JPS596058B2 - Semiconductor device manufacturing equipment - Google Patents

Semiconductor device manufacturing equipment

Info

Publication number
JPS596058B2
JPS596058B2 JP53142826A JP14282678A JPS596058B2 JP S596058 B2 JPS596058 B2 JP S596058B2 JP 53142826 A JP53142826 A JP 53142826A JP 14282678 A JP14282678 A JP 14282678A JP S596058 B2 JPS596058 B2 JP S596058B2
Authority
JP
Japan
Prior art keywords
sheet
semiconductor element
semiconductor
backup ring
mounting member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53142826A
Other languages
Japanese (ja)
Other versions
JPS5570041A (en
Inventor
照雄 草苅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP53142826A priority Critical patent/JPS596058B2/en
Publication of JPS5570041A publication Critical patent/JPS5570041A/en
Publication of JPS596058B2 publication Critical patent/JPS596058B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68354Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to support diced chips prior to mounting

Landscapes

  • Die Bonding (AREA)

Description

【発明の詳細な説明】 この発明は半導体装置の製造装置にかゝり、特に半導体
装置の半導体素子を光学的画像に変換して自動的に検出
、位置調整、素子取着部材に取着を施す製造装置に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a manufacturing apparatus for semiconductor devices, and in particular to converting a semiconductor element of a semiconductor device into an optical image and automatically detecting, positioning, and attaching the semiconductor element to an element attachment member. The invention relates to manufacturing equipment.

半導体装置の製造において、半導体ウェハを分割して得
られる半導体素子(以降素子と略称する)を素子取着部
材に定位して取着する工程がある。
2. Description of the Related Art In the manufacture of semiconductor devices, there is a step of positioning and attaching semiconductor elements (hereinafter referred to as elements) obtained by dividing a semiconductor wafer to an element attaching member.

この工程は従来第1図に側面の断面図によつて示される
装置、またはピンセットによる手作業にて実施されてい
た。第1図に示す装置は多数の素子1、V・・・・・・
・・をその能動面の反対主面で接着する展延性シート2
が素子を上に配置され、シート下方にプッシュロッド3
を、また素子側上方に吸着ノズル4が設けられている。
なお、図における5は上記展延性シート2を展張するカ
セットリングである。上記装置にては、まずシート2を
加熱展延させておき、吸着ノズル4を下降し、ついでプ
ッシュロッド3にて突き上げ1個の素子1を吸着ノズル
4のノズルロに近づける。吸着ノズル4は素子1を負圧
にて吸着し、電子取着部材上に搬送したのち取着する。
上述の装置は次にあげる欠点がある。
This process has conventionally been carried out manually using the device shown in side cross-section in FIG. 1, or with tweezers. The device shown in FIG. 1 has a large number of elements 1, V...
A malleable sheet 2 that adheres ... on its main surface opposite to its active surface.
is placed with the element above, and the push rod 3 is placed below the seat.
Also, a suction nozzle 4 is provided above the element side.
In addition, 5 in the figure is a cassette ring for spreading the above-mentioned malleable sheet 2. In the above apparatus, the sheet 2 is first heated and spread, the suction nozzle 4 is lowered, and then pushed up with the push rod 3 to bring one element 1 close to the nozzle of the suction nozzle 4. The suction nozzle 4 suctions the element 1 under negative pressure, transports it onto an electronic attachment member, and then attaches it.
The above-described device has the following drawbacks.

(a)素子1を所定に位置合わせしても吸着ノズルにて
搬送途中で偏位し、取着部材へのマウントの際位置ずれ
を生ずる。
(a) Even if the element 1 is positioned in a predetermined position, it will be displaced during transportation by the suction nozzle, and a positional deviation will occur when it is mounted on a mounting member.

(b)吸着ノズルによる吸着の際に素子が割れたり、吸
着ノズルの先端が非常に小さいために吸着保持が困難で
あり偏位しやすい。
(b) The element may break during suction by the suction nozzle, and the tip of the suction nozzle is very small, making it difficult to hold the element by suction and causing deviation.

