JPS6083339A - Breaking device for resin sealed semiconductor element - Google Patents
Breaking device for resin sealed semiconductor elementInfo
- Publication number
- JPS6083339A JPS6083339A JP19207483A JP19207483A JPS6083339A JP S6083339 A JPS6083339 A JP S6083339A JP 19207483 A JP19207483 A JP 19207483A JP 19207483 A JP19207483 A JP 19207483A JP S6083339 A JPS6083339 A JP S6083339A
- Authority
- JP
- Japan
- Prior art keywords
- storage tank
- liquid
- trap
- vapor
- resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Abstract
Description
【発明の詳細な説明】
く技術分野〉
本発明は、従来型の樹脂封止半導体素子開封装置の吸引
部の気流ポンプ化をはかり、公害対策を行った装置に関
するものである。DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a conventional resin-sealed semiconductor device unsealing device in which the suction section is replaced with an airflow pump to take measures against pollution.
〈従来技術〉
第1図に、水流ポンプを使用する従来型の樹脂封止半導
体素子の開封装置の構成図を示す。<Prior Art> FIG. 1 shows a configuration diagram of a conventional resin-sealed semiconductor device unsealing device using a water pump.
図に於て、1は4&I脂溶解剤(例えば、H2SO4゜
HNO3)、はボトル、3は試料台、4は試料、5は水
流ポンプ(アスピレータ)、6Hつなぎパイプ、7は溶
解剤加熱器、8は水(市水等)であるOこの開封装置の
動作原理は、3の試料台に試料である樹脂封止半導体デ
バイス4fI:載せ、水を流して、5の水流ポンプを働
かせると、■の樹脂溶解剤(液)(液を加熱すれば、反
応速度が高くなり、溶解時間が短縮できる)は、1→3
−→5の経路で吸い出される。そのとき、3の試料台の
ところで半導体デバイスの樹脂面が溶解液と接触し、そ
の結果、デバイスの樹脂は試料台の穴の寸法で開封され
る。In the figure, 1 is a 4&I fat-dissolving agent (for example, H2SO4°HNO3), is a bottle, 3 is a sample stage, 4 is a sample, 5 is a water pump (aspirator), 6H is a connecting pipe, 7 is a dissolving agent heater, 8 is water (city water, etc.) The principle of operation of this unsealing device is that when the resin-sealed semiconductor device 4fI, which is a sample, is placed on the sample stage in 3, water is run, and the water flow pump in 5 is activated, ■ The resin dissolving agent (liquid) (heating the liquid increases the reaction rate and shortens the dissolution time) is 1→3
It is sucked out via route -→5. At this time, the resin surface of the semiconductor device comes into contact with the solution at the sample stage 3, and as a result, the resin of the device is unsealed to the size of the hole in the sample stage.
しかしながら、この装置には以下のような欠点がある。However, this device has the following drawbacks.
(イ)水流ポンプを用いるために樹脂溶解に多量の水を
必要とする。(a) Since a water pump is used, a large amount of water is required to dissolve the resin.
(ロ) 5の所で溶解使用済み液とポンプ水とが混合す
る。この溶解液は通常H2SO4、HNO3等の強酸を
用いるので、混合液は酸性の液体になり、この状態では
下水道に簡単に放出できないofた、この混合液を貯蔵
するには非常に大きな貯蔵タンクが必要となる0
〈発明の目的〉
本発明の目的は、上記従来装置の欠点を除去した開封装
置を提供することにある。(b) At point 5, the dissolved used liquid and pump water mix. This solution usually uses strong acids such as H2SO4 and HNO3, so the mixed solution becomes an acidic liquid, and in this state it cannot be easily discharged into the sewer, and a very large storage tank is required to store this mixed solution. Required 0 <Object of the Invention> An object of the present invention is to provide an opening device that eliminates the drawbacks of the conventional devices described above.
〈実施例〉
第2図に本発明に係る樹脂封止半導体素子の開封装置の
構成図を示す。<Example> FIG. 2 shows a configuration diagram of an unsealing device for a resin-sealed semiconductor element according to the present invention.
図に於て、11は樹脂溶解剤、12はボトル、13け試
料台、14け試料、15は溶解剤加熱器、16は溶解剤
入口、17は使用済み液貯蔵用タンク、18はつなぎパ
イプ、19は使用済み液取り出し口、20け蒸気トラッ
プ、21はトラップ材(ガラスウール、ガラス玉)、2
2は気流ポンプ、23は排気ガス・ドラッグ、’24I
iトラップ材、25は溶解剤蒸気トラップ、26は高圧
ガス(空気、N2)のボンベである。In the figure, 11 is a resin dissolving agent, 12 is a bottle, 13 sample stands, 14 samples, 15 is a dissolving agent heater, 16 is a dissolving agent inlet, 17 is a used liquid storage tank, and 18 is a connecting pipe. , 19 is a used liquid outlet, 20 is a steam trap, 21 is a trap material (glass wool, glass beads), 2
2 is airflow pump, 23 is exhaust gas drag, '24I
i-trap material, 25 is a dissolving agent vapor trap, and 26 is a high-pressure gas (air, N2) cylinder.
この装置の特徴は、
(a) 水流ポンプを気流ポンプ(空気エジェクター又
はコンバムとも呼ばれている)に変更した点。The features of this device are: (a) The water pump has been replaced with an air pump (also called an air ejector or combum).
(b) 使用済み液の貯蔵タンクを追加した点。(b) Addition of a used liquid storage tank.
