JPS60250230A - 示差屈折計 - Google Patents

示差屈折計

Info

Publication number
JPS60250230A
JPS60250230A JP10698484A JP10698484A JPS60250230A JP S60250230 A JPS60250230 A JP S60250230A JP 10698484 A JP10698484 A JP 10698484A JP 10698484 A JP10698484 A JP 10698484A JP S60250230 A JPS60250230 A JP S60250230A
Authority
JP
Japan
Prior art keywords
slit
sensitivity
light
width
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10698484A
Other languages
English (en)
Japanese (ja)
Other versions
JPH047828B2 (enrdf_load_stackoverflow
Inventor
Mitsuo Kitaoka
北岡　光夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP10698484A priority Critical patent/JPS60250230A/ja
Publication of JPS60250230A publication Critical patent/JPS60250230A/ja
Publication of JPH047828B2 publication Critical patent/JPH047828B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP10698484A 1984-05-26 1984-05-26 示差屈折計 Granted JPS60250230A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10698484A JPS60250230A (ja) 1984-05-26 1984-05-26 示差屈折計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10698484A JPS60250230A (ja) 1984-05-26 1984-05-26 示差屈折計

Publications (2)

Publication Number Publication Date
JPS60250230A true JPS60250230A (ja) 1985-12-10
JPH047828B2 JPH047828B2 (enrdf_load_stackoverflow) 1992-02-13

Family

ID=14447524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10698484A Granted JPS60250230A (ja) 1984-05-26 1984-05-26 示差屈折計

Country Status (1)

Country Link
JP (1) JPS60250230A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5398110A (en) * 1992-04-09 1995-03-14 Shimadzu Corporation Differential refractometer
US7495754B2 (en) * 2005-09-30 2009-02-24 Shimadzu Corporation Differential refractometer and its adjusting method
ES2887026A1 (es) * 2020-06-18 2021-12-21 Univ Cantabria Refractometro y metodo de medida del indice de refraccion de una substancia

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5398110A (en) * 1992-04-09 1995-03-14 Shimadzu Corporation Differential refractometer
US7495754B2 (en) * 2005-09-30 2009-02-24 Shimadzu Corporation Differential refractometer and its adjusting method
ES2887026A1 (es) * 2020-06-18 2021-12-21 Univ Cantabria Refractometro y metodo de medida del indice de refraccion de una substancia

Also Published As

Publication number Publication date
JPH047828B2 (enrdf_load_stackoverflow) 1992-02-13

Similar Documents

Publication Publication Date Title
JP2504356B2 (ja) 示差屈折計
US3474255A (en) Means to detect amount and direction of shaft rotation
JP2962819B2 (ja) 変位測定装置
US3386332A (en) Differential refractometry
US7495754B2 (en) Differential refractometer and its adjusting method
US4200791A (en) Gas analyzer and gas analyzing method
US4279511A (en) Photometric absorption detector
JPS60250230A (ja) 示差屈折計
US3659946A (en) Automated light scattering photometer
US4577106A (en) Spectrophotometer
US3481671A (en) Apparatus and method for obtaining optical rotatory dispersion measurements
US3490875A (en) Photoelectric measuring system including two controlled radiation attenuators
EP0721580A1 (en) A new method of detecting substances in a liquid
RU2007694C1 (ru) Поляриметр
JP4793413B2 (ja) 示差屈折率検出器
JPH0710278Y2 (ja) 屈折率測定装置
JP2526550B2 (ja) 自動分析装置
JPS61277026A (ja) 偏光角検出方法および偏光角検出装置
JPH06317523A (ja) 示差屈折計
JPS5939684B2 (ja) 光学的濃度測定方法
JP2935287B2 (ja) 示差屈折率分光スペクトル測定装置
US3054323A (en) Automatic optical measuring instrument
KR19990027610A (ko) 전동식 파워스티어링장치
JPS63273043A (ja) 連続測定用分光光度計
JPH04303703A (ja) 赤外線式厚み・濃度計

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees