JPS60245139A - Mounting device of semiconductor pellet - Google Patents
Mounting device of semiconductor pelletInfo
- Publication number
- JPS60245139A JPS60245139A JP10143484A JP10143484A JPS60245139A JP S60245139 A JPS60245139 A JP S60245139A JP 10143484 A JP10143484 A JP 10143484A JP 10143484 A JP10143484 A JP 10143484A JP S60245139 A JPS60245139 A JP S60245139A
- Authority
- JP
- Japan
- Prior art keywords
- pellet
- magnification
- image
- camera
- processor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Die Bonding (AREA)
Abstract
Description
【発明の詳細な説明】
〔技術分好〕
本発明は半導体のペレットマウント装置に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION [Technical preference] The present invention relates to a semiconductor pellet mounting device.
従来のベレットマウント装置は第4図に示すように、半
導体ペレッ)1を照明装置lOにより照らし、その反射
光により、ペレットの像を1台のI’lVカメラ11に
て撮影し、その画像をペレット部が白く、ペレット間の
ダイシング溝が黒く写し出すことにより2値化像にする
。次に画像処理部12、演算処理部18を使って、第5
図に示すような2値化像にて、ペレット外形から、ペレ
ット中心値を計算し、ペレットの位置の補正値および不
良マーク17の有無、ダイシング巾16及びペレットの
カケ、ワレ、及び傾き等を良否判定してウエノ・−リン
グ2をのせているXYテーブル4をXYテーブル制御部
14によシ制御し微調を行ったり、不良ペレットはlペ
レット分定ピッチ移動をしたシする。良品ペレットは補
正後マウントヘッド5により送りユニット8上のリード
フレーム7上に連続的にマウントされる。3はリング載
置台であり、まだ6はヘッド部xYテーブルで、該テー
ブル6はXYテーブル制御部14により制御される。し
かし々から、このようなマウント装置においてはITV
カメラの撮像装置にペレット全体が写る為には必らずペ
レットサイズが大きくなると、ズームレンズ90倍率を
小さくしないと、TVモニタ15に全体が写ら々くなる
。As shown in FIG. 4, the conventional pellet mount device illuminates a semiconductor pellet (1) with an illumination device (10), uses the reflected light to take an image of the pellet with one I'lV camera (11), and displays the image. A binarized image is created by showing the pellet part white and the dicing grooves between the pellets black. Next, using the image processing section 12 and the arithmetic processing section 18, the fifth
In the binarized image shown in the figure, the pellet center value is calculated from the pellet outer shape, and the correction value of the pellet position, the presence or absence of defective marks 17, the dicing width 16, and chips, cracks, and tilt of the pellet are determined. After determining the quality, the XY table 4 on which the Ueno ring 2 is placed is controlled by the XY table control section 14 to perform fine adjustment, and defective pellets are moved by one pellet pitch. After correction, the good pellets are continuously mounted on the lead frame 7 on the feed unit 8 by the mount head 5. 3 is a ring mounting table, and 6 is a head xY table, which is controlled by an XY table controller 14. However, in such a mounting device, ITV
In order for the entire pellet to be captured on the image pickup device of the camera, if the pellet size becomes large, the entire pellet will not be captured on the TV monitor 15 unless the zoom lens 90 magnification is reduced.
例えば、分解能がlOμであれば、通常のITVカメラ
(320x240ビツトの撮像領域をもつ)では口2.
6mのペレットまでしか認識できず、それ以上のペレッ
トは分解能を大きくして、すなわち倍率をおとして認識
をせざるをえ々い。倍率が太きいままでは2点目合せの
必要があり、認識時間ががかりすぎる。倍率を小さくす
ると、撮像装置の分解能が大きくなり、マウント精度が
悪くなるという問題がある。倍率を小さくすると、通常
3ト40μ程度のダイシング溝がペレットサイズに比し
て小さくなりすぎ、画像処理の白黒の2値化像にしだ時
に、黒の部分がなくなってしまう為、ウェハーを引伸し
を行うペレットの位置補正機構が必要であった。For example, if the resolution is lOμ, a normal ITV camera (with an imaging area of 320 x 240 bits) will capture 2.
It can only recognize pellets up to 6 m long, and for pellets larger than that, the resolution must be increased, that is, the magnification must be lowered. If the magnification remains high, it is necessary to align the second point, which takes too much recognition time. When the magnification is decreased, the resolution of the imaging device increases, which causes a problem in that the mounting accuracy deteriorates. When the magnification is reduced, the dicing grooves, which are usually about 3 to 40μ, become too small compared to the pellet size, and when the black and white binary image is converted into a black and white image during image processing, the black part disappears, so it is necessary to enlarge the wafer. A pellet position correction mechanism was required to do so.
