JP3196455B2 - Inspection device - Google Patents

Inspection device

Info

Publication number
JP3196455B2
JP3196455B2 JP28677593A JP28677593A JP3196455B2 JP 3196455 B2 JP3196455 B2 JP 3196455B2 JP 28677593 A JP28677593 A JP 28677593A JP 28677593 A JP28677593 A JP 28677593A JP 3196455 B2 JP3196455 B2 JP 3196455B2
Authority
JP
Japan
Prior art keywords
frame
inspected
spacer
gimbal mechanism
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP28677593A
Other languages
Japanese (ja)
Other versions
JPH07140119A (en
Inventor
勝郎 千葉
勝利 縄間
保 西峯
正隆 原口
哲男 川上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP28677593A priority Critical patent/JP3196455B2/en
Publication of JPH07140119A publication Critical patent/JPH07140119A/en
Application granted granted Critical
Publication of JP3196455B2 publication Critical patent/JP3196455B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は角鋼片などの棒状の被
検査材を長手方向に搬送テーブルを用いてダイヤモンド
送りしながら超音波を利用して被検査材中の欠陥や介在
物等の検出を行う検査装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to detection of defects and inclusions in a material to be inspected using ultrasonic waves while feeding a bar-like material to be inspected such as a square steel piece in the longitudinal direction using a transfer table with diamonds. The present invention relates to an inspection apparatus for performing the following.

【0002】[0002]

【従来の技術】図8は従来の検査装置を示す被検査材搬
送方向の外観図であり、図9は上記図8の平面図であ
る。図において、1は超音波探触子、2は超音波探触子
1を保持し、被検査材へのならい動作を行うジンバル機
構、3はジンバル機構2を保持するフレーム、4はフレ
ーム3をHに示す所定の位置に保持するサドル、5はフ
レーム3とサドル4を固定するボルト、6はフレーム3
とサドル4の位置をIに示す所定の量だけ移動させるた
めの上記サドル4に加工された長穴、7a、7bは呼称
寸法が各々小の、大の被検査材(例えば角鋼片などの棒
状の被検査材)である。
2. Description of the Related Art FIG. 8 is an external view of a conventional inspection apparatus in the direction of conveyance of a material to be inspected, and FIG. 9 is a plan view of FIG. In the figure, 1 is an ultrasonic probe, 2 is a gimbal mechanism that holds the ultrasonic probe 1 and performs an operation of following the material to be inspected, 3 is a frame that holds the gimbal mechanism 2, and 4 is a frame that holds the gimbal mechanism 2. Saddle which is held at a predetermined position shown by H, 5 is a bolt for fixing the frame 3 and the saddle 4, and 6 is the frame 3
The long holes 7a and 7b formed in the saddle 4 for moving the position of the saddle 4 by a predetermined amount indicated by I are large test materials (for example, rod-shaped materials such as square steel pieces) having small nominal dimensions. Inspection material).

【0003】圧延して製造される角鋼片の呼称寸法は同
一工場においても複数のサイズとなることが多いため、
検査装置は一般に呼称寸法の異った2サイズ以上に対応
できるようになっている。従来の検査装置は上記のよう
に構成され、被検査材呼称寸法の変更即ち、探傷位置の
変更であるサイズ替は以下の手順で行れる。小の被検査
材7aから大の被検査材7bにサイズ替を行う場合、超
音波探触子1の位置を移動させるため、ボルト5を緩
め、フレーム3、ジンバル機構2、超音波探触子1を一
体で長穴6に沿ってIに示す寸法だけ移動し、再びボル
ト5を締めて固定することによって被検査材の端面から
超音波探触子1までの距離をHからH+Iに変更する。
大の被検査材7bから小の被検査材7aに変更する場合
は逆手順で行う。
[0003] Since the nominal size of the billet produced by rolling is often a plurality of sizes even in the same factory,
Inspection devices are generally adapted to accommodate two or more sizes with different nominal dimensions. The conventional inspection apparatus is configured as described above, and the change of the nominal size of the inspection material, that is, the size change as the change of the flaw detection position is performed in the following procedure. When the size is changed from the small inspection material 7a to the large inspection material 7b, the bolt 5 is loosened to move the position of the ultrasonic probe 1, and the frame 3, the gimbal mechanism 2, the ultrasonic probe 1 is moved along the elongated hole 6 by the dimension indicated by I, and the bolt 5 is tightened and fixed again to change the distance from the end face of the test material to the ultrasonic probe 1 from H to H + I. .
When changing from the large inspection material 7b to the small inspection material 7a, the procedure is reversed.

