JPS60226142A - Module structure - Google Patents

Module structure

Info

Publication number
JPS60226142A
JPS60226142A JP8170484A JP8170484A JPS60226142A JP S60226142 A JPS60226142 A JP S60226142A JP 8170484 A JP8170484 A JP 8170484A JP 8170484 A JP8170484 A JP 8170484A JP S60226142 A JPS60226142 A JP S60226142A
Authority
JP
Japan
Prior art keywords
substrate
sealing
metallization
brazing
module structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8170484A
Other languages
Japanese (ja)
Inventor
Yutaka Tokunaga
徳永 豊
Kazuo Hirota
和夫 廣田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8170484A priority Critical patent/JPS60226142A/en
Publication of JPS60226142A publication Critical patent/JPS60226142A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15312Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE:To produce a module structure for hybrid IC pertinent to miniaturization capable for high density mounting by a method wherein one end of multilayered wiring substrate is metallized for brazing any sealing material etc. CONSTITUTION:One end of multilayered wiring substrate 1 is metallized for sealing to braze a metallic cap 5 using brazing material 6. The brazing material 6 wets both a solder end and the metallic cap 5 to form a fillet. Through these procedures, the substrate 1 may be miniaturized by means of effectively utilizing the end thereof resultantly contributing to the improvement of active mounting density, the reduction of substrate material cost as well as the manufacturing yield.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、LSI等を実装したノ・イブリッドICに係
り、特に封止構造体取付は部の小型化に適するモジュー
ル構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a no-brid IC mounted with an LSI or the like, and in particular to a module structure suitable for miniaturization of a part in which a sealing structure is attached.

〔発明の背景〕[Background of the invention]

第1図にLSIを搭載した従来のノーイブリッドICの
断面図を示す。1けセラミクス基板で、その中には、W
、Noなどの導体による配線層が形成されている。4け
LSIチップで、ワイアボンド、テープキャリア、CC
Bなどの方法で基板1の配線と接続されている。3は基
板1にろう接された入出力ピンである。このよりなノ・
イブリッドI C’では、通常、LSIやワイア。
FIG. 1 shows a cross-sectional view of a conventional no-brid IC equipped with an LSI. It is a single ceramic substrate with W inside it.
, No., and the like are formed. 4-chip LSI chip, wire bond, tape carrier, CC
It is connected to the wiring of the board 1 by a method such as B. 3 is an input/output pin soldered to the board 1. More than this
Hybrid IC' is usually LSI or wire.

配線等を外部と遮断し腐蝕等金防ぐたみに、封止を行な
う。図において、5は封止用の金属製キャップで、通常
、42アロイ、コバール々とが用いられている。このキ
ャップ5け基板表面の周日に施されたメタライズ2の上
にはんだ、ALLSn銀ろうなどによりろう付されてい
る。第2図は他の従来例で、封止、あるいは冷却体の保
持、あるいはモジュール全取付ける手段としての金属製
フランジ7?セラミツク基板1の裏面に取付けたもので
ある。図でわかるように、従来例では、このろう付する
メタライズが配線基板の主平面に位置している。その結
果、第1図の例ではチップ搭載領域が減じ、第2図の例
では入出力ピン領域が減じるとともに、外部に出たフラ
ンジ7はこのハイブリッドICfマザーボードに密に実
装するのを妨げている。従って、従来例ではチップ搭載
部の実装密度に対してモジュール全体でみた場合の実装
密度は低くなるという欠点があった。
Sealing is performed to isolate wiring, etc. from the outside and prevent metal corrosion. In the figure, 5 is a metal cap for sealing, and 42 alloy or Kovar is usually used. This cap 5 is soldered onto the metallization 2 applied on the circumference of the substrate surface using solder, ALLSn silver solder, or the like. FIG. 2 shows another conventional example, in which a metal flange 7 is used for sealing, holding a cooling body, or as a means for attaching the entire module. It is attached to the back side of the ceramic substrate 1. As can be seen in the figure, in the conventional example, the metallization to be brazed is located on the main plane of the wiring board. As a result, the chip mounting area is reduced in the example shown in Fig. 1, and the input/output pin area is reduced in the example shown in Fig. 2, and the external flange 7 prevents dense mounting on this hybrid ICf motherboard. . Therefore, the conventional example has a drawback that the packaging density of the entire module is lower than the packaging density of the chip mounting section.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、上記従来の欠点をなくし、高密度実装
が可能な、従って小型化に適したハイブリッドIC用モ
ジュール構造を提供するにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a module structure for a hybrid IC that eliminates the above-mentioned conventional drawbacks, allows high-density packaging, and is therefore suitable for miniaturization.

