JPS6044816B2 - Composition for semiconductor ceramic capacitors - Google Patents

Composition for semiconductor ceramic capacitors

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Publication number
JPS6044816B2
JPS6044816B2 JP51134562A JP13456276A JPS6044816B2 JP S6044816 B2 JPS6044816 B2 JP S6044816B2 JP 51134562 A JP51134562 A JP 51134562A JP 13456276 A JP13456276 A JP 13456276A JP S6044816 B2 JPS6044816 B2 JP S6044816B2
Authority
JP
Japan
Prior art keywords
dielectric loss
composition
semiconductor ceramic
temperature
weight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51134562A
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Japanese (ja)
Other versions
JPS5358700A (en
Inventor
永生 藤川
国太郎 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
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Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP51134562A priority Critical patent/JPS6044816B2/en
Publication of JPS5358700A publication Critical patent/JPS5358700A/en
Publication of JPS6044816B2 publication Critical patent/JPS6044816B2/en
Expired legal-status Critical Current

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  • Ceramic Capacitors (AREA)
  • Inorganic Insulating Materials (AREA)

Description

【発明の詳細な説明】 この発明はチタン酸ストロンチウム系半導体磁器を基
体とし、高誘電率で平坦な誘電率温度特性を有し、絶縁
抵抗、誘電体損失のすぐれた半導体磁器コンデンサ用組
成物に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a composition for a semiconductor ceramic capacitor that is based on strontium titanate semiconductor ceramic, has a high dielectric constant, flat dielectric constant temperature characteristics, and has excellent insulation resistance and dielectric loss. It is something.

従来より、チタン酸ストロンチウム系組成物にY、N
b、Dy、Ta、Wなどの原子価制御元素を1種または
2種以上添加するか、またはこれらの原子価制御元素と
一緒にさらにZnO、GeO。CuOを添加し、還元雰
囲気中で焼成して得られたチタン酸ストロンチウム系半
導体磁器に、酸化ビスマス(B1。O0)、酸化鉛(P
bO)などの金属酸化物を塗布し、磁器の結晶粒界に金
属酸化物を拡散させて粒界に絶縁層を形成し、磁器の表
面に電極を設けることにより、大容量のコンデンサが得
られることは知られている。 このようなコンデンサの
うち、SrTiO。を主体とし、これに添加物としてY
。O。を0.075モル%、TiO2を0.5モル%加
えた組成比からなるものを大気中1150℃、2時間で
仮焼成し、次いで水素ル容量%、窒素8熔量%からなる
還元雰囲気中で1400〜14300C、2時間焼成し
て磁器試料を作成した。 得られた試料にBi。O。と
ワニスを混練した金属酸化物ペーストを塗布し、大気中
900〜13000Cで1時間焼付けをし、さらに電極
を形成したコンデンサを作成したところ、第1図、第2
図にそれぞれ示すような見掛誘電率の温度特性、誘電体
損失の温度特性が得られた。 図から明らかなように、
この種のコンデンサは磁器の結晶粒界にBi。O。を拡
散させるときの熱処理温度と得られるコンデンサの特性
の間に密接な関連性があり、特に見掛誘電率の温度特性
は低温度で熱処理したものの方が平坦になつている。た
とえば、熱処理温度が1300℃のとき、−30〜+
85℃の温度範囲で+25゜Cのときの見掛誘電率を基
準とした場合、その温度特性は+18〜−14.5%で
あるが、900℃で熱処理すると+2.4〜−1.3%
とかなり平坦になる。しかしながら、熱処理温度を低く
して見掛誘電率の温度特性を平坦にしたとしても、第2
図から明らかなように、誘電体損失が著しく劣化してい
る。 このように従来のものは見掛誘電率の温度特性が
平坦であつても誘電体損失が悪く、このほか絶縁抵抗の
劣化も認められ、さらに印加電圧が高くなると特性が悪
くなつて、低い電圧でしか利用できないという欠点がみ
られた。
Conventionally, Y and N have been added to strontium titanate-based compositions.
b, one or more valence control elements such as Dy, Ta, and W are added, or ZnO and GeO are added together with these valence control elements. Bismuth oxide (B1.O0) and lead oxide (P
By coating a metal oxide such as bO), diffusing the metal oxide into the grain boundaries of the porcelain to form an insulating layer at the grain boundaries, and providing electrodes on the surface of the porcelain, a large capacitor can be obtained. This is known. Among such capacitors, SrTiO. as the main ingredient, and Y as an additive.
. O. A composition with a composition ratio of 0.075 mol % of TiO2 and 0.5 mol % of TiO2 was calcined in the atmosphere at 1150°C for 2 hours, and then in a reducing atmosphere consisting of hydrogen % by volume and nitrogen by 8 mol %. A porcelain sample was prepared by firing at 1,400 to 14,300 C for 2 hours. Bi was added to the obtained sample. O. A metal oxide paste mixed with varnish and varnish was applied and baked at 900 to 13,000C in the air for 1 hour to form capacitors with electrodes, as shown in Figures 1 and 2.
The temperature characteristics of the apparent permittivity and the temperature characteristics of the dielectric loss were obtained as shown in the figures. As is clear from the figure,
This type of capacitor contains Bi at the grain boundaries of the porcelain. O. There is a close relationship between the heat treatment temperature when diffusing the capacitor and the characteristics of the resulting capacitor, and in particular, the temperature characteristic of the apparent dielectric constant is flatter when heat treated at a lower temperature. For example, when the heat treatment temperature is 1300℃, -30 to +
Based on the apparent dielectric constant at +25°C in a temperature range of 85°C, its temperature characteristics are +18 to -14.5%, but when heat treated at 900°C, it becomes +2.4 to -1.3. %
It becomes quite flat. However, even if the temperature characteristics of the apparent permittivity are flattened by lowering the heat treatment temperature, the second
As is clear from the figure, the dielectric loss has significantly deteriorated. In this way, even if the temperature characteristics of the apparent permittivity of conventional products are flat, the dielectric loss is poor and the insulation resistance is also deteriorated.Furthermore, as the applied voltage increases, the characteristics worsen, and The drawback was that it could only be used in

