JPS6063963A - Bevel type thyristor - Google Patents

Bevel type thyristor

Info

Publication number
JPS6063963A
JPS6063963A JP17152283A JP17152283A JPS6063963A JP S6063963 A JPS6063963 A JP S6063963A JP 17152283 A JP17152283 A JP 17152283A JP 17152283 A JP17152283 A JP 17152283A JP S6063963 A JPS6063963 A JP S6063963A
Authority
JP
Japan
Prior art keywords
layer
element body
groove
sealing material
lower surfaces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17152283A
Other languages
Japanese (ja)
Inventor
Shigeru Fujimoto
茂 藤本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP17152283A priority Critical patent/JPS6063963A/en
Publication of JPS6063963A publication Critical patent/JPS6063963A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • H01L29/0661Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body specially adapted for altering the breakdown voltage by removing semiconductor material at, or in the neighbourhood of, a reverse biased junction, e.g. by bevelling, moat etching, depletion etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)

Abstract

PURPOSE:To contrive to improve the productivity by enabling to provide a sealing material without flow by a method wherein buried grooves are formed, in the peripheries of the upper and lower surfaces of an element body formed by the polymerization of a P-layer and an N-layer, in the state of leaving the periphery of each layer in annular form. CONSTITUTION:In the peripheries of the upper and lower surfaces of the element body 1, the buried grooves 9 are formed inside the outer peripheral surface of the body 1 in the diameter direction by approx. 0.2-1mm.. This groove 9 has an oblique plane 10 inclined toward an N-layer 3 at one end of the bottom positioned on the side of the outer peripheral surface of the body 1, and the junction part of each P-layer 2 and 4 with the layer 3 is exposed to this oblique plane 10. In the presence of this groove 9, the periphery of each P-layer 2 and 4 is formed into a ring 11 isolated from these P-layers 2 and 4. Besides, each groove 9 is coated with the fluid sealing material 12 such as Si rubber. The processing of the groove 9 in the body 1 is carried out with a processing device.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明tjP層とN層との接合部分を外気からシール
することによって耐圧性を向上させるベベル杉ザイリス
タに関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a beveled cedar Zyristor that improves pressure resistance by sealing the joint between a tjP layer and an N layer from the outside air.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

ザイリスタには、P層とN層との接合部分の表面を所定
の角度の斜面に形成し、表面電界を弱くして表面破壊を
避けるようにした、いわゆるベベル形のものが知られて
いる。このようなベベル形サイリスタにおいて、上記斜
面にシリコンゴムなどのシール材を塗布し、P層とN層
との接合部分を外気からシールすることによって、耐圧
性をさらに向上させることが行なわれている。
A so-called bevel type Zyristor is known in which the surface of the junction between the P layer and the N layer is formed into a slope at a predetermined angle to weaken the surface electric field and avoid surface breakdown. In such bevel-type thyristors, the pressure resistance is further improved by applying a sealing material such as silicone rubber to the slope to seal the joint between the P layer and the N layer from the outside air. .

ところで、従来は第1図に示すように斜面aは、P層と
N層とを順次重合して形成された素子本体すの上下面周
辺部から外周面にわたって形成されていた。そのため、
上記斜面aにシリコンゴムのような流動性のあるシール
41cを塗布すると、このシール材Cが凝固するまでに
斜面aの傾斜方向に沿って流れ、斜面aを確実にシール
できなくなるので、これを防止するために素子本体aの
外周面に外枠e Jli’:付けてシール材Cの塗布を
行なっていた。したがって、ソール材Cの塗布に多くの
手間が掛り、生産性の低下を招くという問題があった。
Incidentally, conventionally, as shown in FIG. 1, the slope a was formed extending from the upper and lower peripheral portions to the outer peripheral surface of an element body formed by sequentially polymerizing a P layer and an N layer. Therefore,
If a fluid seal 41c such as silicone rubber is applied to the slope a, the seal material C will flow along the slope direction of the slope a before it solidifies, making it impossible to reliably seal the slope a. In order to prevent this, an outer frame e is attached to the outer circumferential surface of the element body a, and the sealing material C is applied. Therefore, there was a problem in that it took a lot of time and effort to apply the sole material C, leading to a decrease in productivity.

