JPS60227175A - Testing method of printed board - Google Patents
Testing method of printed boardInfo
- Publication number
- JPS60227175A JPS60227175A JP59084902A JP8490284A JPS60227175A JP S60227175 A JPS60227175 A JP S60227175A JP 59084902 A JP59084902 A JP 59084902A JP 8490284 A JP8490284 A JP 8490284A JP S60227175 A JPS60227175 A JP S60227175A
- Authority
- JP
- Japan
- Prior art keywords
- printed board
- test
- conductor
- contact
- holes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
+8) 発明の技術分野
本発明はプリント板の試験方法、特に導通試験方法の新
方式に関する。DETAILED DESCRIPTION OF THE INVENTION +8) Technical Field of the Invention The present invention relates to a method for testing printed circuit boards, and in particular to a new method for testing continuity.
fb) 従来技術と問題点
電子技術の驚異的な進歩に伴って、膨大な量のプリント
基板が使用されており、プリント板が多様化して品種が
豊富になると共に、高密度・多層化された高度なプリン
ト板が汎用されるようになってきた。fb) Conventional technology and problems With the amazing progress in electronic technology, a huge amount of printed circuit boards are being used, and as printed circuit boards become more diverse and available in a wide variety of products, they are also becoming more dense and multi-layered. Advanced printed circuit boards have come into widespread use.
第1図はプリント@1の部分平面図を例示しており、1
1は回路パターン、12はスルーホールで、プリント板
1自体は有機樹脂板またはセラミック板からなる絶縁体
である。且つ、スルーホール12の位置は一般に規格化
されており、格子(グリッド)状の点、即ち格子点10
にスルーホ一ル12が配置されて(オングリッド・プリ
ント板と云う)、格子点の間隔は2.54mmあるいは
1.27tm等と定められている。FIG. 1 illustrates a partial plan view of Print@1.
1 is a circuit pattern, 12 is a through hole, and the printed board 1 itself is an insulator made of an organic resin board or a ceramic board. In addition, the positions of the through holes 12 are generally standardized, and the positions of the through holes 12 are generally standardized, and the positions of the through holes 12 are arranged at grid points, that is, grid points 10.
A through hole 12 is arranged on the board (referred to as an on-grid printed board), and the interval between grid points is set to 2.54 mm or 1.27 tm.
このようなプリント板は、製作時に種々の検査がなされ
るが、その中で回路パターンの導通試験(断線や短絡の
チェック)はスルーホールに接触ピンを接触させて行な
っており、その試験方法は凡そ、次のようなものである
。Such printed boards are subjected to various inspections during production, and the continuity test (checking for disconnections and short circuits) of the circuit pattern is performed by touching contact pins to the through holes, and the testing method is as follows: It is roughly as follows.
即ち、第2図に示すように被試験用のプリン1−板1に
対し試験治具2を対向して配置し、スルーボール12と
相対する位置(格子点10の位置)に接触ピン21を立
てて、スルーホール12と接触させ、試験治具2の反対
面で接触ピン21と試験機の端子(図示せず)と接続さ
せて導通試験を行なう方法である。That is, as shown in FIG. 2, the test jig 2 is placed facing the pudding 1-board 1 to be tested, and the contact pin 21 is placed at a position facing the through ball 12 (lattice point 10). In this method, a continuity test is performed by holding the test jig 2 upright, bringing it into contact with the through hole 12, and connecting the contact pin 21 with a terminal (not shown) of a tester on the opposite side of the test jig 2.
