JPS59202045A - つや感の判別方法 - Google Patents

つや感の判別方法

Info

Publication number
JPS59202045A
JPS59202045A JP58076194A JP7619483A JPS59202045A JP S59202045 A JPS59202045 A JP S59202045A JP 58076194 A JP58076194 A JP 58076194A JP 7619483 A JP7619483 A JP 7619483A JP S59202045 A JPS59202045 A JP S59202045A
Authority
JP
Japan
Prior art keywords
scale
chart
glossiness
sample
brightness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58076194A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0233091B2 (https=
Inventor
Shigeru Suga
須賀　蓊
Kiyoshi Chagi
茶木　清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suga Test Instruments Co Ltd
Original Assignee
Suga Test Instruments Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suga Test Instruments Co Ltd filed Critical Suga Test Instruments Co Ltd
Priority to JP58076194A priority Critical patent/JPS59202045A/ja
Publication of JPS59202045A publication Critical patent/JPS59202045A/ja
Priority to US06/714,492 priority patent/US4717259A/en
Publication of JPH0233091B2 publication Critical patent/JPH0233091B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP58076194A 1983-05-02 1983-05-02 つや感の判別方法 Granted JPS59202045A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58076194A JPS59202045A (ja) 1983-05-02 1983-05-02 つや感の判別方法
US06/714,492 US4717259A (en) 1983-05-02 1985-03-21 Luster rating method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58076194A JPS59202045A (ja) 1983-05-02 1983-05-02 つや感の判別方法

Publications (2)

Publication Number Publication Date
JPS59202045A true JPS59202045A (ja) 1984-11-15
JPH0233091B2 JPH0233091B2 (https=) 1990-07-25

Family

ID=13598329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58076194A Granted JPS59202045A (ja) 1983-05-02 1983-05-02 つや感の判別方法

Country Status (2)

Country Link
US (1) US4717259A (https=)
JP (1) JPS59202045A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6253340U (https=) * 1985-09-21 1987-04-02
JPH02658U (https=) * 1988-06-10 1990-01-05
JPH0248853U (https=) * 1988-09-30 1990-04-04

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5142648A (en) * 1990-08-02 1992-08-25 General Motors Corporation Method and apparatus for paint inspection
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
US6433867B1 (en) * 2000-01-11 2002-08-13 The Aerospace Corporation Contrast imaging method for inspecting specular surface devices
EP3220101B1 (en) 2016-03-16 2020-01-29 Ricoh Company, Ltd. Texture evaluation apparatus, texture evaluation method, and computer-readable recording medium
JP6699263B2 (ja) * 2016-03-17 2020-05-27 株式会社リコー 検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5260643A (en) * 1975-11-14 1977-05-19 Suga Test Instruments Method of measuring visibility of image

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2830490A (en) * 1955-09-16 1958-04-15 Mary S Pellegrini Method and apparatus for measuring the surface smoothness of glossy objects
US3396627A (en) * 1965-04-09 1968-08-13 Ednalite Corp Method and device for measuring surface roughness

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5260643A (en) * 1975-11-14 1977-05-19 Suga Test Instruments Method of measuring visibility of image

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6253340U (https=) * 1985-09-21 1987-04-02
JPH02658U (https=) * 1988-06-10 1990-01-05
JPH0248853U (https=) * 1988-09-30 1990-04-04

Also Published As

Publication number Publication date
US4717259A (en) 1988-01-05
JPH0233091B2 (https=) 1990-07-25

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