〔発明の概要〕[Summary of the invention]

本発明では、上記目的全達成するため、配線基板の主平
面ではなく、端面にメタライズを施すことにより、密度
會下げることなく、封止用等のろう付に供するようにな
したことを特徴とする。
In order to achieve all of the above objects, the present invention is characterized in that metallization is applied not to the main plane of the wiring board, but to the end face, so that it can be used for brazing for sealing, etc., without reducing the density. do.

〔発明の実施例〕[Embodiments of the invention]

第3図に本発明の一実施例の断面図を示す。 FIG. 3 shows a sectional view of an embodiment of the present invention.

図に示すように、封止用メタライズ2は、配線基板1の
端面に施され、ろう材6により金属製キャップ5にろう
接される。ろう接部の拡大図を第4図に示す。この図で
は、ろう材がけんだ端面に濡れ、また金属キャップ5に
も濡れてフィレットを形成している。
As shown in the figure, the sealing metallization 2 is applied to the end surface of the wiring board 1 and soldered to the metal cap 5 using a brazing material 6. An enlarged view of the soldered part is shown in Fig. 4. In this figure, the brazing material wets the soldered end face and also wets the metal cap 5, forming a fillet.

第5図は、本発明の他の実施例の拡大断面図である。こ
こでは、メタライズ2は端面だけでなく、これに接する
主平面上にも設けられている。その結果、第4図のもの
に比較して、ろう接面積が増し、かつ、基板1に対する
ろう材の濡れ角度を小さくできるため、ろう接の強度。
FIG. 5 is an enlarged sectional view of another embodiment of the invention. Here, the metallization 2 is provided not only on the end face but also on the main plane in contact with the end face. As a result, compared to the one shown in FIG. 4, the soldering area is increased and the wetting angle of the brazing material with respect to the substrate 1 can be made smaller, thereby increasing the strength of the soldering.

信頼性の向上をはかることができる。Reliability can be improved.

第6図、第7図は各々主平面の一方の周辺にのみメタラ
イズ2を施こした例である。尚、これら周辺のメタライ
ズ2Fi、第8図に示すように基板1の通常四辺にそっ
て等巾で形成される。
FIGS. 6 and 7 each show an example in which metallization 2 is applied only to one periphery of the main plane. Incidentally, the metallization 2Fi around these is generally formed with the same width along the four sides of the substrate 1, as shown in FIG.

このように、本実施例では、ろう接のための主たる部分
を基板の端面としているため、ろう接部に基板の主平面
の面積を多くとられず、その結果、従来のものより小型
化が可能となる。例えば、10cm角基板に対し、ろう
付するため5M巾だけ基板音大きくした場合、その面積
比は、(110/100)2=1.21 、すなわち2
1%も大きくなる。
In this way, in this embodiment, since the main part for soldering is the end face of the board, a large area of the main plane of the board is not taken up for the soldering part, and as a result, the size can be reduced compared to the conventional one. It becomes possible. For example, if a 10cm square board is made louder by 5M width for brazing, the area ratio is (110/100)2=1.21, that is, 2
It will increase by 1%.

これに対し、基板の(例えば5M厚の)端面を利用する
と、全く配線基板のサイズはかわらない。また、基板が
従来例より小型になる効果は、基板の製造歩留り、材料
コストにも有利となる。
On the other hand, if the end face of the board (for example, 5M thick) is used, the size of the wiring board does not change at all. Furthermore, the effect of making the substrate smaller than the conventional example is advantageous in terms of manufacturing yield and material cost of the substrate.

