JPS6065791A - Apparatus for liquid-phase epitaxial crystal growth - Google Patents

Apparatus for liquid-phase epitaxial crystal growth

Info

Publication number
JPS6065791A
JPS6065791A JP17531883A JP17531883A JPS6065791A JP S6065791 A JPS6065791 A JP S6065791A JP 17531883 A JP17531883 A JP 17531883A JP 17531883 A JP17531883 A JP 17531883A JP S6065791 A JPS6065791 A JP S6065791A
Authority
JP
Japan
Prior art keywords
melt
hole
substrate
crystal
slider
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17531883A
Other languages
Japanese (ja)
Inventor
Nobuyasu Hase
長谷 亘康
Yoichi Sasai
佐々井 洋一
Minoru Kubo
実 久保
Masato Ishino
正人 石野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP17531883A priority Critical patent/JPS6065791A/en
Publication of JPS6065791A publication Critical patent/JPS6065791A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/06Reaction chambers; Boats for supporting the melt; Substrate holders
    • C30B19/068Substrate holders

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To form a plurality of uniform multi-layered epitaxial layers on plural substrates at the same time, by boring a hole for holding substrate crystals to a slider, placing plural substrates in the hole, and introducing and discharging plural kinds of melt sources successively to the hole. CONSTITUTION:The slider 32 is provided with the hole 34 for holding substrate crystals, and a plurality of substrate crystals 3 are put into the hole 34. The melt sources 1-1', 1-2', etc. are melted completely by heating the growth boat as a whole. The molten melt sources are cooled to a proper temperature, the hole 34 is shifted by operating the handle 14 to transfer the melt source 1-1' to the hole 34, and the epitaxial growth on the substrate crystal 3 is carried out. The hole 34 for holding substrate crystal is shifted again by operating the handle 34 to discharge the melt source 1-1' through the discharging port 37 to the waste liquid reservior 36. The above operations are repeated to form multi-layered epitaxial layers on a plurality of substrates 3 at the same time.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は基板結晶ヒへのエピタキンヤル結晶成長分野に
おける液相法にJ:るエピタキシャル結晶の成長装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to an apparatus for growing epitaxial crystals using a liquid phase method in the field of epitaxial crystal growth on substrate crystals.

従来例の構成とその問題点 基板結晶上への同様もしくは異種結晶のエピタキシャル
結晶の成長技術の1つとして、液相法によるエピタキシ
ャル結晶の成長技術は従来がら広く利用され、且つ最も
重要な成長技術の−っである1、特に最近では光利用技
術に関連して、化合物半導体ケ利用したレーブス・ぜ子
や受光素子あるいは高速動作電気回路素子の大男にとっ
て、液相法Vこよる化合物半導体のエピタキシャル結晶
の成長技術は欠かすことのできない基本的な要素技術の
一つである。
Structure of conventional examples and their problems As one of the techniques for growing epitaxial crystals of the same or different type on substrate crystals, the epitaxial crystal growth technique by liquid phase method has traditionally been widely used, and is the most important growth technique. 1. Especially recently, in relation to optical technology, the liquid-phase method V-based compound semiconductors have become popular with Rebus-Zeko, a leading man in the field of photodetectors and high-speed operation electric circuit elements, who have used compound semiconductors. Epitaxial crystal growth technology is one of the essential fundamental technologies.

液相法によるエピタキシャル結晶の成長に際して用いら
れる基本的な治具としてエピタキシャル結晶の成長ボー
トがあり、以下ではこの成長ボートの従来例について説
明する。
An epitaxial crystal growth boat is a basic jig used in growing an epitaxial crystal by a liquid phase method, and a conventional example of this growth boat will be described below.