本発明の目的は上記欠点を除去しウェハーの引伸しなし
に、ペレットが大きくなった時でも高い認識精度を持ち
、短い認識時間にてペレットの位置決め及び良否判定を
行う認識装置付きのマウンターを提供することにある。An object of the present invention is to eliminate the above-mentioned drawbacks, and to provide a mounter equipped with a recognition device that has high recognition accuracy even when the pellet becomes large, and that positions the pellet and determines its acceptability in a short recognition time without enlarging the wafer. There is a particular thing.
本発明は同一の半導体ペレット表面を写し出す複数台の
倍率可変のITVカメラと、照明装置と、カメラより取
込んだ画像を処理する画像処理部と、その画像データに
よりペレット位置の補正を行いペレットの良否を判定す
る演算処理部と、その補正値によりペレット位置を補正
するXYテーブルとを有することを特徴とする半導体ペ
レットのマウント装置である。The present invention includes a plurality of ITV cameras with variable magnification that image the surface of the same semiconductor pellet, an illumination device, an image processing unit that processes images captured by the cameras, and corrects the pellet position based on the image data. This is a semiconductor pellet mounting device characterized by having an arithmetic processing unit that determines acceptability and an XY table that corrects the pellet position based on the correction value.
次に本発明を実施例を用い、図面を参照して説明する。 Next, the present invention will be explained using examples and with reference to the drawings.
第1図〜第3図において、第4図、第5図の構成と同一
のものには同一符号を付して説明する。In FIGS. 1 to 3, the same components as those in FIGS. 4 and 5 will be described with the same reference numerals.
第1図は本発明の一実施例の概略構成ブロック図である
。第1図において、本発明は照明装置lOによシ照らさ
れたペレットの反射光をレンズ系18の中を通してプリ
ズム19により2方向に反射させられた2つの像を同時
に写し出す2台のITVカメラを設けたものであり、各
ITVカメラ20.21の倍率が可変であり、各ペレッ
ト全体を写し出す程度の倍率と、ペレットの角が十分大
きく写し出されるくらいの高倍率の2種類にしておき、
ペレットのコーナーが写し出されるようにする。FIG. 1 is a schematic block diagram of an embodiment of the present invention. In FIG. 1, the present invention uses two ITV cameras that simultaneously capture two images in which the reflected light of the pellet illuminated by the illumination device IO is reflected in two directions by a prism 19 through a lens system 18. The magnification of each ITV camera 20 and 21 is variable, and there are two types of magnification: one that shows the entire pellet, and one that is high enough to show the corners of the pellet sufficiently large.
Make sure the corners of the pellet are visible.
例えばITVカメラ20を高倍率とし、該カメラ20の
撮像管上に第2図のように像が写し出されるとする。カ
メラ20は高倍率なので、引伸し無しのフルカットウェ
ハーでも、ダイシング溝巾16が十分黒く見え画像処理
部12にて2値化処置を行ったあと、演算処理部13に
て演算処理が行われ、XYテーブル制御部14にて位置
補正が精度よく行える。For example, assume that the ITV camera 20 has a high magnification and an image is projected on the image pickup tube of the camera 20 as shown in FIG. Since the camera 20 has a high magnification, even on a fully cut wafer without enlarging, the dicing groove width 16 appears sufficiently black, and after the image processing section 12 performs binarization processing, the arithmetic processing section 13 performs arithmetic processing. Position correction can be performed with high precision by the XY table control section 14.
一方、第3図のように位置決めと同時にITVカメラ2
1により、低倍率にてペレット全体を写し出しだ時に不
良マーク17の検出及びペレットのカケ、ワレ、傾き等
の検出を行い、良否の判定を演算処理部13にて行い、
良品ペレットをマウントヘッド5でpick upする
場合には、マウントヘッド5およびXYテーブル6のス
タート信号を出す。不良ペレットの場合にはリングのX
Yテーブル4に信号を出し、ペレットピッチ分だけスキ
ップし、隣りのペレットの認識を行う。On the other hand, as shown in Figure 3, at the same time as positioning, the ITV camera 2
1, when the entire pellet is imaged at low magnification, the defective mark 17 is detected, and chips, cracks, tilts, etc. of the pellet are detected, and the arithmetic processing unit 13 determines whether the pellet is good or bad.
