JPS5963960U - Ion source for mass spectrometer - Google Patents
Ion source for mass spectrometerInfo
- Publication number
- JPS5963960U JPS5963960U JP16012382U JP16012382U JPS5963960U JP S5963960 U JPS5963960 U JP S5963960U JP 16012382 U JP16012382 U JP 16012382U JP 16012382 U JP16012382 U JP 16012382U JP S5963960 U JPS5963960 U JP S5963960U
- Authority
- JP
- Japan
- Prior art keywords
- electron
- passage hole
- filament
- mass spectrometer
- magnetic pole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Tubes For Measurement (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図及び第2図は従来の装置の概略を説明するための
図、第3図は本考案の一実施例の主要部を示す図、第4
図a、 bは第3図装置の使用状態を説明する図、第
5図a、 bは第3図装置の一部変形を示す図である。
1:イオン化筐、2:導管、3:開口、4:電極群、5
a、 5b:電子通過孔、6:フィラメント、8a。
8b:磁石の磁極、9:試料ターゲット、lQ:FAB
ガン、11:中性粒子通過孔、12a、12b:偏向電
極、13,14,15,16:電源。1 and 2 are diagrams for explaining the outline of a conventional device, FIG. 3 is a diagram showing the main part of an embodiment of the present invention, and FIG.
Figures a and b are views for explaining the usage state of the apparatus shown in figure 3, and Figures a and b are views showing a partial modification of the apparatus shown in figure 3. 1: Ionization case, 2: Conduit, 3: Opening, 4: Electrode group, 5
a, 5b: electron passing hole, 6: filament, 8a. 8b: magnetic pole of magnet, 9: sample target, lQ: FAB
Gun, 11: Neutral particle passage hole, 12a, 12b: Deflection electrode, 13, 14, 15, 16: Power supply.
Claims (1)
入又は挿入する手段、該イオン化筐からイオンを質量分
析系に取出すための開口、該イオン取出し方向と直交す
る方向に設けられた一部 対の電子通過孔、該電子通
過孔の一方の外側に置かれた電子放射用のフィラメント
、該フィラメントからの電子を他方の電子通過孔に向け
て加速するための電源、前記電子の進行方向に磁界を発
生するために前記フィラメントの外側及び他方の電子通
過孔の外側に置かれた磁石装置の少くとも一対の磁極部
分、前記他方の電子通過孔の外側に置かれた磁極部分に
形成された粒子通過孔、該粒子通過孔を有する磁極部分
の外側に置かれ前記粒子通過孔及び電子通過孔を介して
高速中性粒子又はイオンをイオン化筐内に導入する手段
、前記粒子通過孔を有する磁極部分とイオン化筐部との
間に電子及び粒子の通路を挾んで対向、配置された一対
の電子トラツケ用の偏向電極及び該偏向電極に相互に異
った電圧を印加する電源から成る質量分析装置用イオン
源。 2 前記偏向電極の一方は前記フィラメントと同一の電
位に保持されている実用新案登録請求の範囲第1項記載
の質量分析装置用イオン源。 3 前記偏向電極め一方はイオン化筐で兼用している実
用新案登録請求の範囲第1項又は第2項 、記載の質
量分析装置用イオン源。[Scope of Claim for Utility Model Registration] 1. An ionization housing, means for injecting or inserting a sample to be analyzed into the ionization housing, an opening for extracting ions from the ionization housing into a mass spectrometry system, and an opening perpendicular to the ion extraction direction. A pair of electron passing holes provided in the direction, a filament for electron emission placed outside one of the electron passing holes, and a power source for accelerating electrons from the filament toward the other electron passing hole. , at least a pair of magnetic pole portions of a magnet device placed outside the filament and outside the other electron passage hole to generate a magnetic field in the electron traveling direction; a particle passage hole formed in a magnetic pole part, a means placed outside the magnetic pole part having the particle passage hole, and introducing high-speed neutral particles or ions into the ionization housing through the particle passage hole and the electron passage hole; A pair of deflection electrodes for electron tracking are arranged opposite to each other with a passage for electrons and particles interposed between the magnetic pole part having the particle passage hole and the ionization housing, and different voltages are applied to the deflection electrodes. An ion source for a mass spectrometer consisting of a power supply. 2. The ion source for a mass spectrometer according to claim 1, wherein one of the deflection electrodes is held at the same potential as the filament. 3. The ion source for a mass spectrometer according to claim 1 or 2, wherein one side of the deflection electrode is also used as an ionization housing.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16012382U JPS5963960U (en) | 1982-10-22 | 1982-10-22 | Ion source for mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16012382U JPS5963960U (en) | 1982-10-22 | 1982-10-22 | Ion source for mass spectrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5963960U true JPS5963960U (en) | 1984-04-27 |
Family
ID=30352279
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16012382U Pending JPS5963960U (en) | 1982-10-22 | 1982-10-22 | Ion source for mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5963960U (en) |
-
1982
- 1982-10-22 JP JP16012382U patent/JPS5963960U/en active Pending
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