第1図は液相法によるエピタキシャル結晶の成長に用い
られる成長ボートの概略図である。成長ボート全体は全
て高純度カーボンで構成さ扛、図に示すように複数個の
メルト溜め1−1.1−2゜1−3.・・・・をもった
メルト保持部11、エピタキシャル成長のための基板設
置部2を設けたスライダ一部分12および下部土台部1
3から成っている。この様な成長ボートを用いて実際に
液相法によるエピタキシャル結晶の成長を行う方法を次
に説明を簡単にするため、以下では1μm素子の基本的
な構造となる第2図に示したようなInP基板上への4
層エピタキシャル結晶の例について示す。同図はInP
基板3上に連続的に成長したInPバッファ一層22 
、 InGaAsP活性層23.InPクラッド層24
 、 InGaAsPキャップ層25から成るエピタキ
シャル結晶を成長せしめた例である。
FIG. 1 is a schematic diagram of a growth boat used for growing epitaxial crystals by a liquid phase method. The entire growth boat is made of high-purity carbon, and has multiple melt reservoirs 1-1.1-2.1-3. as shown in the figure. . . . a melt holding section 11, a slider portion 12 provided with a substrate installation section 2 for epitaxial growth, and a lower base section 1.
It consists of 3. In order to simplify the explanation of how to actually grow epitaxial crystals by the liquid phase method using such a growth boat, we will use the basic structure of a 1 μm device as shown in Figure 2 below. 4 onto InP substrate
An example of a layered epitaxial crystal will be shown. The figure shows InP
InP buffer layer 22 continuously grown on the substrate 3
, InGaAsP active layer 23. InP cladding layer 24
This is an example in which an epitaxial crystal consisting of an InGaAsP cap layer 25 is grown.

このようなエピタキシャル結晶の成長を第1図に示した
成長ボートを用いて実施する場合、まず成長ボートには
第3図にその断面図で示したようにInP基板3とメル
ト溜め1−2には基鈑表面の汚染物や加工傷等を除去す
るために基板表面層をとかしこむメルトバック用In或
はIn と僅かのInF3.(加えたメルトバック用ソ
ースト21入れる。次いでメルト溜め1−3 、1−4
 、1−5 。
When such epitaxial crystal growth is carried out using the growth boat shown in Fig. 1, first the InP substrate 3 and the melt reservoir 1-2 are placed in the growth boat as shown in the cross-sectional view of Fig. 3. In is used for meltback to melt the substrate surface layer to remove contaminants and processing scratches on the substrate surface, and a small amount of InF3. (Put in the added melt bag sauce 21. Next, melt reservoirs 1-3 and 1-4
, 1-5.

1−6には夫々第2図)InPバッフ 7 f?’−+
 2” rInGaAsP活性層23.1nPクラッド
層24゜InGaAsPキャップ層25を形成するため
の各ソース材料1−3’、 1−4’・・・・・全メル
ト用In と共に規定量入れ、更に基板1nP3の上部
には晶泥下でのInP基板面上の熱損傷ヶ防止するため
に別のInPAをかぶせた後、成長ボート全体を電気炉
に入れ、水素雰囲気中で通常650℃以上に丑で温度を
あげて、メルト溜めの中の各ソース桐材を充分に融解せ
しめる。
1-6 respectively (Figure 2) InP buffer 7 f? '−+
2" rInGaAsP active layer 23. 1nP cladding layer 24. Each source material 1-3', 1-4' for forming InGaAsP cap layer 25. A specified amount is added together with In for the whole melt, and the substrate 1nP3 After covering the top of the growth boat with another layer of InPA to prevent thermal damage on the InP substrate surface under the crystal mud, the entire growth boat is placed in an electric furnace and heated to a temperature usually above 650°C in a hydrogen atmosphere. to fully melt each source paulownia wood in the melt reservoir.

次いで電気炉の温度全徐冷しないから(通常0.5〜1
℃10)、スライダー12の一端に設けられた引出し棒
14でもってスライダー12を移動し、InP基板3が
メルト溜め1−2の下に来るように動かす。ここで基板
3の表面はメルトバック溶液に表面の数μmだけとかさ
れきれいにされた後、引出し棒14で更にメルト溜め1
−3に入っているlnPバッファ一層形成のための溶液
1−3′の下に移動させ、第2図のInPバッファ一層
の形成が行われる。
Next, the temperature of the electric furnace is not completely slowly cooled (usually 0.5 to 1
10), move the slider 12 using the pull-out rod 14 provided at one end of the slider 12 so that the InP substrate 3 is located below the melt reservoir 1-2. Here, the surface of the substrate 3 is cleaned by combing only a few micrometers of the surface with the meltback solution, and then the melt reservoir 1 is further removed using the pull-out rod 14.
The solution 1-3' for forming a single layer of InP buffer contained in 1-3 is moved below, and a single layer of InP buffer as shown in FIG. 2 is formed.

