JPS60221391A - Device for growing compound semiconductor single crystal - Google Patents

Device for growing compound semiconductor single crystal

Info

Publication number
JPS60221391A
JPS60221391A JP7770384A JP7770384A JPS60221391A JP S60221391 A JPS60221391 A JP S60221391A JP 7770384 A JP7770384 A JP 7770384A JP 7770384 A JP7770384 A JP 7770384A JP S60221391 A JPS60221391 A JP S60221391A
Authority
JP
Japan
Prior art keywords
single crystal
vessel
heater
crucible
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7770384A
Other languages
Japanese (ja)
Inventor
Tetsuo Saito
斎藤 哲郎
Masakatsu Kojima
児島 正勝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP7770384A priority Critical patent/JPS60221391A/en
Publication of JPS60221391A publication Critical patent/JPS60221391A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To grow a high-quality compd. semiconductor single crystal by separating a high-pressure vessel into three parts, making the intermediate part freely exchangeable, and providing a temp. controlling part consisting of a heating member which are separated in correspondence with the intermediate part. CONSTITUTION:A high-pressure vessel 26 of a device 35 for growing compd. semiconductor single crystals is separated into three parts so that an intermediate vessel 26b may be put and held between an upper vessel 26a and a lower vessel 26c. In addition, a heater 27 and a heat insulating member 28 are also separated in correspondence with the intermediate vessel 26b and the lower vessel 26c. Accordingly, the intermediate vessel 26b and its corresponding upper heater 27a and upper heat insulating member 28b can be easily changed into specified shapes, and a control part constituting a desired hot zone can be fromed. Consequently, the temp. control can be strictly carried out, when a single crystal 22 to be pulled up by a pulling shaft 23 is grown.

Description

【発明の詳細な説明】 〔発明の術分野〕 本発明は、化合物半導体単結晶育成装置に関する。[Detailed description of the invention] [Field of invention] The present invention relates to a compound semiconductor single crystal growth apparatus.

〔発明の技術的背景〕[Technical background of the invention]

従来、化合物半導体単結晶育成装置として例えば第1図
に示す構造のものが使用されている。図中1は、半導体
材料融液2を収容したルツボである。ルツボ1の開口部
の上方には、単結晶体3を引上げる引上軸4が昇降自在
に設けらている。半導体材料融液2の表面には、液面被
覆剤5が設けられている。ルツボ1は、支持軸6によっ
て支持されている。ルツボ1の周囲には、その開口部を
除いてヒータ7が設けられている。ヒータ7の外側には
、保温部材8が設けられている。保温部材8の外側には
、ルツボ1とを収容する高耐圧容器9が設けられている
。高耐圧容器9の外面には、冷W管10が取付けられて
いる。なお、同図中11は、高耐圧容器9及び保温部材
8を貫挿してヒータ7に接続された電極である。
2. Description of the Related Art Conventionally, a compound semiconductor single crystal growth apparatus having a structure shown in FIG. 1, for example, has been used. In the figure, 1 is a crucible containing a semiconductor material melt 2. A pulling shaft 4 for pulling up the single crystal 3 is provided above the opening of the crucible 1 so as to be movable up and down. A liquid surface coating agent 5 is provided on the surface of the semiconductor material melt 2 . The crucible 1 is supported by a support shaft 6. A heater 7 is provided around the crucible 1 except for the opening thereof. A heat retaining member 8 is provided outside the heater 7. A high pressure resistant container 9 that accommodates the crucible 1 is provided on the outside of the heat retaining member 8 . A cold W pipe 10 is attached to the outer surface of the high pressure container 9. In the figure, reference numeral 11 denotes an electrode that penetrates the high pressure container 9 and the heat insulating member 8 and is connected to the heater 7.

このように構成された化合物半導体単結晶育成装置上、
?−は、P、A8等の大きな蒸気圧の成分を含むGaP
、GaAs、InP等の化合物半導体の単結晶育成を、
高耐圧容器9中にN2、Ar等のガスを導入して液面被
覆剤5に8203を使用しながら行っている。このため
、単結晶の育成の際の温度制御を厳格にする必要がある
On the compound semiconductor single crystal growth apparatus configured in this way,
? - is GaP containing components with high vapor pressure such as P and A8
, single crystal growth of compound semiconductors such as GaAs and InP,
This is carried out by introducing a gas such as N2 or Ar into the high pressure container 9 and using 8203 as the liquid surface coating agent 5. For this reason, it is necessary to strictly control temperature during single crystal growth.

