, the transmitted light 8 from the first polarizer 2 which is linearly polarized light in FIG. When passing through the defect portion 6 having optical anisotropy, due to the birefringence characteristic of the substance having optical anisotropy, the transmitted light 8 from the first polarizer 2 becomes a linearly polarized light having a different vibration direction. It is converted into the transmitted light 9 from the optical disc 3. Therefore, at least a part of the transmitted light 9 passes through the second polarizer 4 and enters the photodetector 5 as the transmitted light 10. Therefore, the intensity of the light detected by the detection detector 5 becomes stronger than that in the case where there is no defective portion 6, whereby the defective portion 6 having optical anisotropy can be detected.

【0011】上記の実施例においては、第1偏光子2と
第2偏光子4は、その偏光の振動方向が互いに直角にな
るように配置されているが、これに限定されるものでは
なく、他の角度となるように配置することもできる。
In the above embodiment, the first polarizer 2 and the second polarizer 4 are arranged so that the vibration directions of the polarized lights thereof are at right angles to each other, but the invention is not limited to this. It can also be arranged at other angles.

【0012】[0012]

【発明の効果】以上のようにこの発明の記憶媒体の検査
装置においては、記憶媒体上の光学的異方性を有する欠
陥部分の検出が可能となり、記憶媒体の検査がより完全
なものとなる。
As described above, in the storage medium inspection apparatus of the present invention, it is possible to detect a defective portion having optical anisotropy on the storage medium, and the storage medium can be inspected more completely. .

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の記憶媒体の検査装置の一実施例の構
成を示す斜視図である。
FIG. 1 is a perspective view showing the configuration of an embodiment of a storage medium inspection device of the present invention.

【図2】上記実施例の断面図である。FIG. 2 is a cross-sectional view of the above embodiment.

【図3】記憶媒体に光学的異方性を有する欠陥がない場
合の模式図である。
FIG. 3 is a schematic diagram when the storage medium has no defects having optical anisotropy.

【図4】光学的異方性を有する欠陥がある場合のこの実
施例による作用を示した模式図である。
FIG. 4 is a schematic diagram showing the operation of this example when there is a defect having optical anisotropy.

【符号の説明】[Explanation of symbols]

1 光源 2 第1偏光子 3 記憶媒体 4 第2偏光子 5 光検知器 1 Light Source 2 1st Polarizer 3 Storage Medium 4 2nd Polarizer 5 Photodetector

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光源(1)と光検知器(5)との間に第
1偏光子(2)と第2偏光子(4)とが配置され、上記
第1偏光子(2)と上記第2偏光子(4)との間に検査
対象物たる記憶媒体(3)を配置すると共に、上記第1
偏光子(2)と上記第2偏光子(4)とは、その偏光の
振動方向が交差するように配置して成り、上記光源
(1)からの光が、上記第1偏光子(2)を介して直線
偏光に変換され、上記直線偏光が上記記憶媒体(3)と
上記第2偏光子(4)とを順に通過した後、上記光検知
器(5)に入射する構造を有することを特徴とする記憶
媒体の検査装置。
1. A first polarizer (2) and a second polarizer (4) are arranged between a light source (1) and a photodetector (5), and the first polarizer (2) and the above A storage medium (3) as an inspection object is arranged between the second polarizer (4) and the first polarizer.
The polarizer (2) and the second polarizer (4) are arranged so that the vibration directions of the polarized light intersect, and the light from the light source (1) is supplied to the first polarizer (2). The linearly polarized light is converted to linearly polarized light through the storage medium (3) and the second polarizer (4) in this order, and then is incident on the photodetector (5). Characteristic storage medium inspection device.
JP25207693A 1993-08-31 1993-08-31 Inspection device for memory medium Pending JPH07270332A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25207693A JPH07270332A (en) 1993-08-31 1993-08-31 Inspection device for memory medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25207693A JPH07270332A (en) 1993-08-31 1993-08-31 Inspection device for memory medium

Publications (1)

Publication Number Publication Date
JPH07270332A true JPH07270332A (en) 1995-10-20

Family

ID=17232220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25207693A Pending JPH07270332A (en) 1993-08-31 1993-08-31 Inspection device for memory medium

Country Status (1)

Country Link
JP (1) JPH07270332A (en)

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