【0004】[0004]

【発明が解決しようとする課題】従来の装置は以上のよ
うに構成されているので、超音波探触子の位置を移動す
るのに、ボルトを緩めたり締めたりするため、工具が必
要であり、作業に時間がかかった。また、長穴の寸法だ
けスライドさせてボルトで締結しているため超音波探触
子を正確な位置に固定することが困難であるなどの問題
点があった。
Since the conventional apparatus is configured as described above, a tool is required to loosen and tighten bolts to move the position of the ultrasonic probe. It took time to work. In addition, there is a problem that it is difficult to fix the ultrasonic probe at an accurate position because it is slid by the length of the elongated hole and fastened with bolts.

【0005】この発明は、上記のような問題点を解消す
るためになされたもので、被検査材のサイズ替えなどに
伴う超音波探触子の移動を工具を用いることなく容易且
つ正確に短時間で行える検査装置を得る事を目的とす
る。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and it is possible to easily and accurately move an ultrasonic probe in accordance with a change in size of a material to be inspected without using a tool. The purpose is to obtain an inspection device that can be performed in a short time.

【0006】[0006]

【課題を解決するための手段】この発明に係る検査装置
は、超音波探触子を保持するジンバル機構に、軸のスラ
イドによる移動機構と、その位置決めを兼ねた固定装置
を設けたものである。
An inspection apparatus according to the present invention comprises a gimbal mechanism for holding an ultrasonic probe, a moving mechanism by sliding a shaft, and a fixing device for positioning the same. .

【0007】[0007]

【作用】この発明における検査装置は、スペーサのはさ
みこむ位置を置き替える事により、超音波探触子の位置
を所定量移動できるので、簡単な操作で正確な量を短時
間に行える。また、スペーサの厚さを変える事により、
同じ装置で異なる移動量を得る事も容易にできる。
According to the inspection apparatus of the present invention, the position of the ultrasonic probe can be moved by a predetermined amount by replacing the position where the spacer is inserted, so that an accurate amount can be obtained in a short time by a simple operation. Also, by changing the thickness of the spacer,
Different movement amounts can be easily obtained with the same device.

【0008】[0008]