この発明は誘電率が大きく、見掛誘電率の温度特性が
平坦で、絶縁抵抗、誘電体損失のすぐれたコンデンサか
ら得られる半導体磁器コンデンサ用組成物を提供するこ
とを目的とする。
An object of the present invention is to provide a composition for a semiconductor ceramic capacitor which can be obtained from a capacitor having a large dielectric constant, flat temperature characteristics of apparent dielectric constant, and excellent insulation resistance and dielectric loss.

特に誘電体損失の電圧依存性の小さいコンデンサが得ら
れる半導体磁器コンデンサ用組成物を提供することを目
的とする。すなわち、この発明の要旨とするところは、
チタン酸ストロンチウムを主体とし、これにYからなる
原子価制御元素を添加して還元雰囲気中で焼結して得ら
れたチタン酸ストロンチウム系半導体磁器の結晶粒界に
、酸化ビスマスがBi2O3に換算して85.0〜99
.9重量%、酸化銅がCuOに換算して、0.1〜15
.0重量%からなる金属酸化物が拡散され、結晶粒界が
絶縁体化されていることを特徴とするものであ・る。
In particular, it is an object of the present invention to provide a composition for a semiconductor ceramic capacitor, which provides a capacitor with a small voltage dependence of dielectric loss. In other words, the gist of this invention is:
Bismuth oxide is converted into Bi2O3 at the grain boundaries of strontium titanate-based semiconductor porcelain, which is mainly composed of strontium titanate and is obtained by adding a valence control element consisting of Y and sintering it in a reducing atmosphere. te85.0~99
.. 9% by weight, copper oxide is 0.1-15 in terms of CuO
.. It is characterized in that a metal oxide consisting of 0% by weight is diffused and the grain boundaries are made into an insulator.

金属酸化物の組成比を限定した理由は、酸化ピスマスが
85.唾量%未満になると、誘電体損失が大きくなると
ともにその温度特性が悪くなる。
The reason for limiting the composition ratio of metal oxides is that pismuth oxide is 85%. When the saliva content is less than %, dielectric loss increases and its temperature characteristics deteriorate.

