JPS58184761U - Automatic gain level control device for scanning electron microscope - Google Patents

Automatic gain level control device for scanning electron microscope

Info

Publication number
JPS58184761U
JPS58184761U JP8275282U JP8275282U JPS58184761U JP S58184761 U JPS58184761 U JP S58184761U JP 8275282 U JP8275282 U JP 8275282U JP 8275282 U JP8275282 U JP 8275282U JP S58184761 U JPS58184761 U JP S58184761U
Authority
JP
Japan
Prior art keywords
level
scanning
level control
automatic gain
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8275282U
Other languages
Japanese (ja)
Inventor
島山 八郎
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP8275282U priority Critical patent/JPS58184761U/en
Publication of JPS58184761U publication Critical patent/JPS58184761U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は正常な信号と不良な信号とを説明するための図
、第2図は本考案の一実施例を示すための図、第3図は
各回路よりの出力信号を例示するための図である。 1:電子銃、2:収束レンズ、3:対物レンズ、4:試
料、5:電子線、6:偏向コイル、7:倍率制御回路、
8:2次電子検出器、9:増幅率可変増幅器、10:L
/ベベル整器、11:混合器、12:切換回路、13:
陰極線管、14:不良信号検出回路、15、 16:走
査回路、17.18:比較回路、19:上限レベル出力
回路、20:下限レベル出力回路、21,22:ゲート
回路、23,24ニフリツプフロツプ回路、25:オア
回路、26:プランキング信号発生部、27:自動利得
レベル制御回路。 −−−−−−一↑T−□時− 一一一一一一1Bトーc−−
Fig. 1 is a diagram for explaining normal signals and defective signals, Fig. 2 is a diagram for showing an embodiment of the present invention, and Fig. 3 is a diagram for illustrating output signals from each circuit. It is a diagram. 1: Electron gun, 2: Converging lens, 3: Objective lens, 4: Sample, 5: Electron beam, 6: Deflection coil, 7: Magnification control circuit,
8: Secondary electron detector, 9: Variable gain amplifier, 10: L
/Bevel straightener, 11: Mixer, 12: Switching circuit, 13:
Cathode ray tube, 14: Bad signal detection circuit, 15, 16: Scanning circuit, 17.18: Comparison circuit, 19: Upper limit level output circuit, 20: Lower limit level output circuit, 21, 22: Gate circuit, 23, 24 Nifritz Pflop circuit, 25: OR circuit, 26: Planking signal generator, 27: automatic gain level control circuit. −−−−−−1↑T−□Time− 111111Bto c−−

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子線を試料面上において2次元的に走査し、該走査に
伴なって試料より得ら糺た情報信号を検出器によって検
出し、該検出した信号を増幅及びレベル調整し、該増幅
及びレベル調整した信号を一監視しこの信号が予め設定
した正常範囲から外れた際に正常範囲内に戻るように前
記増幅器の利得及びレベル調整量を自動調整する自動利
得レベル制御回路を備えた装置において、前記増幅及び
レベル調整された信号のレベルを監視し該信号のレベル
が正常な範囲から外れた瞬間に前記電子線の走査速度を
自動的に速めるための手段と、該自動利得レベルル制御
回路による利得レベル制御が終了すると同時に自動的に
前記電子線を元の走査位置から元の走査速度で走査を再
開させるための手段と、該自動利得レベル制御回路によ
る利得レベル制御期間中は前記陰極線管を自動的にブラ
ンキングするための手段とを具備することを特徴とする
走査電子顕微鏡の自動利得レベル制御装置。
An electron beam is scanned two-dimensionally on a sample surface, an information signal obtained from the sample during the scanning is detected by a detector, the detected signal is amplified and the level is adjusted, and the amplification and level A device comprising an automatic gain level control circuit that monitors the adjusted signal and automatically adjusts the gain and level adjustment amount of the amplifier so that the signal returns to the normal range when it deviates from a preset normal range, means for monitoring the level of the amplified and level-adjusted signal and automatically increasing the scanning speed of the electron beam at the moment the level of the signal goes out of a normal range; and a gain control circuit for automatically increasing the scanning speed of the electron beam. means for automatically restarting scanning of the electron beam from the original scanning position at the original scanning speed as soon as the level control is completed; and means for automatically restarting the cathode ray tube during the gain level control period by the automatic gain level control circuit. 1. An automatic gain level control device for a scanning electron microscope, comprising means for blanking the scanning electron microscope.
JP8275282U 1982-06-03 1982-06-03 Automatic gain level control device for scanning electron microscope Pending JPS58184761U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8275282U JPS58184761U (en) 1982-06-03 1982-06-03 Automatic gain level control device for scanning electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8275282U JPS58184761U (en) 1982-06-03 1982-06-03 Automatic gain level control device for scanning electron microscope

Publications (1)

Publication Number Publication Date
JPS58184761U true JPS58184761U (en) 1983-12-08

Family

ID=30091791

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8275282U Pending JPS58184761U (en) 1982-06-03 1982-06-03 Automatic gain level control device for scanning electron microscope

Country Status (1)

Country Link
JP (1) JPS58184761U (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4922073A (en) * 1972-04-24 1974-02-27
JPS5227313A (en) * 1975-08-27 1977-03-01 Hitachi Ltd Automated picture tone control photographing method and its device
JPS569235U (en) * 1979-06-30 1981-01-27

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4922073A (en) * 1972-04-24 1974-02-27
JPS5227313A (en) * 1975-08-27 1977-03-01 Hitachi Ltd Automated picture tone control photographing method and its device
JPS569235U (en) * 1979-06-30 1981-01-27

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