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Application filed by 原電子測器株式会社filedCritical原電子測器株式会社
Priority to JP1976064216UpriorityCriticalpatent/JPS5925007Y2/ja
Publication of JPS52155587UpublicationCriticalpatent/JPS52155587U/ja
Application grantedgrantedCritical
Publication of JPS5925007Y2publicationCriticalpatent/JPS5925007Y2/ja
Method and device for nondestructively inspecting elongated objects for structural defects using longitudinally arranged magnet means and sensor means disposed immediately downstream therefrom