JPS6035874Y2 - 薄片試料作製装置 - Google Patents

薄片試料作製装置

Info

Publication number
JPS6035874Y2
JPS6035874Y2 JP13407279U JP13407279U JPS6035874Y2 JP S6035874 Y2 JPS6035874 Y2 JP S6035874Y2 JP 13407279 U JP13407279 U JP 13407279U JP 13407279 U JP13407279 U JP 13407279U JP S6035874 Y2 JPS6035874 Y2 JP S6035874Y2
Authority
JP
Japan
Prior art keywords
chemical polishing
sample
sample preparation
thin section
preparation device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13407279U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5652243U (US07413550-20080819-C00001.png
Inventor
史夫 志村
純爾 松井
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP13407279U priority Critical patent/JPS6035874Y2/ja
Publication of JPS5652243U publication Critical patent/JPS5652243U/ja
Application granted granted Critical
Publication of JPS6035874Y2 publication Critical patent/JPS6035874Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)
  • ing And Chemical Polishing (AREA)
JP13407279U 1979-09-28 1979-09-28 薄片試料作製装置 Expired JPS6035874Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13407279U JPS6035874Y2 (ja) 1979-09-28 1979-09-28 薄片試料作製装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13407279U JPS6035874Y2 (ja) 1979-09-28 1979-09-28 薄片試料作製装置

Publications (2)

Publication Number Publication Date
JPS5652243U JPS5652243U (US07413550-20080819-C00001.png) 1981-05-08
JPS6035874Y2 true JPS6035874Y2 (ja) 1985-10-24

Family

ID=29365646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13407279U Expired JPS6035874Y2 (ja) 1979-09-28 1979-09-28 薄片試料作製装置

Country Status (1)

Country Link
JP (1) JPS6035874Y2 (US07413550-20080819-C00001.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0444569Y2 (US07413550-20080819-C00001.png) * 1986-06-24 1992-10-21

Also Published As

Publication number Publication date
JPS5652243U (US07413550-20080819-C00001.png) 1981-05-08

Similar Documents

Publication Publication Date Title
CN107796958B (zh) 一种原子力显微镜用胶体探针的制备方法
JPH0895066A (ja) 液晶素子の製造方法及びその装置
US3577267A (en) Method of preparing blood smears
TW200425310A (en) Method of preparing whole semiconductor wafer for analysis
JPH03276622A (ja) モノリシック・シリコン膜集積体およびその製造方法
JPS6035874Y2 (ja) 薄片試料作製装置
TW538148B (en) Method and apparatus for growing high quality single crystal
Vand et al. The Laser as a Light Source for Ultramicroscopy and Light Scattering by Imperfections in Crystals. Investigation of Imperfections in LiF, MgO, and Ruby
WO2007018117A1 (ja) 電子ビームアシストeem法
JP2001144059A (ja) 半導体装置の製造方法
Ohtsuki et al. Electron microscopy of negatively stained and freeze-etched high density lipoprotein-3 from human serum.
US4198788A (en) Method of forming a sharp edge on an optical device
Hellermann et al. Crystal growth of K (Ta1-xNbx) O3 solid solutions
JPS6035873Y2 (ja) 薄片試料作製装置
Pandian et al. TGS crystal growth below and above Curie temperature (Tc)
Ochs Orienting and polishing single crystals for ultrasonic measurements
Khanna et al. Homodyne interferometer for basilar membrane vibration measurements. II. Hardware and techniques
JP2002068899A (ja) 有機単結晶の形成方法
JPS6035872Y2 (ja) 薄片試料作製装置
CN100498415C (zh) 观察工具及使用该工具的观察方法
JPS5612735A (en) Peeling of monocrystalline wafer
Mehta et al. Silicon wafers at sub-μm separation for confined 4 He experiments
Teetsov et al. Micromanipulation of extraterrestrial particles
JPH095251A (ja) 欠陥検査装置
Smith et al. The metallographic preparation of some plutonium-uranium fuel materials