(c)手作業にて1個ずつ位置合わせすることは極めて
非能率であり、装置の自動化に大きな障害である。
(c) Manual alignment one by one is extremely inefficient and is a major obstacle to automating the device.

(d)展延性シートの端寄りの素子をプツシユロツドで
突くときプツシユロツドを中心とし周囲に発生する応力
が不均一(シート端縁側に大きい)になるため素子が傾
斜する(第11図参照)。
(d) When an element near the edge of the extensible sheet is poked with a push rod, the stress generated around the push rod becomes uneven (greater toward the edge of the sheet), causing the element to tilt (see FIG. 11).

これによりプツシユロツドの突く距離が制約をうける。
この発明は上記従来の欠点にたいし、これを改良する半
導体装置の製造装置の構造を提供するものである。
This limits the distance the push rod can hit.
The present invention provides a structure for a semiconductor device manufacturing apparatus that overcomes the above-mentioned conventional drawbacks.

この発明にかkる半導体装置の製造装置は、複数の半導
体素子をその能動面にて接着されたシートをその半導体
素子を下側に水平に張架した力セツトリングと、前記力
セツトリング内の半導体素子の1個を中心にシートを押
し下げ下方の半導体素子取着部材に前記半導体素子を接
触させるバツクアツプリングと、前記バツクアツプリン
グの下降についでこれと同心に下降して前記半導体素子
をシートを介しかつシートを破らずに素子取着部材に押
しつけるとともに押しつけ後に前記バツクアツプリング
の上昇後に上昇するプツシユニードルと、前記プツシユ
ニードルとバツクアップリングとを前記相関をもつて上
下動させる上下動機構と、前記展延性シートを透して半
導体素子面にスリツト光を投射する投光部および前記透
光の半導体素子面における反射像を受像し二次元イメー
ジセンサを含む受光部が互いに所定の角度にて配設され
た光学系機構と、前記受像パターンと二次元イメージセ
ンサの絶対座標に対する偏位を補正するマイクロコンピ
ユータを含む自動位置決め装置部と、半導体素子取着部
材を載置しこの素子配置位置に対応して系統的に水平移
動させる取着部材送り機構と、前記力セツトリングが配
設され前記自動位置決め装置の情報量に対応して水平移
動する素子送り機構とを具備したもので、半導体素子を
素子取着部材に取着するために、光学的機構により自動
的に素子の検出、位置修正を施し自動的に取着部材に取
着する機構を備えたことを特徴とする。
The semiconductor device manufacturing apparatus according to the present invention includes a force setting method in which a sheet in which a plurality of semiconductor devices are bonded at their active surfaces is stretched horizontally with the semiconductor devices below, and a back-up spring that presses down the sheet centering on one of the semiconductor elements and brings the semiconductor element into contact with a lower semiconductor element mounting member; A push unit needle which is pressed against the element mounting member through the sheet and without tearing the sheet and which rises after the back up spring is raised after the pressing, and the push unit needle and the back up ring are moved up and down in the above correlation. A vertical movement mechanism, a light projecting section that projects a slit light onto the semiconductor element surface through the malleable sheet, and a light receiving section that receives a reflected image of the transmitted light on the semiconductor element surface and includes a two-dimensional image sensor are arranged in a predetermined position with respect to each other. An optical system mechanism arranged at an angle of An attachment member feeding mechanism that systematically moves horizontally in accordance with the element arrangement position, and an element feeding mechanism that is provided with the force setting and moves horizontally in accordance with the amount of information of the automatic positioning device. In order to attach the semiconductor element to the element attachment member, the semiconductor element is characterized by being equipped with a mechanism that automatically detects the element, corrects the position of the element, and automatically attaches it to the attachment member using an optical mechanism. .

