JPS5960264A - Signal detection circuit - Google Patents
Signal detection circuitInfo
- Publication number
- JPS5960264A JPS5960264A JP17073782A JP17073782A JPS5960264A JP S5960264 A JPS5960264 A JP S5960264A JP 17073782 A JP17073782 A JP 17073782A JP 17073782 A JP17073782 A JP 17073782A JP S5960264 A JPS5960264 A JP S5960264A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- converter
- offset voltage
- signal detection
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
Abstract
Description
【発明の詳細な説明】
本発明は信号検出回路、特にオフセット電圧を補償する
信号検出回路に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a signal detection circuit, and more particularly to a signal detection circuit that compensates for offset voltage.
従来、信号検出回路に於けるオフセット電圧補イ′1(
は抵抗トリミングや容量素子への電荷蓄積等の方法があ
ったが、抵抗トリミングは工数、時間がかかり高価であ
る。寸た容量素子を用いる方法は、有限の時間内に完全
にオフセット電圧を補償することはできないという欠点
があった。Conventionally, offset voltage compensation in a signal detection circuit A'1 (
There were methods such as resistor trimming and charge storage in a capacitive element, but resistor trimming requires a lot of man-hours, is time consuming, and is expensive. The method using a small capacitive element has the disadvantage that it is not possible to completely compensate for the offset voltage within a finite time.
本究明の目的は短時間で、安価にしかも高精度にオフセ
ット電圧を補償できる信号検出回路を提供することにあ
る。The purpose of this research is to provide a signal detection circuit that can compensate offset voltage in a short time, at low cost, and with high precision.
本発明によればA/D変換器と該A/D fi換器出力
の情報を保持する2つの記憶回路と該記憶回路の情報を
処理する演算回路とを備えた信号検出回路が得られる。According to the present invention, a signal detection circuit can be obtained that includes an A/D converter, two memory circuits that hold information on the output of the A/D fi converter, and an arithmetic circuit that processes the information in the memory circuit.
以下本発明について図面を参照して説明する。The present invention will be explained below with reference to the drawings.
第1図は本発明の一実施例を示すブロック図である。S
tダイアフラム型型圧上センサ信号を検出する例で、破
線で囲まれたブロック1は拡散抵抗で構成したブリッジ
である。端子2,3は電源端子で端子4,5は出力端子
である。出力端子から得られる電圧信号をA/D変換器
6に入力し、ディジタル出力をスイッチ7によりデータ
保持回路8または校正回路9に転送する。10は2進減
算回路でデータ保持回路8と校正回路9の減算を行う。FIG. 1 is a block diagram showing one embodiment of the present invention. S
In this example, a block 1 surrounded by a broken line is a bridge made of a diffused resistor in an example of detecting a t-diaphragm pressure-up sensor signal. Terminals 2 and 3 are power supply terminals, and terminals 4 and 5 are output terminals. The voltage signal obtained from the output terminal is input to the A/D converter 6, and the digital output is transferred to the data holding circuit 8 or the calibration circuit 9 by the switch 7. 10 is a binary subtraction circuit that performs subtraction between the data holding circuit 8 and the calibration circuit 9.
次に信号検出の方法について述べる。ブリッジ1の出力
端子4,5には圧力を加えていない状態でも抵抗値のば
らつきや組立時の歪によシオフセット電圧が発生してい
る。またA/D変換器6も素子のばらつきに起因するオ
フセット電圧を有する。Next, the method of signal detection will be described. Even when no pressure is applied to the output terminals 4 and 5 of the bridge 1, an offset voltage is generated due to variations in resistance value and distortion during assembly. Further, the A/D converter 6 also has an offset voltage due to variations in elements.
との(;トなオフセット市川が有ると信号の正6(It
な絶71計を検出できな−、そこで先ずスイッチ7を校
正回路9に接続し、ブリッジlとA/D変換器6の合成
オフセット電圧のディジタル値を校正回路9に保持して
おく、次にスイッチ7をデータ保持回路8に接続し、圧
力を印加した状態のA/D変換出力をデータ保持回路8
に保持する。データ保持回路8には真の信号電圧以外に
前記合成オフセット電圧が含まれる。データ保持回路8
及び校正回路9はいづれもフロップ・フロップの様な2
値4¥を報記憶回路であシ、ピット数はA/D変換器6
の出力と同桁数とする。データ保持回路8及び校正回路
9への人力方式は【灯列でも並列でも良い。If there is an offset Ichikawa, the positive 6 of the signal (It
71 cannot be detected, so first connect the switch 7 to the calibration circuit 9 and hold the digital value of the combined offset voltage of the bridge 1 and the A/D converter 6 in the calibration circuit 9. The switch 7 is connected to the data holding circuit 8, and the A/D conversion output with pressure applied is sent to the data holding circuit 8.
to hold. The data holding circuit 8 includes the composite offset voltage in addition to the true signal voltage. Data holding circuit 8
and the calibration circuit 9 are both like flop-flops.
The value 4 yen is sent by the information storage circuit, and the number of pits is 6 by the A/D converter.
The number of digits is the same as the output of . The data holding circuit 8 and the calibration circuit 9 can be operated manually by either a row of lights or parallel lights.
