JPS6077424A - Mask securing device of x-ray exposure apparatus - Google Patents

Mask securing device of x-ray exposure apparatus

Info

Publication number
JPS6077424A
JPS6077424A JP58184993A JP18499383A JPS6077424A JP S6077424 A JPS6077424 A JP S6077424A JP 58184993 A JP58184993 A JP 58184993A JP 18499383 A JP18499383 A JP 18499383A JP S6077424 A JPS6077424 A JP S6077424A
Authority
JP
Japan
Prior art keywords
mask
chuck
coil
leakage
base material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58184993A
Other languages
Japanese (ja)
Inventor
Tomohiro Kuji
久迩 朝宏
Yukio Kenbo
行雄 見坊
Mitsuyoshi Koizumi
小泉 光義
Hiroshi Makihira
牧平 坦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58184993A priority Critical patent/JPS6077424A/en
Publication of JPS6077424A publication Critical patent/JPS6077424A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/707Chucks, e.g. chucking or un-chucking operations or structural details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PURPOSE:To secure a mask in high reliability by providing an electromagnet to a member for mounting the mask, and attracting the mask of a magnetic substrate. CONSTITUTION:A mask chuck 1' is composed of a magnetic material, a coated wire 15 is wound on the outer periphery to form a coil 15. When the coil 15 is energized, the chuck 1' becomes a cylindrical magnet. When a mask substrate 6' is composed of a ferromagnetic material, the chuck l' attracts fixedly by the magnetic force the mask 6'. The attracting force can be arbitrarily controlled by the number of turns of the coil 15 and the current value, and when the current is interrupted, the attraction can be released. With this structure, no vacuum is used, a loss of He leakage or a vibration of the mask 6' due to the variation in the attracting force and the leakage amount can be eliminated. Ultrafine dust particles in the He are not attracted to the attracting surface of the mask due to He leakage current, and the X-ray exposure mask can be reliably secured.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はX線露光装置において、パターンを設けたマス
クを装着して固定する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to an apparatus for mounting and fixing a patterned mask in an X-ray exposure apparatus.

〔発明の背景〕[Background of the invention]

従来、露光装置のマスク固定装置は一般に真空吸着法が
用いられでいる。
Conventionally, a vacuum suction method has generally been used for a mask fixing device of an exposure apparatus.

可視光乃至近紫外光重よる露光においては、露光に用い
るマスクの基材が数に711厚さのガラスであるため、
真空吸着によって均等な力でマスクを吸着固定すること
かでき、マスクチャックO吸着面が平坦であればマスク
にほとんど歪を与えない。
In exposure using visible light to near ultraviolet light, the base material of the mask used for exposure is glass with a thickness of 711 mm.
The mask can be suctioned and fixed with uniform force by vacuum suction, and if the suction surface of the mask chuck O is flat, almost no distortion will be caused to the mask.

第1因は従来技術におけるマスクの真空吸着装置を示す
。円筒形のマスクチャックlのマスク吸着面3の全周に
溝2か設けられ、この溝2ま連通路4、パイプ5を介し
て真空ポンプ(図第2図は、上記のマスク吸着装置によ
ってマスクを吸着した状態を示す。マスクはリング状の
基材6に数μmn厚のメンブレン78貼着し、このメン
ブレン7上にパターン(図示せず)を形成しである。上
記の基材6は、従来一般にシリコンウェハの中央部を打
ち抜いた構成のものが用いられる。
The first factor shows a vacuum suction device for a mask in the prior art. A groove 2 is provided on the entire circumference of the mask suction surface 3 of the cylindrical mask chuck l, and the groove 2 is connected to a vacuum pump (Fig. The mask is made by adhering a membrane 78 with a thickness of several μm to a ring-shaped base material 6, and forming a pattern (not shown) on this membrane 7.The above base material 6 is Conventionally, a structure in which the central portion of a silicon wafer is punched out is generally used.

焼料転写を受けるべきウェハ10と前記のマスクとは間
隔g(通常数μm乃至数十μm)を介して正対せしめら
れ、X 心源(図示せず)からX線98照射してメンブ
レン7上のパターンがウェハ10上に焼付転写される。
The wafer 10 to be subjected to pyrography transfer and the mask are directly opposed to each other with a gap g (usually several μm to several tens of μm), and the membrane 7 is irradiated with X-rays 98 from an X-ray source (not shown). The upper pattern is printed and transferred onto the wafer 10.

