JPS59222996A - Device for holding hanger in surface treating equipment - Google Patents

Device for holding hanger in surface treating equipment

Info

Publication number
JPS59222996A
JPS59222996A JP58097397A JP9739783A JPS59222996A JP S59222996 A JPS59222996 A JP S59222996A JP 58097397 A JP58097397 A JP 58097397A JP 9739783 A JP9739783 A JP 9739783A JP S59222996 A JPS59222996 A JP S59222996A
Authority
JP
Japan
Prior art keywords
contact
conical
current supply
hole
voltage detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58097397A
Other languages
Japanese (ja)
Inventor
苅谷 進
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chuo Seisakusho KK
Original Assignee
Chuo Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chuo Seisakusho KK filed Critical Chuo Seisakusho KK
Priority to JP58097397A priority Critical patent/JPS59222996A/en
Publication of JPS59222996A publication Critical patent/JPS59222996A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は、印刷配線板のメッキ被覆されたスルホールの
、そのメッキ部の抵抗測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for measuring the resistance of a plated portion of a plated through hole of a printed wiring board.

スルホールメッキ部のメッキ厚や、メッキ品質を知る方
法として、顕微鏡による断面法や、ベータ反射型測定装
置を使用する方法がある。ところで、前者は、試験片を
スルホール部からνJ除したり、エツチング等の処理を
要する等のため試験片の作成に手間とって、測定が極め
て面倒であり、後者は、メ・2キ被覆の割れ目、空洞等
の検出が不能である等のため前記検出に適しているとは
いえない。
Methods for determining the plating thickness and plating quality of through-hole plating areas include cross-sectional methods using a microscope and methods using a beta reflection type measuring device. By the way, the former method requires a lot of time and effort to prepare the test piece because it requires removal of νJ from the through-hole part, etching, etc., and the measurement is extremely troublesome. Since it is impossible to detect cracks, cavities, etc., it cannot be said that it is suitable for the above-mentioned detection.

そこでこれらの欠点のない容易簡便な方法として、メッ
キ部の電圧降下による抵抗を測定する抵抗測定法がある
Therefore, as an easy and simple method that does not have these drawbacks, there is a resistance measurement method that measures the resistance due to the voltage drop in the plated portion.

ところで、かかる抵抗とメッキ厚との関係は次式で表さ
れる。
By the way, the relationship between such resistance and plating thickness is expressed by the following equation.

R=ρT/π(D+t)t ここで R:抵抗 T;基板の厚さ D;スルホールの内径 t;スルホールにおけるメッキ厚 ρ;メッキ銅の比抵抗 前式において例えばT=1.ffmm、D=Imm、t
=25g m、p= 1.72X 1O−6Q caト
すルトR=350gQ 、!: すり、電流をLA流し
たとして、350 =vの微小な電圧降下しか得ること
ができず、測定が難かしい。
R=ρT/π(D+t)t where R: resistance T; substrate thickness D; inner diameter t of through-hole; plating thickness ρ in through-hole; resistivity of plated copper In the previous equation, for example, T=1. ffmm, D=Imm, t
= 25g m, p = 1.72X 1O-6Q catosult R = 350gQ,! : If a current is passed through LA, only a minute voltage drop of 350 = v can be obtained, which is difficult to measure.

そこで前記抵抗測定を精密におこなうため、電流供給と
抵抗測定とを別異の接点にして、各々の接点をスルホー
ルの上口縁と下田縁に接触させる4端子法が用いられる
Therefore, in order to accurately measure the resistance, a four-terminal method is used in which current supply and resistance measurement are made using different contacts, and each contact is brought into contact with the upper edge and lower edge of the through hole.

この4端子法に適応する測定装置として、特開昭50−
100572で開示されているように、円錐状電極の先
端から錐方向に沿った小山面部を電圧検出接点とし、他
面部を電流供給接点として、夫々を絶縁することにより
前記円錐状電極に電流供給接点と、電圧検出接点とを形
成し、印刷配線板のメッキ被覆されたスルホールの1円
周縁と下田周縁とに、夫々前記円錐状電極の円錐面を当
てて、電流供給と抵抗測定とをおこなうものがある。
As a measuring device adapted to this four-terminal method,
No. 100572, the conical electrode has a small ridge extending from its tip in the conical direction as a voltage detection contact, and the other surface serves as a current supply contact, and by insulating each of them, a current supply contact is provided to the conical electrode. and a voltage detection contact, and current supply and resistance measurement are performed by applying the conical surface of the conical electrode to the circumferential edge of a plating-covered through hole of the printed wiring board and the circumferential edge of Shimoda, respectively. There is.