ところが、プリント板の高密度化によって、格子点にス
ルーホール12を配置し難い品種のプリント板(オフグ
リッド・プリント板)も製作されるようになってきてお
り、その場合は格子点上に接触ピン21を配置した試験
治具2を用いても、スルーホール12と接触させること
ができない。従って、その時には、第3図に示すように
プリン1−板1と試験治具2との間にアダプタ3を介在
せしめ、接触ピン21を斜めに修正して、格子点にない
スルーホール12°に接触ピン21が接鮪するように図
っている。However, due to the increasing density of printed boards, types of printed boards (off-grid printed boards) in which it is difficult to arrange through holes 12 at grid points are also being manufactured. Even if the test jig 2 in which the pins 21 are arranged is used, the pins 21 cannot be brought into contact with the through holes 12. Therefore, at that time, as shown in FIG. 3, an adapter 3 is interposed between the print 1-board 1 and the test jig 2, and the contact pin 21 is corrected diagonally to form a through hole 12 degrees that is not at the grid point. The contact pin 21 is designed to be in contact with the contact pin 21.
しかしながら、このようなアダプタ3を介在させる方法
は、プリン1−板の品種に合致したそれぞれの種類のア
ダプタを作成しなければならない。However, in this method of interposing the adapter 3, it is necessary to create each type of adapter that matches the type of printer 1-board.
(C)発明の目的
本発明は、このようなアダプタを必要とすることなく、
容易に接触できる導通試験方法を提案するものである。(C) Purpose of the Invention The present invention does not require such an adapter;
This paper proposes a continuity test method that allows easy contact.
(dl 発明の構成
その目的は、−主面より試験機に接続する試験治具の反
対面に、相対する被試験用プリント板の1格子点を含む
導体ランドを配列し、一方の被試験用プリント板のスル
ーホールには導体ボールを嵌め込んで、該導体ボールと
前記導体ランドとを接触させて導通試験を行なうように
したプリント板の試験方法によって達成される。(dl Structure of the Invention The purpose is to arrange conductive lands including one lattice point of the opposing printed board to be tested on the opposite surface of the test jig connected to the testing machine from the main surface, and This is achieved by a printed board testing method in which a conductive ball is fitted into a through hole of the printed board, and the conductive ball and the conductive land are brought into contact to perform a continuity test.
また、−主面より試験機に接続する試験治具の反対面に
おいて、相対する被試験用プリント板の格子点に相当す
る位置から導体ボールをワイヤで吊し、該導体ボールを
被試験用プリント板のスルーホールに嵌め込んで、導通
試験を行なうようにしたプリント板の試験方法によって
も達成される。In addition, on the opposite side of the test jig that is connected to the tester from the main surface, hang a conductor ball with a wire from a position corresponding to the lattice point of the opposing printed board under test, and hang the conductor ball on the printed board under test. This can also be achieved by a printed board testing method in which a continuity test is performed by inserting the board into a through hole in the board.
te+ 発明の実施例 以下5図面を参照して実施例によって詳細に説明する。te+ Example of invention Examples will be described in detail below with reference to five drawings.
第4図(alは本発明にかかる一実施例の試験方法の概
要断面図を示しており、同図fb)は本発明にかかる試
験治具の部分平面図(被試験用プリント板と接触する面
から見た平面図)を示している。FIG. 4 (al shows a schematic sectional view of a test method according to an embodiment of the present invention, and FIG. The figure shows a plan view (viewed from the surface).
図のように、被試験用のプリント板1のスルーホール1
2.12′上に導体ボール15を嵌め込んで、そのプリ
ント板lの上に本発明にかかる試験治具4を当接し、導
体ボール15を試験治具4の導体ランド41に接触させ
る。試験治具4の導体ラント”41は、同図fblの部
分平面図に示すように格子点10を中心に方形の導体ラ
ンド41をマトリックス状に配置している。このように
すれば、オフグリ・ノド・プリント板のように、スルー
ホール12′が格子点にない場合でも導体ボール15と
導体ランド41とを接触させることができる。又、勿論
、オングリッド・プリント板にも利用できる。As shown in the figure, through hole 1 of printed board 1 to be tested
2. Fit the conductor ball 15 onto the printed board l, and bring the test jig 4 according to the present invention into contact with the printed board l, and bring the conductor ball 15 into contact with the conductor land 41 of the test jig 4. As shown in the partial plan view of FIG. Even when the through holes 12' are not located at lattice points, as in the case of a grid printed board, the conductor ball 15 and the conductive land 41 can be brought into contact with each other.Of course, it can also be used for an on-grid printed board.
