JPS60169777A - Connection apparatus of electric circuit - Google Patents

Connection apparatus of electric circuit

Info

Publication number
JPS60169777A
JPS60169777A JP59025815A JP2581584A JPS60169777A JP S60169777 A JPS60169777 A JP S60169777A JP 59025815 A JP59025815 A JP 59025815A JP 2581584 A JP2581584 A JP 2581584A JP S60169777 A JPS60169777 A JP S60169777A
Authority
JP
Japan
Prior art keywords
contact
support member
electric circuit
contact pin
printed wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59025815A
Other languages
Japanese (ja)
Inventor
Takeshi Okuno
奥野 武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP59025815A priority Critical patent/JPS60169777A/en
Publication of JPS60169777A publication Critical patent/JPS60169777A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To make it possible to use the titled apparatus in common in order to test many kinds of electric circuits by simple operation, by selecting electric connection with an electric circuit apparatus by the action of a connection member without applying load to a contact pin. CONSTITUTION:In such a state that a contact pin 24 is naturally inserted in an insert hole 31, an externally directed flange 24b is contacted with the support surface 31b of the insert hole 31 and the displacement of the contact pin 24 to a downward direction is inhibited. In this case, the length of the contact pin 24 in the axial direction is selected so that the lower end of said pin 24 is pushed upwardly by the rising displacement of a connection member 26 and the upper end of the contact pin 24 is contacted with the contact position 30 of a printed wiring board 20, when the displacement operation thereof is completed, to be electrically connected thereto. Further, in the side of one surface of the support member 23 faced to the printed wiring board 20 and in the side of the other surface 23a thereof being the opposite side, the connection member 26 is arranged so as to perform displacement approachable to and separable from the support member 23. The connection member 26 is made of an electric insulating material.

Description

【発明の詳細な説明】 技術分野 本発明は印刷配線基板に実装されるなどした電気回路の
動作試験を行なうための装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to an apparatus for testing the operation of an electric circuit mounted on a printed wiring board or the like.

背景技術 印刷配線基板に実装された電気回路の動作を試験するた
めの典形的な先行技術は、印刷配線基板の下方に配置さ
れた多数の接触ビンが、試験されるべき各電気回路に個
別的に対応して配置されて構成されている。このような
先行技術では試験されるべき電気回路が異なるごとに新
たな試験装置を組立てなければならず、多大の労力を必
要とし、また多数の電気回路毎にそのような試験装置を
個別的に構成した場合には、保管のための大きなスペー
スを必要とする。
BACKGROUND OF THE INVENTION The typical prior art for testing the operation of electrical circuits mounted on printed wiring boards consists of a number of contact bins placed below the printed wiring board, each contacting a separate contact bin for each electrical circuit to be tested. They are arranged and configured to correspond to each other. In such prior art, a new test device must be assembled for each different electric circuit to be tested, which requires a great deal of labor, and such a test device must be installed individually for each of a large number of electric circuits. When configured, it requires a large amount of space for storage.

このような問題点を解決するための成る試験装置は、第
1図に示されるように印刷配線基板の下方にマスクプレ
ート1を配置し、このマスクプレート1に印刷配線基板
の試験されるべき電気回路に対応する接触ピン2を挿通
ずる挿通孔3を形成し、試験動作時に不用の接触ピン4
が印刷配線基板と電気的に接続されないように構成され
る。接触ピン2はラッピング配線5によってインターフ
ェースポード6と接続され、このインターフェースボー
ド6はテスタ(図示せず)に接続される。
A test device designed to solve these problems includes a mask plate 1 placed below a printed wiring board as shown in FIG. An insertion hole 3 is formed through which a contact pin 2 corresponding to the circuit is inserted, and a contact pin 4 which is unnecessary during test operation is formed.
is configured so that it is not electrically connected to the printed wiring board. The contact pins 2 are connected by wrapping wires 5 to an interface port 6, and this interface board 6 is connected to a tester (not shown).