(c)溶解液の蒸気ミストのトラップ10,13゜15
を付加した点。(c) Trap of vapor mist of dissolved liquid 10, 13° 15
The point added.
にあり、上記(a) 、 (b) 、 (C)により公
害防止を行った樹脂溶解装置である。This is a resin melting device in which pollution is prevented by the above (a), (b), and (C).
この装置の動作原理は、半導体デバイスを13の試料台
に載せ、22の気流ポンプを動作させると、溶解剤は、
11→13→17の経路で吸い出される。使用済み液は
7の貯蔵タンクに貯蔵される。その結果、溶解液は装置
外に出ることはなく、水質汚染を起こさない。また、こ
の貯蔵タンクは溶解液だけを貯蔵するので小さいタンク
で良い。The operating principle of this device is that when a semiconductor device is placed on a 13 sample stage and 22 airflow pumps are operated, the dissolving agent is
It is sucked out along the route 11 → 13 → 17. The used liquid is stored in 7 storage tanks. As a result, the dissolved solution does not leak out of the device and does not cause water pollution. Furthermore, since this storage tank stores only the solution, it can be a small tank.
溶解時間を短縮するために溶解液を高温に加熱する方法
が一般的に取られている。溶解液を高温に加熱した場合
に、溶解液が蒸発したシ、或いは分解したりして、大気
中に飛散し、大気汚染を起こす。その発生場所は、工2
の溶解液ボトル及び17の溶解使用済み液貯蔵タンクの
2箇所である。In order to shorten the dissolution time, a method of heating the dissolution solution to a high temperature is generally used. When the solution is heated to a high temperature, the solution evaporates or decomposes and scatters into the atmosphere, causing air pollution. The location of the occurrence is
There are two locations: 17 dissolving liquid bottles and 17 used dissolving liquid storage tanks.
そこで、上記12.17で発生する蒸気あるいは分解ガ
スを、25,20.23の蒸気ミスト・トラップで除去
し、大気汚染を防止する。なお、21.24には、ガラ
ス玉、或いはガラスウール竺3トラップ内部に挿入し、
トラップ効率を上げている。Therefore, the steam or decomposition gas generated in 12.17 above is removed by the steam mist trap 25 and 20.23 to prevent air pollution. In addition, in 21.24, insert a glass ball or glass wool cloth into the 3 trap,
Increases trap efficiency.
〈効 果〉
以上詳細に説明したように本発明によれば、従来装置の
欠点全除去できる、きわめて有用な樹脂封止半導体素子
開刺装Rを得ることができるものである。<Effects> As described in detail above, according to the present invention, it is possible to obtain an extremely useful resin-sealed semiconductor device puncture R that can eliminate all the drawbacks of conventional devices.
第1図は従来型の樹脂封止半導体素子開封装置の構成図
、第2図は本発明に係る樹脂制止半導体素子開封装置の
構成図である。
符号の説明
11:樹脂溶解剤、12:ボトル、13:試料台、14
:試料、15:溶解剤加熱器、16:溶解剤入口、17
:使用済み液貯蔵用タンク、18二つなぎパイプ、19
:使用済み液取り出し口、20′:蒸気ドラッグ、21
:トラップ材、22:気流ポンプ、23:排気・ガス・
トラップ、24ニドラツプ材、25:溶解剤蒸気トラッ
プ、26:高圧ガス・ボンベ1.。FIG. 1 is a block diagram of a conventional resin-sealed semiconductor element unsealing apparatus, and FIG. 2 is a block diagram of a resin-sealed semiconductor element unsealer according to the present invention. Explanation of symbols 11: Resin dissolving agent, 12: Bottle, 13: Sample stand, 14
: Sample, 15: Solving agent heater, 16: Solving agent inlet, 17
: Used liquid storage tank, 18 two-piece pipe, 19
: Used liquid outlet, 20': Steam drag, 21
: Trap material, 22: Air flow pump, 23: Exhaust/gas/
Trap, 24 Nidrap material, 25: Solvent vapor trap, 26: High pressure gas cylinder1. .
Claims (1)
溶解剤の蒸気トラップをもつことで、大気汚染及び水質
汚染を防止したことを特徴とする樹脂封止半導体素子開
封装置。1. An unsealing device for resin-sealed semiconductor devices, which is characterized by having an air flow pump, a storage tank for the resin-dissolved liquid, and a vapor trap for the dissolving agent, thereby preventing air pollution and water pollution.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19207483A JPS6083339A (en) | 1983-10-13 | 1983-10-13 | Breaking device for resin sealed semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19207483A JPS6083339A (en) | 1983-10-13 | 1983-10-13 | Breaking device for resin sealed semiconductor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6083339A true JPS6083339A (en) | 1985-05-11 |
Family
ID=16285196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19207483A Pending JPS6083339A (en) | 1983-10-13 | 1983-10-13 | Breaking device for resin sealed semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6083339A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62286763A (en) * | 1986-06-04 | 1987-12-12 | Ricoh Co Ltd | Drive control method for thermal head |
JPS63187331U (en) * | 1987-05-26 | 1988-11-30 |
-
1983
- 1983-10-13 JP JP19207483A patent/JPS6083339A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62286763A (en) * | 1986-06-04 | 1987-12-12 | Ricoh Co Ltd | Drive control method for thermal head |
JPS63187331U (en) * | 1987-05-26 | 1988-11-30 |
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