JPS6022677A - Ic testing device - Google Patents

Abstract

PURPOSE:To improve the use efficiency of a power source and to lower the cost of a device by providing a programmable power source whose purpose can be changed optionally to use it as a power source for a sample, a power source for input level setting, or a power source of output level decision. CONSTITUTION:In accordance with a type of an IC to be tested, some of outputs of programmable power sources 15-20 are selected and led to power supply terminals of the IC to be tested as power sources for the sample and some of them are selected and led to input drivers 22-27 as input level setting power sources and others are selected and led to output level discriminators 28-33 as output level discriminating power sources by a multiplexer 21. An optional circuit setting is given to the multiplexer 21 to use individual programmable power sources 15-20 as power sources of any type.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a programmable power supply for an IC testing device that tests the electrical characteristics of an IC.

Generally, the above IC test equipment performs the following tests necessary for the operation of the IC under test.
a sample power supply to be applied to the power supply terminal of the IC under test;
The application pattern applied to the input terminal of the IC under test is...
It is a well-known fact that the IC is equipped with an input level setting power supply that determines the voltage level, and an output level determination power supply that serves as a reference for comparison and judgment of output voltage values when determining the output pattern of the IC under test. be. Each of these power sources is called a programmable power source because the voltage value can be set arbitrarily.

In general, ICs have a plurality of power supply terminals that each require different voltages, an IC that has an input terminal that requires a high/low voltage level consisting of a plurality of combinations of different 'ilz pressure values, Alternatively, there are devices that have multiple output terminals that output different voltage levels, each with a combination of high and low output voltage values, and as a result, it is required to be able to test more ICs. For this purpose, a general-purpose IC testing device needs to be equipped with a plurality of sample power supplies, a plurality of input level setting power supplies, and a plurality of output level determination power supplies. Furthermore, in conjunction with the recent trend of increasing IC integration and expanding the fields of IC use, a single I
As seen in the example of mixing digital and analog circuits in a C chip, the interior of an I(Jt) will increasingly take on the appearance of a complex of different circuit blocks governed by various voltage rules. It is seen as a thing.

In contrast, in conventional IC test equipment, the power supply for the sample, the power supply for input level setting, and the power supply for output level judgment can all be used only for their respective purposes, and as a result, the power supply for the IC to be tested is Depending on the type, there is a major drawback in that there may be a shortage of either a power supply for the sample, a power supply for setting the input level, or a power supply for determining the output level. On the other hand, in order to resolve such situations,
This requires the provision of more programmable power supplies, which has the disadvantage of increasing the cost of the IC test equipment.

It is an object of the present invention to alleviate the drawbacks of such conventional IC test equipment as much as possible.

In other words, the feature of the present invention is that each of the above programmable power supplies can be used individually as a sample mold, sometimes as a source for input level setting, and sometimes as a power supply for output level determination. It lies in what is possible.

An embodiment of the present invention will be described below with reference to the drawings.

FIG. 1 shows a general example of a conventional IC testing device.

In the figure, reference numeral 1.2 is a sample power supply that outputs different voltages, and its output is led to the power supply terminal of the IC under test.
It is used as a power source. In addition, 3 and 4 are different labels, a power supply for input level setting that outputs pressure, 5.6 is an input driver, and 7.8 is a mark) 1]! The application patterns generated by 7 and 8 are applied to 5 and 6, respectively, and the outputs of 5 and 6 are converted to voltage values output by 3 and 4. When the person's cover is turned, the input terminal [4] of the IC under test is opened.

Next [9 and 10 are power supplies for output level judgment that output different voltages, 11 and 12 are output level judgment units, 13 and 14 (1, i are logic judgment devices that judge whether they are good or bad, and their operation is of the IC under test without removing it]
The outputs of ICs with different paper pressure levels are led to 11 and 12, and the voltage values output at 9 and 10 are used as criteria for judgment.
1,,O) is converted into logical information of the 11th, its (1,0)
The logic information is further checked by 13 and 14 to determine whether it is good or bad.

In such a state, the programmable power supplies 1 and 2 are used only as power supplies for the sample, the programmable power supplies 3 and 4 are used only as galvanic corrosion for setting the input level, and the programmable power supplies 9 and 10 are used only for determining the output level. IC'f! can only be used as a power source, and as a result, for example, an IC'f! that requires more power supply only for the sample, or an IC'f! that requires more power supply especially for output level determination. How do ICs that require a large number of power supplies of a particular type end up requiring more power supplies of each type than the IC test equipment is equipped with? This means that you will not be able to take the test.

Referring to FIG. 2, an embodiment of an IC testing device according to the present invention will be described. 15,16°17.18,1 in Figure 2
9.20 is a programmable power supply 21 is a multiplexer
122, 2: L 24, 25° 26.27 is an input driver, 28, 29, 30° 31, 32, 33 is an output level judger, and in Fig. 2, the applied backoon generation as shown in Fig. 1 is shown. The description of the device and the logical judgment device for determining whether it is good or bad is omitted. In the second eIVC, programmable power supply 15. '16.17,18,19
Each output of ゜20 is once sent to the multiplexer 21, and depending on the type of IC under test pf4 IC, one of them is connected to the power supply terminal of the IC under test as a sample power supply, and one of them is connected to an input driver as a power supply for input level setting. Either one of them is selected and led to the output level determiner as a power source for output level determination. At this time 15.16.17, 18, 1
9.20 programmable power supplies can be used as any type of power supply by giving the multiplexer circuit settings completely arbitrarily, increasing the utilization efficiency of the programmable power supply, and eliminating the bias of type A. Even when the purpose is to test an IC that only requires a power supply, conventional IC
This has the advantage of alleviating the shortcomings found in test equipment.

[Brief explanation of drawings]

FIG. 1 is a diagram showing a conventional IC testing device, and FIG. 2 is a diagram showing an example of an IC testing device according to the present invention. L and 2...8゛Experimental power supply and L7 programmable 6 sources, 3 and 4...Programmable power supply as power supply for input level setting, source, 5 and 6...
... Input driver, 7 and 8 ... Application pattern generator, 9 and 10 ... Power supply for output level judgment, 11 and 12 ... Output level judgment device, 13 and 14...Logic determining device fK that determines whether it is good or bad. 15, 16.17.18.19 and 20.
...70 grama pull power supply, 21...Multiplexer 122, 23, 24, 25, 26 and 2
7... Input driver, 28, 29, 30, 3
1゜32 and 33...--does not represent output level determiner. ＼J裟 7-r＼ Agent Patent Attorney Yo Uchihara 1.ノ, )\ -, / /4 Figure 1

Claims (1)

[Claims] A power source that can be arbitrarily selected and used as a power source for the IC under test, a reference power source for setting the input voltage of the IC under test, or a reference power source for determining the output voltage of the IC under test, and a selection means. I characterized by comprising
C test equipment.