このような試験装置ではマスクプレート1を交換するだ
けで印刷配線基板の機種交換ごとに、パターン電極から
の信号を検出することが可能となる反面、マスクプレー
ト1の取付け、取外しに手間どり、しかも動作時におけ
る不用の接触ピン3がマスクプレート1によって押圧さ
れて変形し、その寿命が短くなることとなった。
In such a test device, it is possible to detect signals from the pattern electrodes every time the printed wiring board model is replaced by simply replacing the mask plate 1, but on the other hand, it is time-consuming to attach and remove the mask plate 1. During operation, the unnecessary contact pins 3 are pressed and deformed by the mask plate 1, resulting in a shortened lifespan.

目 的 本発明の目的は上述の技術的課題を解決し、接触ピンを
傷めることがなり、シかも簡単な操作によって多種類の
電気回路を試験するために共通に用いることができる電
気回路の試験装置を提供することである。
OBJECTIVE The purpose of the present invention is to solve the above-mentioned technical problems, and to provide a test for electrical circuits that can be commonly used to test many types of electrical circuits with simple operations that avoid damaging contact pins. The purpose is to provide equipment.

実施例 第2図は本発明の一実施例のブロック図である。Example FIG. 2 is a block diagram of one embodiment of the present invention.

マイクロコンピュータなどによって実現される主処理装
置10は、マイクロコンピュータなどによって実現され
る入力用の処理装置11から通信ライン12を介して試
験されるべき電気回路の生産設備に接続されている。主
処理装置10の動作を行なうためのプログラムなどはメ
モリ13にストアされている。入出力用処理装置11に
はキーボード14.表示装置15およびプリンタ16が
接続される。主処理装置10のシステムバスクを介して
検査回路AI 、A2 、・・・、 A nが備えられ
、また検査回路Bl、B2.・・・、Bnが接続され抵
抗ラダー回路18および負荷抵抗19が備えられる。
A main processing device 10 realized by a microcomputer or the like is connected to a production facility for an electric circuit to be tested via a communication line 12 from an input processing device 11 realized by a microcomputer or the like. Programs and the like for operating the main processing unit 10 are stored in the memory 13. The input/output processing device 11 includes a keyboard 14. A display device 15 and a printer 16 are connected. Inspection circuits AI, A2, . , Bn are connected, and a resistance ladder circuit 18 and a load resistor 19 are provided.

第3図は印刷配線基板20に電子回路素子21などが実
装された試験されるべき電気回路を備える電気回路装置
22の試験状態を示す断面図である。本発明に従う試験
装置50は、基本的には印刷配線基板20の下方に配置
される支持部材23によって支持される複数の接触ピン
24と、接触ピン24を上下に変位駆動する駆動手段2
5と、啼 接触ピン24の変位駆動を選択的に行なう′ための接続
部材26とを含む。本装置22の基台27上には第3図
の上方に延びる一対の支柱28 、29が間隔をあけて
平行に立設される。支柱28,29はそれぞれL字状に
形成されており、下方端が基台27に固定される脚部2
8a、29aと、脚部28a、29aの各上方端に連な
り相互に近接方向に延びる屈曲部28b、29bとをそ
れぞれ含む。屈曲部28b 、29b間に亘って延びる
印刷配線基板20の第3図の下面には、試験されるべき
電気回路の印刷配線が形成される。印刷配線の接続位置
30に臨む下方には、脚部28a、29a間に亘って延
びる支持部材23が配置される。
FIG. 3 is a sectional view showing a test state of an electric circuit device 22 including an electric circuit to be tested in which an electronic circuit element 21 and the like are mounted on a printed wiring board 20. The test device 50 according to the present invention basically includes a plurality of contact pins 24 supported by a support member 23 disposed below a printed wiring board 20, and a driving means 2 for vertically displacing and driving the contact pins 24.
5, and a connecting member 26 for selectively displacing the contact pin 24. A pair of support columns 28 and 29 extending upward in FIG. 3 are erected in parallel and spaced apart from each other on the base 27 of the apparatus 22. The pillars 28 and 29 are each formed in an L-shape, and the lower ends of the legs 2 are fixed to the base 27.
8a and 29a, and bent portions 28b and 29b that are connected to the upper ends of the leg portions 28a and 29a and extend in a direction close to each other. Printed wiring of an electrical circuit to be tested is formed on the lower surface of the printed wiring board 20 in FIG. 3 extending between the bent portions 28b and 29b. A support member 23 extending between the legs 28a and 29a is arranged below facing the connection position 30 of the printed wiring.