(背景技術の問題点) 而して、この温度制御は、高耐圧容器9内に設けられる
ホットゾーン、すな力ちヒータ7と保温部材8で形成さ
れる加熱領域を調節することによって行われている。し
かしながら、高耐圧容器9の形状や構造が製作段階でほ
ぼ決まってしまうため、ホットゾーンの調節は極めて難
しい。因みに、ヒータ7を1個内蔵するようにした高耐
圧容器9では、補助用のヒーターをもう一つ取付けるこ
とは極めて困難である。また、保温部材8も高さや幅が
制限されているので、この制限の範囲内でしか形状の調
節をできない。これらの範囲を越えてヒーター7や保温
部材8の種類を調節使用とすると高耐圧容器9の形状、
構造を改造しなければならず、その価格が高くなる。
(Problems with the Background Art) This temperature control is performed by adjusting the hot zone provided in the high pressure container 9, that is, the heating area formed by the heater 7 and the heat insulating member 8. ing. However, since the shape and structure of the high pressure container 9 are almost determined at the manufacturing stage, it is extremely difficult to adjust the hot zone. Incidentally, in the high pressure container 9 which has one built-in heater 7, it is extremely difficult to attach another auxiliary heater. Furthermore, since the heat retaining member 8 is also limited in height and width, its shape can only be adjusted within these limits. If the type of heater 7 and heat insulating member 8 is adjusted beyond these ranges, the shape of high pressure container 9,
The structure must be modified, which increases the price.

このように高耐圧容器9内の温度分布を大幅に変えるこ
とができず、単結晶の育成の際の温度制御を厳格にでき
ない。その結果、高品質の単結晶体を容易にることがで
きない問題があった。
In this way, the temperature distribution within the high pressure container 9 cannot be changed significantly, and the temperature cannot be strictly controlled during single crystal growth. As a result, there was a problem in that high quality single crystals could not be easily produced.

〔発明の目的〕[Purpose of the invention]

本発明は、かかる点に鑑でなされたものであり、高耐圧
容器に温度制御部を設けて単結晶体の製造時の温度制御
を容易にして高品質の製品を得ることができる化合物半
導体単結晶育成装置を提供することをその目的とするも
のである。
The present invention has been made in consideration of this point, and provides a compound semiconductor monomer that can easily control the temperature during the production of single crystals by providing a temperature control section in a high-pressure container to obtain high-quality products. Its purpose is to provide a crystal growth device.

〔発明の概要〕[Summary of the invention]

本発明は、高耐圧容器を3分割にしてその中間部分を自
在に交換可能にし、加熱手段、冷却手段の容量を調節す
ることができる温度制御部にして、単結晶体の製造時の
温度制御を容易にして高品質の製品を得ることができる
化合物半導体単結晶育成装置である。
The present invention divides a high-pressure container into three parts, makes the middle part freely replaceable, and provides a temperature control part that can adjust the capacity of heating means and cooling means, thereby controlling the temperature during the production of single crystals. This is a compound semiconductor single crystal growth device that can easily produce high-quality products.

〔発明の茄例〕[Example of invention]

以下、本発明の実施例について図面を参照して説明する
Embodiments of the present invention will be described below with reference to the drawings.

第2図は、本発明の一実施例の概略構成を示す説明図で
ある。図中20は、半導体材料融液21を収容したルツ
ボである。ルツボ20の間口部の上方には、単結晶体2
2を引上げる引上軸23が昇降自在にもうけらでいる。
FIG. 2 is an explanatory diagram showing a schematic configuration of an embodiment of the present invention. 20 in the figure is a crucible containing a semiconductor material melt 21. Above the frontage of the crucible 20, a single crystal 2
A pull-up shaft 23 for pulling up 2 is provided so as to be able to move up and down freely.

半導体材料融液21の表面には、液面被覆剤24が設け
られている。
A liquid surface coating agent 24 is provided on the surface of the semiconductor material melt 21 .