以下同様の手続でメルト溜め1−6′の点で1nGaA
sPキャッAs形成用メル)1−6’によって第2図の
InGaAsPキャップ層25の形成が行われた後、ス
ライダー12上の基板2はメルト溜めの外側まで引出し
、急冷することによって第2図に示した4層のエピタキ
シャル結晶が基板InF3上に形成されることになる。
Following the same procedure, 1nGaA is obtained at the point of melt reservoir 1-6'.
After the InGaAsP cap layer 25 shown in FIG. 2 is formed by the sP cap As forming melt 1-6', the substrate 2 on the slider 12 is pulled out to the outside of the melt reservoir and rapidly cooled to form the InGaAsP cap layer 25 shown in FIG. The four epitaxial crystal layers shown will be formed on the substrate InF3.

この際第2図の各エピタキシャル結晶22〜25の厚さ
は、夫々の形成時の温度、成長時間、ソース材料等によ
って決定することが出来る。
At this time, the thickness of each epitaxial crystal 22 to 25 shown in FIG. 2 can be determined by the temperature at the time of formation, growth time, source material, etc.

ところで、前記の成長ホートラ用いた液相法によるエピ
タキシャル結晶の成長では1度の成長過程で1枚の基板
上へのエピタキシャル結晶を得るにすぎず、又、各成長
過程毎にメルト溜めに充填するソース材料の秤量バラツ
キ、成長時間のバラツキ、成長温度の僅かな誤差等々の
原因により得られたエピタキシャル結晶自体の組成変動
、特性変動が生ずる可能性は極めて大きい。従って、特
性の揃ったデバイス、例えばレーザ素子鶴の量産性とい
った面からみると上述したエピタキシャル結晶の成長法
は極めて効率の悪い手法であるものと考えられる。
By the way, in the growth of epitaxial crystals by the liquid phase method using the above-mentioned growth hole, epitaxial crystals are only grown on one substrate in one growth process, and the melt reservoir is filled in each growth process. There is an extremely high possibility that variations in the composition and characteristics of the obtained epitaxial crystal itself will occur due to factors such as variations in the weight of the source material, variations in the growth time, and slight errors in the growth temperature. Therefore, from the standpoint of mass production of devices with uniform characteristics, such as laser devices, the above-mentioned epitaxial crystal growth method is considered to be an extremely inefficient method.

発明の目的 本発明は上記従来の問題点を解消し、1度のエピタキシ
ャル成長過程で、特性の揃ったコービタキシャル結晶を
多数の画板上に同時に形成することによって液相法によ
るエピタキシャル結晶成長の量産性、均一性を著るしく
向上せしむること全可能とする新規構造をもったエピタ
キシャル結晶の成長ボートの提供を目的とする。
Purpose of the Invention The present invention solves the above-mentioned conventional problems and improves the mass productivity of epitaxial crystal growth by liquid phase method by simultaneously forming corbitaxial crystals with uniform characteristics on a large number of drawing plates in one epitaxial growth process. The object of the present invention is to provide an epitaxial crystal growth boat having a novel structure that makes it possible to significantly improve uniformity.

発明の構成 本発明は、液相法エピタキシャル結晶のための列状に配
列した複数のメルト溜めを持つメルト保持部と、このメ
ルト保持部と一体となるように組合された排液溜めを備
えた土台部、及び上記のメルト保持部と土台部の間には
まってメルト溜めに沿って摺動出来るように構成された
スライダ一部から成る成長ボートで、スライダ一部には
エピタキシャル成長用の複数枚の基板結晶を設置するた
めの基板設置穴と共に基板設置穴の低部にはスライダー
の下部まで貫通したメルト排液の排出孔を備えている。
Composition of the Invention The present invention includes a melt holding section having a plurality of melt reservoirs arranged in a row for liquid-phase epitaxial crystal, and a drainage reservoir combined to be integrated with the melt holding section. A growth boat consisting of a base part and a part of a slider that fits between the melt holding part and the base part and is configured to slide along the melt reservoir.The slider part has multiple sheets for epitaxial growth. In addition to the substrate installation hole for installing the substrate crystal, the lower part of the substrate installation hole is provided with a discharge hole for melt drainage that penetrates to the bottom of the slider.

又、前記の土台部にはスライダ一部の排出孔から流出す
る排液全土台部に設けられた排液溜めに導くための排液
導入孔が、前記のメルト保持部の隣9合ったメルト溜め
のシキリ壁の直下に設けらnている。そして、メルト保
持部に設けら扛ている複数のメルト溜めの間のシキリ壁
は、少なくともスライダ一部に設けられた基板結晶設置
穴の摺動方向の長さよりも厚く設計されている。
Further, in the base part, there is a drain introduction hole for guiding all the drain liquid flowing out from the discharge hole of a part of the slider to a drain liquid reservoir provided in the base part. It is installed directly under the wall of the reservoir. The walls between the plurality of melt reservoirs provided in the melt holding section are designed to be thicker than the length in the sliding direction of the substrate crystal installation hole provided in at least a portion of the slider.