次にこの発明を一実施例の半導体装置の製造装置につき
図面を参照して詳細に説明する。
Next, the present invention will be described in detail with reference to the drawings regarding an embodiment of a semiconductor device manufacturing apparatus.

この発明の一実施例装置の斜視図を示す第2図において
、12は展延性のシートで一例の0.2mm厚さの塩化
ビニールフイルムでなり、力セツトリング15に水平に
張架され下面に複数の半導体素子1,「・・・・・・・
・・をその能動面にて接着する。
In FIG. 2 showing a perspective view of an apparatus according to an embodiment of the present invention, reference numeral 12 is a malleable sheet made of vinyl chloride film with a thickness of 0.2 mm, which is stretched horizontally on a force setting ring 15 and has a lower surface. A plurality of semiconductor elements 1, ``...
... is glued on its active surface.

13はプツシュニードルで前記力セツトリングに対向し
垂直に下降し前記シートを介して素子を下方の素子取着
部材に押しつける如くなる。
A push needle 13 is opposed to the force setting ring and descends perpendicularly so as to press the element against the element mounting member below through the sheet.

次に前記プツシユニードルと同心にて下降し下面の素子
の1個を限りプツシユするバツクアツプリング6が前記
プツシユニードル13とタイミングを異にして上下動す
る如く上下動機構136によつて支持されてなる。また
、二次元イメージセンサを含む光学系機構7のセンター
はプツシユニードル13およびバツクアツプリング6の
軸心を含む垂直平面内にあり、垂直方向に対して光学系
機構を構成している部品の受光側、投光側の角度は夫々
20度に設定してシートからの反射光を除くに好適なら
しめるとともに直上方が空けるので、プツシユニードル
などの操作を容易にする。また、力セツトリング15は
力セツトリングホルダ15aにより保持されており、水
平移動が可能になる。さらに力セツトリングの下方の素
子取着部材8が水平方向に変位可になる素子送り機構8
0に配置され、縦、横方向の駆動手段のパルスモータ8
0Y,80Xによつて変位が微細に調整達成される。な
お、各部の相関自動駆動機構は後述することとし、各部
の動作の概要を第3図ないし第8図によつて工程順を追
つて説明する。第3図 プツシユニードル13、バツク
アツプリング6はいずれも力セツトリング15に張架さ
れた展延性シート12の上方にあり、かつ、素子1,1
″・・・・・・・・・はシートの下面に各能動面にて接
着されてなる。
Next, a back-up spring 6 that descends concentrically with the push unit needle and pushes one of the elements on the lower surface is supported by a vertical movement mechanism 136 so as to move up and down at different timing from the push unit needle 13. It will be done. Furthermore, the center of the optical system mechanism 7 including the two-dimensional image sensor is located within a vertical plane that includes the axes of the push unit needle 13 and the backup spring 6, and the parts constituting the optical system mechanism are aligned in the vertical direction. The angles of the light-receiving side and the light-emitting side are each set to 20 degrees to make it suitable for removing reflected light from the sheet, and the space directly above is left open, making it easier to operate the push needle and the like. Further, the force setting ring 15 is held by a force setting ring holder 15a, and can be moved horizontally. Furthermore, the element feeding mechanism 8 allows the element mounting member 8 below the force setting ring to be displaced in the horizontal direction.
A pulse motor 8 is arranged at 0 and serves as a driving means in the vertical and horizontal directions.
The displacement can be finely adjusted by 0Y and 80X. The interrelated automatic drive mechanism of each part will be described later, and the outline of the operation of each part will be explained step by step with reference to FIGS. 3 to 8. FIG. 3 The push unit needle 13 and the back-up spring 6 are both located above the malleable sheet 12 stretched over the force setting ring 15, and the elements 1, 1
"...... are glued to the bottom surface of the sheet at each active surface.