【実施例】 実施例1.図1から図7は、この発明の一実施例を示す
図であり、図1は被検査材搬送方向から見た全体図、図
2は図1をA方向から見た図、図3は図2の側断面で大
の被検査材の端面から超音波探触子までの距離をBとす
る図、図4は超音波探触子の被検査材端面からの距離を
図3におけるBからCに移動した状態の図、図5は図4
の側断面図、図6は図3のD方向から見た図、図7は図
5をE方向から見た図である。図中の符号1〜3、7
a、7bは従来の装置と同一または相当部分を示すもの
である。8はFに示すフランジを備えたフランジ付軸
で、ジンバル機構2はこの軸を中心に回転するが、軸方
向にはフランジ付軸8に対し9に示す止め輪で固定され
ている。また、このフランジ付軸8はフレーム3に対軸
方向に摺動する。10はフレーム3に固定され、上記ジ
ンバル機構2を回転支掌するが軸方向には自由支持する
軸、11は所定の厚さGなるスペーサで、その厚さが超
音波探触子1の移動量となる。スペーサ11は上記フレ
ーム3に打設され12に示すピンを中心に回転し、ピン
の軸方向に摺動する。13はスペーサ11とフランジ付
軸8のフランジ部の外側もしくは内側と重ねてフレーム
3に手でねじ込み固定するノブ付きボルトである。
Embodiment 1 1 to 7 are views showing an embodiment of the present invention. FIG. 1 is an overall view as viewed from the direction of transporting the inspection material, FIG. 2 is a view as viewed in FIG. 1 from direction A, and FIG. FIG. 4 is a diagram in which the distance from the end surface of the large inspection material to the ultrasonic probe in the side section 2 is B, and FIG. 4 shows the distance from the inspection material end surface of the ultrasonic probe to B to C in FIG. FIG. 5 is a view showing a state in which
6 is a view as seen from the direction D in FIG. 3, and FIG. 7 is a view as seen from the direction E in FIG. Reference numerals 1-3, 7 in the figure
Reference numerals a and 7b denote the same or corresponding parts as those of the conventional apparatus. Reference numeral 8 denotes a flanged shaft provided with a flange shown by F. The gimbal mechanism 2 rotates about this shaft, but is fixed to the flanged shaft 8 by a retaining ring shown in 9 in the axial direction. The flanged shaft 8 slides on the frame 3 in the axial direction. Reference numeral 10 denotes an axis which is fixed to the frame 3 and rotatably supports the gimbal mechanism 2 but freely supports it in the axial direction. Reference numeral 11 denotes a spacer having a predetermined thickness G, the thickness of which moves the ultrasonic probe 1. Amount. The spacer 11 is mounted on the frame 3 and rotates around a pin shown at 12, and slides in the axial direction of the pin. Reference numeral 13 denotes a bolt with a knob which is overlapped with the spacer 11 and the outside or inside of the flange portion of the flanged shaft 8 and screwed and fixed to the frame 3 by hand.

【0009】大の被検査材7bから小の被検査材7aに
サイズ替を行うには表側のスペーサ11とその裏側のフ
ランジ付軸8中のFに示すフランジ部とをフレーム3と
の間にはさみ固定しているノブ付ボルト13を手で緩
め、自由になったスペーサ11をフランジ付軸8中のフ
ランジ部と干渉しない位置まで回転させ、フランジ付軸
8ごとジンバル機構2と超音波探触子1を移動させる。
そしてスペーサ11をフレーム3側に押し込み元の位置
まで回転させてフランジ付軸8のフランジ部とフレーム
3との間に配置させ、ノブ付ボルト13を手で締めて固
定する。小の被検査材7aから大の被検査材7bに変更
する場合は上述の逆手順で行う。図3は大の被検査材7
bに対する超音波探触子1の位置をBとする場合を示
し、図5には同様にC=B−Gとする場合を示す。図6
および図7にはスペーサ11の上記の各々についての配
設を示す。また、図7中の矢印は、探触子移動時のスペ
ーサ11の回転方向を示す。
In order to change the size of the large inspection material 7b to the small inspection material 7a, the front side spacer 11 and the flange portion indicated by F in the flanged shaft 8 on the back side are placed between the front side spacer 11 and the frame 3. Loosen the bolt 13 with the knob fixed with the scissors by hand, rotate the released spacer 11 to a position where it does not interfere with the flange portion in the flanged shaft 8, the gimbal mechanism 2 and the ultrasonic probe together with the flanged shaft 8. The child 1 is moved.
Then, the spacer 11 is pushed into the frame 3 side, rotated to the original position, and arranged between the flange portion of the flanged shaft 8 and the frame 3, and the bolt 13 with the knob is tightened by hand and fixed. When changing from the small inspection material 7a to the large inspection material 7b, the above procedure is performed in reverse. FIG. 3 shows a large inspection material 7
FIG. 5 shows a case where the position of the ultrasonic probe 1 with respect to b is B, and FIG. 5 shows a case where C = BG. FIG.
FIG. 7 shows the arrangement of each of the spacers 11 described above. The arrow in FIG. 7 indicates the rotation direction of the spacer 11 during the movement of the probe.

