JPS599524A - Photodetector circuit - Google Patents
Photodetector circuitInfo
- Publication number
- JPS599524A JPS599524A JP11796682A JP11796682A JPS599524A JP S599524 A JPS599524 A JP S599524A JP 11796682 A JP11796682 A JP 11796682A JP 11796682 A JP11796682 A JP 11796682A JP S599524 A JPS599524 A JP S599524A
- Authority
- JP
- Japan
- Prior art keywords
- photodetector
- light receiving
- resistor
- optical
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 abstract description 6
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 230000004044 response Effects 0.000 abstract description 3
- 230000015556 catabolic process Effects 0.000 abstract 2
- 238000006731 degradation reaction Methods 0.000 abstract 2
- 230000023077 detection of light stimulus Effects 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 description 31
- 230000005540 biological transmission Effects 0.000 description 8
- 238000001514 detection method Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000013307 optical fiber Substances 0.000 description 2
- 235000009470 Theobroma cacao Nutrition 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 244000240602 cacao Species 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Spectrometry And Color Measurement (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
【発明の詳細な説明】 本発明は光検波回路に関する。[Detailed description of the invention] The present invention relates to a photodetector circuit.
光通信方式は、従来の電気通信方式に比較して、広帯域
の長距離伝送が可能であるという利点を持ち、かつ、光
ファイバの特異性のため外部からのしよう乱を受けに<
<、より品質の高い伝送システムを構成することができ
る。Compared to conventional telecommunication systems, optical communication systems have the advantage of being able to transmit broadband over long distances, and due to the uniqueness of optical fibers, they are less susceptible to external disturbances.
<, it is possible to configure a transmission system with higher quality.
一方、光ファイバの軽量、細心および安価(材量が豊富
)等の利点により、上記の高品質伝送システム以外にも
、ローカルな光通信が急速に普及する傾向にあり、この
ため、より汎用性のあるシステムが要求されるようにな
ってきている。例えば、工場内通信や同−建造物的通信
のように伝送距離の短いシステムから、加入者系システ
ムや主幹線通信網から分岐される中距離システムまでそ
の需要はさまざまである。このような多様なシステムに
対応するには、伝送路長の違いにより生ずる光受信レベ
ルの違いに対応できなければならない。On the other hand, in addition to the above-mentioned high-quality transmission systems, local optical communications are rapidly becoming popular due to the advantages of optical fibers, such as their light weight, fineness, and low cost (many materials are available). Increasingly, there is a demand for a system with For example, the demands vary from systems with short transmission distances such as intra-factory communications and same-building communications, to subscriber systems and medium-distance systems branched from the main communication network. In order to support such a variety of systems, it is necessary to be able to handle differences in optical reception levels caused by differences in transmission path length.
これの対応策としては、システム毎に機器を変更する第
1の方法、短距離伝送システムの場合には光減衰器を用
いて光受信レベルを強制的に下げる第2の方法および全
ての光受信レベルで動作するような機器を実現する第3
の方法がある。As a countermeasure for this, the first method is to change the equipment for each system, the second method is to forcibly lower the optical reception level using an optical attenuator in the case of a short-distance transmission system, and the The third step to realize equipment that operates at
There is a method.
多様な伝送システムに安価でより汎用性のある機器を提
供するには伝送システム毎の機器の変更がなくかつ、高
価な光減衰器を使用しない第3の方法が優れており光受
信レベルの低いときに動作(受信感度が高い)シ、かつ
光受信レベルの高いときでも安定して動作する機器の使
用は非常に有効である。In order to provide inexpensive and more versatile equipment for various transmission systems, the third method is superior because it does not require changing equipment for each transmission system and does not use expensive optical attenuators, resulting in a low optical reception level. It is very effective to use equipment that operates stably (with high reception sensitivity) and operates stably even when the optical reception level is high.