支持部材23には、複数の前記接続位置30に個別的に
対応する挿通孔31がその厚み方向に形成される。挿通
孔31は印刷配線基板20と支持部材23との間の中空
部32に連なる第1直円筒面31mと、その下方端に連
なりその半径方向内方1こ延びて第1直円筒面31aの
軸線と垂直な平面内にある環状の支持面31bと、支持
面31bの小径端部から一直線状に延びる第2直円筒面
31Cとから成り、第1直円筒面31aと第2直円筒面
31とは同一軸線を有する。
The support member 23 has insertion holes 31 formed in its thickness direction that individually correspond to the plurality of connection positions 30 . The insertion hole 31 is connected to a first right cylindrical surface 31m that is connected to the hollow portion 32 between the printed wiring board 20 and the support member 23, and is connected to the lower end of the first right cylindrical surface 31m and extends one inch inward in the radial direction to the first right cylindrical surface 31a. Consisting of an annular support surface 31b in a plane perpendicular to the axis and a second right cylindrical surface 31C extending in a straight line from the small diameter end of the support surface 31b, the first right cylindrical surface 31a and the second right cylindrical surface 31 and have the same axis.

この挿通孔31内には導電性の金属材料から成る接触ピ
ン24が個別的に挿入される。接触ピン24の外径は前
記第2直円筒面31cの内径よりも小さく選ばれており
、このため接触ピン24は挿通孔31内を上下変位する
ことができる。接触ピン24の頭部24aの近傍には外
向きフランジ24bが形成される。外向きフランジ24
bの外径は挿通孔31の第1直円筒面31aの内径より
小さく、かつ第2直円筒面31cの内径より大きく選ば
れており、このため接触ピン24が挿通孔31に自然に
挿通された状態では外向きフランジ24bが挿通孔31
の支持面31bに当接し、接触ピン24の第3図下方へ
の変位が阻止される。
A contact pin 24 made of a conductive metal material is individually inserted into the insertion hole 31 . The outer diameter of the contact pin 24 is selected to be smaller than the inner diameter of the second right cylindrical surface 31c, so that the contact pin 24 can be vertically displaced within the insertion hole 31. An outward flange 24b is formed near the head 24a of the contact pin 24. Outward flange 24
The outer diameter of b is selected to be smaller than the inner diameter of the first right cylindrical surface 31a of the insertion hole 31 and larger than the inner diameter of the second right cylindrical surface 31c, so that the contact pin 24 is naturally inserted into the insertion hole 31. In this state, the outward flange 24b is inserted into the insertion hole 31.
3, and the contact pin 24 is prevented from moving downward in FIG. 3.

接触ビン24の軸線方向の長さlは、接触ビン24の下
方端が後述する接続部材26の上昇変位によって第3図
の上方に押し上げられ、その変位動作完了時において接
触ビン24の上方端が印刷配線基板20の接続位置30
に接触して電気的に接続することができるように選ばれ
る。
The length l of the contact bottle 24 in the axial direction is such that the lower end of the contact bottle 24 is pushed upward in FIG. Connection position 30 of printed wiring board 20
selected so that it can be contacted and electrically connected.