ルツボ20は、支持軸25によって支持されている。ル
ツボ20、引上軸23、支持軸25は、高耐圧容器26
内に収容されている。高耐圧容器26は、上部容器26
a1中間容!26b、下部容器26cの3つに分割され
ており、図示しないフランジによって一体に着脱自在に
取付けられている。高耐圧容器26とルツボ20の間に
は、ルツボ20の周囲を囲むようにしてヒータ27及び
保温部材28が二重構造的に収容されている。ヒータ2
7及び保温部材28は、中間容器26b及び下部容器2
6cに対応するようにして上部ヒータ27a1下部ヒー
タ27b1上部保温部材28a1下部保温部材28bに
夫々分割されている。上部ヒータ27a及び下部ヒータ
27bには、中間容器26b及び下部容器26cを貫挿
して挿入された電極29が夫々接続されている。高耐圧
容器26の外周面には冷却管30が取付けられている。
The crucible 20 is supported by a support shaft 25. The crucible 20, the pulling shaft 23, and the support shaft 25 are connected to the high pressure container 26.
is housed within. The high pressure container 26 is an upper container 26
a1 intermediate volume! 26b and a lower container 26c, which are detachably attached to each other by a flange (not shown). A heater 27 and a heat insulating member 28 are housed in a double structure between the high pressure container 26 and the crucible 20 so as to surround the crucible 20. Heater 2
7 and the heat insulating member 28 are connected to the intermediate container 26b and the lower container 2.
6c, it is divided into an upper heater 27a, a lower heater 27b, an upper heat retaining member 28a, and a lower heat retaining member 28b. Electrodes 29 inserted through the intermediate container 26b and the lower container 26c are connected to the upper heater 27a and the lower heater 27b, respectively. A cooling pipe 30 is attached to the outer peripheral surface of the high pressure container 26.

冷却管30も上部容器26a1中間容器26b、下部容
器26cに対応して3つに分割されている。
The cooling pipe 30 is also divided into three parts corresponding to the upper container 26a1, the intermediate container 26b, and the lower container 26c.

このように構成された化合物半導体単結晶育成装置11
によれば、高耐圧容器26は中間容器26bを上部容器
26aと下部容器26Cで挟持するようにした3分割構
造をしている。更に、ヒータ27及び保温部材28も、
中間容器26b及び下部容器26cに対応して分割され
ている。従って、中間、容器26b及びこれに対応する
上部ヒータ27a1上部保温部材28aの形状を所定の
ものに容易に可変して、所望のホットゾーンを構成す制
御部を形成することができる。その結果、引上軸23に
よって引上げられる単結晶体22の結晶育成の際の温度
制御を厳格にすることができる。
Compound semiconductor single crystal growth apparatus 11 configured in this way
According to the publication, the high pressure container 26 has a three-part structure in which an intermediate container 26b is sandwiched between an upper container 26a and a lower container 26C. Furthermore, the heater 27 and the heat retaining member 28 are also
It is divided into an intermediate container 26b and a lower container 26c. Therefore, the shapes of the intermediate container 26b and the corresponding upper heater 27a1 and upper heat retaining member 28a can be easily changed to predetermined shapes to form a control section that configures a desired hot zone. As a result, temperature control during crystal growth of the single crystal body 22 pulled up by the pulling shaft 23 can be made stricter.

このため、高品質の単結晶体22を容易に得ることがで
きる。
Therefore, a high quality single crystal body 22 can be easily obtained.

なお、上部ヒータ27aと上部保温部材28aで構成す
る温度制御部は、第3図に示 す如く、上部ヒータ27a1をルツボ2oの上部外周面
に対向する形状とし、これを下部ヒータ27b1と共に
、一体に覆うように長い目の上部保温部材28a1で構
成するようにしたものでもよい。また、第4図に示す如
く、上部ヒータ27a2をルツボ20の関口部に対向す
るように上方に設置すると共に、上部保温部材28a2
でルツボ20の周囲を覆うようにした温度制御部として
もよい。また、第5図に示す如く、上部ヒータ27a3
でルツボ20の周囲全体を覆うようにして設置すると共
に、上部保温部材28a3で上部ヒータ27a3の周囲
を覆うようにした温度制御部としてもよい。
As shown in FIG. 3, the temperature control unit composed of the upper heater 27a and the upper heat insulating member 28a has the upper heater 27a1 shaped to face the upper outer circumferential surface of the crucible 2o, and is integrated with the lower heater 27b1. It may be configured with a long upper heat retaining member 28a1 so as to cover it. Further, as shown in FIG. 4, the upper heater 27a2 is installed above so as to face the entrance of the crucible 20, and the upper heat insulating member 28a2
It is also possible to use a temperature control section that covers the periphery of the crucible 20. Further, as shown in FIG. 5, the upper heater 27a3
The temperature control unit may be installed so as to cover the entire periphery of the crucible 20, and the upper heat insulating member 28a3 may be installed to cover the periphery of the upper heater 27a3.

