JPS60223133A - Treater - Google Patents
TreaterInfo
- Publication number
- JPS60223133A JPS60223133A JP7844984A JP7844984A JPS60223133A JP S60223133 A JPS60223133 A JP S60223133A JP 7844984 A JP7844984 A JP 7844984A JP 7844984 A JP7844984 A JP 7844984A JP S60223133 A JPS60223133 A JP S60223133A
- Authority
- JP
- Japan
- Prior art keywords
- path
- processing
- treating chamber
- small hole
- fluids
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
Abstract
Description
【発明の詳細な説明】
〔技術分野〕
本発明は、処理技術、特に、異なる種類の処理流体の反
応を利用して被処理物を処理する技術に関し、たとえば
、半導体装置の製造において、ウェハに生成膜処理を施
すのに使用して有効な技術に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a processing technology, particularly a technology for processing a workpiece by utilizing reactions of different types of processing fluids. This invention relates to techniques that are effective for use in applying production membrane treatments.
半導体装置において、ウェハにP S G (Phos
ph。In semiconductor devices, PSG (Phos
ph.
5ilicate Glass )膜を生成するCVD
装置として、処理室に導入口からモノシラン(SiH2
)およびホスフィン(PH8)の混合ガスと酸素(0,
)または二酸化窒素(NO! )等の酸化ガスとを導入
し、これらガスのCVD反応によりウェハにPSG膜を
生成せしめるように構成したもの、が考えられる。CVD to produce 5ilicate Glass) film
As a device, monosilane (SiH2
) and phosphine (PH8) and oxygen (0,
) or an oxidizing gas such as nitrogen dioxide (NO!) is introduced, and a PSG film is formed on the wafer through a CVD reaction of these gases.
しかし、かかるCVD装置においては、混合ガスと酸化
ガスとが処理室に1箇所の導入口から吹き出された直後
に混合するため、反応が完遂しないで生成される結合の
弱い5i−0構造がPSG膜中に取り込まれ、膜質か弱
くなってしまうという問題点があること、が本発明者に
よって明らかにされた。However, in such a CVD apparatus, the mixed gas and the oxidizing gas are mixed immediately after being blown out from a single inlet into the processing chamber, so the weakly bonded 5i-0 structure that is generated before the reaction is completed becomes PSG. The inventor of the present invention has revealed that there is a problem in that it is incorporated into the membrane, weakening the membrane quality.
CVD装置について述べである文献として、電子材料1
981年別冊(工業調査会発行、昭和56年11月10
日発行、P77〜P84)がある。Electronic materials 1 is a document that describes CVD equipment.
981 special edition (published by Kogyo Kenkyukai, November 10, 1981)
(Published on P77-P84).
本発明の目的は、良好な処理結果を得ることができる処
理技術を提供することにある。An object of the present invention is to provide a processing technique that can obtain good processing results.
本発明の前記ならびにその他の目的と新規な特徴は、本
明細書の記述および添付図面から明らかになるであろう
。The above and other objects and novel features of the present invention will become apparent from the description of this specification and the accompanying drawings.
本願において開示される発明のうち代表的なものの概要
を簡単に説明すれば、次の通りである。A brief overview of typical inventions disclosed in this application is as follows.
すなわち、処理室の内部に異なる処理流体が流通する通
路をそれぞれ設けるとともに、各通路を、流体を交互に
吹き出すように配列することにより、異なる流体相互を
処理室全体において混合させて反応が完遂するようにし
たものである。That is, by providing passages through which different processing fluids flow inside the processing chamber and arranging the passages so that the fluids are alternately blown out, the different fluids are mixed with each other throughout the processing chamber and the reaction is completed. This is how it was done.
第1図は本発明の一実施例である低圧CVD装置を示す
縦断面図、第2図は第4図■−H線に沿う断面図、第3
図は第2図ト」線に沿う断面図である。Fig. 1 is a longitudinal cross-sectional view showing a low-pressure CVD apparatus which is an embodiment of the present invention, Fig. 2 is a cross-sectional view taken along the line - H in Fig. 4,
The figure is a cross-sectional view taken along the line 'T' in Figure 2.