〔発明の目的〕[Purpose of the invention]

この発明は素子本体の外周面に外枠k 取(=jけずに
P層とN層との接合部分にシール材を確実に塗布できる
ようにしたベベル形サイリスタを提供することにある。
The object of the present invention is to provide a bevel-type thyristor in which a sealing material can be reliably applied to the joint portion of the P layer and the N layer without cutting an outer frame on the outer peripheral surface of the element body.

〔発明の概要〕[Summary of the invention]

Pハ4とN層とが重合されて形成された素子本体の上下
面周辺部に、この素子本体の上下に位置する各層の周辺
部を塔状に残す状態で埋込み溝を形成し、この埋込み溝
にシール材を充填することにより、シール材を流動させ
ずに設けることができるようにしたものである。
An embedding groove is formed in the periphery of the upper and lower surfaces of the element body formed by polymerizing the P-4 and N layers, leaving the periphery of each layer located above and below the element body in a tower shape. By filling the groove with a sealant, the sealant can be installed without flowing.

〔発明の実施列〕[Implementation sequence of the invention]

以下、この発明の一実施[+lI * 第2図と第3図
’t: m ii@、 L、て説明する。第2図中1は
ベベル形サイリスタの素子本体である。この素子本体1
は、図面における下側から2層2、N層3および2層4
が順次重合されているとともに、上側のP;彌4には中
央部にNIWI5が設けられ、周辺部にはゲート端子6
が接続されている。また、下側のP1@2には1嚇極7
が接続され、N+I脅6には陰極8が接続されている。
Hereinafter, one embodiment of the present invention will be described with reference to FIGS. 2 and 3't: m ii@, L. Reference numeral 1 in FIG. 2 is the element body of the bevel-type thyristor. This element body 1
are the 2nd layer 2, the N layer 3, and the 2nd layer 4 from the bottom in the drawing.
are sequentially polymerized, and NIWI 5 is provided in the center of the upper P;
is connected. In addition, the lower P1@2 has 1 threat pole 7
is connected, and the cathode 8 is connected to the N+I inlet 6.

つまり、素子本体lはN−P−凡−Pの4層構造となっ
ている。
In other words, the element body 1 has a four-layer structure of N-P-B-P.

上記素子本体Iの上下面周辺部には、素子本体1の外周
面よりも0.2〜工龍程度径方向内側に埋込み溝9が形
成されている。この埋込み溝9は、素子本体1の外周面
側に位置する底面の一端がN層3に向って傾斜した斜面
10となっており、この斜面IOに各Ppd2,4とN
1曽3との接合部分が露出している。また、この埋込み
溝9により、谷Pj@2,4の周辺部は、この2層2,
4と分離されたリング11に形成されている。そして、
上記各埋込み溝9にシリコンゴムなどの流動性のあるシ
ール材12が塗布されている。
An embedded groove 9 is formed in the peripheral portion of the upper and lower surfaces of the element main body I, radially inward from the outer circumferential surface of the element main body 1 by about 0.2 to 10 mm. One end of the bottom of the embedded groove 9 located on the outer peripheral surface side of the element main body 1 is a slope 10 that is inclined toward the N layer 3.
The joint part with 1st 3 is exposed. Also, due to this embedded groove 9, the peripheral part of the valley Pj@2, 4 is formed by the two layers 2,
4 and a separate ring 11. and,
Each of the embedded grooves 9 is coated with a fluid sealing material 12 such as silicone rubber.

上記素子本体1に埋込み溝9を加工するには、第3図に
示す加工装置15で行なわれる。この加工装置15は、
取付は機I6と、一対の加工機17とから構成されてい
る。取付は機16は軸受18に回転自在に支持されたス
ピンドル19と、このスピンドル1gの一端に設けられ
た真空チャック20と、上記スピンドル19の他端に嵌
着された従動グーリ21と、この従hubプーリ2Iと
モータ22の回転軸23に嵌着された駆動グーリ24と
に張設されたベルト25と力・ら構成されている。そし
て、上記真空チャック20に素子本体lが真空吸涜され
、スピンドル1gはモータ22によって50〜1OOr
、p、mで回転駆動されるようになっている。
Machining of the embedded groove 9 in the element body 1 is performed using a processing device 15 shown in FIG. This processing device 15 is
The installation consists of a machine I6 and a pair of processing machines 17. The machine 16 is installed by a spindle 19 rotatably supported by a bearing 18, a vacuum chuck 20 provided at one end of the spindle 1g, a driven googly 21 fitted on the other end of the spindle 19, and a driven googly 21 fitted to the other end of the spindle 1g. It is composed of a belt 25 stretched between a hub pulley 2I and a drive gooey 24 fitted to a rotating shaft 23 of a motor 22. Then, the device main body l is vacuum-sucked by the vacuum chuck 20, and the spindle 1g is rotated by the motor 22 at 50 to 10 Orr.
, p, and m.