又、前記のスライダ一部の基板結晶設置穴の低部は、そ
この一部に設けられているメルト排出孔に向って全体が
下るように傾斜をつけておけば、排排出メルトは容易に
土台部の排出メルト溜めに導くようにすることが出来る
In addition, if the lower part of the substrate crystal installation hole in a part of the slider is sloped so that the whole part descends toward the melt discharge hole provided in that part, the melt can be easily discharged. It is possible to guide the discharged melt to a reservoir in the base.

実施例の説明 第4図に本発明の一実施例のボートの和親図を示す。同
図において31はメルト保持部、32はスライダ一部、
33は排液溜めを備えた土台部であり、メルト保持部3
1には3ケのメルト溜め1−1.1−2.1−3f備え
た例になっている。
DESCRIPTION OF EMBODIMENTS FIG. 4 shows a diagram of a boat according to an embodiment of the present invention. In the figure, 31 is a melt holding part, 32 is a part of a slider,
33 is a base portion equipped with a drainage reservoir, and the melt holding portion 3
1 has three melt reservoirs 1-1.1-2.1-3f.

又、スライダ一部32には複数の基板結晶を設置し得る
基板結晶設置穴34がある。第4図のような斜視図では
見られないスライダ一部32に設けら扛た基板結晶設置
穴34の底部や、土台部に設けられているメルト溜め等
については、本成長ボートの断面構造図(第6図)に示
した。
Further, the slider portion 32 has a substrate crystal installation hole 34 in which a plurality of substrate crystals can be installed. The bottom of the substrate crystal installation hole 34 formed in the slider part 32 and the melt reservoir provided in the base, which cannot be seen in the perspective view as shown in FIG. 4, are shown in the cross-sectional structure diagram of this growth boat. (Figure 6).

第5図において、第4図と同じ部分は第4図と同じ番号
で示しである。第6図において35Viスライダ一部3
2の基板結晶設置穴34の底部に設けらnた排液流出孔
、36は土台部に設けられた排液溜め、37は前記排液
流出孔36からの排液t Jul液溜め36に導くため
の排液流入孔である。
In FIG. 5, the same parts as in FIG. 4 are indicated by the same numbers as in FIG. In Figure 6, 35Vi slider part 3
2, a drainage outflow hole provided at the bottom of the substrate crystal installation hole 34; 36, a drainage reservoir provided at the base; and 37, the drainage from the drainage outflow hole 36 is led to the liquid reservoir 36. This is a drainage inlet hole for

又、同図は、本発明の成長ボートによるエピタキシャル
結晶の成長過程を説明するために基板結晶設置穴34に
設置された基板結晶3.及びメルト溜め1−1.1−2
.1−3にはメルトソースト1’、 1−2’、 1−
3’が装填された状態を示しである。
The figure also shows the substrate crystal 3.0 installed in the substrate crystal installation hole 34 in order to explain the growth process of epitaxial crystal using the growth boat of the present invention. and melt reservoir 1-1.1-2
.. 1-3 has melt sauce 1', 1-2', 1-
3' is shown loaded.

次に本発明の成長ボートによるエピタキシャル結晶の成
長法について説明する。説明を簡単にするため、エピタ
キシャル結晶として第2図に示したようなInP基板結
晶3の上にメルトバック工程を実施した後、InPバッ
フ1層22.及びInGaAsP活性層23迄の2層成
長を行うものとする。この場合、第6図のメルト溜め1
−1.1−2,1−3の中に入っているメルトソースト
1.1−2’。
Next, a method for growing epitaxial crystals using a growth boat according to the present invention will be explained. To simplify the explanation, after performing a melt-back process on an InP substrate crystal 3 as shown in FIG. 2 as an epitaxial crystal, one InP buffer layer 22. It is assumed that two layers including the InGaAsP active layer 23 and the InGaAsP active layer 23 are grown. In this case, melt reservoir 1 in Figure 6
-1.1-2, melt sauce 1.1-2' contained in 1-3.