【0010】[0010]

【発明の効果】以上のように、この発明によれば呼称寸
法の異った被検査材の端面に対する超音波探触子の移動
すなわちサイズ替は、フランジ付軸をスライドさせ、ス
ペーサの位置をフランジ付軸中の内側又は外側に配設す
ることによって行っているため超音波探触子の移動を容
易に且つ正確、じん速に行う事ができるという効果があ
る。また、ノブ付ボルトは手で締緩できるため従来装置
のように工具を必要としない。
As described above, according to the present invention, the movement of the ultrasonic probe, that is, the size change, with respect to the end faces of the test materials having different nominal dimensions is performed by sliding the shaft with the flange and changing the position of the spacer. Since the ultrasonic probe is disposed inside or outside the flanged shaft, the ultrasonic probe can be moved easily, accurately, and quickly. Further, since the bolt with knob can be tightened and loosened by hand, a tool is not required unlike a conventional device.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の一実施例による検査装置を示す搬送
方向の正面図。
FIG. 1 is a front view in the transport direction showing an inspection apparatus according to an embodiment of the present invention.

【図2】この発明の一実施例による図1のA方向から見
た図。
FIG. 2 is a diagram viewed from a direction A in FIG. 1 according to one embodiment of the present invention;

【図3】この発明の一実施例による図2の側断面で大の
被検査材の場合を示す配設図。
FIG. 3 is an arrangement diagram showing a case of a large inspection material in a side cross section of FIG. 2 according to one embodiment of the present invention;

【図4】この発明の一実施例による図2から小の被検査
材にシフトした場合を示す配設図。
FIG. 4 is an arrangement diagram showing a case where a shift is made to a small material to be inspected from FIG. 2 according to an embodiment of the present invention.

【図5】この発明の一実施例による図4の側断面図。FIG. 5 is a side sectional view of FIG. 4 according to one embodiment of the present invention.

【図6】この発明の一実施例による図3のD方向から見
た図。
FIG. 6 is a view according to an embodiment of the present invention, as viewed from a direction D in FIG. 3;

【図7】この発明の一実施例による図5のE方向から見
た図。
FIG. 7 is a view according to one embodiment of the present invention as viewed from a direction E in FIG. 5;

【図8】従来の検査装置を示す搬送方向の正面図。FIG. 8 is a front view of a conventional inspection apparatus in a transport direction.

【図9】従来の検査装置を示す図8の平面図。FIG. 9 is a plan view of FIG. 8 showing a conventional inspection device.

【符号の説明】 1 超音波探触子 2 ジンバル機構 3 フレーム 4 サドル 5 ボルト 6 長穴 7 被検査材 8 フランジ付軸 9 止め輪 10 軸 11 スペーサ 12 ピン 13 ノブ付ボルト[Description of Signs] 1 Ultrasonic probe 2 Gimbal mechanism 3 Frame 4 Saddle 5 Bolt 6 Elongated hole 7 Material to be inspected 8 Shaft with flange 9 Retaining ring 10 Shaft 11 Spacer 12 Pin 13 Bolt with knob

───────────────────────────────────────────────────── フロントページの続き (72)発明者 原口 正隆 福岡県北九州市小倉北区許斐町1 住友 金属工業株式会社 小倉製鉄所内 (72)発明者 川上 哲男 福岡県北九州市小倉北区許斐町1 住友 金属工業株式会社 小倉製鉄所内 (56)参考文献 特開 昭59−222759(JP,A) 特開 平3−81117(JP,A) 実開 昭60−31662(JP,U) (58)調査した分野(Int.Cl.7,DB名) G01N 29/00 - 29/28 ────────────────────────────────────────────────── ─── Continued on the front page (72) Inventor Masataka Haraguchi 1 Konomi-cho, Kokurakita-ku, Kitakyushu-shi, Fukuoka Sumitomo Metal Industries Co., Ltd. (72) Inventor Tetsuo Kawakami 1 Konomi-cho, Kokurakita-ku, Kitakyushu-shi, Fukuoka Sumitomo Metal Industry Co., Ltd. Ogura Works (56) References JP-A-59-222759 (JP, A) JP-A-3-81117 (JP, A) JP-A-60-31662 (JP, U) (58) Field (Int. Cl. 7 , DB name) G01N 29/00-29/28

