JPS5972153A - 半導体集積回路装置 - Google Patents
半導体集積回路装置Info
- Publication number
- JPS5972153A JPS5972153A JP57182515A JP18251582A JPS5972153A JP S5972153 A JPS5972153 A JP S5972153A JP 57182515 A JP57182515 A JP 57182515A JP 18251582 A JP18251582 A JP 18251582A JP S5972153 A JPS5972153 A JP S5972153A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- transistor
- circuit device
- signal input
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
Landscapes
- Static Random-Access Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57182515A JPS5972153A (ja) | 1982-10-18 | 1982-10-18 | 半導体集積回路装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57182515A JPS5972153A (ja) | 1982-10-18 | 1982-10-18 | 半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5972153A true JPS5972153A (ja) | 1984-04-24 |
| JPS6410095B2 JPS6410095B2 (enExample) | 1989-02-21 |
Family
ID=16119643
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57182515A Granted JPS5972153A (ja) | 1982-10-18 | 1982-10-18 | 半導体集積回路装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5972153A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59157900A (ja) * | 1983-02-25 | 1984-09-07 | Nec Corp | 冗長ビツト使用の検出回路を有するメモリ装置 |
| JPS6166295A (ja) * | 1984-09-10 | 1986-04-05 | Nec Corp | 半導体メモリ |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58170034A (ja) * | 1982-03-19 | 1983-10-06 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | 修復した集積回路の識別 |
-
1982
- 1982-10-18 JP JP57182515A patent/JPS5972153A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58170034A (ja) * | 1982-03-19 | 1983-10-06 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | 修復した集積回路の識別 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59157900A (ja) * | 1983-02-25 | 1984-09-07 | Nec Corp | 冗長ビツト使用の検出回路を有するメモリ装置 |
| JPS6166295A (ja) * | 1984-09-10 | 1986-04-05 | Nec Corp | 半導体メモリ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6410095B2 (enExample) | 1989-02-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5576999A (en) | Redundancy circuit of a semiconductor memory device | |
| CN100433190C (zh) | 可控制电源线与/或接地线的电位电平的半导体存储装置 | |
| US4459685A (en) | Redundancy system for high speed, wide-word semiconductor memories | |
| US5295114A (en) | Semiconductor memory device with redundant circuit for rescuing from rejection due to large current consumption | |
| US8248871B2 (en) | Redundancy circuits and semiconductor memory devices | |
| US4885721A (en) | Semiconductor memory device with redundant memory cells | |
| US6177830B1 (en) | High voltage charge pump using standard sub 0.35 micron CMOS process | |
| JPH01166391A (ja) | スタティック型ランダムアクセスメモリ | |
| US5703816A (en) | Failed memory cell repair circuit of semiconductor memory | |
| US7436729B2 (en) | Fuse circuit and semiconductor device using fuse circuit thereof | |
| US8422327B2 (en) | Semiconductor device having nonvolatile memory element and manufacturing method thereof | |
| US5706231A (en) | Semiconductor memory device having a redundant memory cell | |
| US7539074B2 (en) | Protection circuit with antifuse configured as semiconductor memory redundancy circuitry | |
| JPH01245497A (ja) | 半導体メモリ | |
| US5457656A (en) | Zero static power memory device redundancy circuitry | |
| US6262924B1 (en) | Programmable semiconductor memory device | |
| EP0419760B1 (en) | Zero standby power, radiation hardened, memory redundancy circuit | |
| US6504784B1 (en) | Semiconductor memory device with reduced standby current | |
| JPS5972153A (ja) | 半導体集積回路装置 | |
| US5959907A (en) | Semiconductor memory device having a redundancy circuit | |
| US6982912B2 (en) | Semiconductor memory device | |
| US6545920B2 (en) | Defective address storage scheme for memory device | |
| US8803590B2 (en) | High speed low power fuse circuit | |
| US8054696B1 (en) | System and method to improve reliability in memory word line | |
| JPS59210596A (ja) | 半導体記憶装置 |