JPS6015637A - Resist film developing method - Google Patents

Resist film developing method

Info

Publication number
JPS6015637A
JPS6015637A JP12453383A JP12453383A JPS6015637A JP S6015637 A JPS6015637 A JP S6015637A JP 12453383 A JP12453383 A JP 12453383A JP 12453383 A JP12453383 A JP 12453383A JP S6015637 A JPS6015637 A JP S6015637A
Authority
JP
Japan
Prior art keywords
resist film
developing
vessel
soln
resist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12453383A
Other languages
Japanese (ja)
Inventor
Atsushi Sudo
淳 須藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP12453383A priority Critical patent/JPS6015637A/en
Publication of JPS6015637A publication Critical patent/JPS6015637A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means

Abstract

PURPOSE:To enable automation of a process line and development of a uniform and stable resist film by developing the substrate to be developed with the resist side down, by allowing a developing soln. to flow upward from the bottom of a vessel. CONSTITUTION:The bottom 22 of a vessel 21 is provided with the introduction paths of a developing soln. 23 to introduce the soln. into the vessel 21. The inner wall of the bottom 22 is made of a porous material to inject the soln. 15 always into the vessel 21 through the pores of the porous material. When the vessel 21 is filled with the sol. 15 fed through a pipe 24, the soln. flows out over the surrounding wall and through a central drain pipe 26, received with a receiving tray 27, and discharged. The side of a substrate 28 reverse to the resist to be developed is held with a vacuum chuck, and the side coated with the resist film 29 is directed downward and immersed in the soln. 15 in the vessel 21 for a prescribed time to develop the film 29.

Description

【発明の詳細な説明】 (a) 発明の技術分野 本発明はレジスト膜の現像方法に係り、特にポジV!/
ヌト暎の現像方法の改良に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a method for developing a resist film, and in particular to a method for developing a resist film, particularly for positive V! /
This invention relates to an improvement in the developing method of Nuto-Ari.

(1)> 技術の背景 精密微細加工技術、特に半導体集積回路の製造工程では
、基板にレジストを塗布し、これを露光および現像して
パターンニングすることが頻繁に行なわれている。同時
に経済性と高速化による特性の向上を目的として、基板
の大口径化、パターンの高集積化が進行し、そのためホ
トプロセスの過程で、均一かつ平滑を膜を形成すると同
時に現像作業時における現像むらをなくすことが要求さ
れている。
(1)> Background of the Technology In precision microfabrication technology, particularly in the manufacturing process of semiconductor integrated circuits, resist is often applied to a substrate and patterned by exposing and developing the resist. At the same time, with the aim of improving characteristics through economical efficiency and speeding up, substrates are becoming larger in diameter and patterns are becoming more integrated. There is a need to eliminate unevenness.

(C) 従来技術と問題点 従来レジスト膜の現像方法として、現像槽に現像液を入
れ、これにキャリヤホルダーに複数のレジスト塗布面を
有する基板を載置し、前記現gjA檜に浸漬することに
よってレジスト膜を現像する。
(C) Prior Art and Problems As a conventional method for developing a resist film, a developer is placed in a developer tank, a substrate having a plurality of resist coated surfaces is placed on a carrier holder, and the substrate is immersed in the developer gjA hinoki. Develop the resist film.

いわゆる浸漬法と、現像液滴下ノズルより1回転するレ
ジスト塗布面を有する基板上に現像液を滴下して現像す
るいわゆるスピン現像法などがある、第1図に従来の浸
漬法を行なうための概略構成図を示す。同図においてl
は現像槽、2はキャリヤホルダー、3はたとえばポジレ
ジスト塗面面を有する基板、4は現像液を示す。
There are the so-called immersion method and the so-called spin development method, in which a developing solution is dropped onto a substrate having a resist-coated surface that rotates once from a developing solution dripping nozzle. A configuration diagram is shown. In the same figure, l
2 is a developer tank, 2 is a carrier holder, 3 is a substrate having, for example, a positive resist coating surface, and 4 is a developer.