支持部材23の印刷配線基板2(Nこ臨む一面と反対側
の他面23a側には、第3図に示される接続部材26が
支持部材23に近接・離反変位可能に配置される。接続
部材26は電気絶縁性材料から成り、方形状に形成され
る。接続部材26は、第4図に示されるように接触ビン
24に個別的に対応して支持部材23の前記対応面23
a↓こ臨んで接続部材26が支持部材23に近接変位し
たときに接触ビン24の下方端に電気的に接続される接
続部34と、接続部34に2イン35を介して個別的に
接続される接点部36と、接触ビン24に選択的に対応
して接触ビン24の下方端が挿通ずる挿通孔37とを含
む。接続部34に導通ずる接点部36は、接続部材26
の長手方向の両端部にその幅方向に一直線状にそれぞれ
配列される。
A connecting member 26 shown in FIG. 3 is disposed on the other side 23a of the supporting member 23 facing the printed wiring board 2 (N), which is opposite to the other side facing the printed wiring board 2 (N), so as to be movable toward and away from the supporting member 23. Reference numeral 26 is made of an electrically insulating material and has a rectangular shape.The connecting member 26 is connected to the corresponding surface 23 of the support member 23 in individual correspondence with the contact pin 24, as shown in FIG.
a↓A connecting portion 34 is electrically connected to the lower end of the contact bottle 24 when the connecting member 26 is displaced close to the supporting member 23, and is individually connected to the connecting portion 34 via a 2-in 35. and an insertion hole 37 that selectively corresponds to the contact pin 24 and into which the lower end of the contact pin 24 is inserted. The contact portion 36 that is electrically connected to the connecting portion 34 is connected to the connecting member 26.
are arranged in a straight line in the width direction at both ends of the longitudinal direction.

接続部材26の長手方向の一端(第3図の左方)に配置
される接点部36aには、ライン35aを介して接続部
材26の第4図の左半分に配置される接続部34aが接
続され、一方接枕部材26の長手方向の他端(第3図の
右方)に配置される接点部36bにはライン35bを介
して接続部材26の第3図の右半分に配置される接続部
34bが接続される。このように接点部36を接続部材
26の長手方向の両端に形成したことによって、挿通孔
37によって接続部34と接点部36との出力ライン3
5の設置スペースが狭小になることが防がれる。
A connecting portion 34a located at the left half of the connecting member 26 in FIG. 4 is connected to a contact portion 36a located at one longitudinal end of the connecting member 26 (left side in FIG. 3) via a line 35a. On the other hand, a contact portion 36b disposed at the other longitudinal end of the contact pillow member 26 (on the right side in FIG. 3) is connected via a line 35b to a connection disposed on the right half of the connecting member 26 in FIG. The section 34b is connected. By forming the contact portions 36 at both ends of the connection member 26 in the longitudinal direction, the output line 3 between the connection portion 34 and the contact portion 36 is formed by the insertion hole 37.
This prevents the installation space of No. 5 from becoming too narrow.

接続部材26の各接点部36a、36bは第3図示の駆
動手段25に一体的に固定された一対のコネクタ38に
電気的に接続される。接続部材26の支持部材231ど
臨む一面とは反対側の他面には、駆動手段25によって
第3図の上下1ζ変位自在の押圧部材40が配置される
。抑圧部材40には前記支持部材23の挿通孔31に対
応して挿通孔31と一直径線上に延びる挿通孔41がそ
の厚み方向にそれぞれ形成される。押圧部材4oが駆動
手段25によって支持部材23に近接する方向に変位す
るとき、接続部材26の接続部34に接触する接触ビン
24のみが上昇変位して電気回路装置22の接続位置3
0に電気的に導通ずることができ、他の接触ビン24は
接続部材26の挿通孔31招よび押圧部材4oの挿通孔
41に挿通してその静止状態が維持される。
Each contact portion 36a, 36b of the connecting member 26 is electrically connected to a pair of connectors 38 integrally fixed to the driving means 25 shown in the third figure. On the other side of the connecting member 26 opposite to the one side facing the support member 231, a pressing member 40 which can be vertically displaced by 1ζ as shown in FIG. 3 is disposed by the driving means 25. In the suppressing member 40, insertion holes 41 are formed in the thickness direction corresponding to the insertion holes 31 of the support member 23 and extending on one diameter line with the insertion holes 31, respectively. When the pressing member 4o is displaced in a direction approaching the support member 23 by the driving means 25, only the contact pin 24 that contacts the connecting portion 34 of the connecting member 26 is displaced upward, and the electric circuit device 22 is at the connecting position 3.
0, and the other contact pin 24 is inserted into the insertion hole 31 of the connecting member 26 and the insertion hole 41 of the pressing member 4o, and its stationary state is maintained.