この場合、例えばl muψのスルーホール12に対し
て、1.5+nφ程度の導体ボール15を用いる。且つ
、スルーホールに導体ボール15を嵌め込むためには、
プリント板lを裏面より真空吸引した状態(次の第5図
参照のこと)にして、表面で導体ボール15を転がせる
。そうすると、すべてのスルーボールが導体ボールで埋
められる。更に、導体ボールを真空吸引したまま試験す
ると、十分な接触かえられて、試験の信頼性を高めるこ
ともできる。In this case, for example, a conductor ball 15 of approximately 1.5+nφ is used for a through hole 12 of l mu φ. In addition, in order to fit the conductor ball 15 into the through hole,
The printed board 1 is brought into a state where vacuum suction is applied from the back side (see FIG. 5 below), and the conductor balls 15 are rolled on the front side. Then, all through balls are filled with conductor balls. Furthermore, if the conductor ball is tested while being vacuumed, sufficient contact can be made and the reliability of the test can be increased.
また、導体ランドにスプリング性を与えると、一層良い
接触が保てる。Furthermore, if the conductor land has spring properties, better contact can be maintained.
次に、第5図は本発明にかかる他の実施例の概要断面図
を示しており、本例の試験治具5は格子点10から導体
ボール15をワイヤで吊したもので、その導体ボールを
被試験用プリント板のスルーホール12に嵌め込んで、
導通試験を行なう。そうすると、スルーホール12.1
2’が格子点10にあると否とに関係なく、試験治具を
通して試験機に接続することができる。Next, FIG. 5 shows a schematic sectional view of another embodiment according to the present invention, and the test jig 5 of this embodiment has a conductor ball 15 suspended from a lattice point 10 by a wire. Insert it into the through hole 12 of the printed board to be tested,
Perform a continuity test. Then, through hole 12.1
Regardless of whether 2' is at the grid point 10 or not, it can be connected to the test machine through the test fixture.
スルーホールに導体ボール15を嵌め込むには、図のよ
うにプリント板1を真空吸引用収容箱6に収め、プリン
ト板裏面より真空吸引した状態で、試験治具5をプリン
ト板1に当てる。また、裏面に磁石Nを設け、導体ボー
ルエ5を磁性体にして磁力を附加すれば、接触力は一層
゛強まる。更に、この例では試験治□具5とプリント板
1との間に、マトリックス状の枠7を挟んでおくと、導
体ボールかお互いに接触しないようになって、好都合で
ある。To fit the conductor balls 15 into the through holes, the printed board 1 is placed in the vacuum suction storage box 6 as shown in the figure, and the test jig 5 is applied to the printed board 1 while vacuum is being suctioned from the back side of the printed board. Furthermore, if a magnet N is provided on the back surface and the conductor ball 5 is made of a magnetic material to apply magnetic force, the contact force will be further strengthened. Furthermore, in this example, it is convenient to sandwich a matrix-shaped frame 7 between the test jig 5 and the printed board 1, so that the conductor balls do not come into contact with each other.
(f) 発明の効果
以上の説明から明らかなように、本発明によればアダプ
タを用いなくても、オングリッド・プリント板、オフグ
リッド・プリンl−板の両方の導通試験を行なうことが
でき、且つ、接触ズレの心配がなくなって試験が高信頼
化できる。(f) Effects of the Invention As is clear from the above explanation, according to the present invention, continuity tests can be performed on both on-grid printed boards and off-grid printed boards without using an adapter. In addition, there is no need to worry about contact displacement, making the test highly reliable.
更に、第4図に説明した実施例では、プリント板の品種
(導電パターンの異なる種類)に関係なく、汎用性ある
試験治具にすることもできる。Furthermore, the embodiment described in FIG. 4 can be used as a versatile test jig regardless of the type of printed board (different types of conductive patterns).