−また、上記加工機17は、ベース26上1.(設けら
れたモータ27と、このモータ270回転+1曲28に
取1合された研削砥石29と、上記ベース26を送る送
り機構30とからなる。この送り峡構30は、羽り覚3
Iによって回転自在に支持ざオとだ送りねじ32がベー
ス26に設けられた台片33に螺合している。上記送り
x2じ32V(は継手34を介して送りモータ35の回
転軸36がJF結されている。したがって、送りモータ
35が作動することにより上記ベース26、つまり研削
砥石29が回転軸28の軸線を直交する方向に送られる
。そして、上記研削砥石29はモータ27によって20
000〜50000r−D、Inで1自1 鯖hu< 
’f+rh i h−A −上記構成の一対の加工機1
7は、各研削砥石29が素子本体1の上下面に対して所
定の角度で傾斜した状態で配設されている。したがって
、各研削砥石29を素子本体1に向けて送ることにより
、この素子本体1の上下面に同時に埋込み溝9を加工す
ることができる。
- Also, the processing machine 17 is arranged such that the processing machine 17 has a 1. (It consists of a motor 27 provided, a grinding wheel 29 coupled to the motor 270 rotations + 1 rotation 28, and a feed mechanism 30 that feeds the base 26.
A feed screw 32, which is rotatably supported by I, is screwed into a base piece 33 provided on the base 26. The above-mentioned feed x2 is 32V (the rotation shaft 36 of the feed motor 35 is connected to the JF connection via the joint 34. Therefore, when the feed motor 35 operates, the base 26, that is, the grinding wheel 29 is aligned with the axis of the rotation shaft 28. The grinding wheel 29 is sent in the direction perpendicular to the grinding wheel 29 by the motor 27.
000~50000r-D, In 1 self 1 mackerel hu<
'f+rh i h-A - A pair of processing machines 1 with the above configuration
7, each grinding wheel 29 is disposed so as to be inclined at a predetermined angle with respect to the upper and lower surfaces of the element body 1. Therefore, by sending each grinding wheel 29 toward the element body 1, the embedded grooves 9 can be simultaneously machined on the upper and lower surfaces of the element body 1.

しかして、上述したごとく形成されるベベル形サイリス
タによれば、流動性のあるシール材12を埋込÷溝9に
塗布するようにした。そのため、上記シール材12の流
動が埋込み溝9によって規制されるから、この埋込み6
9内で凝固し、各2層2,4とN層3との露出した接合
部分、つまシ埋込み溝9の底面である斜面1゜を確実に
シールする。また、素子本体1の上下面周辺部にリング
IIを残す念め、このリング11によって素子本体1の
周辺部が保護される。
According to the bevel-shaped thyristor formed as described above, the fluid sealing material 12 is applied to the embedded groove 9. Therefore, since the flow of the sealing material 12 is regulated by the embedded groove 9, the embedded groove 9
9, the exposed joint portions between the two layers 2 and 4 and the N layer 3, and the 1° inclined surface which is the bottom surface of the tamper embedding groove 9 are reliably sealed. Further, in order to leave the ring II around the upper and lower surfaces of the element body 1, the peripheral area of the element body 1 is protected by this ring 11.

つまり、埋込み溝9を形成した素子本体!全搬送する際
などに、上記リング1]によって2層2.4とN層3の
鞘当した接合部分である斜面20に他の物が接触しずら
くなるがら、この斜而10の損傷を妨げる。さらに、素
子本体Iの周辺部がリング11によって補強されるから
、4この素子本体lの剛性が大きく低下するのを防げる
In other words, the element body with the embedded groove 9 formed! When transporting the entire structure, the ring 1 prevents other objects from coming into contact with the slope 20, which is the joint portion of the second layer 2.4 and the N layer 3, and prevents damage to the slope 10. . Furthermore, since the peripheral portion of the element body I is reinforced by the ring 11, it is possible to prevent the rigidity of the element body I from decreasing significantly.

