JPS5990004A - 組立精度測定装置 - Google Patents

組立精度測定装置

Info

Publication number
JPS5990004A
JPS5990004A JP19996682A JP19996682A JPS5990004A JP S5990004 A JPS5990004 A JP S5990004A JP 19996682 A JP19996682 A JP 19996682A JP 19996682 A JP19996682 A JP 19996682A JP S5990004 A JPS5990004 A JP S5990004A
Authority
JP
Japan
Prior art keywords
sensor
disk
difference
zero
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19996682A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6360324B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Akira Ono
明 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP19996682A priority Critical patent/JPS5990004A/ja
Publication of JPS5990004A publication Critical patent/JPS5990004A/ja
Publication of JPS6360324B2 publication Critical patent/JPS6360324B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP19996682A 1982-11-15 1982-11-15 組立精度測定装置 Granted JPS5990004A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19996682A JPS5990004A (ja) 1982-11-15 1982-11-15 組立精度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19996682A JPS5990004A (ja) 1982-11-15 1982-11-15 組立精度測定装置

Publications (2)

Publication Number Publication Date
JPS5990004A true JPS5990004A (ja) 1984-05-24
JPS6360324B2 JPS6360324B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-24

Family

ID=16416558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19996682A Granted JPS5990004A (ja) 1982-11-15 1982-11-15 組立精度測定装置

Country Status (1)

Country Link
JP (1) JPS5990004A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01263506A (ja) * 1988-04-14 1989-10-20 Daiichi Denki Kk 光増幅変位センサと位置制御装置
CN103424071A (zh) * 2012-05-23 2013-12-04 北京理工大学 基于激光三角法的内孔测头固有几何参数标定方法
CN105890517A (zh) * 2015-01-23 2016-08-24 北京空间飞行器总体设计部 一种基于复杂异形精测镜的精度测量方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01263506A (ja) * 1988-04-14 1989-10-20 Daiichi Denki Kk 光増幅変位センサと位置制御装置
CN103424071A (zh) * 2012-05-23 2013-12-04 北京理工大学 基于激光三角法的内孔测头固有几何参数标定方法
CN105890517A (zh) * 2015-01-23 2016-08-24 北京空间飞行器总体设计部 一种基于复杂异形精测镜的精度测量方法
CN105890517B (zh) * 2015-01-23 2018-08-07 北京空间飞行器总体设计部 一种基于复杂异形精测镜的精度测量方法

Also Published As

Publication number Publication date
JPS6360324B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-24

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