JPS60179852U - Surface defect measurement device - Google Patents

Surface defect measurement device

Info

Publication number
JPS60179852U
JPS60179852U JP6630884U JP6630884U JPS60179852U JP S60179852 U JPS60179852 U JP S60179852U JP 6630884 U JP6630884 U JP 6630884U JP 6630884 U JP6630884 U JP 6630884U JP S60179852 U JPS60179852 U JP S60179852U
Authority
JP
Japan
Prior art keywords
measurement
measured
display
measurement head
control circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6630884U
Other languages
Japanese (ja)
Other versions
JPH0443813Y2 (en
Inventor
橋本 利夫
今野 憲一
Original Assignee
トヨタ自動車株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by トヨタ自動車株式会社 filed Critical トヨタ自動車株式会社
Priority to JP6630884U priority Critical patent/JPS60179852U/en
Publication of JPS60179852U publication Critical patent/JPS60179852U/en
Application granted granted Critical
Publication of JPH0443813Y2 publication Critical patent/JPH0443813Y2/ja
Granted legal-status Critical Current

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は考案に係る表面欠陥計測装置の一実施例を示す
構成図、第2図は第1図における測定ヘッド1の構成図
、第3図はイメージセンサ5の各画素が2次元配列され
た状態を示す図、第4図は制御回路20の具体的構成を
示すブロック図、第5図及び第6図はマイクロコンピュ
ータ44により実行されるプログラムの内容を示すフロ
ーチャート、第7図は制御回路20の各部の動作状態を
示すタイミングチャート、第8図はイメージセンサ5に
より撮像される画像Qを分担する各画素の゛位置関係を
示す図、第9図は第8図に示したイメージセンサ5の各
画素に対応して直交座標系に表わ交れたメモリの格納位
置を示す図、第10図はワーク80の内周面81におけ
る表面欠陥め計測状態を示す図、第11図はワーク80
の内周面81にごみが付着した場合におけるイメージセ
ンサ5の出力電圧と基準電圧との関係を示す図、第12
図はワーク80の内周面81に鋳巣、傷等が発生してる
場合におけるイメージセンサ5の出力電圧と基準電圧レ
ベルとの関係を示す図、第13図はワーク80の内周面
81に鋳巣、傷等の欠陥が生じている場合あるいはごみ
等が付着した場合における画像表示部47の画面に表示
される画像を示す図である。 に・・測定ヘッド、2・・・光源ランプ、3・・・魚眼
レンズ、4・・・光ファイバ、5・・・イメージセンサ
、10・・・上下送りモータ、12・・・左右送り台、
14・・・左右送すモータ、17,18・・・駆動回路
、20・・・制御回路、21・・・表示ユニット、47
・・・画像表示部。 (H)撃猷劫 L
FIG. 1 is a block diagram showing an embodiment of the surface defect measuring device according to the invention, FIG. 2 is a block diagram of the measuring head 1 shown in FIG. 1, and FIG. 3 shows a two-dimensional array of pixels of the image sensor 5. 4 is a block diagram showing the specific configuration of the control circuit 20, FIGS. 5 and 6 are flowcharts showing the contents of the program executed by the microcomputer 44, and FIG. 7 is a diagram showing the control circuit 20. 8 is a timing chart showing the operating state of each part of the image sensor 5. FIG. 9 is a timing chart showing the positional relationship of each pixel that shares the image Q captured by the image sensor 5. FIG. FIG. 10 is a diagram showing the state of measurement of surface defects on the inner circumferential surface 81 of the workpiece 80, and FIG. 80
FIG. 12 is a diagram showing the relationship between the output voltage of the image sensor 5 and the reference voltage when dust adheres to the inner circumferential surface 81 of the image sensor 5.
The figure shows the relationship between the output voltage of the image sensor 5 and the reference voltage level when there are blowholes, scratches, etc. on the inner circumferential surface 81 of the work 80. FIG. 7 is a diagram showing an image displayed on the screen of the image display unit 47 when defects such as cavities and scratches occur or when dust or the like is attached. Measuring head, 2... Light source lamp, 3... Fisheye lens, 4... Optical fiber, 5... Image sensor, 10... Vertical feed motor, 12... Left and right feed base,
14... Left and right feed motor, 17, 18... Drive circuit, 20... Control circuit, 21... Display unit, 47
...Image display section. (H) Gekikou L