また99.踵量%を越えると、絶縁抵抗、誘電体損失が
悪くなり、熱処理温度の変化による特性への影響が大き
くなる。また酸化銅が0.1重量%未満では誘電体損失
の電圧依存性を改善する効果がなく、15重量%を越え
ると誘電体損失、特に高温側での誘電体損失が劣化する
。なお、酸化銅の量は上記のように金属酸化物の中で問
題になるとともに、主体となるチタン酸ストロンチウム
系半導体磁器の重量当たり、金属酸化物の重量に換算し
て0.踵量%以下であることが好ましく、この範囲を越
える誘電体損失が劣化して所定の特性のものが得られに
くくなる。
Also 99. If the heel weight exceeds %, the insulation resistance and dielectric loss will deteriorate, and the characteristics will be greatly affected by changes in the heat treatment temperature. Further, if copper oxide is less than 0.1% by weight, there is no effect of improving the voltage dependence of dielectric loss, and if it exceeds 15% by weight, dielectric loss, especially dielectric loss on the high temperature side, deteriorates. The amount of copper oxide is a problem among metal oxides as mentioned above, and the amount of copper oxide is 0.0% per weight of the main strontium titanate semiconductor ceramic. It is preferable that the dielectric loss is less than % of the heel weight, and dielectric loss exceeding this range deteriorates and it becomes difficult to obtain the desired characteristics.

また、ここでチタン酸ストロンチウム系半導体磁器とは
、SrTiO3のみだけではなく、SrTlO3の一部
をCa(30原子%以下)、Ba(10原子%以下)で
置換したものを意味する。ここで、SrTiO3のSr
の一部をCa,Baで置換したチタン酸ストロンチウム
系半導体磁器は昭和5@に発行された研究実用化報告別
冊第28号、第221頁、表35にすでに開示されてい
る。すなわち、これら置換元素を含むチタン酸ストロン
チウム系半導体磁器はSrTiO3により構成された半
導体磁器コンデンサが有する性質を損なわれたものであ
り、各置換元素によつて個々に特性改善を図つたもので
ある。
Furthermore, the strontium titanate semiconductor ceramic herein means not only SrTiO3 but also one in which a part of SrTlO3 is replaced with Ca (30 atomic % or less) or Ba (10 atomic % or less). Here, Sr of SrTiO3
Strontium titanate-based semiconductor porcelain in which a portion of strontium titanate is substituted with Ca or Ba has already been disclosed in Research and Practical Application Report Special Issue No. 28, page 221, Table 35, published in 1932@. That is, the strontium titanate-based semiconductor ceramics containing these substitutional elements have lost the properties of the semiconductor ceramic capacitor composed of SrTiO3, and the characteristics have been individually improved by each substitutional element.

この発明において、Srの一部を30原子%以下のCa
で置換したものは、SrTiO3にくらべて容量温度特
性を改善することができるものである。しかしながら、
30原子%を越えると容量が小さくなり好ましくない。
またSrの一部を10原子%以下の?で置換したものは
、SrTiO3にくらべて容量が大きくなるとともに抗
析強度を向上させることができるが、10原子%を越え
ると誘電体損失が悪くなる。なお、このチタン酸ストロ
ンチウム系半導体磁器において、TiO2を過剰に含有
させることはたとえば特開昭51−12589鰻公報に
開示されており、この発明においても5モル%未満まで
のTiO2を過剰に加えると低温で焼結でき、粒成長が
促進され、また見掛誘電率の温度特性が改善されるなど
好ましい結果を示す。
In this invention, a part of Sr is replaced with Ca of 30 atomic % or less.
When substituted with SrTiO3, the capacitance-temperature characteristics can be improved compared to SrTiO3. however,
If it exceeds 30 atom %, the capacity will become small, which is not preferable.
Also, is the amount of Sr less than 10 atomic %? When substituted with SrTiO3, the capacitance becomes larger and the antiseptic strength can be improved compared to SrTiO3, but when the content exceeds 10 atomic %, the dielectric loss deteriorates. Incidentally, in this strontium titanate-based semiconductor ceramic, the excessive inclusion of TiO2 is disclosed in, for example, Japanese Patent Application Laid-Open No. 12589-1989, and in this invention, too, if TiO2 is added in excess to less than 5 mol%. It shows favorable results such as being able to sinter at low temperatures, promoting grain growth, and improving the temperature characteristics of the apparent dielectric constant.

