JPS5970987A - 遠隔スミア装置 - Google Patents

遠隔スミア装置

Info

Publication number
JPS5970987A
JPS5970987A JP18106882A JP18106882A JPS5970987A JP S5970987 A JPS5970987 A JP S5970987A JP 18106882 A JP18106882 A JP 18106882A JP 18106882 A JP18106882 A JP 18106882A JP S5970987 A JPS5970987 A JP S5970987A
Authority
JP
Japan
Prior art keywords
smear
jig
drum
remote
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18106882A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0377472B2 (enrdf_load_html_response
Inventor
Tomoji Harada
原田 友治
Hiroshi Fujisawa
藤沢 博司
Akio Ozaki
明生 尾崎
Shigemi Hirate
平手 成美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JGC Corp
Osaka Kiko Co Ltd
Original Assignee
JGC Corp
Japan Gasoline Co Ltd
Osaka Kiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JGC Corp, Japan Gasoline Co Ltd, Osaka Kiko Co Ltd filed Critical JGC Corp
Priority to JP18106882A priority Critical patent/JPS5970987A/ja
Publication of JPS5970987A publication Critical patent/JPS5970987A/ja
Publication of JPH0377472B2 publication Critical patent/JPH0377472B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00Details of radiation-measuring instruments
    • G01T7/02Collecting means for receiving or storing samples to be investigated and possibly directly transporting the samples to the measuring arrangement; particularly for investigating radioactive fluids

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP18106882A 1982-10-14 1982-10-14 遠隔スミア装置 Granted JPS5970987A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18106882A JPS5970987A (ja) 1982-10-14 1982-10-14 遠隔スミア装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18106882A JPS5970987A (ja) 1982-10-14 1982-10-14 遠隔スミア装置

Publications (2)

Publication Number Publication Date
JPS5970987A true JPS5970987A (ja) 1984-04-21
JPH0377472B2 JPH0377472B2 (enrdf_load_html_response) 1991-12-10

Family

ID=16094232

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18106882A Granted JPS5970987A (ja) 1982-10-14 1982-10-14 遠隔スミア装置

Country Status (1)

Country Link
JP (1) JPS5970987A (enrdf_load_html_response)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61124885A (ja) * 1984-11-21 1986-06-12 Daifuku Co Ltd スミヤ・ラベリング装置
JPS6235273U (enrdf_load_html_response) * 1985-08-20 1987-03-02
JPS63314491A (ja) * 1987-06-17 1988-12-22 Mitsubishi Metal Corp 表面汚染密度測定装置の拭き取り圧力制御装置
JP2007051928A (ja) * 2005-08-18 2007-03-01 Toshiba Corp 汚染拭き取り装置、汚染除去方法および汚染検査方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5779480A (en) * 1980-11-05 1982-05-18 Jgc Corp Remote smear device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5779480A (en) * 1980-11-05 1982-05-18 Jgc Corp Remote smear device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61124885A (ja) * 1984-11-21 1986-06-12 Daifuku Co Ltd スミヤ・ラベリング装置
JPS6235273U (enrdf_load_html_response) * 1985-08-20 1987-03-02
JPS63314491A (ja) * 1987-06-17 1988-12-22 Mitsubishi Metal Corp 表面汚染密度測定装置の拭き取り圧力制御装置
JP2007051928A (ja) * 2005-08-18 2007-03-01 Toshiba Corp 汚染拭き取り装置、汚染除去方法および汚染検査方法

Also Published As

Publication number Publication date
JPH0377472B2 (enrdf_load_html_response) 1991-12-10

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