こうした装fllこおいて、X線9が通過する雰囲気8
は壁12で償い、ヘリウムガスを満たしてX線の減衰を
防止している。
In this setup, the atmosphere 8 through which the X-rays 9 pass
is compensated for by a wall 12 and filled with helium gas to prevent X-ray attenuation.

上述した従来のX&露光装置用マスク装着固定装置にお
いては次記のような技術的不具合が有る。
The conventional mask mounting and fixing device for an X&exposure device described above has the following technical problems.

(イ)マスクチャック1とマスク基材6との間における
漏洩を完全に無くすることは困難で、矢印13の如く若
干のヘリウムが真空に引かれて漏洩する。このためヘリ
ウムが無益に消費される。
(a) It is difficult to completely eliminate leakage between the mask chuck 1 and the mask base material 6, and some helium is drawn into the vacuum and leaks as shown by arrow 13. This wastes helium.

(リ 真空吸着力の変動、若しくは上記の漏洩量の変動
によって内圧が変動し、その結果メンブレン7が振動し
て間隔gが不安定となり転写パターン像に位置ずれやボ
ケを生じる。
(Li) The internal pressure fluctuates due to fluctuations in the vacuum adsorption force or fluctuations in the amount of leakage described above, and as a result, the membrane 7 vibrates, making the interval g unstable and causing misalignment or blurring of the transferred pattern image.

(ハ)焼付転写はクリーンな雰囲気で行われるが、塵埃
の混入の絶無は期し難い。微小な塵埃粒子かへリウ゛ム
雰囲気8 P3に混入した場合、この微小粒子がイア遊
しているだけであれば直接的には重大な問題を生じない
が、矢印13の漏洩流に乗ってマスクチャック1とマス
ク基材6との間に侵入すると、次回の焼付操作の際に次
回のマスクを歪ませる虞れが有る。
(c) Printing transfer is performed in a clean atmosphere, but it is difficult to guarantee that there will be no dust. If minute dust particles get mixed into the helium atmosphere 8 P3, they will not directly cause a serious problem if they are just floating around in the air, but they will ride the leakage flow shown by arrow 13 and leak into the mask chuck. 1 and the mask base material 6, there is a risk that the next mask will be distorted during the next printing operation.

〔発明の目的〕[Purpose of the invention]

本発明は上述した従来技術の入点を解消すべく為され、
その目的とするところは、ヘリウムを無益に漏失させる
虞れ無く、真空吸着力の変動や漏洩流量の変動によって
メンブレンに振動を与えて転写パターンに悪影響を及ぼ
す虞れが無く、ヘリウム雰囲気〒の塵埃粒子を漏洩気流
によつ゛Cマスク吸着四に1ジ着せしめる虞れの無い、
X踪露光装置用のマスク固定装置を提供するにある。
The present invention has been made to solve the problems of the prior art described above,
The purpose of this is to eliminate the risk of helium being leaked uselessly, and to prevent dust from forming in the helium atmosphere by causing vibrations to the membrane due to fluctuations in the vacuum adsorption force or fluctuations in the leakage flow rate, which may adversely affect the transferred pattern. There is no risk of particles being absorbed by the C mask due to leakage airflow.
To provide a mask fixing device for an X-ray exposure device.

〔発明の概要〕[Summary of the invention]

上記の目的を達成するため、本発明の固定装置は、X線
源から発したX線を、マスクを透してウェハの上に照射
し、上記のマスク上に設けたパターンをウェハ上に焼付
転与fるX線露光装置において、マスクを装着する部材
にIに磁石を設りるとともに、該マスクの基材7il−
磁性体を用いで構成し、前記・電磁石の磁力によって上
記のマスクを・吸着、固定し得べく為したることを特徴
とする。
In order to achieve the above object, the fixing device of the present invention irradiates the wafer with X-rays emitted from an X-ray source through a mask, and prints a pattern provided on the mask onto the wafer. In an X-ray exposure apparatus, a magnet is provided on the member to which the mask is mounted, and a magnet is provided on the base material 7il- of the mask.
It is characterized in that it is constructed using a magnetic material, and that the mask can be attracted and fixed by the magnetic force of the electromagnet.

〔発明の実施例〕[Embodiments of the invention]

次に、木兄りjの1実施例を第3図について説明する。 Next, one embodiment of the Kienori j will be described with reference to FIG.