以下この発明を実施例に従つて詳述する。This invention will be described in detail below with reference to Examples.

実施例 1 第1表に示すような組成比率の磁器組成物が得られるよ
うに、SrTlO3、CaTiO3、BaTiO3など
の主体原料、Y2O3からなる原子価制御元素の各”原
料を適宣配合し、湿式ポツトミルで粉砕、混合したのち
脱水、乾燥した。
Example 1 In order to obtain a porcelain composition having a composition ratio as shown in Table 1, main raw materials such as SrTlO3, CaTiO3, BaTiO3, and each "raw material of a valence control element consisting of Y2O3" were appropriately blended and wet-processed. After pulverizing and mixing in a pot mill, the mixture was dehydrated and dried.

次にバインダとして酢酸ビニル樹脂を約1呼量%添加し
て、約50メツシユに造粒、整粒、油圧プレスを用いて
直径12.5薗肉厚0.6Tn!nの円板に成型した。
成型円板を大気中1150℃で2時間仮焼成し、次いで
水素1熔量%、窒素8容量%からなる還元性雰囲気中に
おいて、1400〜1430℃で2時間一次焼成を行い
、直径10w0n1肉厚0.5?のチタン酸ストロンチ
ウム系半導体磁器試料を得た。
Next, about 1% by volume of vinyl acetate resin was added as a binder, and the particles were granulated into about 50 meshes, sized using a hydraulic press, and had a diameter of 12.5 mm and a wall thickness of 0.6 Tn. It was molded into a disc of n.
The molded disk was pre-fired at 1150°C for 2 hours in the air, and then primary fired at 1400-1430°C for 2 hours in a reducing atmosphere consisting of 1% hydrogen by volume and 8% nitrogen by volume, resulting in a diameter of 10w0n1 wall thickness. 0.5? A strontium titanate semiconductor ceramic sample was obtained.

得られた試料に酸化ビスマス、酸化銅からなる金属酸化
物のペーストを塗布した。
A metal oxide paste consisting of bismuth oxide and copper oxide was applied to the obtained sample.

この金属酸化物ペーストは酸化ビスマス、酸化銅とワニ
スを混練したものである。試料にペーストを塗布する量
は試料の重量当たり金属酸化物に重量に換算して1.5
重量%とし、このペーストを試料の全面に一様な厚さに
塗布し、乾燥させたのち、大気中900〜1300℃で
約1時間焼付けを行つた。さらに、硼硅酸ビスマス鉛を
フリツトとして、これを4重量%含む銀ペーストを試料
の両面に外径8WLの大きさに円形に塗布し、大気中8
00℃で焼付けて電極を形成してコンデンサを作成した
This metal oxide paste is a mixture of bismuth oxide, copper oxide, and varnish. The amount of paste to be applied to the sample is 1.5 in terms of metal oxide weight per weight of the sample.
This paste was applied to the entire surface of the sample to a uniform thickness, dried, and then baked in the air at 900 to 1300° C. for about 1 hour. Furthermore, a silver paste containing 4% by weight of bismuth lead borosilicate as a frit was applied to both sides of the sample in a circular shape with an outer diameter of 8WL, and
A capacitor was created by baking at 00°C to form an electrode.

