JPS60105057U - scanning electron microscope - Google Patents

scanning electron microscope

Info

Publication number
JPS60105057U
JPS60105057U JP19761983U JP19761983U JPS60105057U JP S60105057 U JPS60105057 U JP S60105057U JP 19761983 U JP19761983 U JP 19761983U JP 19761983 U JP19761983 U JP 19761983U JP S60105057 U JPS60105057 U JP S60105057U
Authority
JP
Japan
Prior art keywords
sample
detector
electron
scanning
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19761983U
Other languages
Japanese (ja)
Other versions
JPH0234753Y2 (en
Inventor
肥田 行博
薫 伊藤
中川 清一
秀一 斉藤
Original Assignee
日本電子株式会社
新日本製鐵株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社, 新日本製鐵株式会社 filed Critical 日本電子株式会社
Priority to JP19761983U priority Critical patent/JPS60105057U/en
Publication of JPS60105057U publication Critical patent/JPS60105057U/en
Application granted granted Critical
Publication of JPH0234753Y2 publication Critical patent/JPH0234753Y2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

図面は、本考案の一実施例を示すためのものである。 1:電子銃、2:電子線、3:集束レンズ、4:対物レ
ンズ、5:試料、6:坩堝、7:加熱コイル、8:偏向
コイル、9:定年信号発生回路、10:陰極線管、11
:二次電子検出器、12:増幅器、13:映像増幅器、
14ニゲリツド、15:ローパスフィルター、16:差
動増幅器、17:基準電源、18:バイアス回路。
The drawings are for illustrating one embodiment of the present invention. 1: Electron gun, 2: Electron beam, 3: Focusing lens, 4: Objective lens, 5: Sample, 6: Crucible, 7: Heating coil, 8: Deflection coil, 9: Retirement signal generation circuit, 10: Cathode ray tube, 11
: Secondary electron detector, 12: Amplifier, 13: Video amplifier,
14: low-pass filter, 16: differential amplifier, 17: reference power supply, 18: bias circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料を加熱するための手段と、該試料上において電子線
を二次元的に走査するための手段と、該電子線の走査に
伴なって試料より発生する二次電子を検出するための二
次電子検出器と、該電子線の試料上における走査と同期
走査され該二次電子検出器よりの信号に基づいて試料像
を表示するための手段と、試料より発生する熱電子の該
二次電子検出器への入射を阻止するための試料と二次電
子検出器との間に配置され、負の電圧を与えられたグリ
ッドとを備えた装置において、二次電子検出器よりの検
出信号の平均レベルを表わす信号を得るための回路と、
該回路の出力信号と基準値とを比較し、該回路の出力信
号のレベルが基準値に一致するように前記グリッドに供
給される電圧を制御するための手段とを具備することを
特徴とする走査電子顕微鏡。
means for heating a sample; means for two-dimensionally scanning an electron beam over the sample; and secondary means for detecting secondary electrons generated from the sample as the electron beam scans. an electron detector, means for displaying a sample image based on a signal from the secondary electron detector that is scanned in synchronization with the scanning of the electron beam on the sample, and the secondary electrons of thermoelectrons generated from the sample. In an apparatus equipped with a grid placed between the sample and the secondary electron detector and given a negative voltage to prevent the secondary electrons from entering the detector, the average of the detection signals from the secondary electron detector is a circuit for obtaining a signal representing a level;
and means for comparing the output signal of the circuit with a reference value and controlling the voltage supplied to the grid so that the level of the output signal of the circuit matches the reference value. Scanning electron microscope.
JP19761983U 1983-12-22 1983-12-22 scanning electron microscope Granted JPS60105057U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19761983U JPS60105057U (en) 1983-12-22 1983-12-22 scanning electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19761983U JPS60105057U (en) 1983-12-22 1983-12-22 scanning electron microscope

Publications (2)

Publication Number Publication Date
JPS60105057U true JPS60105057U (en) 1985-07-17
JPH0234753Y2 JPH0234753Y2 (en) 1990-09-19

Family

ID=30756008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19761983U Granted JPS60105057U (en) 1983-12-22 1983-12-22 scanning electron microscope

Country Status (1)

Country Link
JP (1) JPS60105057U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833657A (en) * 1981-08-24 1983-02-26 丸山 隆司 Supply apparatus of telephone, electricity, gas and service water for rotary house and waste water discharge apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833657A (en) * 1981-08-24 1983-02-26 丸山 隆司 Supply apparatus of telephone, electricity, gas and service water for rotary house and waste water discharge apparatus

Also Published As

Publication number Publication date
JPH0234753Y2 (en) 1990-09-19

Similar Documents

Publication Publication Date Title
JPS60105057U (en) scanning electron microscope
JPH024441Y2 (en)
JP3351647B2 (en) Scanning electron microscope
JPH05325860A (en) Method for photographing image in scanning electron microscope
JP2824328B2 (en) Scanning electron microscope
JPS58920Y2 (en) scanning electron microscope
JPS6364255A (en) Particle beam radiating device
JPH0139393Y2 (en)
JPS59150155U (en) scanning electron microscope
JPH0644930A (en) Scanning electron microscope
JPS6055951B2 (en) scanning electron microscope
JP3114416B2 (en) Focusing method in charged particle beam device
JPS6129059A (en) Sample image display device
JPS58184761U (en) Automatic gain level control device for scanning electron microscope
JPS59134539A (en) Device provided with field emission type electron gun
JPS60138252U (en) Sample image display device in particle beam equipment
JPH0696711A (en) Display method for image of scanning electron microscope
JPH06302294A (en) Scanning type charged particle beam device
KR840000875B1 (en) Vedeo signal system
JPS5942417B2 (en) Automatic contrast adjustment device for video signals
JPH05290783A (en) Scanning electron microscope
JPS63131060U (en)
JPS5954160A (en) Charged corpuscular ray device
JPS60200450A (en) Scanning electron microscope
JPS5827621B2 (en) scanning electron microscope