接続位置30に電気的に導通する接触ビン24は接続部
材26の接続部34から接点部36に電気的に導通して
いる。この接点部36は第2図示の一対のコネクタ38
に接続される。コネクタ38は接点部36を検出回路A
I、A2.・・・、Anに接続し、あるいはまた検出回
路Bl、B2.・・・。
The contact pin 24 which is electrically connected to the connection position 30 is electrically connected from the connection part 34 of the connection member 26 to the contact part 36 . This contact portion 36 is connected to a pair of connectors 38 shown in the second figure.
connected to. The connector 38 connects the contact portion 36 to the detection circuit A.
I, A2. . . . are connected to the detection circuits Bl, B2 . ....

Bnに選択的に接続し、さらにまた抵抗2ダ−回路18
および負荷抵抗19などに接続する。試験されるべき電
気回路装置22は、電源42からコネクタ38を経て接
点部36に与えられる電力によって電力付勢される。検
出回路A1〜An、B1〜Bnは接点部36からコネク
タ38を介して与えられる電圧をレベル弁別し、あるい
はまた接点部36に試験のための信号を発生するもので
あって、検出回路A1からAnは各種の試験されるべき
電気回路に共通に用いることができ、また検出回路B1
からBnは特定の電気回路の試験のために専用とされる
selectively connected to Bn, and furthermore a resistor 2-dar circuit 18
It is connected to the load resistor 19 and the like. The electrical circuit device 22 to be tested is powered by power applied from the power supply 42 to the contacts 36 via the connector 38 . The detection circuits A1 to An and B1 to Bn are for level-discriminating the voltage applied from the contact section 36 through the connector 38, or for generating a test signal to the contact section 36, and are for detecting the voltage applied from the detection circuit A1 to the contact section 36. An can be commonly used in various electric circuits to be tested, and can also be used in the detection circuit B1.
Bn is dedicated to testing specific electrical circuits.

印刷配線基板20の第3図における下面に形成される印
刷配線では第5図に示される参照符43で示される位置
のいずれかに接続位置3oが形成されるように構成され
る。このような接続位置30が予め定めた格子43に対
応して第6図に示されるように支持部材23の挿着孔3
1が形成され、また第4図に示されるように接続部材2
6の挿通孔37が形成され、また第7図に示されるよう
に押圧部材40の挿通孔41が形成される。このように
接続部材26の挿通孔37を選択的に形成することによ
って、接続部材26の接続部34に接触する接触ビン2
4のみが交点43にある接続位置30に電気的に接触す
ることが可能となる。
The printed wiring formed on the lower surface of the printed wiring board 20 in FIG. 3 is configured such that the connection position 3o is formed at one of the positions indicated by reference numeral 43 in FIG. As shown in FIG.
1 is formed and a connecting member 2 is formed as shown in FIG.
No. 6 insertion holes 37 are formed, and as shown in FIG. 7, an insertion hole 41 for a pressing member 40 is formed. By selectively forming the insertion hole 37 of the connecting member 26 in this way, the contact pin 2 that comes into contact with the connecting portion 34 of the connecting member 26
4 can be electrically contacted to the connection location 30 at the intersection point 43.

印刷配線基板20iこは第8図のように基準孔44.副
基準孔45とが備えられている。副基準孔45は基準孔
44の半径方向に細長く形成されている。この基準孔4
4および副基準孔45に第3図示の位置決めビン46.
47が挿通されることによって支持部材23と印刷配線
基板2oとの相互の位置が正確に設定される。副基準孔
45は基準孔44の半径方向に細長く延びており、した
がって基準孔44と副基準孔45とに挿通する位置決め
点46.47の間隔の誤差にかかわらず確実に位置決め
を行なうことが可能である。
The printed wiring board 20i has reference holes 44. as shown in FIG. A sub-reference hole 45 is provided. The sub-reference hole 45 is elongated in the radial direction of the reference hole 44 . This reference hole 4
4 and the sub-reference hole 45 as shown in the third figure.
47, the mutual positions of the support member 23 and the printed wiring board 2o are set accurately. The sub-reference hole 45 is elongated in the radial direction of the reference hole 44, so that positioning can be performed reliably regardless of the error in the spacing between the positioning points 46 and 47 inserted through the reference hole 44 and the sub-reference hole 45. It is.

