JPS5972531A - デ−タ入出力装置 - Google Patents

デ−タ入出力装置

Info

Publication number
JPS5972531A
JPS5972531A JP57184151A JP18415182A JPS5972531A JP S5972531 A JPS5972531 A JP S5972531A JP 57184151 A JP57184151 A JP 57184151A JP 18415182 A JP18415182 A JP 18415182A JP S5972531 A JPS5972531 A JP S5972531A
Authority
JP
Japan
Prior art keywords
data
tape
self
diagnosis
output device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57184151A
Other languages
English (en)
Japanese (ja)
Other versions
JPH048836B2 (enrdf_load_stackoverflow
Inventor
Seiichi Hattori
服部 精一
Yutaka Mizuno
豊 水野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fanuc Corp
Original Assignee
Fanuc Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fanuc Corp filed Critical Fanuc Corp
Priority to JP57184151A priority Critical patent/JPS5972531A/ja
Publication of JPS5972531A publication Critical patent/JPS5972531A/ja
Publication of JPH048836B2 publication Critical patent/JPH048836B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/267Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57184151A 1982-10-20 1982-10-20 デ−タ入出力装置 Granted JPS5972531A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57184151A JPS5972531A (ja) 1982-10-20 1982-10-20 デ−タ入出力装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57184151A JPS5972531A (ja) 1982-10-20 1982-10-20 デ−タ入出力装置

Publications (2)

Publication Number Publication Date
JPS5972531A true JPS5972531A (ja) 1984-04-24
JPH048836B2 JPH048836B2 (enrdf_load_stackoverflow) 1992-02-18

Family

ID=16148252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57184151A Granted JPS5972531A (ja) 1982-10-20 1982-10-20 デ−タ入出力装置

Country Status (1)

Country Link
JP (1) JPS5972531A (enrdf_load_stackoverflow)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4929041A (enrdf_load_stackoverflow) * 1972-07-12 1974-03-15
JPS50108483A (enrdf_load_stackoverflow) * 1974-02-05 1975-08-26
JPS521138A (en) * 1973-10-24 1977-01-06 Crosrol Ltd Carding method and carder
JPS5492066A (en) * 1977-12-29 1979-07-20 Takeda Riken Ind Co Ltd Test pattern generator
JPS55163700A (en) * 1979-06-07 1980-12-19 Mitsubishi Electric Corp Memory circuit tester
JPS57137061U (enrdf_load_stackoverflow) * 1981-02-18 1982-08-26
JPS57144159U (enrdf_load_stackoverflow) * 1981-03-05 1982-09-10

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4929041A (enrdf_load_stackoverflow) * 1972-07-12 1974-03-15
JPS521138A (en) * 1973-10-24 1977-01-06 Crosrol Ltd Carding method and carder
JPS50108483A (enrdf_load_stackoverflow) * 1974-02-05 1975-08-26
JPS5492066A (en) * 1977-12-29 1979-07-20 Takeda Riken Ind Co Ltd Test pattern generator
JPS55163700A (en) * 1979-06-07 1980-12-19 Mitsubishi Electric Corp Memory circuit tester
JPS57137061U (enrdf_load_stackoverflow) * 1981-02-18 1982-08-26
JPS57144159U (enrdf_load_stackoverflow) * 1981-03-05 1982-09-10

Also Published As

Publication number Publication date
JPH048836B2 (enrdf_load_stackoverflow) 1992-02-18

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