最後に2進(成層]回路10によシデータ保持回路8に
保持されている値から校正回路9に保持されているオフ
セット量を減3りし、真の信号値を得ることが出来る。Finally, the binary (stratification) circuit 10 subtracts the offset amount held in the calibration circuit 9 from the value held in the data holding circuit 8 to obtain the true signal value.
校正のタイミングはバ1測め度に行なりても良いしi(
u 佇を投入した時だけに行なっても良い。The timing of calibration may be done at the first measurement level.
You may do this only when you insert u.
次変換型でも艮い。また1から10のブロックは1チツ
プのシリコン基板上に集稙化が可能である。The following conversion type also works. Further, blocks 1 to 10 can be assembled on one silicon substrate.
ブロック1に示しだセンサ部分はStダイアフラム型圧
カセセンに限定されるものではなく他のセンサでも良い
。第2図に本発明の他の実施例のブロック図を示す。破
りで示したブロック1はホール素子で端子2及び3は電
流端子で端子4及び5は電圧端子である。紙面に垂直に
磁界を印加すると前記′1)−1圧端子間に磁束台度に
比例する信号電圧が発生する、ホール素子の場合、電圧
端子位置の不整合によりオフセット電圧が発生する。ブ
ロック6〜10は第1図のブロックと同一であり、オフ
セット電圧の校正方法の同一である、
本発明による校正方法はレーザトリミング等に比べ極め
て短時間にでき、しかも−m校正すると電源を遮断する
まではオフセット量は校正回路に保持されているので校
正は不要で、減算操作のみにより真の信号を高精度に得
られる。通常の徂°稍回路技術で、分解能1mV程度の
A/D変換器は容易に、f1′jもれるので、オフセッ
ト電圧を1mVまで減らすことが出来る。The sensor portion shown in block 1 is not limited to the St diaphragm type pressure sensor, but may be any other sensor. FIG. 2 shows a block diagram of another embodiment of the invention. Block 1 shown as broken is a Hall element, terminals 2 and 3 are current terminals, and terminals 4 and 5 are voltage terminals. In the case of a Hall element, in which a signal voltage proportional to the magnetic flux level is generated between the voltage terminals '1) and 1 when a magnetic field is applied perpendicular to the plane of the paper, an offset voltage is generated due to misalignment of the voltage terminal positions. Blocks 6 to 10 are the same as the blocks in Figure 1, and the offset voltage calibration method is the same.The calibration method according to the present invention can be performed in an extremely short time compared to laser trimming, etc., and moreover, the power is cut off after -m calibration. Until then, the offset amount is held in the calibration circuit, so there is no need for calibration, and the true signal can be obtained with high precision just by subtracting. With ordinary advanced circuit technology, an A/D converter with a resolution of about 1 mV easily leaks f1'j, so the offset voltage can be reduced to 1 mV.
第1図は本発明の一実施例であるStダイアフラム型I
Fカセセンの信号検出回路のブロック図で、第2図は本
発明の仙の実施例であるポール素子磁気センサの信号検
出回路のブロック図である。
1・・・センサ
2、:3・・・電鯨端子(11を流端子)4.5・・・
出力端子 6・・・A/D変換器7・・・スイッチ
8・・・データ保持回路9・・・仔〕正回路
】0・・・減算回路31FIG. 1 shows a St diaphragm type I which is an embodiment of the present invention.
FIG. 2 is a block diagram of the signal detection circuit of the F-type magnetic sensor, and FIG. 2 is a block diagram of the signal detection circuit of the pole element magnetic sensor which is the third embodiment of the present invention. 1...Sensor 2, :3...Electric whale terminal (11 is flow terminal) 4.5...
Output terminal 6...A/D converter 7...Switch 8...Data holding circuit 9...Positive circuit
]0...Subtraction circuit 31
Claims (1)
つのh旧煮回路と該記憶回路の情報を処理する演算回路
とを(、il“」えたことを特徴とする信号検出回路。Holding information on the A/D converter and the output of the A/D converter 2
A signal detection circuit characterized in that it includes two conventional circuits and an arithmetic circuit for processing information in the memory circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17073782A JPS5960264A (en) | 1982-09-29 | 1982-09-29 | Signal detection circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17073782A JPS5960264A (en) | 1982-09-29 | 1982-09-29 | Signal detection circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5960264A true JPS5960264A (en) | 1984-04-06 |
Family
ID=15910446
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17073782A Pending JPS5960264A (en) | 1982-09-29 | 1982-09-29 | Signal detection circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5960264A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04103810U (en) * | 1991-01-17 | 1992-09-08 | 紀伊産業株式会社 | Container with built-in cosmetic container |
JP2009281771A (en) * | 2008-05-20 | 2009-12-03 | Honda Motor Co Ltd | Current sensor |
-
1982
- 1982-09-29 JP JP17073782A patent/JPS5960264A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04103810U (en) * | 1991-01-17 | 1992-09-08 | 紀伊産業株式会社 | Container with built-in cosmetic container |
JP2009281771A (en) * | 2008-05-20 | 2009-12-03 | Honda Motor Co Ltd | Current sensor |
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