JPS60102738A - ステップアンドリピート露光装置 - Google Patents

ステップアンドリピート露光装置

Info

Publication number
JPS60102738A
JPS60102738A JP58209940A JP20994083A JPS60102738A JP S60102738 A JPS60102738 A JP S60102738A JP 58209940 A JP58209940 A JP 58209940A JP 20994083 A JP20994083 A JP 20994083A JP S60102738 A JPS60102738 A JP S60102738A
Authority
JP
Japan
Prior art keywords
mark
alignment
mask
wafer
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58209940A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6349369B2 (enExample
Inventor
Naoki Ayada
綾田 直樹
Tadashi Konuki
小貫 忠
Masao Kosugi
小杉 雅夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP58209940A priority Critical patent/JPS60102738A/ja
Priority to GB08418927A priority patent/GB2146427B/en
Priority to DE19843428225 priority patent/DE3428225A1/de
Publication of JPS60102738A publication Critical patent/JPS60102738A/ja
Priority to US07/008,134 priority patent/US4719357A/en
Publication of JPS6349369B2 publication Critical patent/JPS6349369B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7069Alignment mark illumination, e.g. darkfield, dual focus
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073Alignment marks and their environment
    • G03F9/7076Mark details, e.g. phase grating mark, temporary mark
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7092Signal processing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP58209940A 1983-08-01 1983-11-10 ステップアンドリピート露光装置 Granted JPS60102738A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58209940A JPS60102738A (ja) 1983-11-10 1983-11-10 ステップアンドリピート露光装置
GB08418927A GB2146427B (en) 1983-08-01 1984-07-25 Semiconductor manufacture
DE19843428225 DE3428225A1 (de) 1983-08-01 1984-07-31 Geraet zur herstellung von halbleiterschaltungen
US07/008,134 US4719357A (en) 1983-08-01 1987-01-22 Semiconductor circuit manufacturing apparatus having selectively operable detectors for effecting automatic alignment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58209940A JPS60102738A (ja) 1983-11-10 1983-11-10 ステップアンドリピート露光装置

Publications (2)

Publication Number Publication Date
JPS60102738A true JPS60102738A (ja) 1985-06-06
JPS6349369B2 JPS6349369B2 (enExample) 1988-10-04

Family

ID=16581178

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58209940A Granted JPS60102738A (ja) 1983-08-01 1983-11-10 ステップアンドリピート露光装置

Country Status (1)

Country Link
JP (1) JPS60102738A (enExample)

Also Published As

Publication number Publication date
JPS6349369B2 (enExample) 1988-10-04

Similar Documents

Publication Publication Date Title
JP3376179B2 (ja) 面位置検出方法
US5323016A (en) Focusing method
US5751404A (en) Exposure apparatus and method wherein alignment is carried out by comparing marks which are incident on both reticle stage and wafer stage reference plates
US6236447B1 (en) Exposure method and apparatus, and semiconductor device manufactured using the method
JP4434372B2 (ja) 投影露光装置およびデバイス製造方法
US6483571B1 (en) Exposure apparatus and method for transferring a pattern from a plurality of masks onto at least one substrate
US4669867A (en) Alignment and exposure apparatus
US5981116A (en) Alignment in a projection exposure method
US5666205A (en) Measuring method and exposure apparatus
JPS61174717A (ja) 位置合わせ装置
JP3531894B2 (ja) 投影露光装置
JP3335126B2 (ja) 面位置検出装置及びそれを用いた走査型投影露光装置
JP2009099873A (ja) 露光装置およびデバイス製造方法
JPH06232027A (ja) 投影露光装置
JP2009094256A (ja) 露光方法、露光装置およびデバイス製造方法
JPH051610B2 (enExample)
US20090310108A1 (en) Exposure apparatus and method of manufacturing device
JP4174324B2 (ja) 露光方法及び装置
JPH10284393A (ja) 露光装置およびデバイス製造方法
JP3441930B2 (ja) 走査型露光装置およびデバイス製造方法
JP3428825B2 (ja) 面位置検出方法および面位置検出装置
JP2001059704A (ja) 位置決めステージ装置、半導体露光装置およびデバイス製造方法
JPH07219243A (ja) 露光装置の評価方法
JPS60102738A (ja) ステップアンドリピート露光装置
JPH104055A (ja) 自動焦点合わせ装置及びそれを用いたデバイスの製造方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees