JPS60115874A - トランジスタａｓｏ試験方法 - Google Patents

トランジスタａｓｏ試験方法

Info

Publication number
JPS60115874A
JPS60115874A JP22488383A JP22488383A JPS60115874A JP S60115874 A JPS60115874 A JP S60115874A JP 22488383 A JP22488383 A JP 22488383A JP 22488383 A JP22488383 A JP 22488383A JP S60115874 A JPS60115874 A JP S60115874A
Authority
JP
Japan
Prior art keywords
collector
current
circuit
collector current
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22488383A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0430552B2 (enExample
Inventor
Manabu Kobayashi
学 小林
Shozo Iimori
飯森　昭三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP22488383A priority Critical patent/JPS60115874A/ja
Publication of JPS60115874A publication Critical patent/JPS60115874A/ja
Publication of JPH0430552B2 publication Critical patent/JPH0430552B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP22488383A 1983-11-29 1983-11-29 トランジスタａｓｏ試験方法 Granted JPS60115874A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22488383A JPS60115874A (ja) 1983-11-29 1983-11-29 トランジスタａｓｏ試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22488383A JPS60115874A (ja) 1983-11-29 1983-11-29 トランジスタａｓｏ試験方法

Publications (2)

Publication Number Publication Date
JPS60115874A true JPS60115874A (ja) 1985-06-22
JPH0430552B2 JPH0430552B2 (enExample) 1992-05-22

Family

ID=16820657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22488383A Granted JPS60115874A (ja) 1983-11-29 1983-11-29 トランジスタａｓｏ試験方法

Country Status (1)

Country Link
JP (1) JPS60115874A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0218334B1 (en) * 1985-08-13 1992-01-02 Mitsubishi Denki Kabushiki Kaisha Measuring method of a transistor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5817378A (ja) * 1981-07-24 1983-02-01 Hitachi Ltd Ａｓｏ判定回路

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5817378A (ja) * 1981-07-24 1983-02-01 Hitachi Ltd Ａｓｏ判定回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0218334B1 (en) * 1985-08-13 1992-01-02 Mitsubishi Denki Kabushiki Kaisha Measuring method of a transistor

Also Published As

Publication number Publication date
JPH0430552B2 (enExample) 1992-05-22

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