1−3′は、夫々In、In+InP、In+InP+
InAs+GaAといったものの混合メルトである。ま
ず、第5図(a)に示すように複数の基板結晶3を基板
結晶設置穴34に設置した後、成長ボート全体を電気炉
中に入社水素ガス雰囲気中で昇温し、夫々のメルト1−
1’、 1−2’、 1−3’を充分に溶解せしめる。
1-3' are respectively In, In+InP, In+InP+
It is a mixed melt of InAs+GaA. First, as shown in FIG. 5(a), a plurality of substrate crystals 3 are installed in the substrate crystal installation hole 34, and then the entire growth boat is placed in an electric furnace and heated in a hydrogen gas atmosphere to form each melt 1. −
1', 1-2', and 1-3' are sufficiently dissolved.

このメルト溶解過程は第5fV(b)のようにスライダ
ーの引出し棒14を操作して基板結晶設置穴34を移動
せしめた状態で実施した方が、基板結晶3に表面損傷を
与える(−とが少くて望ましい。
It is better to carry out this melt melting process while moving the substrate crystal installation hole 34 by operating the pull-out rod 14 of the slider as shown in 5th fV (b), as it may cause surface damage to the substrate crystal 3 (- Less is desirable.

次いで電気炉を徐冷(o、5〜b ら、適当な温度に達したら再び引出し棒14を操作して
第5図(C)の様にするとメルト溜め1−1の中のIn
 メルト1−1’は基板結晶設置穴34に移動し基板結
晶InP3のメルトバックを行う。メルトバンク終了後
、更に引出し棒14を操作して第 5図(d)の位置に
基板結晶設置穴34を移動すると。
Next, the electric furnace is gradually cooled (o, 5-b, etc.) When the appropriate temperature is reached, the pull-out rod 14 is operated again as shown in FIG.
The melt 1-1' moves to the substrate crystal installation hole 34 and melts back the substrate crystal InP3. After the melt bank is completed, the pull-out rod 14 is further operated to move the substrate crystal installation hole 34 to the position shown in FIG. 5(d).

基板結晶設置穴34の中のIn メルト1−1’は排液
流出孔35.排液6iU入孔37をへて排液溜め36に
流入することになる。以下同様な操作を順次繰返しメル
トソースト2’、 1−3’になって第2図に示したI
nP基板3ヒにInP ノZノファ層22゜1nGa八
6P 活性層23が形成さ扛ることになる。
The In melt 1-1' in the substrate crystal installation hole 34 is drained through the drain outflow hole 35. The drained liquid 6iU flows into the drained liquid reservoir 36 through the inlet hole 37. Thereafter, the same operation was repeated one after another until melt sauces 2' and 1-3' were obtained, as shown in Fig. 2.
An InP layer 22°, 1nGa86P active layer 23 is formed on the nP substrate 3.

以上InP基板3のにへの2層のエピタキシャル結晶の
成長例について説明したが、メルト溜め1−1.1−2
.・・・の数ヲ堀やすことにより何層でも形成出来るこ
とは云うまでもない。
The example of growing two layers of epitaxial crystal on the InP substrate 3 has been described above.
.. It goes without saying that any number of layers can be formed by digging a number of holes.

発明の効果 本発明の液相法エピタキシャル結晶の成長ボートはスラ
イダ一部の基板結晶設置穴の下部に排液流出孔を設ける
と共に土台部に排液溜め及び排液導入孔を設けることに
より、多数の基板結晶上への多層エピタキシャル形成が
、従来法と全く変ることのない操作によって得ることが
可能となり、極めて特性の揃ったエピタキシャル結晶の
H造が容易となる。このことは本エピタキシャル結晶を
用いたデバイス製造に際して歩留シ良く大量の、且つ均
一特性のデバイス実現にとって極めて有効な手段となる
ものである。
Effects of the Invention The liquid phase method epitaxial crystal growth boat of the present invention has a drain outflow hole at the bottom of the substrate crystal installation hole in a part of the slider, as well as a drain reservoir and a drain introduction hole in the base. It becomes possible to form a multilayer epitaxial layer on a substrate crystal using operations that are completely unchanged from conventional methods, and it becomes easy to fabricate an epitaxial crystal with extremely uniform properties. This is an extremely effective means for producing a large number of devices with high yield and uniform characteristics when manufacturing devices using the present epitaxial crystal.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の液相法エピタキシャル結晶の成長ボート
の斜視図、第2図は第1図の成長ボートで形成されたエ
ピタキシャル結晶の構造断面図、第3図は第2図のエピ
タキシャル結晶の形成の際の成長ボートの断面図、第4
図は本発明の液相法エピタキシャル結晶の成長ボートの
分解斜視図、第6図(a)〜(d)は本発明のボートに
よるエピタキシャル結晶の成長過程イ〔説明するための
成長ボート断面図である。 31 ・・・メル!・保持部、32 ・・・スライダ一
部、33・・・土台部、34 ・・基板結晶設置穴、3
5・・・・・排液流出孔、36・・・排液溜め、37−
・・・排液尋人孔。
Figure 1 is a perspective view of a conventional liquid-phase epitaxial crystal growth boat, Figure 2 is a cross-sectional view of the structure of the epitaxial crystal formed in the growth boat of Figure 1, and Figure 3 is the epitaxial crystal of Figure 2. Cross-sectional view of the growth boat during formation, No. 4
The figure is an exploded perspective view of a growth boat for liquid-phase epitaxial crystal of the present invention, and FIGS. 6(a) to 6(d) are cross-sectional views of the growth boat for explaining the growth process of epitaxial crystal using the boat of the present invention. be. 31...Mel! - Holding part, 32... Part of slider, 33... Base part, 34... Substrate crystal installation hole, 3
5...Drainage outflow hole, 36...Drainage reservoir, 37-
... Drainage hole.