本実施例において、低圧CVD装置は気密を維持し得る
処理室1を備えでおり、処理室1は石英ガラスにより一
端閉塞のほぼ円筒形状に形成されたチューブ2にほぼ円
板形状に形成された開閉自在なドア3を被蓋することに
より構成されるようになっている。チューブ2の外周に
はヒータ4が処理室1を加熱し得るように配設され、チ
ューブ2の下部には複数の排気口5が処理室lの内部を
ボンダ等(図示せず)により排気し得るように開設され
ている。処理室1はその内部にドア3から挿入されたボ
ート状の治具6を収容保持し得るように構成されており
、治具6は被処理物としてのウェハ7を複数枚立脚させ
て平行に整列させて保持し得るように構成されている。In this embodiment, the low-pressure CVD apparatus is equipped with a processing chamber 1 that can maintain airtightness, and the processing chamber 1 is formed into a substantially disk-shaped tube 2 which is formed into a substantially cylindrical shape with one end closed with quartz glass. It is constructed by covering a door 3 that can be opened and closed. A heater 4 is disposed around the outer periphery of the tube 2 to heat the processing chamber 1, and a plurality of exhaust ports 5 are provided at the bottom of the tube 2 to exhaust the inside of the processing chamber 1 using a bonder or the like (not shown). It is set up so that you can get it. The processing chamber 1 is configured to accommodate and hold a boat-shaped jig 6 inserted through the door 3, and the jig 6 supports a plurality of wafers 7 as objects to be processed in parallel. It is configured to be able to be aligned and held.
処理室1内の上部には、中空のほぼアーチ屋根形状に形
成された通路用構造体8が治具6′に保持されたウェハ
7群の上級部を近接して覆い得るように配設されており
、この通路用構造体8の内部には、第1通路9と第2通
路1oとが隣り合せに交互に配列されて互いに噛み合う
くし歯状となるように形成されている。第1.第2通路
9,100下面には流出口としての小孔11.12が鉛
直方向に多数開設されており、第1.第2通路9゜10
の各一端には、処理室1外部に突き出された第1導入路
13.第2導入路14がそれぞれ接続されている。In the upper part of the processing chamber 1, a passage structure 8 formed in a hollow, almost arched roof shape is arranged so as to closely cover the upper part of the group of wafers 7 held on the jig 6'. Inside the passage structure 8, first passages 9 and second passages 1o are alternately arranged next to each other and are formed in a comb-like shape that mesh with each other. 1st. A large number of small holes 11.12 serving as outflow ports are opened in the vertical direction on the lower surface of the second passage 9,100. 2nd aisle 9゜10
A first introduction path 13. which protrudes to the outside of the processing chamber 1 is provided at one end of each. The second introduction paths 14 are connected to each other.
次に作用を説明する、
複数枚のウェハ7を治具6に整列させて保持せしめ、こ
の治具6をドア3を開いて処理室1に収容して定置させ
る。Next, the operation will be explained. A plurality of wafers 7 are aligned and held in a jig 6, and the jig 6 is accommodated in the processing chamber 1 with the door 3 opened and placed there.
ドア3が閉じられ、排気口5を介して処理室1内が排気
され、ヒータ4により処理室1が加熱されると、処理室
1の外部において、siH,とPH8との混合′ガス1
.,5が第1導入路13に10tガス16が第2導入路
14にそれぞれ導入される。When the door 3 is closed, the inside of the processing chamber 1 is exhausted through the exhaust port 5, and the processing chamber 1 is heated by the heater 4, a mixed gas 1 of siH and PH8 is generated outside the processing chamber 1.
.. , 5 are introduced into the first introduction path 13 and 10 tons of gas 16 is introduced into the second introduction path 14, respectively.
第1.第2導入路13.14に導入された各ガスは第1
通路9および第2通路10を流れ、第1通路゛9.第2
通路10JC開設された第1小孔11群および第2小孔
12群からほぼ鉛直下向きにそれぞれ吹き出す。吹き出
したSiH,およびPH。1st. Each gas introduced into the second introduction path 13.14 is
Flowing through the passage 9 and the second passage 10, the first passage '9. Second
Air is blown out almost vertically downward from the first small hole 11 group and the second small hole 12 group opened in the passage 10JC. Blowout SiH and PH.