ところで配線板のスルホールの加工は、両面に銅箔を岬
節した基板にドリルで孔開けした後、前記スルホールの
内周面に銅メッキをして基板両面の銅箔を電気的に接続
して施すものであって、この後前記基板の両面には回路
が施される。このため、前記スルホールはドリルにより
穿設され、かつ基板のまくれも加わって真円にはならな
い。従って、前記円錐状電極をスルホールの上下円周縁
に当てた場合、その全周縁に電極が接触することにはな
らず、一部のみ接触し、場合によっては電圧検出接点は
円錐状電極の先端から錐方向に沿った小rtJ形状であ
るから、該接点がスルポールの周縁に接触しないことが
ある。また、上下の電流供給接点の位置により、抵抗値
が変るが、第5図CI)で示すように前記構成では、そ
の接触部が不定となり、かつ接触線xr、x2に分断さ
れるから、同一スルホールにおいての測定値が変動し、
再現性のない数値が表れることとなる。このことを第6
図のグラフに従って、さらに詳細に説明する。
By the way, through-holes on a wiring board are processed by drilling holes in a board with copper foil capped on both sides, then copper plating the inner circumferential surface of the through-hole, and electrically connecting the copper foils on both sides of the board. After that, circuits are applied to both sides of the substrate. For this reason, the through holes are drilled with a drill, and due to the curling of the substrate, they are not perfectly circular. Therefore, when the conical electrode is applied to the upper and lower circumferential edges of the through hole, the electrode does not come into contact with the entire circumferential edge, but only a part of it, and in some cases, the voltage detection contact starts from the tip of the conical electrode. Since the contact point has a small rtJ shape along the conical direction, the contact point may not come into contact with the circumferential edge of the surpole. In addition, the resistance value changes depending on the position of the upper and lower current supply contacts, but as shown in Figure 5 CI), in the above configuration, the contact part is unstable and is divided into contact lines xr and x2, so the resistance value is the same. The measured value at the through hole fluctuates,
This results in numerical values that are not reproducible. This is the sixth
A more detailed explanation will be given according to the graph in the figure.

t56図は、後記する本発明装置を使用して上下の電流
供給接点の角度を換えて厚1.6mm+の配線板につき
a)■、0φ、b)1.2φ、c)1.6φの内径のス
ルホールについて夫々電圧を測定したものである。この
横軸は、(い)上部電極と下部電極との位置を電流供給
接点が上下で一致するよう配置した場合、(ろ)上部電
極を反持計方向へ90°回転させた場合、(は)−上部
電極を180度回転させた場合、(に)上部電極を時計
方向へ9′00回転させた場合を夫々プロットしたもの
である。この測定結果によると、スルホールの内径が配
線破の厚さに近くなるに従って上下の°電流供給接点の
相対角度によって抵抗値が著しく異ってくることが解る
。このため、前記の従来の円錐状接点では:上下の電流
供給接点の接触位置が不定で、かつ接触線、が不連続状
となるから、結局、111定値にパラツギか大きくなる
こととなる。
Figure t56 shows the inner diameter of a) ■, 0φ, b) 1.2φ, c) 1.6φ for a wiring board with a thickness of 1.6 mm+ by changing the angle of the upper and lower current supply contacts using the device of the present invention, which will be described later. The voltages are measured for each through hole. This horizontal axis shows the following values: (a) when the upper and lower electrodes are arranged so that the current supply contacts are aligned vertically; (b) when the upper electrode is rotated 90 degrees in the counterclockwise direction; ) - The case where the upper electrode is rotated by 180 degrees and the case where the upper electrode is rotated by 9'00 clockwise are plotted, respectively. According to the measurement results, it can be seen that as the inner diameter of the through hole approaches the thickness of the broken wire, the resistance value becomes significantly different depending on the relative angle of the upper and lower current supply contacts. For this reason, in the conventional conical contact, the contact positions of the upper and lower current supply contacts are unstable, and the contact line is discontinuous, resulting in a constant value of 111, which is somewhat large.