上記シートは一例の厚さ0.2mmの塩化ビニールフイ
ルムにて、半導体ウエハをシート上にて分割したのち、
シートを加熱延伸させる。素子取着部材8はシート12
の下方に配置され、上面には導電性接着層8aが設けら
れてなる。第4図 バツクアツプリング6が下降(破線
矢印)し、シートを押した状態で停止する。この状態で
光学系7の投光部7aから素子取着部材のパターンに反
射する不所望の反射光を防止するために一例の0,6m
m幅のスリツト光を投光し、受光部7bに内装された二
次元イメージセンサにはシート12を通過し素子表面か
らの反射光が再びシートを通過した光学的形状が画像と
して映写されており、この状態にてマイクロコンピユー
タ(処理部)は「素子あり」と判定する。ついで上記画
像に対し二次元イメージセンサ自体の絶対座標中心に対
する偏位を計算し、この値にもとづいた情報量のパルス
を素子の送り機構(150(第2図))に設置されてい
るパルスモータ(15X(図示なし)、15Y)に印加
し、これにより所定量の水平移動(X.Y方向)して素
子を位置合わせする。第5図 プツシユニードル13も
同時に下降し、展延性シート12を突き素子取着部材8
上に取着させる。第6図 バツクアツプリング6を上昇
させる。
The above sheet is an example of a 0.2 mm thick vinyl chloride film, and after dividing the semiconductor wafer on the sheet,
The sheet is heated and stretched. The element mounting member 8 is a sheet 12
The conductive adhesive layer 8a is provided on the upper surface. FIG. 4 Backup spring 6 descends (dashed arrow) and stops while pushing the sheet. In this state, in order to prevent undesired reflected light from being reflected from the light projecting part 7a of the optical system 7 to the pattern of the element mounting member,
A slit light having a width of m is projected, and the optical shape of the light that has passed through the sheet 12 and reflected from the element surface has passed through the sheet again is projected as an image on the two-dimensional image sensor installed in the light receiving section 7b. In this state, the microcomputer (processing section) determines that "the element is present." Next, the deviation with respect to the absolute coordinate center of the two-dimensional image sensor itself is calculated for the above image, and a pulse with an amount of information based on this value is sent to the pulse motor installed in the element feeding mechanism (150 (Fig. 2)). (15X (not shown), 15Y), thereby aligning the element by horizontal movement (in the X and Y directions) by a predetermined amount. FIG. 5 The push unit needle 13 also descends at the same time and pushes the malleable sheet 12 into the element attachment member 8.
Attach it on top. Figure 6 Raise the back up spring 6.

第7図 プツシユニードル13を上昇させる。第8図
前記上昇中に素子1を水平移動させる送り機構150(
第2図)のパルスモータ15X,15Yに信号が与えら
れ、予め設定された距離だけ動き次の素子をプツシユニ
ードル13およびバツクアツプリング6の下方に移動す
る。別の信号により素子取着部材も移動し次のものが定
位される。なお、上記プツシユニードル13およびバツ
クアツプリング6の上下動駆動は上下動機構136によ
つて実施される。
Figure 7 Raise the push unit needle 13. Figure 8
A feeding mechanism 150 (
A signal is given to the pulse motors 15X and 15Y of FIG. The element mounting member also moves in response to another signal, and the next one is positioned. Note that the push needle 13 and the back-up spring 6 are driven up and down by a vertical movement mechanism 136.

また、素子を所定距離だけ水平移動させるのは素子送り
機構150によつて達成される。さらに素子取着部材8
は素子取着部材支持台に載置され、素子取着部材送り機
構80によつて送られる。また、上記素子位置決めをは
じめ各部のコントロールの系統を第9図にプロツク図で
示す。
Further, horizontal movement of the element by a predetermined distance is achieved by the element feeding mechanism 150. Furthermore, the element mounting member 8
is placed on the element attachment member support stand and is sent by the element attachment member feeding mechanism 80. Further, the control system of each part including the above-mentioned element positioning is shown in a block diagram in FIG.

図におけるAは一例のマイクロコントローラでカメライ
ンターフエースNを内装し、インターフエース・ロジツ
クBに緊密な接続が施されるとともにデイジタルスイツ
チCを接続する。前記インターフエース・ロジツクBは
操作パネルF1ペレツト用エツジセンサwを備えXYテ
ーブル(第2図80)を直接駆動するパルスモータ(第
2図80X,80Y)との接続回路H、基板用エツジセ
ンサJ′を備えXYテーブル(第2図150)を直接駆
動するパルス・モータ(150X,150Y(ともに図
示省略))との接続回路Jの夫々に接続し、製造装置本
体K1ペレツトカウンタG1フオトアレーカメラと光学
系DからさらにモニタEの各々に接続しこれらに信号を
印加する。すなわち、光学系機構7が展延性シートを透
して前記素子を自動的に検出し、絶対座標中心に対して
の偏位量を算出し、これに対する情報量を指令するのは
マイクロコンピユータ(10第2図)(処理部)が、こ
の情報量に従つて素子を位置ぎめするのは素子送り機構
150が夫々実施する。また、素子が取着される素子取
着部材8は予めフ狛グラムされた所定距離だけ送り機構
80によつて移動される。そして1つの素子の取着作業
が終了すると素子送り機構150によつて素子取着部材
8がプログラムされた所定の距離だけX.Y方向(パル
スモータ80X,80Yにより)に水平移動し、同様の
操作が繰り返され次々に素子が素子取着部材8の上にマ
ウントされる。次の第10図はこの発明に力八る製造装
置の別の一実施例の装置を斜視図示するもので、第2図
に示した実施例の製造装置とは各部の配置を異ならしめ
てなり、各部の符号を第2図と同様に附して明確にした
A in the figure is an example of a microcontroller, which incorporates a camera interface N, is closely connected to an interface logic B, and is connected to a digital switch C. The interface logic B includes an operation panel F1, a pellet edge sensor w, a connection circuit H to a pulse motor (80X, 80Y in FIG. 2) that directly drives the XY table (80 in FIG. 2), and an edge sensor J' for the board. The pulse motors (150X, 150Y (both not shown)) that directly drive the equipped XY table (150 in Fig. 2) are connected to the connection circuits J, and the manufacturing equipment main body K1 pellet counter G1 photo array camera and optical The system D is further connected to each of the monitors E and a signal is applied thereto. That is, the optical system mechanism 7 automatically detects the element through the malleable sheet, calculates the amount of deviation with respect to the absolute coordinate center, and commands the amount of information for this by the microcomputer (10 The element feeding mechanism 150 (FIG. 2) (processing section) positions the elements according to this amount of information. Further, the element attachment member 8 to which the element is attached is moved by a predetermined distance determined in advance by the feeding mechanism 80. When the attachment work for one element is completed, the element attachment member 8 is moved by a predetermined programmed distance by the element feeding mechanism 150. The device is horizontally moved in the Y direction (by the pulse motors 80X and 80Y), and the same operation is repeated to mount the devices on the device mounting member 8 one after another. The following FIG. 10 is a perspective view of another embodiment of the manufacturing device according to the present invention, and the arrangement of each part is different from that of the manufacturing device of the embodiment shown in FIG. The symbols of each part have been added in the same way as in Figure 2 for clarity.

この発明によれば、半導体素子をこれが接着されたシー
トから直接素子取着部材上に直接マウントできる利点が
ある。
According to this invention, there is an advantage that the semiconductor element can be directly mounted on the element mounting member from the sheet to which the semiconductor element is bonded.

これには光学的機構により自動的に半導体素子の検出、
位置修正を施しつつ、かつ、バツクアツプリングによつ
て効率、歩留りとも良好に達成されることによつている
。まず、この発明にかかるバツクアツプリングの効果は
力セツトリングに張架されたシートの半導体素子に対す
る張着力がシートの部位、例えば中央部と端部に関係な
く一様にできることにある。
This includes automatically detecting semiconductor elements using an optical mechanism,
This is because both efficiency and yield can be achieved favorably by back-up springs while performing position correction. First, the effect of the back-up spring according to the present invention is that the tensioning force of the sheet suspended on the force-setting ring to the semiconductor element can be made uniform regardless of the portion of the sheet, for example, the center and the edges.

これは第12図に示すように、プツシユニードルで突く
ときシートに発生する応力Fl,f2(f1とF2とは
プツシユニードルを中にして反対側にある)がシートの
中央部でも端部でも常に相等しくなることである。これ
をさらに説明するためにバツクアツプリングを用いない
在来の技術では第11図に示すように、シートの端部で
はプツシユロツドを中にシートに発生する応力FC,f
≦とではfl>f≦となり、素子を矢印方向に傾斜回転
させることになる。このためプツシユロツドの突出距離
が制約され、前記距離の制約を超えて突出することが位
置ずれの要因をなしていた。この発明はバツクアツプリ
ングによつて半導体素子を中央にシートの一部を押して
この半導体素子が素子取着部材に充分接するようにした
のち、プツシユニードルによりマウントが施されること
と、第6図および第7図によつて示されるようにマウン
ト後にまずバツクアツプリングが退く(上昇する)が、
このときプツシユニードルは未だ半導体素子を素子取着
部材に押しているので、半導体素子からシートを剥離す
る際のシートの接着力を支持してマウント性を劣化させ
ないのである。さらに、プツシユニードルはシートを介
して半導体素子を押しマウントするもので、シートの接
着面に半導体素子の能動面が接着されていることからし
てもシートに開孔し、あるいはこれを破ることはしない
ので、シートがたるみ、破れないことがシートから始め
に取り出される半導体素子も、後に取り出される半導体
素子も変わりなくバツクアツプリングの効果と相まつて
一定の良好なマウントが達成できる利点がある。叙上の
如く、この発明には半導体素子のマウントにあたり半導
体素子が自動位置調整されつつシートを介して素子取着
部材上に直接マウントがなされるため位置ずれを生じに
くく、したがつて工程能率、マウント歩留、品質歩留等
において顕著な向上を示すとともに、シート土で隣り合
う半導体素子どうしが擦れないので半導体素子の破損も
極減する利点もある。
This is because, as shown in Figure 12, the stress Fl, f2 (f1 and F2 are on opposite sides of the sheet with the pusher needle inside) generated in the sheet when it is poked with the pusher needle is applied to both the center and the edge of the sheet. But they are always equal. To further explain this, in the conventional technology that does not use a back-up spring, as shown in FIG.
≦, fl>f≦, and the element is tilted and rotated in the direction of the arrow. For this reason, the protrusion distance of the push rod is restricted, and protrusion exceeding the distance restriction is a cause of misalignment. The present invention includes the following steps: after pushing a part of the sheet to the center of the semiconductor element using a back-up spring so that the semiconductor element is in sufficient contact with the element mounting member, the semiconductor element is mounted using a push unit needle; As shown in Fig. 7 and Fig. 7, the back-up spring first retreats (raises) after mounting;
At this time, the push needle is still pushing the semiconductor element against the element mounting member, so that the adhesive force of the sheet is supported when the sheet is peeled off from the semiconductor element, and the mountability is not deteriorated. Furthermore, the push unit needle is used to press and mount the semiconductor device through a sheet, and since the active surface of the semiconductor device is adhered to the adhesive surface of the sheet, there is no risk of puncturing or tearing the sheet. Since the sheet does not sag or tear, both the semiconductor elements taken out first from the sheet and the semiconductor elements taken out later have the advantage that a certain good mounting can be achieved in combination with the back-up spring effect. As mentioned above, in the present invention, when