JPS5992852U - Ultrasonic flaw detection equipment - Google Patents

Ultrasonic flaw detection equipment

Info

Publication number
JPS5992852U
JPS5992852U JP18963582U JP18963582U JPS5992852U JP S5992852 U JPS5992852 U JP S5992852U JP 18963582 U JP18963582 U JP 18963582U JP 18963582 U JP18963582 U JP 18963582U JP S5992852 U JPS5992852 U JP S5992852U
Authority
JP
Japan
Prior art keywords
test piece
probe
plate
ultrasonic probe
movable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18963582U
Other languages
Japanese (ja)
Inventor
寺西 知幸
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP18963582U priority Critical patent/JPS5992852U/en
Publication of JPS5992852U publication Critical patent/JPS5992852U/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の超音波探傷装置を示す図、第2図は標準
欠陥を設けたテストピースを説明するための図、第3図
及び第4図はこの考案iこよる超音波探傷装置の一実施
例を示す図である。 図において1は被検査材、2は探触子、3は倣い機構、
4は移動台車、5はテストピース、8は支持台、9は第
一のプレート、10は第二のプレート、11は第三のプ
レート、12.13は移動機構、14は第四のプレート
、15はフレーム、16は軸である。なお図中同一ある
いは相当部分には同一符号を付して示している。 (4 弗ヮ 第2図
Fig. 1 shows a conventional ultrasonic flaw detection device, Fig. 2 shows a test piece with standard defects, and Figs. 3 and 4 show an ultrasonic flaw detection device based on this invention. It is a figure showing one example. In the figure, 1 is the material to be inspected, 2 is the probe, 3 is the copying mechanism,
4 is a moving cart, 5 is a test piece, 8 is a support stand, 9 is a first plate, 10 is a second plate, 11 is a third plate, 12.13 is a moving mechanism, 14 is a fourth plate, 15 is a frame, and 16 is an axis. In the drawings, the same or corresponding parts are designated by the same reference numerals. (4 弗ヮFig. 2

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 搬送ライン上を搬送されるパイプまたは棒状の円形断面
を有する被検査材に対向できるように設置された超音波
探触子と、上記超音波探触子を内蔵し、被検査材に上記
探触子を倣わせる為の倣い機構と、上記倣い機構を搭載
し被検査材に探触子を対向させる位置と、超音波探触子
の感度を校正するために標準欠陥が設けられているテス
トピースに対向させる位置との間を移動する移動台車と
、校正装置として上記テストピースを支持するフレーム
と、上記フレームとは第1の回転軸を介して連結された
第1のプレートと、上記第1のプレートと第2の回転軸
を介して連結された第2のプレートと、上記第2のプレ
ートと搬送方向とは平行な方向に移動可能な第1の移動
機構を介して連結された第3のプレートと、上記第3の
プレートと、上記移動台車の方向と直角でかつ搬送方向
に直角な方向に移動可能な第2の移動機構を介して連結
され、かつ搬送ラインと同一固定体に固定された第4の
プレートとから構成され、探触子を搬送ラインからオフ
ラインさせて感度の校正を行なうときに、テストピース
に設けられた標準欠陥の位置と探触子の位置とを第1の
回転軸まわりにテストピースを回し、あるいは第1の移
動機構を用いてテストピースを移動して合わせるととも
に、倣い機構の倣い性を確認するために、テストピース
を、被検香材搬送面内と同一面内において、第2の回転
軸まわりにテストピースを曲げること、及ヒ被検査材の
搬送方向とは直角な2方向に上記移動台車と第2の移動
機構とを用いて、テストピースと超音波探触子との間に
位置ずれを生じさせ、倣い機構により所定の倣い性を得
られることを確認できる機能を有する校正装置を備えた
超音波探触子装置。
An ultrasonic probe installed so as to face a pipe or rod-shaped material to be inspected having a circular cross section being conveyed on a conveyance line; A test in which a standard defect is provided to calibrate the sensitivity of the ultrasonic probe, the position where the probe is equipped with the copying mechanism, and the probe facing the material to be inspected. a movable cart that moves between a position facing the test piece; a frame that supports the test piece as a calibration device; a first plate connected to the frame via a first rotating shaft; a second plate connected to the first plate via a second rotating shaft; and a second plate connected to the second plate via a first moving mechanism movable in a direction parallel to the conveying direction. The third plate is connected to the third plate via a second moving mechanism that is movable in a direction perpendicular to the direction of the moving cart and perpendicular to the transport direction, and is connected to the same fixed body as the transport line. When the probe is taken offline from the conveyance line to calibrate the sensitivity, the position of the standard defect provided on the test piece and the position of the probe are Rotate the test piece around the rotation axis of By bending the test piece around the second rotation axis in the same plane as the test piece, and by using the moving cart and the second moving mechanism in two directions perpendicular to the conveying direction of the test piece, An ultrasonic probe device equipped with a calibration device that has a function of causing a positional shift between the ultrasonic probe and the ultrasonic probe and confirming that a predetermined tracking performance is obtained by the scanning mechanism.
JP18963582U 1982-12-15 1982-12-15 Ultrasonic flaw detection equipment Pending JPS5992852U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18963582U JPS5992852U (en) 1982-12-15 1982-12-15 Ultrasonic flaw detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18963582U JPS5992852U (en) 1982-12-15 1982-12-15 Ultrasonic flaw detection equipment

Publications (1)

Publication Number Publication Date
JPS5992852U true JPS5992852U (en) 1984-06-23

Family

ID=30408809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18963582U Pending JPS5992852U (en) 1982-12-15 1982-12-15 Ultrasonic flaw detection equipment

Country Status (1)

Country Link
JP (1) JPS5992852U (en)

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