JPS59217936A - 大気圧イオン化質量分析計 - Google Patents

大気圧イオン化質量分析計

Info

Publication number
JPS59217936A
JPS59217936A JP59083723A JP8372384A JPS59217936A JP S59217936 A JPS59217936 A JP S59217936A JP 59083723 A JP59083723 A JP 59083723A JP 8372384 A JP8372384 A JP 8372384A JP S59217936 A JPS59217936 A JP S59217936A
Authority
JP
Japan
Prior art keywords
gas
atmospheric pressure
mass spectrometer
concentration
carrier gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59083723A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0115985B2 (enExample
Inventor
Hideki Kanbara
秀記 神原
Yasuhiro Mitsui
泰裕 三井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59083723A priority Critical patent/JPS59217936A/ja
Publication of JPS59217936A publication Critical patent/JPS59217936A/ja
Publication of JPH0115985B2 publication Critical patent/JPH0115985B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP59083723A 1984-04-27 1984-04-27 大気圧イオン化質量分析計 Granted JPS59217936A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59083723A JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59083723A JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Publications (2)

Publication Number Publication Date
JPS59217936A true JPS59217936A (ja) 1984-12-08
JPH0115985B2 JPH0115985B2 (enExample) 1989-03-22

Family

ID=13810431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59083723A Granted JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Country Status (1)

Country Link
JP (1) JPS59217936A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311554A (ja) * 1988-06-10 1989-12-15 Hitachi Ltd プラズマイオン化質量分析計

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311554A (ja) * 1988-06-10 1989-12-15 Hitachi Ltd プラズマイオン化質量分析計

Also Published As

Publication number Publication date
JPH0115985B2 (enExample) 1989-03-22

Similar Documents

Publication Publication Date Title
McLuckey et al. Atmospheric sampling glow discharge ionization source for the determination of trace organic compounds in ambient air
KR101110358B1 (ko) 유해물질 검출 방법 및 테스트 시스템
Siegel et al. Terminal ions in weak atmospheric pressure plasmas. Applications of atmospheric pressure ionization to trace impurity analysis in gases
Hansel et al. Improved detection limit of the proton‐transfer reaction mass spectrometer: on‐line monitoring of volatile organic compounds at mixing ratios of a few pptv
Guharay et al. Ion mobility spectrometry: Ion source development and applications in physical and biological sciences
US4261698A (en) Trace oxygen detector
US20030112431A1 (en) Method of using an aerosol to calibrate spectrometers
JP2008508511A (ja) コロナ放電イオン化エレメントを備えたイオン移動度分光器
CA2269385A1 (en) Simultaneous detection isotopic ratio mass spectrometer
Noble et al. Aerosol characterization using mass spectrometry
US20130260473A1 (en) Ionisation method for a universal gas analyzer
Eisele et al. High-pressure chemical ionization flow reactor for real-time mass spectrometric detection of sulfur gases and unsaturated hydrocarbons in air
Nier et al. Recording mass spectrometer for process analysis
Hutton et al. Analysis of pure metals using a quadrupole-based glow discharge mass spectrometer. Part 1. Analysis of copper
Siefering et al. Quantitative analysis of contaminants in ultrapure gases at the parts‐per‐trillion level using atmospheric pressure ionization mass spectroscopy
US6895339B2 (en) Method for measuring the concentration of water in argon, hydrogen, nitrogen and helium by ionization mobility spectrometry
JPS59217936A (ja) 大気圧イオン化質量分析計
CN108169321B (zh) 高纯氮气检测方法及装置
Zook et al. Detection mass bias in atmospheric pressure ionization mass spectrometry
JP2002122570A (ja) ガス中の微量不純物の分析方法及び装置
Hirata et al. A reaction cell as a sample introduction portal for detection of gaseous components in ICP-MS
US6956206B2 (en) Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63NI electron source
CN1639565A (zh) 利用离子迁移率光谱法测定氮气中氢气的甲烷浓度的方法
Genuit et al. Selective ion source for trace gas analysis
JPH10239280A (ja) 質量分析方法及び試料ガス混合装置