のガスとOtガラスは混合することになるが、第1小孔
11群と第2小孔群12とが交互に隣り合せに配列され
ているため、両ガスの混合は処理室1内におけるウェハ
7群が並んだ全体にわたって起こることになる。かつ、
小孔群はウェハ7群の上縁辺に近接して開口しているの
で、混合はウェハ7群の近傍において起る。The gas and the Ot glass will be mixed, but since the first small hole group 11 and the second small hole group 12 are arranged alternately next to each other, the mixing of both gases will occur on the wafer in the processing chamber 1. This will occur throughout the 7 groups lined up. and,
Since the small holes open close to the upper edges of the wafers 7, mixing occurs in the vicinity of the wafers 7.
このように、SiH4,PHs と0.とがウェハ7群
の全体にわたって、かつ近傍位置において混合すると、
CVD反応がウェハに対して完全に行われて分子間の結
合が強く膜質の良好なPSG膜がウェハ上に生成される
。特に、低圧CVD法においては、ウェハ上の段差部に
おける膜質か弱くなる傾向があるが、段差部における膜
質が均一になる。In this way, SiH4, PHs and 0. When mixed over the entire group of 7 wafers and at nearby positions,
The CVD reaction is completely performed on the wafer, and a PSG film with strong intermolecular bonds and good film quality is produced on the wafer. In particular, in the low-pressure CVD method, the film quality tends to be weak at the step portions on the wafer, but the film quality at the step portions becomes uniform.
また、両ガス15.16は両小孔11,12群から鉛直
下向きに吹き出すため、治具6に立脚して平行に整列さ
れたウェハ7の表面に対して平行に流れ、層流状態を維
持してウェハ7に接触することになり、そのため、各ウ
ェハ7においても全面にわたって膜質が均一になる。In addition, since both gases 15 and 16 are blown out vertically downward from both groups of small holes 11 and 12, they flow parallel to the surface of the wafers 7, which are aligned parallel to each other while standing on the jig 6, maintaining a laminar flow state. As a result, the film quality becomes uniform over the entire surface of each wafer 7.
(1)互いに反応する異なる処理流体を被処理群の全体
において混合するように構成することにより、被処理群
の全体において混合を行わせて処理反応を完遂させるこ
とができるため、強度および純度等が良好で、かつ均一
な処理状態が得られる。(1) By configuring different processing fluids that react with each other to be mixed in the entire group to be treated, mixing can be performed in the entire group to be treated and the treatment reaction can be completed, resulting in improved strength, purity, etc. Good and uniform processing conditions can be obtained.
(21PSG膜を反応生成する複数の反応ガスをウェハ
群の全体において混合するように構成することにより、
ウェハ群の全体において均一に処理が起こるため、CV
D反応を完遂させることができ、リン濃度、膜質、膜厚
が均一で、段差部を含めて膜強度が高く、かつ膜中に5
i−0構造等のような中間生成物のない良好なPSG膜
が得られる。(By configuring a plurality of reaction gases that react and produce the 21PSG film to be mixed throughout the wafer group,
Because processing occurs uniformly across the wafer group, the CV
The D reaction can be completed, the phosphorus concentration, film quality, and thickness are uniform, the film strength is high including the step part, and the film contains
A good PSG film without intermediate products such as i-0 structure can be obtained.
(3)膜質の良好なPSG膜が形成できるため、PSG
膜に熱負荷が加わった場合に発生することがあるクラッ
クの発生を防止することができる。(3) Since a PSG film with good film quality can be formed, PSG
It is possible to prevent the occurrence of cracks that may occur when a heat load is applied to the film.
(4)処理流体を被処理物の表面に対して平行に流すこ
とにより、処理状態を被処理物の全面にわたって均一化
することができる。(4) By flowing the processing fluid parallel to the surface of the object to be processed, the processing state can be made uniform over the entire surface of the object to be processed.
以上本発明者によってなされた発明を実施例に基づき具
体的に説明したが、本発明は前記実施例に限定されるも
のではなく、その要旨を逸脱しない範囲で種々変更可能
であることはいうまでもない0
たとえば、2組の通路なくし歯状に配列するに限らず、
3組以上の通路を交互に配列してもよい。Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the Examples and can be modified in various ways without departing from the gist thereof. For example, it is not limited to arranging two sets of channels in a comb-like shape.
Three or more sets of passages may be arranged alternately.