第1図はプリント板の部分平面図、第2図および第3図
は従来の試験方法を示す概要断面図、第4図(alは本
発明にかかる一実施例の試験方法を示す概要断面図、第
4図(b)は同図falの試験治具の部分平面図、第5
図は本発明にかかる他の実施例の試験方法を示す概要断
面図である。
図中、1はプリント板、2は従来の試験治具。
3はアダプタ、4.5は本発明にかかる試験治具。
6は真空吸引用収容箱、7はマトリックス状の枠。
10は格子点、11は導体パターン、12はスルーホー
ル、15は導体ボール、41は導体ランド、Nは磁石を
示している。
第1図
182図
第3図
第4図
第5図
ノリト夏(FIG. 1 is a partial plan view of a printed board, FIGS. 2 and 3 are schematic cross-sectional views showing a conventional test method, and FIG. 4 (al is a schematic cross-sectional view showing a test method according to an embodiment of the present invention) , FIG. 4(b) is a partial plan view of the test jig shown in FIG.
The figure is a schematic sectional view showing a test method according to another embodiment of the present invention. In the figure, 1 is a printed board and 2 is a conventional test jig. 3 is an adapter, and 4.5 is a test jig according to the present invention. 6 is a storage box for vacuum suction, and 7 is a matrix-shaped frame. 10 is a lattice point, 11 is a conductor pattern, 12 is a through hole, 15 is a conductor ball, 41 is a conductor land, and N is a magnet. Figure 1 Figure 182 Figure 3 Figure 4 Figure 5 Norito Natsu (
Claims (2)
に、相対する被試験用プリント板の1格子点を含む導体
ランドを配列し、一方の被試験用プリント板のスルーホ
ールには導体ボールを嵌め込んで、該導体ポールと前記
導体ランドとを接触させて導ilN試験を律なうように
したことを特徴とするプリント板の試験方法。(1) - On the opposite side of the test jig that is connected to the tester from the main surface, arrange conductor lands that include one lattice point of the opposing printed board under test, and connect them to the through holes of one printed board under test. A method for testing a printed circuit board, characterized in that a conductor ball is inserted and the conductor pole and the conductor land are brought into contact with each other to control the conductor IN test.
において、相対する被試験用プリント板の格子点に相当
する位置から導体ポールをワイヤで吊し、該導体ボール
を被試験用プリント板のスルーホールに嵌め込んで、導
通試験を行なうようにしたことを特徴とするプリント板
の試験方法。(2) - On the opposite side of the test jig connected to the testing machine from the main surface, hang a conductor pole with a wire from a position corresponding to the lattice point of the opposing printed board under test, and place the conductor ball on the opposite side of the test jig. A method for testing a printed board, characterized in that a continuity test is performed by inserting the printed board into a through hole of the printed board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59084902A JPS60227175A (en) | 1984-04-25 | 1984-04-25 | Testing method of printed board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59084902A JPS60227175A (en) | 1984-04-25 | 1984-04-25 | Testing method of printed board |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60227175A true JPS60227175A (en) | 1985-11-12 |
Family
ID=13843664
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59084902A Pending JPS60227175A (en) | 1984-04-25 | 1984-04-25 | Testing method of printed board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60227175A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030043327A (en) * | 2001-11-27 | 2003-06-02 | 허상록 | Power connector of jig for tester |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5016087B1 (en) * | 1971-09-01 | 1975-06-10 | ||
JPS5984901A (en) * | 1982-09-30 | 1984-05-16 | エクソン・リサ−チ・アンド・エンジニアリング・カンパニ− | Preparation of conjugate diene butyl |
-
1984
- 1984-04-25 JP JP59084902A patent/JPS60227175A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5016087B1 (en) * | 1971-09-01 | 1975-06-10 | ||
JPS5984901A (en) * | 1982-09-30 | 1984-05-16 | エクソン・リサ−チ・アンド・エンジニアリング・カンパニ− | Preparation of conjugate diene butyl |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030043327A (en) * | 2001-11-27 | 2003-06-02 | 허상록 | Power connector of jig for tester |
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