磁性材料によってマスクナヤツク1′を構成し、その外
周に被覆層線147j−巻回してコイル15を形成する
。上記のコイル15に通電するとマスクチャック1′は
円筒状の磁石となる。
A mask kayak 1' is made of a magnetic material, and a coil 15 is formed by winding a covering layer wire 147j around its outer periphery. When the coil 15 is energized, the mask chuck 1' becomes a cylindrical magnet.

一方、マスク基材6′を磁性体で構成する。これにより
、マスクチャック1はマスクを磁力で吸着、固定できる
ようになる。吸着力はコイル150巻数と電流値によっ
て任意に制御することができ、通電を断てば吸着力を解
除することもできる。
On the other hand, the mask base material 6' is made of a magnetic material. This allows the mask chuck 1 to magnetically attract and fix the mask. The attraction force can be arbitrarily controlled by the number of turns of the coil 150 and the current value, and the attraction force can be canceled by cutting off the current.

上記と異なる実施例として、マスク基材6を非磁性体で
構成し、磁性体製の補強リングをこれに貼着することも
できる。要は、マスクの基材部分の少なくとも一部に磁
性材料を使用することによって磁力吸着の機能を果たす
ことができる。
As a different embodiment from the above, the mask base material 6 may be made of a non-magnetic material, and a reinforcing ring made of a magnetic material may be attached thereto. In short, by using a magnetic material for at least a portion of the base material portion of the mask, the function of magnetic attraction can be achieved.

第4図は前記と異なる実施例を示す。第3図と同一の図
面参照番号を付したマスクチャック1′、被覆電線14
.コイル15は前記の実施例(第3図)におけると同様
乃至は類似の構成部材である。本実施例においてはコイ
ル15と吸着面16との間にパイプ17を巻きイ」けて
冷却水を流通循環せしめ得るように榴成しである。本実
施例によれば、コイル15の通電に起因する発熱がマス
ク吸着面16を経てマスクに伝わって熱歪を起こす虞れ
が無い。
FIG. 4 shows an embodiment different from the above. Mask chuck 1' and covered electric wire 14 with the same drawing reference numbers as in Fig. 3
.. Coil 15 is the same or similar component as in the previous embodiment (FIG. 3). In this embodiment, a pipe 17 is wound between the coil 15 and the suction surface 16 so that cooling water can be circulated. According to this embodiment, there is no possibility that heat generated due to energization of the coil 15 will be transmitted to the mask via the mask adsorption surface 16 and cause thermal distortion.

図示しないが、マスクチャック1′の支承部とコイル1
5との間に冷却用のパイプを設けることもできる。これ
によりコイル15の発熱によってマスクチャック1′の
支承状態に悪影響を及ぼす處れが無くなる。
Although not shown, the support part of the mask chuck 1' and the coil 1
A cooling pipe may also be provided between the 5 and 5. This eliminates the possibility that the heat generated by the coil 15 will adversely affect the supporting state of the mask chuck 1'.

以上に説明した実施例においては、真空吸着によらずに
マスク基材6を吸着固定するので、ヘリウムの漏洩を生
じる虞れが無く、ヘリウムを無益に消費する虞れが無い
。また真空吸着力や漏洩ヘリウム流量の変動によってメ
ンブレンに振動を与える虞れも無い。その上、ヘリウム
雰囲気中に浮遊している微小な塵埃粒子がヘリウム漏洩
流によってマスク吸着面に吸い込まれて付着する虞れが
無い。
In the embodiment described above, since the mask base material 6 is suctioned and fixed without using vacuum suction, there is no risk of leakage of helium and no risk of wasting helium. Furthermore, there is no risk of vibrations being imparted to the membrane due to fluctuations in vacuum suction force or leakage helium flow rate. Furthermore, there is no risk that minute dust particles floating in the helium atmosphere will be sucked into the mask suction surface by the helium leakage flow and adhere to the mask.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように、本発明によればヘリウムを無益に
漏失する虞れが無く、真空吸着力や漏洩流量の変動によ
って転写パターンに悪影響を及ぼす虞れが無く、シかも
ヘリウム雰囲気中に浮遊する微小な塵埃粒子を漏洩気流
によってマスク吸着面に吸込み付着させる虞れも無い。
As described in detail above, according to the present invention, there is no risk of helium leaking out uselessly, there is no risk of adverse effects on the transferred pattern due to fluctuations in vacuum adsorption force or leakage flow rate, and there is no risk of helium floating in the helium atmosphere. There is also no risk that minute dust particles caused by leakage airflow will be sucked in and adhered to the mask suction surface.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のマスク吸着装置の1例の垂直断面図、第
2図は上記のマスク吸着装置によってマスクを吸着固定
した状態を示す垂直断面図、第3図は本発明のX線露光
装置のマスク固定装置の1実施例の部分的垂直断面図、
第4図は上記と異なる実施例の部分的断面図である。 1.1′・・・マスクチャック。 2・・・溝、 3・・・吸着面。 4・・・連通路、 5・・・パイプ。 6.6′・・・マスクの基羽。 7・・・メンブレン、8・・・ヘリウム雰囲気。 9・・、X線、10・・・ウェハ。 12・・・壁、13・・・ヘリウム漏洩流。 オl閃 f″3図 5 第4図
FIG. 1 is a vertical sectional view of an example of a conventional mask suction device, FIG. 2 is a vertical sectional view showing a state in which a mask is suctioned and fixed by the above mask suction device, and FIG. 3 is an X-ray exposure device of the present invention. a partial vertical cross-sectional view of an embodiment of the mask fixing device of;
FIG. 4 is a partial sectional view of an embodiment different from the above. 1.1'...Mask chuck. 2...Groove, 3...Adsorption surface. 4...Communication path, 5...Pipe. 6.6'...Basis of the mask. 7... Membrane, 8... Helium atmosphere. 9..., X-ray, 10... wafer. 12...Wall, 13...Helium leakage flow. Figure 4