〔発明の効果J 以上述べたようにこの発明は、P層とN層とが重合され
て形成された素子本体の上下面周辺部に、素子本体の上
下に位置する各層の周辺部ヲ猿状に残す状態で埋込み溝
を形成し、この埋込み溝にシール材を充填するようにし
た。したかつで、シール材は埋込み溝によってその流動
が規制されるから、この埋込み溝、つまり埋込み^4の
が(而に蕗出したP層とN層の接合部分を確実に7−ル
することができる。すなわち、従来のように外枠を用い
ずにシール材を設けることができるから、生産性の向上
が計れる。また、素子本体の上下面周辺部に上下に位置
する各層の周辺部が環状に残されるから、この環状部分
によってシール材を設ける前に埋込み病に底面が損傷さ
れずらくなるばかりか、素子本体周辺部の剛性を大幅に
低下させるのを防ぐ。
[Effects of the Invention J As described above, the present invention provides a monkey-shaped periphery of each layer located above and below the element body on the periphery of the upper and lower surfaces of the element body formed by polymerizing the P layer and the N layer. An embedding groove was formed in such a state that it remained, and this embedding groove was filled with a sealing material. In addition, since the flow of the sealing material is regulated by the embedded groove, it is necessary to ensure that this embedded groove, that is, the embedded groove (and the protruding joint part between the P layer and the N layer) is properly sealed. In other words, since the sealing material can be provided without using an outer frame as in the past, productivity can be improved.In addition, the periphery of each layer located above and below the upper and lower surfaces of the element body can be Since it is left in an annular shape, this annular portion not only prevents the bottom surface from being damaged by embedding disease before the sealing material is provided, but also prevents the rigidity of the periphery of the element body from being significantly reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のベベル形サイリスタの断面図、第2図は
この発明の一実施例を示すベベル形サイリスタの断面図
、第3図は素子本体に埋込み溝を形成するための加工装
置の平面図である。 1・・・素子本体、9・・・埋込み溝、11・・・リン
グ、12・・・シール材。
Fig. 1 is a cross-sectional view of a conventional bevel-type thyristor, Fig. 2 is a cross-sectional view of a bevel-type thyristor showing an embodiment of the present invention, and Fig. 3 is a plan view of a processing device for forming an embedded groove in an element body. It is a diagram. DESCRIPTION OF SYMBOLS 1...Element body, 9...Embedded groove, 11...Ring, 12...Sealing material.

Claims (1)

【特許請求の範囲】[Claims] P層とN層とが重合されて形成された素子本体と、この
素子本体の上下面周辺部に素子本体の上下に位置する各
層の周辺部を環状に残す状態で形成された埋込み溝と、
この埋込み溝に充填されたシール材とを具備したベベル
形サイリスタ。
An element body formed by polymerizing a P layer and an N layer, and a buried groove formed in a peripheral area of the upper and lower surfaces of the element body so as to leave peripheral areas of each layer located above and below the element body in an annular shape;
The bevel-shaped thyristor is equipped with a sealing material filled in this embedded groove.
JP17152283A 1983-09-17 1983-09-17 Bevel type thyristor Pending JPS6063963A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17152283A JPS6063963A (en) 1983-09-17 1983-09-17 Bevel type thyristor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17152283A JPS6063963A (en) 1983-09-17 1983-09-17 Bevel type thyristor

Publications (1)

Publication Number Publication Date
JPS6063963A true JPS6063963A (en) 1985-04-12

Family

ID=15924672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17152283A Pending JPS6063963A (en) 1983-09-17 1983-09-17 Bevel type thyristor

Country Status (1)

Country Link
JP (1) JPS6063963A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018005907A1 (en) 2017-09-05 2019-03-07 Fanuc Corporation Water leakage detection system for a laser device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018005907A1 (en) 2017-09-05 2019-03-07 Fanuc Corporation Water leakage detection system for a laser device

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