JPS604851A - イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置 - Google Patents

イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置

Info

Publication number
JPS604851A
JPS604851A JP58113298A JP11329883A JPS604851A JP S604851 A JPS604851 A JP S604851A JP 58113298 A JP58113298 A JP 58113298A JP 11329883 A JP11329883 A JP 11329883A JP S604851 A JPS604851 A JP S604851A
Authority
JP
Japan
Prior art keywords
ion
temperature
effect transistor
temp
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58113298A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0422220B2 (enExample
Inventor
Michihiro Nakamura
通宏 中村
Hidenori Gion
祇園　英則
Makoto Yano
誠 矢野
Kenji Kubota
久保田　謙治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kuraray Co Ltd
Original Assignee
Kuraray Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kuraray Co Ltd filed Critical Kuraray Co Ltd
Priority to JP58113298A priority Critical patent/JPS604851A/ja
Priority to US06/622,250 priority patent/US4641249A/en
Priority to DE8484107120T priority patent/DE3485624D1/de
Priority to EP84107120A priority patent/EP0129852B1/en
Publication of JPS604851A publication Critical patent/JPS604851A/ja
Publication of JPH0422220B2 publication Critical patent/JPH0422220B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403—Cells and electrode assemblies
    • G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP58113298A 1983-06-22 1983-06-22 イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置 Granted JPS604851A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58113298A JPS604851A (ja) 1983-06-22 1983-06-22 イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置
US06/622,250 US4641249A (en) 1983-06-22 1984-06-19 Method and device for compensating temperature-dependent characteristic changes in ion-sensitive FET transducer
DE8484107120T DE3485624D1 (de) 1983-06-22 1984-06-20 Verfahren und einrichtung zur kompensation von temperaturabhaengigen eigenschaftsaenderungen in ionenempfindlichen feldeffekttransistor-sensoren.
EP84107120A EP0129852B1 (en) 1983-06-22 1984-06-20 Method and device for compensating temperature-dependent characteristic changes in ion-sensitive fet transducer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58113298A JPS604851A (ja) 1983-06-22 1983-06-22 イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置

Publications (2)

Publication Number Publication Date
JPS604851A true JPS604851A (ja) 1985-01-11
JPH0422220B2 JPH0422220B2 (enExample) 1992-04-16

Family

ID=14608660

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58113298A Granted JPS604851A (ja) 1983-06-22 1983-06-22 イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置

Country Status (1)

Country Link
JP (1) JPS604851A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60225056A (ja) * 1984-04-24 1985-11-09 Kuraray Co Ltd イオンモニタ装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60225056A (ja) * 1984-04-24 1985-11-09 Kuraray Co Ltd イオンモニタ装置

Also Published As

Publication number Publication date
JPH0422220B2 (enExample) 1992-04-16

Similar Documents

Publication Publication Date Title
US4490678A (en) Method of and an apparatus for measuring ion concentrations in solutions
JPS58131524A (ja) 測温装置
JPS63261178A (ja) 静電容量測定回路
KR870006408A (ko) 순수한 물의 전도성센서
US4879517A (en) Temperature compensation for potentiometrically operated ISFETS
CN103472114B (zh) 带补偿功能的多通道isfet传感器读出电路
US4839000A (en) Buffer compensation in enzyme-modified ion sensitive devices
US5602467A (en) Circuit for measuring ion concentrations in solutions
JPH05129093A (ja) 空間電位誤差を補正するトリプルプローブ・プラズマ測定装置
JPS604851A (ja) イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置
Enke et al. A versatile and inexpensive controlled potential polarographic analyzer
US20070089988A1 (en) Electronic circuit for ion sensor with body effect reduction
US4267504A (en) Device for measuring a quantity which influences a field-effect transistor
JPH0233991B2 (enExample)
JPS6260662B2 (enExample)
JPS60225056A (ja) イオンモニタ装置
US4066528A (en) Analytical apparatus
JPH0682115B2 (ja) イオンモニタ装置
TW201202692A (en) Measurement device and measurement method utilizing the same
SU1509719A1 (ru) Устройство дл измерени концентрации ионов в растворах электролитов
JPS6313486Y2 (enExample)
JPS5942691Y2 (ja) 温度補償回路
JPH01209348A (ja) イオン濃度などの測定装置
SU1112316A1 (ru) Устройство дл измерени концентрации носителей зар да в провод щих материалах
JP2912967B2 (ja) 赤外線放射温度計