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被測定物の内周面に沿って光照射し且つ該反射光を集光
レンズにより集光すると共に、該集光レンズの光軸に直
交するように各画素が二決元配列されたイメージセンサ
により光電変換し被測定物内周面の各検出部位に対応し
た画像信号を出力する測定ヘッドと、該測定ヘッドの画
像信号を取り込み被測定物の各検出部位における画像信
号と該検出部位に対応して予め記憶されている受光量の
基準値を示す基準データとを比較して被測定物内周面に
おける欠陥の有無及びごみ等の付着の有無を判定し、該
判定結果を画像等により表示させるための表示信号を出
力すると共に、計測時に測定ヘッドを各被測定物の内周
面に沿って移動させ且つ1つの被測定物の計測終了毎に
順次、他の被測定物における測定開始位置まで移動させ
るための−制御信号を出力する制御回路と、該制御回路
からの制御信号に基づいて測定ヘッドを駆動する駆動手
段と、制御回路からの表示信号を受けて被測定物の計測
結果を表示する表示手段とから構成されたことを特徴と
する表面欠陥計測装置。
An image sensor that irradiates light along the inner circumferential surface of an object to be measured, collects the reflected light with a condensing lens, and has pixels arranged in a two-dimensional array so as to be perpendicular to the optical axis of the condensing lens. A measurement head that performs photoelectric conversion and outputs an image signal corresponding to each detection area on the inner peripheral surface of the object to be measured, and a measurement head that takes in the image signal of the measurement head and outputs an image signal at each detection area of the object to be measured and an image signal corresponding to the detection area. and compares it with standard data that indicates the standard value of the amount of received light stored in advance to determine the presence or absence of defects and the presence or absence of dust, etc. on the inner circumferential surface of the object to be measured, and displays the determination results as an image, etc. At the same time, the measurement head is moved along the inner peripheral surface of each object to be measured during measurement, and each time the measurement of one object is completed, the measurement start position of another object is sequentially determined. a control circuit that outputs a control signal to move the measuring head to the desired position, a driving means that drives the measurement head based on the control signal from the control circuit, and a display signal that receives the display signal from the control circuit to display the measurement results of the object to be measured. 1. A surface defect measuring device comprising a display means for displaying a display.
JP6630884U 1984-05-07 1984-05-07 Surface defect measurement device Granted JPS60179852U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6630884U JPS60179852U (en) 1984-05-07 1984-05-07 Surface defect measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6630884U JPS60179852U (en) 1984-05-07 1984-05-07 Surface defect measurement device

Publications (2)

Publication Number Publication Date
JPS60179852U true JPS60179852U (en) 1985-11-29
JPH0443813Y2 JPH0443813Y2 (en) 1992-10-15

Family

ID=30599089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6630884U Granted JPS60179852U (en) 1984-05-07 1984-05-07 Surface defect measurement device

Country Status (1)

Country Link
JP (1) JPS60179852U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09178671A (en) * 1995-12-25 1997-07-11 Shitara Seisakusho:Kk Inspection apparatus for inside of can
JP2000331168A (en) * 1999-03-12 2000-11-30 Tokyoto Gesuido Service Kk Device and method for processing image of internal surface of conduit
JP2011089826A (en) * 2009-10-21 2011-05-06 Aisin Seiki Co Ltd Internal surface defect inspection apparatus of screw hole or hole

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518904A (en) * 1978-07-26 1980-02-09 Hitachi Ltd Inspecting device
JPS5580736U (en) * 1978-11-28 1980-06-03
JPS57182155U (en) * 1981-05-12 1982-11-18

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518904A (en) * 1978-07-26 1980-02-09 Hitachi Ltd Inspecting device
JPS5580736U (en) * 1978-11-28 1980-06-03
JPS57182155U (en) * 1981-05-12 1982-11-18

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09178671A (en) * 1995-12-25 1997-07-11 Shitara Seisakusho:Kk Inspection apparatus for inside of can
JP2000331168A (en) * 1999-03-12 2000-11-30 Tokyoto Gesuido Service Kk Device and method for processing image of internal surface of conduit
JP2011089826A (en) * 2009-10-21 2011-05-06 Aisin Seiki Co Ltd Internal surface defect inspection apparatus of screw hole or hole

Also Published As

Publication number Publication date
JPH0443813Y2 (en) 1992-10-15

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