処理流体は、SiH4およびPH,の混合ガスと0、ま
たはNO,ガスとに限らず、5itHa 、5tH4゜
P Ha = AsH,、およびB tHeと0.、N
o、等でもよい。The processing fluid is not limited to a mixed gas of SiH4 and PH, or NO gas, but also 5itHa, 5tH4゜P Ha = AsH, and BtHe and 0. , N
o, etc. are also acceptable.
処理はPSG膜の生成に限らず、As5G膜、BSG膜
、BPSG膜、さらにはSin、膜の生成等の処理であ
ってもよい。The processing is not limited to the production of a PSG film, but may also be processing such as the production of an As5G film, a BSG film, a BPSG film, or even a Sin film.
以上の説明では主として本発明者によってなされた発明
をその背景となった利用分野で・あるウェハにPSG膜
を生成処理する低圧CVD装置に適用した場合について
説明したが、それに限定されるものではなく、たとえば
、酸化膜形成装置やエピタキシャル装置等に適用できる
。In the above explanation, the invention made by the present inventor was mainly applied to a low-pressure CVD apparatus that generates a PSG film on a certain wafer, which is the background field of application, but the invention is not limited to this. , for example, it can be applied to oxide film forming equipment, epitaxial equipment, etc.
第1図は本発明の一実施例を示す縦断面図、第2図は第
1図■−■線に沿う断面図、第3図は第2図ト」線に沿
う断面図である。
1・・・処理室、2・・・チューブ、3・・・ドア、4
・・・ヒータ、5・・・排気口、6・・・治具、7・・
・ウニノ・(被処理物)、8・・・通路用構造体、9・
・・第1通路、10・・・第2通路、11.12・・・
小孔(流出口)、13・・・第1導入路、14・・・第
2導入路。
第 1 図FIG. 1 is a longitudinal cross-sectional view showing an embodiment of the present invention, FIG. 2 is a cross-sectional view taken along line 1--2 in FIG. 1, and FIG. 3 is a cross-sectional view taken along line G in FIG. 2. 1...Processing chamber, 2...Tube, 3...Door, 4
...Heater, 5...Exhaust port, 6...Jig, 7...
・Unino・(processed object), 8...Passway structure, 9・
...First aisle, 10...Second aisle, 11.12...
Small hole (outlet), 13...first introduction path, 14...second introduction path. Figure 1
Claims (1)
物に処理を施す処理装置であって、前記処理室の内部に
前記処理流体が流通する複数の通路が交互に配列され、
これら通路に開口が各処理流体を前記被処理物に向けて
流出するように開設されていることを特徴とする処理装
置。 2、通路が、2組設けられ互いに噛合するくし歯状に配
列されていることを特徴とする特許請求の範囲第1項記
載の処理装置。 3、通路が、被処理物に近接して設けられていることを
特徴とする特許請求の範囲第1項記載の処理装置、 4、開口が、処理流体を被処理物の表面と平行方向に流
出するように開設されていることを特徴とする特許請求
の範囲第1項記載の処理装置。[Scope of Claims] 1. A processing apparatus that processes a workpiece by introducing processing fluids that react with each other into a processing chamber, wherein a plurality of passages through which the processing fluids flow in the processing chamber are arranged alternately. arranged in
A processing apparatus characterized in that openings are provided in these passages so that each processing fluid flows out toward the object to be processed. 2. The processing device according to claim 1, characterized in that two sets of passages are provided and arranged in a comb-like shape that mesh with each other. 3. The processing apparatus according to claim 1, wherein the passage is provided close to the object to be processed; 4. The opening directs the processing fluid in a direction parallel to the surface of the object to be processed. The processing device according to claim 1, characterized in that the processing device is opened so that the water flows out.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7844984A JPS60223133A (en) | 1984-04-20 | 1984-04-20 | Treater |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7844984A JPS60223133A (en) | 1984-04-20 | 1984-04-20 | Treater |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60223133A true JPS60223133A (en) | 1985-11-07 |
Family
ID=13662342
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7844984A Pending JPS60223133A (en) | 1984-04-20 | 1984-04-20 | Treater |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60223133A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6080241A (en) * | 1998-09-02 | 2000-06-27 | Emcore Corporation | Chemical vapor deposition chamber having an adjustable flow flange |
-
1984
- 1984-04-20 JP JP7844984A patent/JPS60223133A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6080241A (en) * | 1998-09-02 | 2000-06-27 | Emcore Corporation | Chemical vapor deposition chamber having an adjustable flow flange |
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