When a good pellet is to be picked up by the mount head 5, a start signal for the mount head 5 and the XY table 6 is issued. If the pellet is defective, mark it with an X on the ring.
A signal is sent to the Y table 4, the pellet pitch is skipped, and the adjacent pellet is recognized.
す々わち、同一の画像を違う倍率にて同時に演算処理す
ることで、短時間にて位置決めができるのである。In other words, positioning can be performed in a short time by processing the same image at different magnifications at the same time.
本発明は以上説明したように同一画像を違う倍率にて同
時に演算処理するようにしだので、フルカットダイシン
グの引伸し無しウェハーにおいても、ペレットサイズに
よらず、高い認識精度で認識でき、認識時間も2点目合
せ時の半分で行うことができる効果を有するものである
。As explained above, since the present invention simultaneously processes the same image at different magnifications, it can be recognized with high recognition accuracy regardless of the pellet size, even on wafers without enlarging in full-cut dicing, and the recognition time can be reduced. This has the effect that the second point alignment can be performed in half the time.
第1図は本発明の実施例を示す概略構成図、第2図は高
倍率のカメラの画像処理後の図、第3図は低倍率のカメ
ラの画像処理後の図、第4図は従来のマウント装置の概
略構成図、第5図は画像処理後の2値化像の一例を示す
図である。
l・・半導体ペレット、2・・・ウェハーリング、8・
・・リング載台、4・・・XYテーブル、5・・マウン
トヘッド、6 ヘッド部XYテーブル、7・・・リード
フレーム、8 送りユニット、9・・ズームレンズ、1
0・・・照明装置、11−・・ITVカメラ、12・・
画像処理部、13・・・演算処理部、14.・・・XY
テーブル制御部、15・・・TVモニター、 16・・
ダイシング溝巾、17・・・不良マーク、18 レンズ
系、19・・・プリズム、20・・・TTVカメラ、2
1・・・ITVカメラ。
特許出願人 日本電気株式会社Figure 1 is a schematic configuration diagram showing an embodiment of the present invention, Figure 2 is a diagram of a high magnification camera after image processing, Figure 3 is a diagram of a low magnification camera after image processing, and Figure 4 is a conventional diagram. FIG. 5 is a diagram showing an example of a binarized image after image processing. l...Semiconductor pellet, 2...Wafer ring, 8...
...Ring stand, 4...XY table, 5...Mount head, 6 Head section XY table, 7...Lead frame, 8 Feeding unit, 9...Zoom lens, 1
0...Lighting device, 11-...ITV camera, 12...
Image processing section, 13... Arithmetic processing section, 14. ...XY
Table control unit, 15...TV monitor, 16...
Dicing groove width, 17... Defective mark, 18 Lens system, 19... Prism, 20... TTV camera, 2
1...ITV camera. Patent applicant: NEC Corporation
Claims (1)
率可変のITVカメラと、照明装置と、カメラより取込
んだ画像を処理する画像処理部と、その画像データによ
りペレット位置の補正を行い、ペレットの良否を判定す
る演算処理部と、その補正値によりペレット位置を補正
するXYテーブルとを有することを特徴とする半導体ペ
レットのマウント装置。(1) A plurality of ITV cameras with variable magnification that image the same semiconductor pellet surface, an illumination device, an image processing unit that processes images captured by the cameras, corrects the pellet position using the image data, and 1. A semiconductor pellet mounting device comprising: an arithmetic processing unit that determines the quality of the semiconductor pellet; and an XY table that corrects the pellet position based on the correction value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10143484A JPS60245139A (en) | 1984-05-19 | 1984-05-19 | Mounting device of semiconductor pellet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10143484A JPS60245139A (en) | 1984-05-19 | 1984-05-19 | Mounting device of semiconductor pellet |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60245139A true JPS60245139A (en) | 1985-12-04 |
Family
ID=14300586
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10143484A Pending JPS60245139A (en) | 1984-05-19 | 1984-05-19 | Mounting device of semiconductor pellet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60245139A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH077028A (en) * | 1993-06-16 | 1995-01-10 | Shibuya Kogyo Co Ltd | Semiconductor alignment method |
-
1984
- 1984-05-19 JP JP10143484A patent/JPS60245139A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH077028A (en) * | 1993-06-16 | 1995-01-10 | Shibuya Kogyo Co Ltd | Semiconductor alignment method |
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