JPS593309A - 測地機器用水準台 - Google Patents

測地機器用水準台

Info

Publication number
JPS593309A
JPS593309A JP10034683A JP10034683A JPS593309A JP S593309 A JPS593309 A JP S593309A JP 10034683 A JP10034683 A JP 10034683A JP 10034683 A JP10034683 A JP 10034683A JP S593309 A JPS593309 A JP S593309A
Authority
JP
Japan
Prior art keywords
optical
geodetic
adjustment element
level
geodetic instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10034683A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0345770B2 (enrdf_load_stackoverflow
Inventor
マ−チン・ケツペル
ヨセフ・アイゼンリング
ヴイルフリ−ト・ピスケ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Geosystems AG
Original Assignee
Wild Heerbrugg AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wild Heerbrugg AG filed Critical Wild Heerbrugg AG
Publication of JPS593309A publication Critical patent/JPS593309A/ja
Publication of JPH0345770B2 publication Critical patent/JPH0345770B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/30—Supports specially adapted for an instrument; Supports specially adapted for a set of instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Telescopes (AREA)
  • Accessories Of Cameras (AREA)
  • Sewage (AREA)
  • Details Of Measuring And Other Instruments (AREA)
JP10034683A 1982-06-08 1983-06-07 測地機器用水準台 Granted JPS593309A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH353382A CH656457A5 (de) 1982-06-08 1982-06-08 Dreifuss fuer geodaetische instrumente.
CH3533/82-3 1982-06-08

Publications (2)

Publication Number Publication Date
JPS593309A true JPS593309A (ja) 1984-01-10
JPH0345770B2 JPH0345770B2 (enrdf_load_stackoverflow) 1991-07-12

Family

ID=4258045

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10034683A Granted JPS593309A (ja) 1982-06-08 1983-06-07 測地機器用水準台

Country Status (4)

Country Link
JP (1) JPS593309A (enrdf_load_stackoverflow)
CH (1) CH656457A5 (enrdf_load_stackoverflow)
DE (1) DE3317732A1 (enrdf_load_stackoverflow)
SE (1) SE455017B (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6231589A (ja) * 1985-08-02 1987-02-10 Nippon Kokan Kk <Nkk> 索のくり出しくり入れ装置
CN105115482A (zh) * 2015-08-17 2015-12-02 苏州华徕光电仪器有限公司 一种三爪固定基座

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1207369A1 (de) * 2000-11-17 2002-05-22 Leica Geosystems AG Sensorträger zur Durchführung zentrierter Aufstellungen
DE202005018286U1 (de) 2005-11-21 2007-03-29 Stabila-Meßgeräte Gustav Ullrich GmbH Lasermessgerät
CN102889460A (zh) * 2011-12-16 2013-01-23 西安科技大学 陀螺全站仪强制对准连接装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5341986A (en) * 1976-09-29 1978-04-15 Toshiba Corp Production of semiconductor unit
JPS54156664A (en) * 1978-05-31 1979-12-10 Tokyo Optical Base plate for measuring instrument

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5341986A (en) * 1976-09-29 1978-04-15 Toshiba Corp Production of semiconductor unit
JPS54156664A (en) * 1978-05-31 1979-12-10 Tokyo Optical Base plate for measuring instrument

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6231589A (ja) * 1985-08-02 1987-02-10 Nippon Kokan Kk <Nkk> 索のくり出しくり入れ装置
CN105115482A (zh) * 2015-08-17 2015-12-02 苏州华徕光电仪器有限公司 一种三爪固定基座

Also Published As

Publication number Publication date
CH656457A5 (de) 1986-06-30
SE8303170L (sv) 1983-12-09
SE8303170D0 (sv) 1983-06-06
SE455017B (sv) 1988-06-13
JPH0345770B2 (enrdf_load_stackoverflow) 1991-07-12
DE3317732C2 (enrdf_load_stackoverflow) 1992-03-05
DE3317732A1 (de) 1983-12-08

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