図から明らかなようにかかる現像方法においてはバッチ
処理であり、インフィンの自動化が難しいという問題が
あり又現像液の空気中における炭酸ガスとの反応による
現像液の消耗、現像液の交換の管理、更に現像作業中に
現像液の波動過流現象に起因する現像むらなどの問題が
あった。
As is clear from the figure, this developing method is a batch process, and there are problems in that it is difficult to automate the infin process, as well as consumption of the developer due to the reaction of the developer with carbon dioxide gas in the air, and management of developer replacement. Furthermore, there were problems such as uneven development due to the undulating overflow phenomenon of the developer during the development process.

叉第2図に従来のヌピン現像法を行なうための概略h−
Y成図を示す。同図において5は現像液を滴下するノズ
ル、6は基板7上に塗布されたたとえばポジレジスト膜
であり、前記ノズlし5は基板7の回転中心の上方に位
置している。8は前記基板7を載せる載置台、9は載置
台8の下面に配設された真空チャック、10はこの真空
チャック9および載置台8を回転させる駆動モーター、
11は現像装置本体の側壁、12は飛散された現像液を
排除するための排液孔である。
Figure 2 shows a schematic diagram of the conventional Nupin development method.
A Y diagram is shown. In the figure, 5 is a nozzle for dropping a developer, and 6 is, for example, a positive resist film coated on a substrate 7. The nozzle 5 is located above the center of rotation of the substrate 7. 8 is a mounting table on which the substrate 7 is placed; 9 is a vacuum chuck disposed on the lower surface of the mounting table 8; 10 is a drive motor for rotating the vacuum chuck 9 and the mounting table 8;
Reference numeral 11 indicates a side wall of the main body of the developing device, and reference numeral 12 indicates a drain hole for discharging the scattered developer.

かかる様に構成された装置を用いて従来のスピン現像を
行なう場合には、駆動モーター10を停止した状態で載
置台8上に所定のたとえばポジレジスト膜6が塗布され
た基板7を真空チャック9により吸着固定し1次いで駆
動モーターIOに:り基板7を所定の速度に回転しなが
ら基板7の・回転中心上に設けられたノズル5より基板
7面上に現像液を滴下して前記レジスト膜6を現像する
When performing conventional spin development using an apparatus configured as described above, the substrate 7 coated with a predetermined positive resist film 6, for example, is placed on the mounting table 8 with the drive motor 10 stopped, and placed on the vacuum chuck 9. The resist film is fixed by suction and fixed by the drive motor IO.While the substrate 7 is being rotated at a predetermined speed, a developer is dripped onto the surface of the substrate 7 from a nozzle 5 provided on the rotation center of the substrate 7 to form the resist film. Develop 6.

かかる現像方法においてはインラインによる自動化は可
能である。
In-line automation is possible in such a developing method.

しかしながら上述したスピン現像方法においては基板7
の中心部から側縁部に拡がる現像液の時間差、及び中心
部に供給される現像液の新鮮度によって基板7の中心部
のレジストパターンと側縁部のレジストパターンの寸法
精度に差を生じ、特に大口径化の基板においては基板7
全体の均一な現像が難しいという問題があった。
However, in the spin development method described above, the substrate 7
There is a difference in dimensional accuracy between the resist pattern at the center of the substrate 7 and the resist pattern at the side edges due to the time difference in the developer spreading from the center to the side edges and the freshness of the developer supplied to the center. Especially for large-diameter boards, the board 7
There was a problem in that it was difficult to develop uniformly the entire image.

((1) 発明の目的 本発明の目的はかかる問題点に鑑みなされたもので、イ
ンラインの自動化が可能で均一で安定したレジスト膜の
現像方法の提供にある。
((1) Object of the Invention The object of the present invention was made in view of the above problems, and is to provide a method for developing a resist film that is uniform and stable and that can be automated in-line.

(e) 発明の構成 その目的を達成するため本発明のvly、)膜の現像方
法は、底面より現像液が流入する容器に、レジスト塗布
面を下向けにした被現像基板を浸漬して、現像するよう
・にしたことを特徴とする。更に底面よりガスを噴出さ
せて攪拌するようにしたことを特徴とする。
(e) Structure of the Invention In order to achieve the object, the method of developing a film of the present invention is to immerse a substrate to be developed with the resist-coated surface facing downward in a container into which a developer flows from the bottom. It is characterized by being developed. A further feature is that gas is ejected from the bottom for stirring.

(f) 発明の実施例 以下本発明の実施例について図面を参照して説明する。(f) Examples of the invention Embodiments of the present invention will be described below with reference to the drawings.

第8図は本発明の一実施例を説明するための概略構成図
、第4図は本発明の他の実施例を説明するだめの概略構
成図である。
FIG. 8 is a schematic configuration diagram for explaining one embodiment of the present invention, and FIG. 4 is a schematic configuration diagram for explaining another embodiment of the present invention.

第3図において容器21の底面22には現像液導入路2
8が設けられ導入管24より現像液が供給される。底面
22の内壁は多孔質よりなる部材より構成されており多
孔質の孔を通じて容器21内にたえず噴出される構造を
有している。前記導入管24より現像液25が容器21
内に満たされると該容器21の周囲と中央の排液管26
より流出する構造になっており流出した現像液25は受
皿27によって排除される。上記流出機構は周囲か中央
の排液管26のいずれか一方より行なってもよい。
In FIG. 3, the bottom surface 22 of the container 21 has a developer introduction passage 2.
8 is provided, and a developer is supplied from an introduction pipe 24. The inner wall of the bottom surface 22 is made of a porous member, and has a structure in which water is constantly ejected into the container 21 through the porous holes. The developer 25 is supplied from the introduction pipe 24 to the container 21.
When the container 21 is filled with water, the drain pipe 26 at the periphery and center of the container 21
The developing solution 25 is structured to allow more flow out, and the developer 25 that flows out is removed by a tray 27. The outflow mechanism may be provided by either the peripheral or central drain pipe 26.

かかるように構成された現像装置を用いて、たとえば真
空・チャック(図示せず)で被現像基板28のレジスト
塗布面でない而を吸着保持し、レジスト膜・2□9・が
塗布された基板面を図示したように下向けにしで、容器
21内に満たされた現像液面に所定時間、浸漬して前記
レジスト膜29を現像する。
Using the developing device configured as described above, the surface of the substrate to be developed 28 that is not coated with the resist is held by suction using a vacuum chuck (not shown), and the surface of the substrate coated with the resist film 2□9 is held. The resist film 29 is developed by immersing the resist film 29 in the developer solution filled in the container 21 for a predetermined time while facing downward as shown in the figure.

かかる現・像方法においては現像液面にレジスト艇2′
9全体が同時に浸漬され、常に新しい現像液が底面2S
の内壁よ妙一様に供給されるため、レジスト膜29の現
像は中央部と側縁部においても均一となり所望のパター
ン精度を有する現像が可能となる。又一枚処理のためイ
ンラインの自動化が可能である。
In such a developing/imaging method, a resist boat 2' is placed on the developing solution surface.
9 is immersed at the same time, and new developer is always added to the bottom 2S.
Since the resist film 29 is uniformly supplied to the inner wall of the resist film 29, the development of the resist film 29 becomes uniform even in the center and side edges, making it possible to develop the resist film 29 with desired pattern accuracy. Additionally, in-line automation is possible due to single-sheet processing.

次に第4図に示す現像方法について説明する。Next, the developing method shown in FIG. 4 will be explained.

同図において容器31には側壁に現像液導入管32が設
けられ、該容器81の底面83には複数個のガス噴出孔
34を有するガス流通路35がf=1設され、ガス導入
管36よりたとえば窒素(N2)ガスが導入される機構
になっている。
In the same figure, a developer introduction pipe 32 is provided on the side wall of the container 31, a gas flow passage 35 having a plurality of gas ejection holes 34 is provided at f=1 on the bottom surface 83 of the container 81, and a gas introduction pipe 36 is provided on the bottom surface 83 of the container 81. For example, the mechanism is such that nitrogen (N2) gas is introduced.

かかる構造の現像装置を用いてレジス) +I3の現像
を行なう場合には、先ず初めに前記現像液導入管32よ
り容器81内に現像液87を導入して該容器31内が満
たされ周囲よりオーバフローされ、流出した現像液は受
皿38によって排除される。
When developing Regis) +I3 using a developing device having such a structure, first the developer 87 is introduced into the container 81 from the developer introduction tube 32, and the inside of the container 31 is filled and there is no overflow from the surrounding area. The developer solution that flows out is removed by the tray 38.