mounting a semiconductor element, the semiconductor element is automatically positioned and mounted directly on the element mounting member via a sheet, so that positional deviation is less likely to occur, and therefore process efficiency is improved. In addition to showing remarkable improvements in mounting yield, quality yield, etc., there is also the advantage that damage to semiconductor elements is greatly reduced because adjacent semiconductor elements do not rub against each other due to the sheet soil.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の半導体装置の製造装置の断面図、第2図
はこの発明の一実施例の半導体装置の製造装置の斜視図
、第3図ないし第8図はこの発明の一実施例の半導体装
置の製造装置によるマウント工程を示すいずれも一部断
面にて示す側面図、第9図は製造装置におけるコントロ
ール系統を示すプロツク図、第10図はこの発明の別の
実施例を示す斜視図、第11図は従来のプツシユロツド
の動作を説明するための断面図、第12図はこの発明に
かかるバツクアツプリングを説明するための断面図であ
る。 なお、図中同一符号は同一または相当部分を夫々示す。
1,1/・・・・・・素子、6・・・・・・バツクアツ
プリング、7・・・・・・光学系機構、7a,7b・・
・・・・光学系機構にぉける発光部、8・・・・・・素
子取着部材、10・・・・・・コントロール部、12・
・・・・・展延性のシート、13・・・・・・プツシユ
ニードル、15・・・・・・力セツトリング、15X,
15Y・・・・・・力セツトリングの水平移動用パルス
モータ、80・・・・・・素子取着部材送り機構、80
X,80Y・・・・・・素子取着部材送り機構の水平移
動パルスモータ、136・・・・・・プツシユニードル
およびバックアツプリングの上下動機構、150・・・
・・・力セツトリングの水平移動機構。
1 is a sectional view of a conventional semiconductor device manufacturing apparatus, FIG. 2 is a perspective view of a semiconductor device manufacturing apparatus according to an embodiment of the present invention, and FIGS. 3 to 8 are a sectional view of a conventional semiconductor device manufacturing apparatus according to an embodiment of the present invention. FIG. 9 is a side view, partially in cross section, showing the mounting process using the semiconductor device manufacturing equipment; FIG. 9 is a block diagram showing the control system in the manufacturing equipment; and FIG. 10 is a perspective view showing another embodiment of the present invention. 11 is a cross-sectional view for explaining the operation of a conventional push rod, and FIG. 12 is a cross-sectional view for explaining the back-up spring according to the present invention. Note that the same reference numerals in the figures indicate the same or corresponding parts, respectively.
1,1/... Element, 6... Backup spring, 7... Optical system mechanism, 7a, 7b...
... Light emitting section in the optical system mechanism, 8 ... Element mounting member, 10 ... Control section, 12.
...Multiple sheet, 13...Push unit needle, 15...Force setting, 15X,
15Y...Pulse motor for horizontal movement of force setting, 80...Element attachment member feeding mechanism, 80
X, 80Y...Horizontal movement pulse motor of element mounting member feeding mechanism, 136...Vertical movement mechanism of push unit needle and back up spring, 150...
...Horizontal movement mechanism for force settling.