〔発明の効果〕〔Effect of the invention〕

以上説明した如く、本発明に係る化合物半導体単結晶育
成装置によれば、単結晶体の製造時の温度制御を容易に
して高品質の製品を得ることができるものある。
As explained above, according to the compound semiconductor single crystal growth apparatus according to the present invention, it is possible to easily control the temperature during the production of a single crystal and obtain a high quality product.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、従来の化合物半導体単結晶育成装置の概略構
成を示す説明図、第2図は、本発明の一実施例の概略構
成を示す説明図、第3図乃至第5図は、本発明の他の実
施例の概略構成を示す説明図である。 20・・・ルツボ、21・・・半導体材料融液、22・
・・単結晶体、23・・・引上軸、24・・・液面被覆
剤、25・・・支持軸、26・・・高耐圧容器、26a
・・・上部容器26a、26b・・・中間容器、26b
・・・下部容器、27・・・ヒータ、27a・・・上部
ヒータ、27b・・・下部ヒータ、28・・・保温部材
、28a・・・上部保温部材、28b・・・下部保温部
材、29・・・電極、30・・・冷却管30.35・・
・化合物半導体単結晶育成装置。 出願人代理人 弁理士 鈴江武彦 第1図 第3図 第4図
FIG. 1 is an explanatory diagram showing a schematic configuration of a conventional compound semiconductor single crystal growth apparatus, FIG. 2 is an explanatory diagram showing a schematic configuration of an embodiment of the present invention, and FIGS. FIG. 3 is an explanatory diagram showing a schematic configuration of another embodiment of the invention. 20... Crucible, 21... Semiconductor material melt, 22.
... Single crystal, 23... Pulling shaft, 24... Liquid surface coating agent, 25... Support shaft, 26... High pressure resistant container, 26a
... Upper containers 26a, 26b... Middle containers, 26b
... lower container, 27 ... heater, 27a ... upper heater, 27b ... lower heater, 28 ... heat retention member, 28a ... upper heat retention member, 28b ... lower heat retention member, 29 ...Electrode, 30...Cooling pipe 30.35...
・Compound semiconductor single crystal growth equipment. Applicant's agent Patent attorney Takehiko Suzue Figure 1 Figure 3 Figure 4

Claims (1)

【特許請求の範囲】[Claims] 半導体材料融液を収容するルツボと、該ルツボを支持す
る支持軸と、該ルツボの開口部の上方に前記半導体材料
融液に対向して設けられた引上軸と、分割された上部容
器、中間容器、下部容器からなり、これらを一体に結合
して前記引上軸、前記ルツボ、前記支持軸を収容する高
耐圧容器と、該高耐圧容器内に収容され、前記中間容器
に対応して分割された加熱部材及び保温部材からなる温
度制御部とを具備することを特徴とする化合物半導体単
結晶育成装置。
a crucible that accommodates a semiconductor material melt, a support shaft that supports the crucible, a pulling shaft provided above an opening of the crucible facing the semiconductor material melt, and a divided upper container; a high pressure resistant container consisting of an intermediate container and a lower container, which are integrally connected to accommodate the pulling shaft, the crucible, and the support shaft; 1. A compound semiconductor single crystal growth apparatus comprising a temperature control section consisting of a divided heating member and a heat insulating member.
JP7770384A 1984-04-18 1984-04-18 Device for growing compound semiconductor single crystal Pending JPS60221391A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7770384A JPS60221391A (en) 1984-04-18 1984-04-18 Device for growing compound semiconductor single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7770384A JPS60221391A (en) 1984-04-18 1984-04-18 Device for growing compound semiconductor single crystal

Publications (1)

Publication Number Publication Date
JPS60221391A true JPS60221391A (en) 1985-11-06

Family

ID=13641255

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7770384A Pending JPS60221391A (en) 1984-04-18 1984-04-18 Device for growing compound semiconductor single crystal

Country Status (1)

Country Link
JP (1) JPS60221391A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171986A (en) * 1986-01-22 1987-07-28 Toshiba Ceramics Co Ltd Production of single crystal
JPH0261965U (en) * 1988-10-27 1990-05-09
WO2000022199A1 (en) * 1998-10-13 2000-04-20 Memc Electronic Materials, Inc. Electrode assembly for electrical resistance heater used in crystal growing apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5226517U (en) * 1975-08-15 1977-02-24
JPS5711897A (en) * 1980-06-27 1982-01-21 Sumitomo Electric Ind Ltd Method of pulling up single crystal and device therefor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5226517U (en) * 1975-08-15 1977-02-24
JPS5711897A (en) * 1980-06-27 1982-01-21 Sumitomo Electric Ind Ltd Method of pulling up single crystal and device therefor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171986A (en) * 1986-01-22 1987-07-28 Toshiba Ceramics Co Ltd Production of single crystal
JPH0261965U (en) * 1988-10-27 1990-05-09
WO2000022199A1 (en) * 1998-10-13 2000-04-20 Memc Electronic Materials, Inc. Electrode assembly for electrical resistance heater used in crystal growing apparatus
US6287382B1 (en) 1998-10-13 2001-09-11 Memc Electronic Materials, Inc. Electrode assembly for electrical resistance heater used in crystal growing apparatus

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