Claims (1)

【特許請求の範囲】[Claims] (1)液相法エピタキシャル結晶のための列状に配列し
た複数個のメルト溜めを持つメルト保持部と前記メルト
保持部と一体に組合された排液溜めを備えた土台部、及
び前記メルト保持部と土台部との間にはまり列状に並ん
だ前記メルト溜めに沿って摺動出来るように構成された
スライダ一部を備え、前記スライダ一部には複数個の基
板結晶の設置が可能な基板結晶設置穴と共に前記基板結
晶穴の下部にメルト流出用の貫通したメルト排出孔を備
えると共に、前記土台部には前記スライダ一部のメルト
排出孔から流出する排液を排液溜めに導くための排液導
入孔が前記メルト保持部の瞬り合ったメルト溜めのシキ
リ壁の面下に設けられていることを特徴とする液相エピ
タキシャル結晶成長装置。 (乞 スライダー盲すの基板結晶膜N宜の低部じ力;、
前記基板結晶設置穴の低部の一部に設けらflたメルト
」J1出孔に向って−F方に傾斜していることを特徴と
する特許請求の範囲第1項に記載の液相エピタキシャル
結晶成長装置。
(1) A melt holding section having a plurality of melt reservoirs arranged in a row for liquid-phase epitaxial crystal, a base section having a drainage reservoir integrally combined with the melt holding section, and the melt holding section. A slider part is fitted between the part and the base part and configured to be able to slide along the melt reservoirs arranged in a row, and a plurality of substrate crystals can be installed in the slider part. A penetrating melt discharge hole for melt outflow is provided at the bottom of the substrate crystal hole together with the substrate crystal installation hole, and the base portion is provided for guiding the drain liquid flowing out from the melt discharge hole of a part of the slider to a drain liquid reservoir. A liquid phase epitaxial crystal growth apparatus, characterized in that a drainage inlet hole is provided below the surface of the wall of the twinkling melt reservoir of the melt holding section. (Low force due to the substrate crystal film N of the slider blind;
The liquid phase epitaxial device according to claim 1, characterized in that the melt provided in a part of the lower part of the substrate crystal installation hole is inclined in the −F direction toward the J1 exit hole. Crystal growth equipment.
JP17531883A 1983-09-22 1983-09-22 Apparatus for liquid-phase epitaxial crystal growth Pending JPS6065791A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17531883A JPS6065791A (en) 1983-09-22 1983-09-22 Apparatus for liquid-phase epitaxial crystal growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17531883A JPS6065791A (en) 1983-09-22 1983-09-22 Apparatus for liquid-phase epitaxial crystal growth

Publications (1)

Publication Number Publication Date
JPS6065791A true JPS6065791A (en) 1985-04-15

Family

ID=15993989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17531883A Pending JPS6065791A (en) 1983-09-22 1983-09-22 Apparatus for liquid-phase epitaxial crystal growth

Country Status (1)

Country Link
JP (1) JPS6065791A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2318312B (en) * 1996-06-14 1999-10-13 Kansai Paint Co Ltd Method for forming a multi-layer metallic coating film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2318312B (en) * 1996-06-14 1999-10-13 Kansai Paint Co Ltd Method for forming a multi-layer metallic coating film

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