本発明は前記欠点の除去を目的とするものであって、錐
状゛電極の錐面に、その先端から錐方向に沿った小11
]の電圧検出接点を形成し、さらに前記検出接点と円周
方向で不連続な、先端部から後方に拡がる扇状の部分円
錐面からなる電流供給接点を形成し、夫々を電気的に絶
縁した構成になり、電流供給接点を錐面の略全周とはせ
ず、電圧検出接点と対向する扇状として、前記電圧検出
接点を確実に上下円縁に接触させるとともに、電流供給
接点の接触を分断しない接触線により施し、その接触位
置を特定し得るようにして、前記したメッキ厚と、導電
性の測定に最適となるようにしたちのである。
The present invention is aimed at eliminating the above-mentioned drawbacks, and includes a conical surface of a conical electrode with a small 11
A voltage detection contact is formed, and a current supply contact is formed with a fan-shaped partial conical surface that is discontinuous in the circumferential direction from the detection contact and expands rearward from the tip, and each is electrically insulated. Therefore, the current supply contact is not arranged around almost the entire circumference of the conical surface, but is made into a fan shape facing the voltage detection contact, so that the voltage detection contact is surely brought into contact with the upper and lower circular edges, and the contact of the current supply contact is not broken. This is done using a contact line, and the contact position can be specified, making it optimal for measuring the plating thickness and conductivity described above.

本発明の一実施例を添付図面について説明する。An embodiment of the invention will be described with reference to the accompanying drawings.

第1図は、測定装置の概要を示すものであって、印刷配
線板lの内周にメッキ部3が形成されたスルホール2の
上下部に錐状電極4,4が配置され、その電圧検出接点
5,5には抵抗測定器1   0が接続され、その電流
供給接点6,6には測定スイッチ11を介して直流定電
流源12が接続されるものであって、錐状電極4,4の
円錐面をスルホール2の上下円縁2aに接触させて、前
記測定スイッチ11を閉路し、上下の錐状電極4.4の
電流供給接点6,6間に電流を流し、その抵抗を電圧検
出接点5,5から抵抗測定器10によって検出する。
FIG. 1 shows an outline of the measuring device, in which conical electrodes 4, 4 are arranged at the upper and lower parts of a through hole 2 in which a plated part 3 is formed on the inner periphery of a printed wiring board l, and the voltage is detected by the conical electrodes 4, 4. A resistance measuring device 10 is connected to the contacts 5, 5, and a DC constant current source 12 is connected to the current supply contacts 6, 6 via a measuring switch 11. The conical surface of is brought into contact with the upper and lower circular edges 2a of the through hole 2, the measurement switch 11 is closed, a current is passed between the current supply contacts 6, 6 of the upper and lower conical electrodes 4.4, and the resistance is detected as a voltage. It is detected by the resistance measuring device 10 from the contacts 5,5.

錐状電極4,4の接触後に前記測定スイッチllを閉路
するようにしたのは、スパークによる錐状電極4,4の
円錐面及び、スルホール2の損壊を防止するためである
The reason why the measurement switch 11 is closed after the conical electrodes 4, 4 come into contact is to prevent the conical surfaces of the conical electrodes 4, 4 and the through hole 2 from being damaged by sparks.

かかる錐状電極4の構成につき、さらに詳細に説明する
The structure of the conical electrode 4 will be explained in more detail.

前記錐状電極4は第2,3図で拡大して示すように、そ
の先端部は先の尖った錐状をしていて、その先端から錐
面に沿って小+1Jの面部を分割して、これを電圧検出
接点5とし、前記検出接点5と180度の対向位置に先
端部から錐方向に沿って後方に拡がる扇状の部分円錐面
を電流供給接点6とし、前記電圧検出接点5.電流供給
接点6を絶縁性フィルム7により絶縁している。前記電
圧検出接点5.電流供給接点6間には、電流供給接点6
と同一部材であって傾斜角を約45°としだ平滑削成面
8,8が形成され、これにより、電圧検出接点5と電流
供給接点6とは円周方向で不連続となる。
As shown enlarged in FIGS. 2 and 3, the conical electrode 4 has a pointed conical tip, and a small +1J surface is divided from the tip along the conical surface. , this is used as a voltage detection contact 5, and a fan-shaped partial conical surface extending backward along the cone direction from the tip at a position 180 degrees opposite to the detection contact 5 is used as a current supply contact 6, and the voltage detection contact 5. The current supply contact 6 is insulated by an insulating film 7. The voltage detection contact 5. Between the current supply contacts 6, the current supply contacts 6
Smoothly machined surfaces 8, 8 are formed of the same member with an inclination angle of approximately 45°, and as a result, the voltage detection contact 5 and the current supply contact 6 are discontinuous in the circumferential direction.