Claims (1)

【特許請求の範囲】[Claims] 1 複数の半導体素子をその能動面にて接着されたシー
トをその半導体素子を下側に水平に張架したカセットリ
ングと、前記カセットリング内の半導体素子の1個を中
心にシートを押し下げ下方の半導体素子取着部材に前記
半導体素子を接触させるバックアップリングと、前記バ
ックアップリングの下降についでこれと同心に下降して
前記半導体素子をシートを介しかつシートを破らずに素
子取着部材に押しつけるとともに押しつけ後に前記バッ
クアップリングの上昇後に上昇するプッシュニードルと
、前記プッシュニードルとバックアップリングとを前記
相関をもつて上下動させる上下動機構と、前記展延性シ
ートを透して半導体素子面にスリット光を投射する投光
部および前記透光の半導体素子面における反射像を受像
し二次元イメージセンサを含む受光部が互いに所定の角
度にて配設された光学系機構と、前記受像パターンと二
次元イメージセンサの絶対座標に対する偏位を補正する
マイクロコンピュータを含む自動位置決め装置部と、半
導体素子取着部材を載置しこの素子配置位置に対応して
系統的に水平移動させる取着部材送り機構と、前記カセ
ットリングが配設され前記自動位置決め装置の情報量に
対応して水平移動する素子送り機構とを具備した半導体
装置の製造装置。
1 A cassette ring in which a sheet to which a plurality of semiconductor devices are glued on their active surfaces is stretched horizontally with the semiconductor devices below; a backup ring that brings the semiconductor element into contact with the semiconductor element attachment member; and a backup ring that descends concentrically with the backup ring after the descent of the backup ring to press the semiconductor element against the element attachment member through the sheet without tearing the sheet; a push needle that rises after the backup ring rises after pressing; a vertical movement mechanism that moves the push needle and the backup ring up and down with the correlation; and a slit light beam that passes through the malleable sheet and onto the semiconductor element surface. an optical system mechanism in which a light projecting section for projecting light and a light receiving section that receives a reflected image on the light-transmitting semiconductor element surface and includes a two-dimensional image sensor are arranged at a predetermined angle to each other; and the image receiving pattern and the two-dimensional image. an automatic positioning device section including a microcomputer that corrects the deviation of the sensor with respect to the absolute coordinates; a mounting member feeding mechanism for placing a semiconductor element mounting member and systematically horizontally moving the semiconductor element mounting member in accordance with the element placement position; A semiconductor device manufacturing apparatus comprising: an element feeding mechanism in which the cassette ring is disposed and moves horizontally in accordance with the amount of information of the automatic positioning device.
JP53142826A 1978-11-21 1978-11-21 Semiconductor device manufacturing equipment Expired JPS596058B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53142826A JPS596058B2 (en) 1978-11-21 1978-11-21 Semiconductor device manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53142826A JPS596058B2 (en) 1978-11-21 1978-11-21 Semiconductor device manufacturing equipment

Publications (2)

Publication Number Publication Date
JPS5570041A JPS5570041A (en) 1980-05-27
JPS596058B2 true JPS596058B2 (en) 1984-02-08

Family

ID=15324508

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53142826A Expired JPS596058B2 (en) 1978-11-21 1978-11-21 Semiconductor device manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS596058B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5850751A (en) * 1981-09-22 1983-03-25 Shinkawa Ltd Replacing method for die
RU2468733C2 (en) 2008-11-28 2012-12-10 Масаси ЯМАСАКИ Table electric mixer
DE102011017218B4 (en) * 2011-04-15 2018-10-31 Mühlbauer Gmbh & Co. Kg Apparatus and method for transferring electronic components from a first carrier to a second carrier
DE102018006771B4 (en) 2018-08-27 2022-09-08 Mühlbauer Gmbh & Co. Kg Device and method for transferring electronic components from a first to a second carrier
DE102018006760A1 (en) 2018-08-27 2020-02-27 Mühlbauer Gmbh & Co. Kg Inspection when transferring electronic components from a first to a second carrier
DE102020001439B3 (en) * 2020-02-21 2021-06-10 Mühlbauer Gmbh & Co. Kg Apparatus and method for transferring electronic components from a first to a second carrier
DE102020005484A1 (en) 2020-09-07 2022-03-10 Mühlbauer Gmbh & Co. Kg Devices and methods for operating at least two tools

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5065172A (en) * 1973-10-09 1975-06-02
JPS52149070A (en) * 1976-06-07 1977-12-10 Toshiba Corp Locating and inspecting method for semiconductor parts and die bonding device using the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5065172A (en) * 1973-10-09 1975-06-02
JPS52149070A (en) * 1976-06-07 1977-12-10 Toshiba Corp Locating and inspecting method for semiconductor parts and die bonding device using the same

Also Published As

Publication number Publication date
JPS5570041A (en) 1980-05-27

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