JPS5933260U - semiconductor equipment - Google Patents
semiconductor equipmentInfo
- Publication number
- JPS5933260U JPS5933260U JP12988882U JP12988882U JPS5933260U JP S5933260 U JPS5933260 U JP S5933260U JP 12988882 U JP12988882 U JP 12988882U JP 12988882 U JP12988882 U JP 12988882U JP S5933260 U JPS5933260 U JP S5933260U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor equipment
- semiconductor
- semiconductor element
- sensor
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は半導体装置の一例を示す一部透視平面図、第２
図は第１図側面図、第３図は第１図半導体装置のブロッ
クダイアグラム、第４図は保護部の一例を示す回路図、
第５図は本考案の一実施例を示す半導体装置の一部透視
平面図、第６図は第５図側面図、第７図は第５図装置に
用いられた半導体ペレットの平面図、第８図は特性チェ
ック用半導体素子を有する保護部の回路図を示す。
１５・・・センサー用半導体素子、２３・・・半導体ペ
レット、２４・・・特性チェック用半導体素子。FIG. 1 is a partially transparent plan view showing an example of a semiconductor device, and FIG.
1 is a side view, FIG. 3 is a block diagram of the semiconductor device in FIG. 1, and FIG. 4 is a circuit diagram showing an example of a protection section.
5 is a partially perspective plan view of a semiconductor device showing an embodiment of the present invention, FIG. 6 is a side view of the semiconductor device shown in FIG. 5, and FIG. 7 is a plan view of a semiconductor pellet used in the device shown in FIG. FIG. 8 shows a circuit diagram of a protection section having a semiconductor element for characteristic checking. 15... Semiconductor element for sensor, 23... Semiconductor pellet, 24... Semiconductor element for characteristic check.
Claims (1)
部を形成したものにおいて、上記センサー用半導体素子
の近傍に特性チェック用半導体素子を配置形成したこと
を特徴とする半導体装置。1. A semiconductor device in which a protection part including a semiconductor element for a sensor is formed in a semiconductor pellet, characterized in that a semiconductor element for characteristic checking is arranged and formed in the vicinity of the semiconductor element for a sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12988882U JPS5933260U (en) | 1982-08-27 | 1982-08-27 | semiconductor equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12988882U JPS5933260U (en) | 1982-08-27 | 1982-08-27 | semiconductor equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5933260U true JPS5933260U (en) | 1984-03-01 |
Family
ID=30294158
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12988882U Pending JPS5933260U (en) | 1982-08-27 | 1982-08-27 | semiconductor equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5933260U (en) |
-
1982
- 1982-08-27 JP JP12988882U patent/JPS5933260U/en active Pending
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