電気回路装置22の試験を行なうにあたっては、試験を
行なうべき電気回路装置22の種類をキーボード14の
操作によって主処理回路1oに大刀する。主処理回路1
oはシステムパス17に接続されている処理回路48に
よって、1個の電気回路装置22に対応する接続部材2
6を選択してコネクタ38に自動的に挿着してゆく。
When testing the electric circuit device 22, the type of electric circuit device 22 to be tested is input to the main processing circuit 1o by operating the keyboard 14. Main processing circuit 1
o is connected to the connecting member 2 corresponding to one electric circuit device 22 by the processing circuit 48 connected to the system path 17.
6 is selected and automatically inserted into the connector 38.

第9図を参照して接続部材26の挿着時には、駆動手段
25によって抑圧部材4oが第9図(1)のように下降
する。この状態で試験されるべき電気回路装置22の種
類に対応する接続部材26をコネクタ38に装着する。
Referring to FIG. 9, when the connecting member 26 is inserted, the suppressing member 4o is lowered by the driving means 25 as shown in FIG. 9(1). In this state, the connecting member 26 corresponding to the type of electric circuit device 22 to be tested is attached to the connector 38.

コネクタ38には第10図に示されるように、接続部材
26を固定するための接触子レバー49が設けられてお
り、この接触子レバー49を矢符A方向に操作すること
によって、接続部材26はコネクタ38に着脱自在とな
り、接触子レバー49を矢符B方向に操作することによ
って接続部材26はコネクタ38に固定される。接続部
材26をコネクタ38に装着したのち、抑圧部材40は
駆動手段24によって第9図f8Jのように上昇変位す
る。このとき接続部材26の接続部341こ対応する接
触ビン24のみが印刷配線基板20の接続位置30に電
気的に接続され、電気回路装置22の電気回路の試験を
行なうことができる。新たな電気回路装置22の試験を
行なうときは、第9図(4)のように再び駆動手段24
によって接続部材26を下降し、上記動作の手順によっ
て電気回路装置22の種類に対応する接続部材26を選
択して試験装置5oに取付ける。
As shown in FIG. 10, the connector 38 is provided with a contact lever 49 for fixing the connecting member 26. By operating this contact lever 49 in the direction of arrow A, the connecting member 26 is fixed. can be attached to and detached from the connector 38, and the connecting member 26 is fixed to the connector 38 by operating the contact lever 49 in the direction of arrow B. After the connecting member 26 is attached to the connector 38, the suppressing member 40 is upwardly displaced by the driving means 24 as shown in FIG. 9 f8J. At this time, only the contact pin 24 corresponding to the connecting portion 341 of the connecting member 26 is electrically connected to the connecting position 30 of the printed wiring board 20, and the electric circuit of the electric circuit device 22 can be tested. When testing a new electric circuit device 22, the driving means 24 is turned on again as shown in FIG. 9 (4).
The connecting member 26 is lowered by the steps described above, and the connecting member 26 corresponding to the type of the electric circuit device 22 is selected and attached to the test apparatus 5o according to the above-described operation procedure.

このように1枚の接続部材26によって接触ビン24の
選択およびコネクタ回路38との接続が行なえるので交
換が容易となり、スペースも少な、くて済び。また処理
回路48の働きによって自動的に接続部材26を交換す
ることで作業性が向上される。また従来技術で示したよ
うなマスクプレート1を用いる場合と比べ、電気回路装
置22の機種の変化に応じ、交流信号と直流信号との切
換え回路が必要でなり、シたがってその構成も簡単とな
る。
In this way, since the contact bin 24 can be selected and connected to the connector circuit 38 using one connecting member 26, replacement is easy, and less space is required. Furthermore, the processing circuit 48 automatically replaces the connecting member 26, thereby improving work efficiency. Furthermore, compared to the case of using the mask plate 1 as shown in the prior art, a switching circuit between an AC signal and a DC signal is required in response to changes in the model of the electric circuit device 22, and the configuration is therefore simpler. Become.