この受信感度は、主に光検波回路とそれに続く増幅回路
とに大きく依存している。光検波器は電気回路的には電
流源として働くため、受信感度は光検波器の負荷抵抗す
なわち光検波器の電源供給用抵抗(以下、バイアス抵抗
と言う)と増幅回路の帰還抵抗とで決められる。This receiving sensitivity largely depends on the optical detection circuit and the subsequent amplifier circuit. Since a photodetector works as a current source in an electrical circuit, the receiving sensitivity is determined by the photodetector's load resistance, that is, the photodetector's power supply resistance (hereinafter referred to as bias resistance) and the feedback resistance of the amplifier circuit. It will be done.
増幅回路の帰還抵抗の値は伝送信号の周波数帯域によっ
て一義的に決められるため、光検波器のバイアス抵抗の
値はその帰還抵抗の値より十分大きく選び、光検波器の
負荷抵抗値が下らないようにしている。Since the value of the feedback resistor of the amplifier circuit is uniquely determined by the frequency band of the transmission signal, the value of the bias resistor of the photodetector should be selected to be sufficiently larger than the value of the feedback resistor so that the load resistance value of the photodetector does not drop. I have to.
一般に、光受信レベル変動の補正を行なう自動可変利得
回路や像幅制限回路を使用することにより光受信レベル
の比較的高いときにも機器が動作するよう考慮されてい
る。しかしながら、光受信レベルが非常に高いときには
、例えば、半導体接合型の光検波器を使用したときには
、光信号を検出して流れる光電流により光検出器のパイ
アメ抵抗で大きな電圧降下が生じ、この結果、光検波器
の醒源電圧不足を招く。この電源電圧の不足は、半導体
接合型光検波器の仝乏層幅を狭くシタリ、その端子間容
量を増大させて、周波数応答特性を劣化させるため、正
常な光検波が行なえなくなる。Generally, by using an automatic variable gain circuit or an image width limiting circuit that corrects fluctuations in the optical reception level, it is considered that the equipment can operate even when the optical reception level is relatively high. However, when the optical reception level is very high, for example when a semiconductor junction type photodetector is used, a large voltage drop occurs in the photodetector's piezoelectric resistance due to the photocurrent that flows when detecting the optical signal. , leading to insufficient power source voltage for the photodetector. This shortage of power supply voltage narrows the depletion layer width of the semiconductor junction type photodetector, increases the capacitance between its terminals, and deteriorates the frequency response characteristics, making it impossible to perform normal photodetection.
この電圧降下は、光検波器のバイアス抵抗の大きさに比
例しているため、光受信レベルの高いときには、そのバ
イアス抵抗値を小さくして周波数応答特性の劣化を防ぐ
ことができる。しかしながら、上述したように、光受信
レベルが低いときに、十分な特性を得るにはその光検波
器のバイアス抵抗を大きくして光受信感度の劣化を押え
る必要があり、この相反する特性により、広範囲の光受
信レベルで動作する光検波回路を実現することは困難で
あった。Since this voltage drop is proportional to the magnitude of the bias resistance of the photodetector, when the optical reception level is high, the bias resistance value can be reduced to prevent deterioration of the frequency response characteristics. However, as mentioned above, in order to obtain sufficient characteristics when the optical reception level is low, it is necessary to increase the bias resistance of the optical detector to suppress deterioration of optical reception sensitivity, and due to these contradictory characteristics, It has been difficult to realize an optical detection circuit that operates over a wide range of optical reception levels.
本発明の目的は上述の欠点を除去した光検波回路を提供
することにある
本発明の光検波回路は、光信号を受信する光検波手段と
該光検波器手段と接続され第1の抵抗と第1の電源との
直列接続からなる第1の直列回路と、該第1の直列回路
と並列に接続され第2の抵抗とダイオードと第2の電源
との直列接続からなる第2の直列回路とから構成されて
いる。(N号しベルの変動はこの光検波回路の後段の増
幅回路や自動可変利得回路または像幅制限回路で補償す
るものとする。An object of the present invention is to provide a photodetector circuit which eliminates the above-mentioned drawbacks.The photodetector circuit of the present invention comprises a photodetector means for receiving an optical signal, a first resistor connected to the photodetector means, a first series circuit connected in series with a first power source; and a second series circuit connected in parallel with the first series circuit and consisting of a second resistor, a diode, and a second power source connected in series. It is composed of. (It is assumed that fluctuations in the N signal are compensated for by an amplifier circuit, an automatic variable gain circuit, or an image width limiting circuit after this optical detection circuit.