各コンデンサについて、25℃、1KHz−0.3Vで
見掛誘電率(εs)、誘電体損失(捻nζ)を測定し、
25℃て順当たり50Vの印加電圧で抵抗率を測定し、
さらに−30〜+85℃の温度範囲で+25℃を基準と
しての見掛誘電率の温度変化率および誘電体損失(Ta
nζ)の温度変化率を測定した。第2表はその測定結果
を示したものである。なお、第1表、第2表中※印を付
したものは、この発明範囲外のもの、それ以外はすべて
この発明範囲内のものである。第3図は試料番号1−1
,1−5,1−7, 1−14について、金属酸化物を
磁器の粒界に拡散させるときの熱処理温度と見掛誘電率
の関係を示したものである。
For each capacitor, the apparent permittivity (εs) and dielectric loss (twist nζ) were measured at 25°C and 1KHz-0.3V.
Resistivity was measured at 25°C with an applied voltage of 50V per order,
Furthermore, the temperature change rate of apparent permittivity and dielectric loss (Ta
nζ) was measured. Table 2 shows the measurement results. In Tables 1 and 2, those marked with * are outside the scope of this invention, and all others are within the scope of this invention. Figure 3 shows sample number 1-1.
, 1-5, 1-7, and 1-14, the relationship between the heat treatment temperature and the apparent dielectric constant when a metal oxide is diffused into the grain boundaries of porcelain is shown.

第4図は同じく熱処理温度と誘電ノ体損失の関係図、第
5図は同じく熱処理温度と抵抗率の関係図、第6図は同
じく熱処理温度と見掛誘電率の温度変化率の関係図であ
る。また第7図は試料番号1−1,1−5,1−7,1
−14について、25℃において1KHz10.3Vr
msの条件で測定した見掛誘電率、誘電体損失のバイア
ス電圧依存性を示したものである。
Figure 4 is a diagram of the relationship between heat treatment temperature and dielectric loss, Figure 5 is a diagram of the relationship between heat treatment temperature and resistivity, and Figure 6 is a diagram of the relationship between heat treatment temperature and temperature change rate of apparent permittivity. be. In addition, Fig. 7 shows sample numbers 1-1, 1-5, 1-7, 1.
-14, 1KHz10.3Vr at 25℃
This figure shows the bias voltage dependence of the apparent permittivity and dielectric loss measured under the conditions of ms.

次に、第8図には半導体磁器の結晶粒界に拡散する酸化
ビスマス、酸化銅からなる金属酸化物について、その酸
化銅の量を変化させたときの各電気的特性との関係を示
した。なお、半導体磁器の組成としては、SrTlO3
99.85モル%、Y2O3O.l5モル%のものを用
い、金属酸化物ペーストの拡散熱処理温度を1100℃
とした。実施例 2 半導体磁器の組成についてTiO,の量を変化させたと
きの各電気的特性について測定し、その結果を第9図に
示した。
Next, Figure 8 shows the relationship between various electrical properties when the amount of copper oxide is varied for metal oxides consisting of bismuth oxide and copper oxide that diffuse into the grain boundaries of semiconductor porcelain. . The composition of the semiconductor ceramic is SrTlO3
99.85 mol%, Y2O3O. The diffusion heat treatment temperature of the metal oxide paste was 1100℃ using 15 mol%.
And so. Example 2 Various electrical characteristics were measured when varying the amount of TiO in the composition of semiconductor ceramics, and the results are shown in FIG.

このときのY2O3=0.15モル%とした。半導体磁
器の結晶粒界を絶縁体化する金属酸化物として、酸化ビ
スマスと酸化銅の割合が9鍾量%:4重量%のものを用
い、1100℃で熱拡散させた。以上のごとくこの発明
によれば、大きな誘電率が得られ、誘電体損失、抵抗率
も良好であり、見掛誘電率、誘電体損失の温度特性も平
坦てある。
At this time, Y2O3 was set to 0.15 mol%. As a metal oxide for insulating the grain boundaries of semiconductor porcelain, a metal oxide containing bismuth oxide and copper oxide in a ratio of 9% by weight: 4% by weight was used and thermally diffused at 1100°C. As described above, according to the present invention, a large dielectric constant can be obtained, the dielectric loss and resistivity are also good, and the temperature characteristics of the apparent dielectric constant and dielectric loss are also flat.

5また金属酸化物を磁器の粒界に拡散させるとき、熱処
理温度が変化しても各特性のバラツキは従来のものにく
らべて小さくなつている。
5 Furthermore, when the metal oxide is diffused into the grain boundaries of the porcelain, even if the heat treatment temperature changes, the variation in each property is smaller than in the conventional case.

