JPS5942955U - Object surface defect detection device - Google Patents

Object surface defect detection device

Info

Publication number
JPS5942955U
JPS5942955U JP14052082U JP14052082U JPS5942955U JP S5942955 U JPS5942955 U JP S5942955U JP 14052082 U JP14052082 U JP 14052082U JP 14052082 U JP14052082 U JP 14052082U JP S5942955 U JPS5942955 U JP S5942955U
Authority
JP
Japan
Prior art keywords
scanning
laser beam
start pulse
photoelectric converter
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14052082U
Other languages
Japanese (ja)
Inventor
雅良 島田
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP14052082U priority Critical patent/JPS5942955U/en
Publication of JPS5942955U publication Critical patent/JPS5942955U/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、従来の物体表面の欠陥検出装置の概略構成図
;第2図は、第1図に示す光電変換器から出力された信
号を欠陥検出波形として検出するためのブロック回路図
;第3図は、第2図に示す夫々該当する個所で得られる
波形図;第4図は、被検査物体の表面構造によって異な
るレーザ光の異なる走査入力波形図;第5図は、この考
案の一実施例を示す物体表面の欠陥検出装置の概略構成
図;第6図は、第5図に示す光電変換器から出力された
信号を欠陥検出波形として検出するためのブロック図;
及び第7図は第6図に示す夫々該当する個所で得られる
波形図である。 1、 2. 3・・・レーザ光発振装置、14・・・ス
タートパルス検出器、6・・・光電変換器、17・・・
記憶回路、20・・・演算回路、22・・・比較回路。
FIG. 1 is a schematic configuration diagram of a conventional object surface defect detection device; FIG. 2 is a block circuit diagram for detecting a signal output from the photoelectric converter shown in FIG. 1 as a defect detection waveform; Figure 3 is a waveform diagram obtained at each corresponding point shown in Figure 2; Figure 4 is a diagram of different scanning input waveforms of laser beams that differ depending on the surface structure of the object to be inspected; Figure 5 is a diagram of one part of this invention. A schematic configuration diagram of an object surface defect detection device showing an embodiment; FIG. 6 is a block diagram for detecting a signal output from the photoelectric converter shown in FIG. 5 as a defect detection waveform;
and FIG. 7 are waveform diagrams obtained at corresponding locations shown in FIG. 6, respectively. 1, 2. 3... Laser beam oscillation device, 14... Start pulse detector, 6... Photoelectric converter, 17...
Memory circuit, 20... Arithmetic circuit, 22... Comparison circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検査物体の表面にレーザ光を走査するためのレーザ光
発振装置と;前記走査の開始を検出するスタートパルス
検出器と;前記被検査物体の表面に走査された反射され
たレーザ光を光電変換する光電変換器と;予め欠陥のな
い標準サンプルの表面情報を、前記スタートパルス検出
器からのスタートパルスを起点として、前記光電変換器
を介して入力され記憶する記憶回路と;前記被検査物体
の表面がレーザ光を走査され前記光電変換器を介して得
られた表面情報信号と前記記憶回路からスタートパルス
を起点として走査に同期させて、出力された標準サンプ
ルの標準波形信号とを入力して演算し、正規された走査
波形信号を出力する演−算回路と;前記演算回路からの
出力を基準信号と比較して表面欠陥情報を再現する波形
信号を得る比較回路とより成る物体表面の欠陥検出装置
a laser beam oscillator for scanning the surface of the object to be inspected with a laser beam; a start pulse detector for detecting the start of the scanning; a photoelectric converter for the reflected laser beam scanned on the surface of the object to be inspected; a storage circuit that inputs and stores surface information of a standard sample having no defects in advance through the photoelectric converter starting from a start pulse from the start pulse detector; A surface information signal obtained by scanning the surface with a laser beam through the photoelectric converter and a standard waveform signal of the standard sample outputted from the storage circuit in synchronization with scanning with a start pulse as a starting point are inputted. A defect on the surface of an object, comprising: an arithmetic circuit that calculates and outputs a normalized scanning waveform signal; and a comparison circuit that compares the output from the arithmetic circuit with a reference signal to obtain a waveform signal that reproduces surface defect information. Detection device.
JP14052082U 1982-09-16 1982-09-16 Object surface defect detection device Pending JPS5942955U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14052082U JPS5942955U (en) 1982-09-16 1982-09-16 Object surface defect detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14052082U JPS5942955U (en) 1982-09-16 1982-09-16 Object surface defect detection device

Publications (1)

Publication Number Publication Date
JPS5942955U true JPS5942955U (en) 1984-03-21

Family

ID=30314577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14052082U Pending JPS5942955U (en) 1982-09-16 1982-09-16 Object surface defect detection device

Country Status (1)

Country Link
JP (1) JPS5942955U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS639853A (en) * 1986-06-30 1988-01-16 Konica Corp Defect detection method for eliminating detection signal noise

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS639853A (en) * 1986-06-30 1988-01-16 Konica Corp Defect detection method for eliminating detection signal noise

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