次に本発明について図面を参照して詳細に説明する。Next, the present invention will be explained in detail with reference to the drawings.
第1図は本発明の一実施例を示す回路図である。FIG. 1 is a circuit diagram showing one embodiment of the present invention.
図において、本実施例は、光信号を受信する半導体接合
型光検波器1と、検波器lと接続され抵抗値RB1を有
する第1のバイアス抵抗器2と、正極側が接地され負極
側が抵抗器2と接続された電源電圧が−Vlllの第1
の電源3と、検波器lと接続され抵抗値几B2を有する
第2の抵抗器4と、アノードが抵抗器4と接続されたダ
イオード5と、正極側が接地され負極側がダイオード5
0カソードと接続された電源電圧か−vB2の第2の電
源と、 5−
増幅回路8と、増幅回路8の帰還抵抗7とから構成され
ている。In the figure, the present embodiment includes a semiconductor junction photodetector 1 that receives an optical signal, a first bias resistor 2 connected to the detector 1 and having a resistance value RB1, and a resistor whose positive electrode side is grounded and whose negative electrode side is grounded. 2 and the power supply voltage is -Vllll.
a second resistor 4 connected to the detector l and having a resistance value B2, a diode 5 whose anode is connected to the resistor 4, and a diode 5 whose positive electrode side is grounded and whose negative electrode side is grounded.
The second power supply has a power supply voltage of -vB2 connected to the 0 cathode, 5- an amplifier circuit 8, and a feedback resistor 7 of the amplifier circuit 8.
ココア、−VBI <−VB2 (IVBI l >
l VBI21 )と仮定すると、光検波器のバイアス
電圧VBは、光受信レベルが小さくて光電流が少ない場
合には(1)式で与えられ、光受信レベルが大きく光電
流が多い場合には(2)式で与えられる。Cocoa, -VBI <-VB2 (IVBI l >
l VBI21 ), the bias voltage VB of the photodetector is given by equation (1) when the optical reception level is low and the photocurrent is small, and when the optical reception level is high and the photocurrent is large, the bias voltage VB of the photodetector is given by (1). 2) Given by Eq.
vn =VB□+I o X RBI 曲・
聞(1)VBeVB□十Vf十工◎XRB2 °
凹曲(2)ここで、■oは光電流%Vfは半導体5の順
方向電圧降下である。vn =VB□+I o X RBI song・
(1) VBeVB □ 10Vf 10K ◎XRB2 °
Concave Curve (2) Here, ■o is the photocurrent %Vf is the forward voltage drop of the semiconductor 5.
すなわち、第2図に示すように、光電流がめる直1x
より少ないときには、(1)式のVBlとRBlと1
、とてバイアス電圧VBが決まる。このとき、第2の電
源電圧vB2がそのバイアス電圧VB より高いため
ダイオード5には逆電圧がかかり、この結果、等制約に
光検波バイアス回路は、”11とVBIだけで構成した
ものと同一となり、負荷抵抗の減少による光受信感度の
劣化はない。That is, as shown in FIG.
When the number is smaller, VBl and RBl in equation (1) and 1
, the bias voltage VB is determined. At this time, since the second power supply voltage vB2 is higher than its bias voltage VB, a reverse voltage is applied to the diode 5, and as a result, the photodetection bias circuit under the equality constraint is the same as one configured only with ``11'' and VBI. , there is no deterioration in optical reception sensitivity due to a decrease in load resistance.