上記の実施例は、封止キャップを基板に直接ろう付する
場合について述べられているが、封止用0リングをつけ
る、あるいは冷却用構造体をつケル、あるいけモジュー
ルの取付用等のフランジをろう付する場合についても、
同様の効果を有する。
The above embodiment describes the case where the sealing cap is brazed directly to the board, but it is also possible to attach a sealing O-ring, a cooling structure, or a flange for mounting a module. Also when brazing
Has a similar effect.

〔発明の効果〕〔Effect of the invention〕

以上述べた如く、本発明によれば、基板端面を有効に利
用しているため、従来に較べ、基板の小型化がはかれる
。したがって、実効の実装密度向上、基板材料コスト低
減、製造歩留向上に寄与することができる。
As described above, according to the present invention, since the end face of the substrate is effectively utilized, the size of the substrate can be reduced compared to the conventional method. Therefore, it is possible to contribute to an effective increase in packaging density, a reduction in substrate material costs, and an improvement in manufacturing yield.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は従来例の側断面図、第3図は、本発明
の実施例の側断面図、第4図から第7図は本発明を用い
たろう接部の拡大断面図、第8図はメタライズの一例を
示す基板の斜視図である。 1・・・配線基板 2 メタライズ 3・・・入出力ピン 4・・、LSI 5・封止キャップ 6・・・ろう材 代理人弁理士 高 橋明 夫 −1図 物3凶 男6図 17− 第8図
1 and 2 are side sectional views of a conventional example, FIG. 3 is a side sectional view of an embodiment of the present invention, and FIGS. 4 to 7 are enlarged sectional views of a soldered part using the present invention, FIG. 8 is a perspective view of a substrate showing an example of metallization. 1... Wiring board 2 Metallization 3... Input/output pin 4..., LSI 5, Sealing cap 6... Brazing material agent Patent attorney Akio Takahashi-1 Figure 3 Bad guy 6 Figure 17- Figure 8

Claims (1)

【特許請求の範囲】 1、 多層配線基板の四辺の端面にメタライズを施し、
該メタライズに対し金属接合によシ封止構造体を取り付
けたことを特徴とするモジュール構造。 2、 上記多層配線基板の主平面上で端面に接する部分
にもメタライズ1に施し、上記接合材料が主平面上にフ
ィレット全形成するように構成したことを特徴とする特
許請求の範囲第1項記載のモジュール構造。
[Claims] 1. Metallizing the end faces of the four sides of the multilayer wiring board,
A module structure characterized in that a sealing structure is attached to the metallization by metal bonding. 2. The metallization 1 is also applied to a portion of the main plane of the multilayer wiring board that is in contact with the end face, so that the bonding material forms a fillet entirely on the main plane. Modular structure as described.
JP8170484A 1984-04-25 1984-04-25 Module structure Pending JPS60226142A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8170484A JPS60226142A (en) 1984-04-25 1984-04-25 Module structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8170484A JPS60226142A (en) 1984-04-25 1984-04-25 Module structure

Publications (1)

Publication Number Publication Date
JPS60226142A true JPS60226142A (en) 1985-11-11

Family

ID=13753766

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8170484A Pending JPS60226142A (en) 1984-04-25 1984-04-25 Module structure

Country Status (1)

Country Link
JP (1) JPS60226142A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318758A (en) * 1987-06-22 1988-12-27 Toyo Commun Equip Co Ltd Structure of airtight package
DE4110373A1 (en) * 1990-03-30 1991-10-10 Hitachi Ltd ELECTRONIC CIRCUIT DEVICE AND METHOD FOR PRODUCING THE SAME
EP0779657A3 (en) * 1995-12-13 1998-11-11 Oki Electric Industry Co., Ltd. Surface-mounted semiconductor package and its manufacturing method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318758A (en) * 1987-06-22 1988-12-27 Toyo Commun Equip Co Ltd Structure of airtight package
DE4110373A1 (en) * 1990-03-30 1991-10-10 Hitachi Ltd ELECTRONIC CIRCUIT DEVICE AND METHOD FOR PRODUCING THE SAME
EP0779657A3 (en) * 1995-12-13 1998-11-11 Oki Electric Industry Co., Ltd. Surface-mounted semiconductor package and its manufacturing method

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