JPS59210681A - Manufacture of semiconductor laser - Google Patents
Manufacture of semiconductor laserInfo
- Publication number
- JPS59210681A JPS59210681A JP8412383A JP8412383A JPS59210681A JP S59210681 A JPS59210681 A JP S59210681A JP 8412383 A JP8412383 A JP 8412383A JP 8412383 A JP8412383 A JP 8412383A JP S59210681 A JPS59210681 A JP S59210681A
- Authority
- JP
- Japan
- Prior art keywords
- resonator
- end surface
- wafer
- electrode
- face
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Weting (AREA)
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
(技術分野)
この発明は半導体レーザの製造方法に関するものである
。DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to a method of manufacturing a semiconductor laser.
(従来技術)
これまでの半導体レーザは、(、o o i )基板上
に<110>または< i i O>方向に共振器を形
成し、襞間またはエツチングによシ端面を形成していた
。(Prior art) Conventional semiconductor lasers have formed a resonator in the <110> or <i i O> direction on a (, o o i ) substrate, and formed an end face between the folds or by etching. .
しかしながら、これらの方法のうち襞間による場合には
、刃による歪や傷をつけやすいという欠点があった。ま
た、エツチングによる場合には、面方位依存性により端
面が逆メサまたは順メサ状となシフアプリベロー共振器
としては損失が大きいという欠点があシ、さらに反応性
イオンエツチングなどドライエツチングでは、化学エツ
チングはど滑らかな端面が得られず損失が大きいという
欠点があった。However, among these methods, the method using interfolds has the disadvantage that it is easily distorted or damaged by the blade. In addition, when etching is used, there is a disadvantage that the end face has an inverted mesa or forward mesa shape due to surface orientation dependence, and the loss is large for a shifted vertical resonator.Furthermore, dry etching such as reactive ion etching has the disadvantage that chemical etching Etching has the disadvantage that smooth end surfaces cannot be obtained and loss is large.
(発明の目的)
この発明は上記の点に鑑みなされたもので、歪や傷をつ
けずに滑らかに、しかも垂直に共振器端面を形成できる
半導体レーザの製造方法を提供することを目的とする。(Objective of the Invention) The present invention has been made in view of the above points, and an object thereof is to provide a method for manufacturing a semiconductor laser that can form a resonator end face smoothly and vertically without causing distortion or scratches. .
(実施例)
以下、InGaAsP/ InP半導体レーザを例にと
ってこの発明の一実施例を第1図および第2図を参照し
て説明する。(Embodiment) An embodiment of the present invention will be described below with reference to FIGS. 1 and 2, taking an InGaAsP/InP semiconductor laser as an example.
第1図(a)において、1はInP(001)基板であ
シ、まずこの基板1上にs GaInAsPよQなる活
性領域2すなわちレーザ共振器が<100>方向になる
ようにして成長層3を通常の方法で形成することによシ
、レーザウェハ4を作成する。ここで、レーザウェハ4
は、利得導波路形または屈折率導波路形のいずれの素手
を構成するようにしてもよい。In FIG. 1(a), reference numeral 1 is an InP (001) substrate. First, a grown layer 3 made of sGaInAsP is grown on the substrate 1 so that the active region 2, that is, the laser cavity, is in the <100> direction. A laser wafer 4 is created by forming a laser wafer 4 using a conventional method. Here, the laser wafer 4
The bare hand may be either a gain waveguide type or a refractive index waveguide type.
次に、そのレーデウェハ4上に電極5を形成し、さらに
その電極5上に、フォトワークによυ、共振器長を幅と
するストライプ状エツチングマスク6を<o i o>
方向に形成する(第1図(b))。Next, an electrode 5 is formed on the radar wafer 4, and a striped etching mask 6 whose width is the resonator length is formed on the electrode 5 by photowork.
(FIG. 1(b)).
しかる後、エツチングマスク6をマスクとして電極5を
エツチングし、さらに、臭素−メタノールなど面方位依
存性の強いエッチャントで活性領域2の下迄レーザウェ
ハ4をエツチングする(第1図(C))。すると、エツ
チング端面(その一部が共振器端面となる)は垂直すな
わち(ioo)面となシ、7アプリ一ベロー鏡面が構成
される。Thereafter, the electrode 5 is etched using the etching mask 6 as a mask, and the laser wafer 4 is further etched down to the bottom of the active region 2 using an etchant having a strong surface orientation dependence such as bromine-methanol (FIG. 1(C)). Then, the etched end face (a part of which becomes the resonator end face) becomes a vertical, ie (ioo) plane, and a seven-sided bellows mirror surface is formed.
以上の後、第1図(d)に示すようにマスク6を除去す
る。そして、その上で、電極5付のレーザウェハ4を同
第1図(d)に細線7..72で示すように<110>
および<−11o>方向に所定の大きさ−に−J!#開
し、レーザチップを切り出す。この切シ出されfclつ
のチップを第2図に示す。After the above, the mask 6 is removed as shown in FIG. 1(d). Then, the laser wafer 4 with the electrode 5 is attached to the thin line 7. shown in FIG. 1(d). .. <110> as shown in 72
and -J to a predetermined magnitude in the <-11o> direction! #Open and cut out the laser chip. This cut out fcl chip is shown in FIG.