前記実施例の作用を第4,5図について説明すると、ス
ルホール2の上下に錐状電極4,4を当てて、その上下
円縁2aに接触させると、前記平滑削成面8,8は上下
円縁2aに接触しず、また電圧検出接点5の巾は、約Q
、2mm程度で微小であり1本の小幅線縁(略点接触)
とみなすことができるから、スルホール2どの接触圧は
電圧検出接点5と電流供給接点6とで保持される。この
ため第5図■)に示すようにスルホール2が真円でなく
ても電圧検出接点5は勿論、電流供給接点6も円縁2a
と扇状のほぼ前山に渡って線接触し、かつその接触線y
が分断されず、このため測定位置が特定でき、かつ再現
性のある安定した値が得られることとなる。
The operation of the above embodiment will be explained with reference to FIGS. 4 and 5. When the conical electrodes 4, 4 are placed on the upper and lower sides of the through hole 2 and brought into contact with the upper and lower circular edges 2a, the smooth-cut surfaces 8, 8 are It does not contact the circular edge 2a, and the width of the voltage detection contact 5 is approximately Q.
, is minute at about 2 mm and has a single narrow line edge (approximately point contact)
Therefore, the contact pressure of the through hole 2 is maintained at the voltage detection contact 5 and the current supply contact 6. Therefore, as shown in Fig. 5 (■), even if the through hole 2 is not a perfect circle, not only the voltage detection contact 5 but also the current supply contact 6 will be
line contact across almost the front mountain of the fan shape, and the contact line y
is not divided, and therefore the measurement position can be specified and stable values with reproducibility can be obtained.

前記実施例は、円錐面を電圧検出接点5の両側において
平滑削成面8,8を削成して前記検出接点5と180度
の対向位置に扇状電流供給接点6を形成したものである
が、該供給接点6は、電圧検出接点5と円周方向で不連
続となる位置にあればよく、必ずしも対向位置にある必
要はない。ただし、錐状電極4が円縁2aに安定的に当
接するためたは180度の対向位置であることが望まし
い。また錐状電極4は截頭形であってもよい。
In the embodiment described above, the conical surfaces are smoothed and smoothed on both sides of the voltage detection contact 5, and the fan-shaped current supply contact 6 is formed at a position 180 degrees opposite the detection contact 5. , the supply contact 6 only needs to be discontinuous with the voltage detection contact 5 in the circumferential direction, and does not necessarily need to be located at an opposite position. However, in order for the conical electrode 4 to stably contact the circular edge 2a, it is preferable that the conical electrode 4 be in a position facing the circular edge 2a at 180 degrees. Further, the conical electrode 4 may have a truncated shape.

本発明は錐状電極4の錐面に、その先端から錐方向に沿
った小I11の電圧検出接点5と、前記検出接点と円周
方向で不連続な、先端部から後方に拡がる扇状の部分円
錐面からなる電流供給接点6とを夫々形成し、夫々を電
気的に絶縁するようにしたから、 イ〕スルホール2が真円でなくても電圧検出接点5、電
流供給接点6は確実に内縁2aと接触することとなり、
゛電圧検出接点5の接触不良に伴う抵抗の測定不良とい
ったことを生じない。
The present invention includes, on the conical surface of the conical electrode 4, a small I11 voltage detection contact 5 extending from the tip in the conical direction, and a fan-shaped portion extending rearward from the tip, which is discontinuous with the detection contact in the circumferential direction. Since the current supply contacts 6 each have a conical surface and are electrically insulated from each other, a) Even if the through hole 2 is not a perfect circle, the voltage detection contact 5 and the current supply contact 6 can be reliably connected to the inner edge. I came into contact with 2a,
``Poor resistance measurement due to poor contact of the voltage detection contact 5 does not occur.