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 角鋼片などの棒状の被検査材を長手方向
に搬送テーブルを用いてダイヤモンド送りしながら、超
音波を利用して被検査材中の欠陥や介在物等の検出を行
う検査装置において、被検査材に対向して配置された複
数個の超音波探触子と、上記複数個の超音波探触子を保
持し互いに直角な2軸を中心として、被検査材の表面に
対してならうように揺動させるジンバル機構と、一方は
上記ジンバル機構の被検査材搬送方向の中心を、搬送直
交方向には自由にかつ回転支掌され、他方は上記ジンバ
ル機構をつつむ形のフレームに固定された軸と、一方は
上記ジンバル機構の上記軸と同一軸上の対面に回転支掌
され、他方は上記フレームに移動可能に支持されたフラ
ンジ付軸と、上記フレームの上記フランジ付軸側に打設
されたピンと、上記フレームにピンを介して設けられ、
上記ピン軸方向に自由でかつ、回転支掌された、所定の
板厚を有するスペーサと、上記スペーサを上記フランジ
付軸のフランジの外側もしくは内側に配置した状態でフ
レームに固定させる固定具とを備えた事を特徴とする検
査装置。
1. An inspection apparatus for detecting a defect or inclusion in a material to be inspected by using ultrasonic waves while feeding a rod-like material to be inspected such as a square billet in a longitudinal direction with a diamond using a transfer table. In, a plurality of ultrasonic probes arranged opposite to the material to be inspected, and holding the plurality of ultrasonic probes, centering on two axes perpendicular to each other, with respect to the surface of the material to be inspected A gimbal mechanism that swings in a manner similar to the above, and a frame that freely and rotationally supports the center of the gimbal mechanism in the direction of conveyance of the test object in the direction orthogonal to the conveyance, and the other is a frame enclosing the gimbal mechanism. A shaft, one of which is rotatably supported on the opposite surface on the same axis as the shaft of the gimbal mechanism, the other is a flanged shaft movably supported by the frame, and the flanged shaft of the frame. And the above pin Provided on the frame via pins,
A spacer having a predetermined thickness, which is free in the direction of the pin axis and is rotatably supported, and a fixture for fixing the spacer to a frame in a state where the spacer is arranged outside or inside the flange of the flanged shaft. An inspection device characterized by having
【請求項2】 固定具としてノブ付ボルトを用いたこと
を特徴とする請求項1記載の検査装置。
2. The inspection apparatus according to claim 1, wherein a bolt with a knob is used as the fixture.
JP28677593A 1993-11-16 1993-11-16 Inspection device Expired - Fee Related JP3196455B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28677593A JP3196455B2 (en) 1993-11-16 1993-11-16 Inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28677593A JP3196455B2 (en) 1993-11-16 1993-11-16 Inspection device

Publications (2)

Publication Number Publication Date
JPH07140119A JPH07140119A (en) 1995-06-02
JP3196455B2 true JP3196455B2 (en) 2001-08-06

Family

ID=17708894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28677593A Expired - Fee Related JP3196455B2 (en) 1993-11-16 1993-11-16 Inspection device

Country Status (1)

Country Link
JP (1) JP3196455B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102540513B1 (en) * 2016-06-30 2023-06-05 일리노이즈 툴 워크스 인코포레이티드 Hardwired holder for tablet/smartphone as equipment console

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102540513B1 (en) * 2016-06-30 2023-06-05 일리노이즈 툴 워크스 인코포레이티드 Hardwired holder for tablet/smartphone as equipment console

Also Published As

Publication number Publication date
JPH07140119A (en) 1995-06-02

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