(発明の効果)
以上の一実施例から明らかなようにこの発明の半導体レ
ーデの製造方法においては、(001)面の基板上に半
導体レーザの共振器を<ioo>方向に形成し、さらに
面方位依存性の強い化学エツチング液を用いて共振器端
面を(ioo)面に、すなわち垂直に形成する。したが
って、この発明の方法によれば、共振器端面を骨間によ
らずに化学エツチングで垂直に形成することが可能とな
る。そして、化学エツチングによる方法であるから、共
振器端面にひずみや傷をつけることがない。捷た、端面
が滑らかであり、したがって得られた半導体レーザは、
前記端面が垂直であることと相まって損失が少なく、骨
間による場合と同程度の効率を保持できる。(Effects of the Invention) As is clear from the above embodiment, in the method for manufacturing a semiconductor laser of the present invention, a semiconductor laser resonator is formed in the <ioo> direction on a (001) plane substrate, and A resonator end face is formed in the (ioo) plane, that is, perpendicularly, using a chemical etching solution with strong orientation dependence. Therefore, according to the method of the present invention, it is possible to form the resonator end face perpendicularly by chemical etching without having to pass between the bones. Furthermore, since the method uses chemical etching, no strain or damage is caused to the resonator end face. The resulting semiconductor laser has a smooth edge surface.
Coupled with the fact that the end surface is vertical, there is little loss, and the efficiency can be maintained at the same level as in the case of using an interosseous method.
また、一実施例では、最終工程で骨間によりチップに切
シ出しているが、その前に既に共、振器端面が化学エツ
チングによシ垂直に形成されているから、この弁開工程
を歩留りよく、かつ簡略化して行うことができる。In addition, in one embodiment, the tip is cut out by the interbone in the final step, but since the end face of the vibrator has already been vertically formed by chemical etching before that, this valve opening step is not necessary. It can be carried out with high yield and in a simple manner.
(他の例)
なお、一実施例ではレーザチップを作製する場合を説明
したが、半絶縁性基板上に素子を集積化する場合にもこ
の発明を適用できる。(Other Examples) Although the case of manufacturing a laser chip has been described in one embodiment, the present invention can also be applied to the case of integrating elements on a semi-insulating substrate.
第1図および第2図はこの発明の半導体レーザの製造方
法の一実施例を説明するための斜視図である。
1・・・InP(001)基板、2・・・活性領域、4
・・・レーザウェハ、6・・・エツチングマスク。
特許出願人 沖電気工業株式会社FIGS. 1 and 2 are perspective views for explaining an embodiment of the method for manufacturing a semiconductor laser according to the present invention. 1... InP (001) substrate, 2... Active region, 4
... Laser wafer, 6... Etching mask. Patent applicant Oki Electric Industry Co., Ltd.
Claims (1)
0>方向に形成し、さらに面方位依存性の強い化学エツ
チング液を用いて共振器端面を(100)面に形成する
ことを特徴とする半導体レーザの製造方法。A semiconductor laser resonator is mounted on a (001) plane substrate with <10
0> direction, and a resonator end face is formed in the (100) plane using a chemical etching solution that is strongly dependent on the plane orientation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8412383A JPS59210681A (en) | 1983-05-16 | 1983-05-16 | Manufacture of semiconductor laser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8412383A JPS59210681A (en) | 1983-05-16 | 1983-05-16 | Manufacture of semiconductor laser |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59210681A true JPS59210681A (en) | 1984-11-29 |
Family
ID=13821735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8412383A Pending JPS59210681A (en) | 1983-05-16 | 1983-05-16 | Manufacture of semiconductor laser |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59210681A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06216106A (en) * | 1992-03-17 | 1994-08-05 | Hikari Keisoku Gijutsu Kaihatsu Kk | Semiconductor device and its manufacture |
DE19527000A1 (en) * | 1994-07-25 | 1996-02-01 | Mitsubishi Electric Corp | Semiconductor laser and method for manufacturing a semiconductor laser |
-
1983
- 1983-05-16 JP JP8412383A patent/JPS59210681A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06216106A (en) * | 1992-03-17 | 1994-08-05 | Hikari Keisoku Gijutsu Kaihatsu Kk | Semiconductor device and its manufacture |
DE19527000A1 (en) * | 1994-07-25 | 1996-02-01 | Mitsubishi Electric Corp | Semiconductor laser and method for manufacturing a semiconductor laser |
GB2292005A (en) * | 1994-07-25 | 1996-02-07 | Mitsubishi Electric Corp | Semiconductor ridge laser |
US5604764A (en) * | 1994-07-25 | 1997-02-18 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor laser |
US5656539A (en) * | 1994-07-25 | 1997-08-12 | Mitsubishi Denki Kabushiki Kaisha | Method of fabricating a semiconductor laser |
GB2292005B (en) * | 1994-07-25 | 1998-11-04 | Mitsubishi Electric Corp | Semiconductor laser and method of fabricating semiconductor laser |
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