口)常に円縁2aと一定位置で接触するため、測定値に
再現性を生じる。このため、その測定に当っては、スル
ホール2への電圧検出接点5、電がt供給接点6の接触
位置を換えて数点測定することにより、その値がスルホ
ール2の円周に沿ったものとなり、その円周に沿ったメ
ッキ部の厚みのバラ付きを測定することが可能となる等
の効果がある。
Mouth) Since it is always in contact with the circular edge 2a at a fixed position, reproducibility occurs in the measured values. Therefore, when making the measurement, change the contact positions of the voltage detection contact 5 and the voltage supply contact 6 to the through hole 2 and measure at several points, so that the value can be adjusted along the circumference of the through hole 2. This has the effect of making it possible to measure variations in the thickness of the plated portion along its circumference.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は測定装置の概要図、第2〜4図は本発明の実施
例を示し第2図は錐状電極4の側面図、第3図は端面図
、第4図は当接状態の側面図、第5図I)、II)は電
流供給接点6の接触状態を従来構造と比較して示す横断
平面図、第6図は上下の電流供給接点6,6の相対角度
と、測定値との関係を示すグラフである。 2;スルホール 2a;円縁 4;錐状電極5:電圧検
出接点 6;電流供給接点 ′jpJ1  図 第20    第3図 地40 第 鋒
Fig. 1 is a schematic diagram of the measuring device, Figs. 2 to 4 show embodiments of the present invention, Fig. 2 is a side view of the conical electrode 4, Fig. 3 is an end view, and Fig. 4 shows the contact state. The side view, Figures 5 I) and 5 II) are cross-sectional plan views showing the contact state of the current supply contacts 6 in comparison with the conventional structure, and Figure 6 shows the relative angles of the upper and lower current supply contacts 6, 6, and measured values. It is a graph showing the relationship between 2; Through hole 2a; Circular edge 4; Conical electrode 5: Voltage detection contact 6; Current supply contact 'jpJ1 Fig. 20 Fig. 3 Fig. 40 No. Feng

Claims (1)

【特許請求の範囲】[Claims] 印刷配線板のメッキ被覆されたスルホールの上置周縁と
下田周縁とに、夫々電流供給接点と、電圧検出接点とを
接触し、前記上下の電圧検出接点で、スルホールメッキ
部の抵抗を測定する装置において、錐状電極の錐面に、
その先端から錐方向に沿った小111の電圧検出接点を
形成し、さらに前記検出接点と円周方向で不連続な、先
端部から後方に拡がる扇状の部分円錐面からなる電流供
給接点を形成し、前記両接点を電気的に絶縁したことを
特徴とするスルホールメッキ部の抵抗測定装置
A device that measures the resistance of the through-hole plated portion by contacting a current supply contact and a voltage detection contact with the upper periphery and lower periphery of the plated through-hole of a printed wiring board, respectively, and using the upper and lower voltage detection contacts. , on the conical surface of the conical electrode,
A small 111 voltage detection contact is formed from the tip along the conical direction, and a current supply contact is formed from a fan-shaped partial conical surface that is discontinuous with the detection contact in the circumferential direction and expands rearward from the tip. , a resistance measuring device for a through-hole plating part, characterized in that both the contacts are electrically insulated.
JP58097397A 1983-06-01 1983-06-01 Device for holding hanger in surface treating equipment Pending JPS59222996A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58097397A JPS59222996A (en) 1983-06-01 1983-06-01 Device for holding hanger in surface treating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58097397A JPS59222996A (en) 1983-06-01 1983-06-01 Device for holding hanger in surface treating equipment

Publications (1)

Publication Number Publication Date
JPS59222996A true JPS59222996A (en) 1984-12-14

Family

ID=14191381

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58097397A Pending JPS59222996A (en) 1983-06-01 1983-06-01 Device for holding hanger in surface treating equipment

Country Status (1)

Country Link
JP (1) JPS59222996A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564295A (en) * 1979-06-14 1981-01-17 Upa Technology Inc Probe device for measuring conductivity of plated through hole

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564295A (en) * 1979-06-14 1981-01-17 Upa Technology Inc Probe device for measuring conductivity of plated through hole

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