さらにこの発明のものは高い電圧を印加しても誘電体損
失は小さい値を示し、低い電圧のみならず高い電圧を印
加しても十分満足できる特性を得られ、バイアス電圧依
存性が小さいという特徴を有している。
Furthermore, the device of this invention exhibits a small dielectric loss even when a high voltage is applied, and can obtain sufficiently satisfactory characteristics not only when applying a low voltage but also when a high voltage is applied, and has a characteristic that bias voltage dependence is small. have.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来例の見掛誘電率の温度特性図、第゛2図は
従来例の誘電体損失の温度特性図、第3図は金属酸化物
の熱処理温度と見掛誘電率の関係図、第4図は同じく熱
処理温度と誘電体損失の関係図、第5図は同じく熱処理
温度と抵抗率の関係図、第6図は同じく熱処理温度と見
掛誘電率の温度変化率の関係図、第7図は見掛誘電率、
誘電体損失とバイアス電圧の関係図、第8図は酸化銅の
量を変化させたときの各電気的特性との関係を示す図、
第9図TiO2の量を変化させたときの各電気的特性と
の関係を示す図である。
Figure 1 is a temperature characteristic diagram of apparent permittivity of a conventional example, Figure 2 is a temperature characteristic diagram of dielectric loss of a conventional example, and Figure 3 is a diagram of the relationship between heat treatment temperature and apparent permittivity of metal oxide. , FIG. 4 is a diagram of the relationship between heat treatment temperature and dielectric loss, FIG. 5 is a diagram of the relationship between heat treatment temperature and resistivity, and FIG. 6 is a diagram of the relationship between heat treatment temperature and temperature change rate of apparent permittivity. Figure 7 shows the apparent permittivity,
Figure 8 is a diagram showing the relationship between dielectric loss and bias voltage, and Figure 8 is a diagram showing the relationship between each electrical characteristic when the amount of copper oxide is changed.
FIG. 9 is a diagram showing the relationship with each electrical characteristic when the amount of TiO2 is changed.

Claims (1)

【特許請求の範囲】[Claims] 1 チタン酸ストロンチウムを主体とし、これにYから
なる原子価制御元素を添加して環元雰囲気中で焼結して
得られたチタン酸ストロンチウム系半導体磁器の結晶粒
界に、酸化ビスマスがBi_2O_3に換算して85.
0〜99.9重量%、酸化銅がCuOに換算して、0.
1〜15.0重量%、からなる金属酸化物が拡散され、
結晶粒界が絶縁体化されていることを特徴とする半導体
磁器コンデンサ用組成物。
1 Bismuth oxide changes to Bi_2O_3 in the grain boundaries of strontium titanate-based semiconductor porcelain obtained by adding a valence control element consisting of Y to strontium titanate and sintering it in a ring atmosphere. Converted to 85.
0 to 99.9% by weight, copper oxide converted to CuO, 0.
1 to 15.0% by weight of a metal oxide is diffused,
A composition for a semiconductor ceramic capacitor, characterized in that grain boundaries are made into an insulator.
JP51134562A 1976-11-08 1976-11-08 Composition for semiconductor ceramic capacitors Expired JPS6044816B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51134562A JPS6044816B2 (en) 1976-11-08 1976-11-08 Composition for semiconductor ceramic capacitors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51134562A JPS6044816B2 (en) 1976-11-08 1976-11-08 Composition for semiconductor ceramic capacitors

Publications (2)

Publication Number Publication Date
JPS5358700A JPS5358700A (en) 1978-05-26
JPS6044816B2 true JPS6044816B2 (en) 1985-10-05

Family

ID=15131224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51134562A Expired JPS6044816B2 (en) 1976-11-08 1976-11-08 Composition for semiconductor ceramic capacitors

Country Status (1)

Country Link
JP (1) JPS6044816B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3484332D1 (en) * 1983-02-10 1991-05-02 Matsushita Electric Ind Co Ltd PORCELAIN COMPOSITION FOR VOLTAGE DEPENDENT NONLINEAR RESISTOR.
US4889837A (en) * 1986-09-02 1989-12-26 Tdk Corporation Semiconductive ceramic composition

Also Published As

Publication number Publication date
JPS5358700A (en) 1978-05-26

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