Claims (1)

【特許請求の範囲】 1、X線源から発したX線を、マスクを透してウェハの
上に照射し、上記のマスク上に設けたパターンをウェハ
上に焼付転写するX線露光装置において、マスクを装着
する部材に電磁石を設けるとともに、該マスクの基材を
磁性体を用いて構成し、前記電磁石の磁力によって上記
のマスクを吸着、固定し得べく為したることを特徴とす
るX線露光装置のマスク固定装置。 2、前記のマスクの基材に用いる磁性体は、これを板状
に形成してマスクの基材部分に貼着したものであること
を特徴とする特許請求の範囲第1項に記載のX線露光装
置の固定装置。 3、 前記のマスクを装着する部材は、冷却用の流体を
流通せしめる流路を設けたものであることを特徴とする
特許請求の範囲第1項又は 1置。
[Claims] 1. In an X-ray exposure device that irradiates X-rays emitted from an X-ray source onto a wafer through a mask and prints and transfers a pattern provided on the mask onto the wafer. X, characterized in that an electromagnet is provided on the member to which the mask is attached, and the base material of the mask is made of a magnetic material, so that the mask can be attracted and fixed by the magnetic force of the electromagnet. Mask fixing device for line exposure equipment. 2. X according to claim 1, wherein the magnetic material used for the base material of the mask is formed into a plate shape and adhered to the base material portion of the mask. Fixing device for line exposure equipment. 3. The member for attaching the mask is provided with a flow path through which a cooling fluid flows.
JP58184993A 1983-10-05 1983-10-05 Mask securing device of x-ray exposure apparatus Pending JPS6077424A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58184993A JPS6077424A (en) 1983-10-05 1983-10-05 Mask securing device of x-ray exposure apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58184993A JPS6077424A (en) 1983-10-05 1983-10-05 Mask securing device of x-ray exposure apparatus

Publications (1)

Publication Number Publication Date
JPS6077424A true JPS6077424A (en) 1985-05-02

Family

ID=16162908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58184993A Pending JPS6077424A (en) 1983-10-05 1983-10-05 Mask securing device of x-ray exposure apparatus

Country Status (1)

Country Link
JP (1) JPS6077424A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6433927A (en) * 1987-07-30 1989-02-03 Canon Kk Mask holder and mask conveying method using the same
EP0361516A2 (en) * 1988-09-30 1990-04-04 Canon Kabushiki Kaisha Method of making X-ray mask structure
US4963921A (en) * 1985-06-24 1990-10-16 Canon Kabushiki Kaisha Device for holding a mask

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4963921A (en) * 1985-06-24 1990-10-16 Canon Kabushiki Kaisha Device for holding a mask
JPS6433927A (en) * 1987-07-30 1989-02-03 Canon Kk Mask holder and mask conveying method using the same
EP0361516A2 (en) * 1988-09-30 1990-04-04 Canon Kabushiki Kaisha Method of making X-ray mask structure

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