更にガス導入管36より、たとえば窒素ガスを導入して
前記ガス噴出孔34よりガスを噴出して容器31内の現
像液37をバブルして攪拌する。次いで前述したと同様
に被現像基板39のレジスト膜40が塗布された面を下
向けにして図示したように現像液面に所定時間浸漬して
現像する。かかる現像方法においてはレジスト膜40全
体が同時に現像液37に浸漬され常に新しい液が供給さ
れ。
Furthermore, nitrogen gas, for example, is introduced through the gas introduction pipe 36, and the gas is ejected from the gas ejection hole 34 to bubble and stir the developer 37 in the container 31. Next, as described above, the substrate 39 to be developed is developed by immersing the substrate 39 in a developer solution for a predetermined period of time with the surface coated with the resist film 40 facing downward as shown in the figure. In this developing method, the entire resist film 40 is immersed in the developer 37 at the same time, and fresh solution is always supplied.

更にガスのバブルによる攪拌機構のためレジスト膜40
の現像がよりすみやかに均一に現像されることが可能と
がる。勿論一枚処理のためインラインの自動化が可能で
ある。
Furthermore, due to the stirring mechanism using gas bubbles, the resist film 40
This allows for faster and more uniform development. Of course, in-line automation is possible for single-sheet processing.

■ 発明の詳細 な説明したごとく本発明によればインフィンの自動化が
可能で均一で安定したレジスト膜の現像が可能となり信
頼性向上1歩留向上及び能率向上に効果がある。
(2) Detailed Description of the Invention According to the present invention, it is possible to automate the infin process, and it is possible to develop a uniform and stable resist film, which is effective in improving reliability, improving yield, and improving efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は従来の現像方法を説明するだめの概略
構成図、第3図は本発明の一実/11゛α例を説明する
ための概略構成図、第4図は本発明の他の実施例を説明
するための概略構成図である、図において21・31は
容器、22・33は底面、23は現像液導入路、24は
導入管、28・39は被現像基板、29・40はレジス
ト膜、32は現像液導入管、34はガス噴出孔、35は
ガス流通路、86はガス導入管を示す。 第1図 第2図 ↓ 第 3図 フQ 第4図
1 and 2 are schematic configuration diagrams for explaining a conventional developing method, FIG. 3 is a schematic configuration diagram for explaining an embodiment/11゛α example of the present invention, and FIG. 4 is a schematic diagram for explaining the present invention. This is a schematic configuration diagram for explaining another embodiment. In the figure, 21 and 31 are containers, 22 and 33 are bottom surfaces, 23 is a developer introduction path, 24 is an introduction pipe, 28 and 39 are substrates to be developed, 29 and 40 are resist films, 32 is a developer introduction tube, 34 is a gas ejection hole, 35 is a gas flow path, and 86 is a gas introduction tube. Figure 1 Figure 2↓ Figure 3 FQ Figure 4

Claims (1)

【特許請求の範囲】 α)底面より現像液が流入する容器に、レジスト塗布面
を下向けにした被現像基板を浸漬して。 現像するようにしたことを特徴とするレジスト膜の現像
方法。 (2)底面よりガスを噴出させて攪拌するようにしたこ
とを特徴とする特許請求の範囲第1項記戦のレジスト膜
の現像方法。
[Claims] α) A substrate to be developed with the resist coated side facing downward is immersed in a container into which a developer flows from the bottom. A method for developing a resist film, the method comprising: developing a resist film. (2) The method for developing a resist film as set forth in claim 1, characterized in that gas is ejected from the bottom surface for stirring.
JP12453383A 1983-07-07 1983-07-07 Resist film developing method Pending JPS6015637A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12453383A JPS6015637A (en) 1983-07-07 1983-07-07 Resist film developing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12453383A JPS6015637A (en) 1983-07-07 1983-07-07 Resist film developing method

Publications (1)

Publication Number Publication Date
JPS6015637A true JPS6015637A (en) 1985-01-26

Family

ID=14887827

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12453383A Pending JPS6015637A (en) 1983-07-07 1983-07-07 Resist film developing method

Country Status (1)

Country Link
JP (1) JPS6015637A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5536832U (en) * 1978-08-31 1980-03-10
JPS57110674A (en) * 1980-12-29 1982-07-09 Fujitsu Ltd Surface treating device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5536832U (en) * 1978-08-31 1980-03-10
JPS57110674A (en) * 1980-12-29 1982-07-09 Fujitsu Ltd Surface treating device

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