また、光電流が■えよシ大きいときには、(2)式のv
B2 ” f ’ ”B2およびl。でバイアス電圧
が決まる。これは、光電流の増加にともない、RBlで
の電圧降下が大きくなり、バイアス電圧■8が第2の電
源電圧vB2より高くなるためダイオード5には順方向
の電圧がかかり、光1に流が第2の電源6方向に流れ出
すためである。Also, when the photocurrent is large, v in equation (2)
B2 ” f ” ”B2 and l. The bias voltage is determined by This is because as the photocurrent increases, the voltage drop at RB1 increases, and the bias voltage 8 becomes higher than the second power supply voltage vB2, so a forward voltage is applied to the diode 5, causing a current to the light 1. This is because it flows out in the 6 directions of the second power source.
具体的な数値例を以下に示す。Specific numerical examples are shown below.
vnt=−20(V)+ vB□=−5(V)、 %=
100 (k(1)+”52=1 (kQ ) −Rn
2= 1 (kn ) オヨヒV(=0.7(v)トす
ると、lx+==036(mA)となり、光ノ波長カ1
.3(μm)帯の光検波器を使用し次ときには、平均光
受信レベルにおいて約−5(dHm)以上で第2の電源
6が働くことになる。vnt=-20(V)+vB□=-5(V), %=
100 (k(1)+”52=1 (kQ) −Rn
2 = 1 (kn) Oyohi V (= 0.7 (v)) becomes lx + = = 036 (mA), and the wavelength of light is 1
.. When a 3 (μm) band photodetector is used, the second power supply 6 will operate at an average optical reception level of approximately -5 (dHm) or higher.
以上、本発明には煩雑な調整や高価な光減衰器が不要で
、広範囲な光受信レベルで動作する光検波回路を提供で
きるという効果がある。As described above, the present invention has the advantage of being able to provide an optical detection circuit that operates at a wide range of optical reception levels without requiring complicated adjustments or expensive optical attenuators.
第1図は本発明の一実施例を示す回路図および第2図は
実施例の光検波回路のバイアス電圧VB光醒流Ioとの
関係を示す図である。
図において、l・・・・・・半導体接合型光検波器、2
・・・・・・抵抗器、3・・・・・・′電源、4・・・
・・・抵抗器、5・・・・・・ダイオード、6・・・・
・・電源、7・・・・・・抵抗器、8・・・・・・増幅
回路。
勇
4− >FIG. 1 is a circuit diagram showing an embodiment of the present invention, and FIG. 2 is a diagram showing the relationship between the bias voltage VB and the optical current Io of the optical detection circuit of the embodiment. In the figure, l... semiconductor junction type photodetector, 2
...Resistor, 3...'Power supply, 4...
...Resistor, 5...Diode, 6...
...Power supply, 7...Resistor, 8...Amplification circuit. Isamu 4->
Claims (1)
れ第1の抵抗と第1の電源との直列接続からなる第1の
直列回路と、該第1の直列回路と並列に接続され第2の
抵抗とダイオードと第2の電源との直列接続からなる第
2の直列回路とから構成されたことを特徴とする光検波
回路。a first series circuit connected to the photodetection means and comprising a series connection of a first resistor and a first power source; and a first series circuit connected in parallel with the first series circuit. A photodetector circuit comprising a second series circuit including a second resistor, a diode, and a second power source connected in series.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11796682A JPS599524A (en) | 1982-07-07 | 1982-07-07 | Photodetector circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11796682A JPS599524A (en) | 1982-07-07 | 1982-07-07 | Photodetector circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS599524A true JPS599524A (en) | 1984-01-18 |
JPH0326332B2 JPH0326332B2 (en) | 1991-04-10 |
Family
ID=14724669
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11796682A Granted JPS599524A (en) | 1982-07-07 | 1982-07-07 | Photodetector circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS599524A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54131981A (en) * | 1978-04-03 | 1979-10-13 | Nippon Telegr & Teleph Corp <Ntt> | Automatic control circuit of photo detecting sensitivity |
-
1982
- 1982-07-07 JP JP11796682A patent/JPS599524A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54131981A (en) * | 1978-04-03 | 1979-10-13 | Nippon Telegr & Teleph Corp <Ntt> | Automatic control circuit of photo detecting sensitivity |
Also Published As
Publication number | Publication date |
---|---|
JPH0326332B2 (en) | 1991-04-10 |
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