このような電気回路の試験装置5oの試験動作および試
験結果は、処理回路1oの動作によってメモリ11にス
トアし、また表示装置15によって表示し、プリンタ1
6によって印字することができる。試験動作は通信ライ
ン12に接続されている電気回路装置の生産設備と関連
しながら、その生産設備で生産された電気回路装置22
を直ちに試験することができ、生産性の向上に役立てる
ことができる。
The test operation and test results of the electric circuit testing device 5o are stored in the memory 11 by the operation of the processing circuit 1o, displayed on the display device 15, and sent to the printer 1.
6 can be printed. The test operation is performed in conjunction with the electric circuit device production facility connected to the communication line 12, and the electric circuit device 22 produced by the production facility is connected to the communication line 12.
can be tested immediately and can be used to improve productivity.

効果 以上のように本発明によれば接続部材の働きによって接
触ビンに負担をかけることなく、電気回路装置との電気
接続を選択することができ、しかも多種類の電気回路の
試験をするために用いることができるので、本件電気回
路の試験装置を好適に実施することができる。
Effects As described above, according to the present invention, it is possible to select an electrical connection with an electric circuit device without putting a burden on the contact bottle due to the function of the connecting member, and moreover, it is possible to test many types of electric circuits. Therefore, the present electric circuit testing device can be suitably implemented.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は先行技術を示す断面図、第2図は本発明の一実
施例のブロック図、第3図は電気回路装置22の試験状
態を示す断面図、第4図は接続部材26の平面図、第5
図は印刷配線基板20の接続位置30の配置を説明する
ための図、第6図は支持部材23の平面図、第7図は押
圧部材40の平面図、第8図は印刷配線基板2oの平面
図、第9図は試験装置50の動作状態を示す簡略図、第
10図は接続部材26のコネクタ38への装着状態を示
す図である。 2.4.24・・・接触ピン、22・・・電気回路装置
、23・・・支持部材、26・・・接続部材、30・・
・接続位置、31.37・・・挿通孔、34・・・接続
部、50・・・電気回路の試験装置 代理人 弁理士 西教圭一部 第1図 3b 第4図 3 第5図 第6図 第7図 第8図
FIG. 1 is a sectional view showing the prior art, FIG. 2 is a block diagram of an embodiment of the present invention, FIG. 3 is a sectional view showing a test state of the electric circuit device 22, and FIG. 4 is a plan view of the connecting member 26. Figure, 5th
6 is a plan view of the support member 23, FIG. 7 is a plan view of the pressing member 40, and FIG. 8 is a plan view of the printed wiring board 2o. The plan view and FIG. 9 are simplified diagrams showing the operating state of the test device 50, and FIG. 10 is a diagram showing the state in which the connecting member 26 is attached to the connector 38. 2.4.24... Contact pin, 22... Electric circuit device, 23... Supporting member, 26... Connection member, 30...
・Connection position, 31. 37...Insertion hole, 34...Connection part, 50...Electric circuit testing device representative Patent attorney Kei Nishi Part 1 Figure 1 3b Figure 4 3 Figure 5 Figure 6 Figure 7 Figure 8

Claims (1)

【特許請求の範囲】 試験されるべき電気回路の複数の接続位置に個別的に対
応して挿着孔がその厚み方向に形成されており、−表面
側に前記電気回路が配置される支持部材と、 支持部材に個別的に挿着されて挿着孔内を第1位置と、
それよりも一端が前記−表面からさらに突出した第2位
置とに移動可能であって、第2位置では一端は電気回路
の接続位置に電気的に接続し、他端は支持部材の他表面
から突出する接触ビンと、 前記支持部材の両面側に配置されこの支持部材に近接離
反変位可能であって、接触ビンに個別的に対応して支持
部材の前記他表面に臨んで支持部材に近接変位したとき
に接触ビンの前記他端に電気的に接続される接続部と、
前記接触ビンに選択的に対応して接触ビンの前記他端が
挿通ずる挿通孔とを有する接続部材と、 前記接続部からの信号を受信して前記電気回路の試験を
行なう手段とを含むことを特徴とする電気回路の試験装
置。
[Scope of Claims] A support member in which insertion holes are formed in the thickness direction of the electric circuit to individually correspond to a plurality of connection positions of the electric circuit to be tested, and the electric circuit is disposed on the surface side of the support member. and, individually inserted into the support member and positioned in the insertion hole in the first position;
one end thereof is movable to a second position further protruding from said surface, wherein in the second position one end is electrically connected to a connection position of an electrical circuit and the other end is away from the other surface of the support member. protruding contact bins disposed on both sides of the support member, the contact bins being movable toward and away from the support member, the contact bins facing the other surface of the support member being movable toward the support member individually corresponding to the contact bins; a connection part that is electrically connected to the other end of the contact bottle when
a connecting member having an insertion hole through which the other end of the contact bottle is inserted selectively corresponding to the contact bottle; and means for receiving a signal from the connection part to test the electric circuit. An electrical circuit testing device featuring:
JP59025815A 1984-02-13 1984-02-13 Connection apparatus of electric circuit Pending JPS60169777A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59025815A JPS60169777A (en) 1984-02-13 1984-02-13 Connection apparatus of electric circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59025815A JPS60169777A (en) 1984-02-13 1984-02-13 Connection apparatus of electric circuit

Publications (1)

Publication Number Publication Date
JPS60169777A true JPS60169777A (en) 1985-09-03

Family

ID=12176359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59025815A Pending JPS60169777A (en) 1984-02-13 1984-02-13 Connection apparatus of electric circuit

Country Status (1)

Country Link
JP (1) JPS60169777A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS635274A (en) * 1986-06-25 1988-01-11 マニア・エレクトロニツク・アウトマテイザチオン・エントビツクルンク・ウント・ゲレ−テバウ・ゲ−エムベ−ハ− Method and device for inspecting printed substrate
JP2009245889A (en) * 2008-03-31 2009-10-22 Yamaha Corp Ic socket, and ic inspecting method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS635274A (en) * 1986-06-25 1988-01-11 マニア・エレクトロニツク・アウトマテイザチオン・エントビツクルンク・ウント・ゲレ−テバウ・ゲ−エムベ−ハ− Method and device for inspecting printed substrate
JP2009245889A (en) * 2008-03-31 2009-10-22 Yamaha Corp Ic socket, and ic inspecting method

Similar Documents

Publication Publication Date Title
US4225819A (en) Circuit board contact contamination probe
US3016489A (en) Test jig for contacting circuit card positions
US20200088765A1 (en) Testing apparatus having a configurable probe fixture
JP2006126197A (en) General-purpose testing tool
JPS60169777A (en) Connection apparatus of electric circuit
CN218037156U (en) Device for relay voltage withstand test and insulation resistance test
KR102451715B1 (en) PCB Function Inspection Apparatus For ATM
JP2012068043A (en) Electric inspection device and method for planar circuit board
JP2014235126A (en) Substrate inspection device, substrate inspection method, and substrate inspection jig
JPH02130483A (en) Inspecting method of printed circuit board
JP6176466B1 (en) PCB inspection jig
JPS6312977A (en) Board tester
US6150829A (en) Three-dimensional programmable connector
JP4698300B2 (en) Connection structure and connection method between electrical connection member and electrical contact
JPH0815384A (en) Board inspection apparatus
JPH0412468Y2 (en)
JPH1026646A (en) Contact device
JPH05215814A (en) Semiconductor device inspecting device
KR0130142Y1 (en) Test socket of semiconductor device
JP3079901U (en) Conductive circuit board measurement jig
JPH0138531Y2 (en)
JP2001074814A (en) Inspection apparatus for circuit board
JPH0578792B2 (en)
JPH0815361A (en) Inspection method for printed wiring board
KR100255708B1 (en) Slope testing apparatus for the surface of the controller